Juan Valls - LECC03 Amsterdam 1 Recent System Test Results from the CMS TOB Detector Introduction ROD System Test Setup ROD Electrical and Optical Characterization Noise Characterization (ROD vs OTRI) S/N, Signal Efficiencies, Noise Occupancies Conclusions Juan Valls CERN 9 th Workshop on Electronics For LHC Experiments
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Recent System Test Results from the CMS TOB Detector
Recent System Test Results from the CMS TOB Detector. Juan Valls CERN. 9 th Workshop on Electronics For LHC Experiments. Introduction ROD System Test Setup ROD Electrical and Optical Characterization Noise Characterization (ROD vs OTRI) S/N, Signal Efficiencies, Noise Occupancies - PowerPoint PPT Presentation
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Juan Valls - LECC03 Amsterdam
1
Recent System Test Results from the CMS
TOB Detector
Introduction ROD System Test Setup ROD Electrical and Optical Characterization Noise Characterization (ROD vs OTRI) S/N, Signal Efficiencies, Noise Occupancies Conclusions
6 (SS) or 12 (DS) silicon modules Interconnection electronics (ICB, ICC) Control electronics (CCUM) Optoelectronics (AOH) Cooling pipe + module cooling elements
CF frame profile
ICBICCs
Juan Valls - LECC03 Amsterdam4
ROD Assembly (Readout)
Analog Optohybrids (AOH ICs)
24fibers
Juan Valls - LECC03 Amsterdam5
ROD System Test Setup
FEC2CCUMboard
Optical Readout
ElectricalControls
TOB DS RODLayer 1
HV
LV
C6F14
Cooling Plant
1 kW +5C/+32C
(~3 m)
Juan Valls - LECC03 Amsterdam6
Thermal Behavior
t (sec)
T (
°C)
LV off LV on LV off
T (Si-pipe) 6 °C
Design figure:
T < 10 °C with irradiated sensorsand highest optohybrid settings
All tests at room temp To be repeated in the cold
DS ROD SS ROD
Juan Valls - LECC03 Amsterdam7
System Tests
Integrate sensors with FE electronics, interconnecting boards and buses in the final mechanical support
Integrate full optical link for signal distribution (control and readout) Integrate HV and LV power, long cables and test LV power uniformity Verify electrical tests to check integrity of signals (timing and
control) through transmission between cards Tunning of the controls and analogue optical links Validate grounding and detector bias schemes by studying noise Analysis of data from sensors, S/N ratios, signal efficiencies and strip
noise occupancies
Main objectives of pre-production phase (system tests) are the validation of the overall design structure before production
Juan Valls - LECC03 Amsterdam8
Control and Readout
PLL Delay
MUX 2:1
PLL
APVamplifierspipelines
128:1 MUX
Detector Hybrid A-Opto Hybridprocessingbuffering
TTCRx
ADC
Rx Module
FED
TTCRx
FEC
CCUCCU
CCU CCU
DCU
Control
processingbuffering
Back-End
TTC
DAQ
Digital Control2500 links @40MHz
D-Opto Hybrid
Front-End
Analogue Readout40000 links @ 40MS/s
TRx Module
Front End Drivers
Front End Controllers
Juan Valls - LECC03 Amsterdam9
Time Alignment Scans Scan through PLL
fine delays (1.04 ns) and with a fixed FED digitization delay
Reconstruct APV tick marks
The DS ROD introduces shift delays of ~2 ns on the trigger arrival time to APVs.
FED 0
FED 1
FED 2
Juan Valls - LECC03 Amsterdam10
FED Digitizing Point Find the FED optimal
digitization point
Reconstruct APV tick marks by varying FED skew clock delay wrt data (PLL settings fixed)
Choose sampling point close to the back edge of the tick mark
FED 0
FED 1
FED 2
Juan Valls - LECC03 Amsterdam11
Optical Scan Characterization
Plot ticks and baselines as a function of bias (for a fixed gain)
Get the tick amplitude from the difference between these distributions
Find optimal settings (gain and bias) for an 800 mV AOH input tick amplitude What does this correspond to at the FED (in ADC counts)? Need to calibrate FED cards: FED gain ~3.5 mV/count, Optolink gain ~0.8V/V
Juan Valls - LECC03 Amsterdam13
DS ROD Noise
DeconvolutionNon-Inverting
(200 V)
CCUM
difftot
CMN
Juan Valls - LECC03 Amsterdam14
DS ROD CMNCMN (flat) Calculation
(running average pedestals)
Non-Inverting Inverting
~40%
Juan Valls - LECC03 Amsterdam15
DS ROD HV ScansHV Bias Scan on DS ROD
6 HV channels for 12 modules(CAEN SY-127, A343 boards)
Total noise (ADC) = f (Vbias)
Full depletion at ~150 VoltsSimilar behavior for all modules
30% larger Noise in the DS ROD wrtOTRI setup
Juan Valls - LECC03 Amsterdam16
Full Gain Scans
Fit Range: Ical=18 to Ical=70
0.6 – 2.7 MIPs
Ical=29 ~ 25000 elecPeak Mode
Non-Inverting
DeconvolutionNon-Inverting
OTRI ROD
OTRI ROD
~ 850 e/ADC (OTRI)~ 650 e/ADC (ROD)
Juan Valls - LECC03 Amsterdam17
Noise (DS ROD vs OTRI)
APV25 bare chip on PCB(Cinp=18 pF)Peak: 900 elec.Dec: 1500 elec.
OTRI SetupPeak: 1600 elec.Dec: 2600 elec.
DS ROD SetupPeak: 1600 elec.Dec: 2700 elec.
Peak ModeNon-Inverