Reid & Sanders, Operations Management © Wiley 2002 Statistical Quality Control 6 C H A P T E R
Reid & Sanders, Operations Management© Wiley 2002
Statistical Quality Control 6C H A P T E R
Page 2Reid & Sanders, Operations Management© Wiley 2002
Learning Objectives
• Describe quality control methods• Understand the use of statistical process
control • Describe & apply control charts• Distinguish x-bar, R, p and c-charts• Define process capability • Describe & apply capability indexes• Define six-sigma capability
Page 3Reid & Sanders, Operations Management© Wiley 2002
Quality Control Methods
• Descriptive statistics:– Used to describe distributions of data
• Statistical process control (SPC):– Used to determine whether a process is
performing as expected
• Acceptance sampling:– Used to accept or reject entire batches by
only inspecting a few items
Page 4Reid & Sanders, Operations Management© Wiley 2002
Descriptive Statistics
• Mean (x-bar):– The average or central tendency of a data set
• Standard deviation (sigma):– Describes the amount of spread or observed
variation in the data set
• Range:– Another measure of spread – The range measures the difference between the
largest & smallest observed values in the data set
Page 5Reid & Sanders, Operations Management© Wiley 2002
The Normal Distribution
Page 6Reid & Sanders, Operations Management© Wiley 2002
Equations
• Mean:
• Standard deviation:
n
xx
n
ii
1
1
1
2
n
Xxn
ii
Page 7Reid & Sanders, Operations Management© Wiley 2002
Impact of Standard Deviation
Page 8Reid & Sanders, Operations Management© Wiley 2002
Skewed Distributions (One Form of Non-Normal Distribution)
Page 9Reid & Sanders, Operations Management© Wiley 2002
SPC Methods
• Control charts– Use statistical limits to identify when a
sample of data falls within a normal range of variation
Page 10Reid & Sanders, Operations Management© Wiley 2002
Setting Limits RequiresBalancing Risks
• Control limits are based on a willingness to think something’s wrong, when it’s actually not (Type I or alpha error), balanced against the sensitivity of the tool - the ability to quickly reveal a problem (failure is Type II or beta error)
Page 11Reid & Sanders, Operations Management© Wiley 2002
Types of Data
• Variable level data:– Can be measured using a continuous scale– Examples: length, weight, time, &
temperature
• Attribute level data:– Can only be described by discrete
characteristics– Example: defective & not defective
Page 12Reid & Sanders, Operations Management© Wiley 2002
Control Charts for Variable Data
• Mean (x-bar) charts– Tracks the central tendency (the average
value observed) over time
• Range (R) charts:– Tracks the spread of the distribution over
time (estimates the observed variation)
Page 13Reid & Sanders, Operations Management© Wiley 2002
x-Bar Computations
xx
xx
x
n
zxLCL
zxUCL
nn
xxxx
...21
Page 14Reid & Sanders, Operations Management© Wiley 2002
Example
• Assume the standard deviation of the process is given as 1.13 ounces• Management wants a 3-sigma chart (only 0.26% chance of alpha error)• Observed values shown in the table are in ounces
Time 1 Time 2 Time 3
Observation 1 15.8 16.1 16.0
Observation 2 16.0 16.0 15.9
Observation 3 15.8 15.8 15.9
Observation 4 15.9 15.9 15.8
Sample means 15.875 15.975 15.9
Page 15Reid & Sanders, Operations Management© Wiley 2002
Computations
• Center line (x-double bar):
• Control limits:
92.153
9.15975.15875.15
x
Page 16Reid & Sanders, Operations Management© Wiley 2002
2nd Method Using R-bar
RAxLCL
RAxUCL
n
RRRR
x
x
n
2
2
21 ...
Page 17Reid & Sanders, Operations Management© Wiley 2002
Control Chart Factors
Factor for x-ChartA2 D3 D4
2 1.88 0.00 3.273 1.02 0.00 2.574 0.73 0.00 2.285 0.58 0.00 2.116 0.48 0.00 2.007 0.42 0.08 1.928 0.37 0.14 1.869 0.34 0.18 1.82
10 0.31 0.22 1.7811 0.29 0.26 1.7412 0.27 0.28 1.7213 0.25 0.31 1.6914 0.24 0.33 1.6715 0.22 0.35 1.65
Factors for R-ChartSample Size (n )
Page 18Reid & Sanders, Operations Management© Wiley 2002
Example
Time 1 Time 2 Time 3
Observation 1 15.8 16.1 16.0
Observation 2 16.0 16.0 15.9
Observation 3 15.8 15.8 15.9
Observation 4 15.9 15.9 15.8
Sample means 15.875 15.975 15.9
Sample ranges 0.2 0.3 0.2
Page 19Reid & Sanders, Operations Management© Wiley 2002
Computations
22.1433.273.092.15
62.1733.273.092.15
33.23
2.03.02.0
2
2
RAxLCL
RAxUCL
R
x
x
Page 20Reid & Sanders, Operations Management© Wiley 2002
Example x-bar Chart
X-bar Chart
12
13
14
15
16
17
18
1 2 3 4 5 6 7 8 9 10
Time
Ou
nc
es
UCL
LCL
CL
Page 21Reid & Sanders, Operations Management© Wiley 2002
R-chart Computations(Use D3 & D4 Factors: Table 6-1)
0033.2
71.628.233.2
33.23
2.03.02.0
3
4
DRLCL
DRUCL
R
R
R
Page 22Reid & Sanders, Operations Management© Wiley 2002
Example R-chart
R Chart
0
1
2
3
4
5
6
7
8
1 2 3 4 5 6 7 8 9 10 11
Time
Ou
nc
es
UCL
LCL
CL
Page 23Reid & Sanders, Operations Management© Wiley 2002
Using x-bar & R-charts
• Use together• Reveal different
problems
Page 24Reid & Sanders, Operations Management© Wiley 2002
Control Charts for Attribute Data
• p-Charts:– Track the proportion defective in a sample
• c-Charts:– Track the average number of defects per
unit of output
Page 25Reid & Sanders, Operations Management© Wiley 2002
Process Capability
• A measure of the ability of a process to meet preset design specifications:– Determines whether the process can do what we
are asking it to do
• Design specifications (a/k/a tolerance limits):– Preset by design engineers to define the
acceptable range of individual product characteristics (e.g.: physical dimensions, elapsed time, etc.)
– Based upon customer expectations & how the product works (not statistics!)
Page 26Reid & Sanders, Operations Management© Wiley 2002
Measuring Process Capability
Compare the width of design specifications & observed process output
Page 27Reid & Sanders, Operations Management© Wiley 2002
Capability Indexes
• Centered Process (Cp):
• Any Process (Cpk):
6 widthprocess
ion widthspecificat LSLUSLC p
3
;3
minLSLUSL
C pk
Page 28Reid & Sanders, Operations Management© Wiley 2002
Example
• Design specifications call for a target value of 16.0 +/-0.2 microns (USL = 16.2 & LSL = 15.8)
• Observed process output has a mean of 15.9 and a standard deviation of 0.1 microns
Page 29Reid & Sanders, Operations Management© Wiley 2002
Computations
• Cp:
• Cpk:
66.06.0
4.0
1.06
8.152.16
6
LSLUSL
C p
33.033.0or 1min3.0
1.0or
3.0
3.0min
1.03
8.159.15or
1.03
9.152.16min
3or
3min
LSLUSLC pk
Page 30Reid & Sanders, Operations Management© Wiley 2002
Three Sigma Capability
• Until now, we assumed process output should be modeled as +/- 3 standard deviations
• By doing so, we ignore the 0.26% of output that falls outside +/- 3 sigma range
• The result: a 3-sigma capable process produces 2600 defects for every million units produced
Page 31Reid & Sanders, Operations Management© Wiley 2002
Six Sigma Capability
• Six sigma capability assumes the process is capable of producing output where +/- 6 standard deviations fall within the design specifications (even when the mean output drifts up to 1.5 standard deviations off target)
• The result: only 3.4 defects for every million produced
Page 32Reid & Sanders, Operations Management© Wiley 2002
3-Sigma versus 6-Sigma
Page 33Reid & Sanders, Operations Management© Wiley 2002
The End
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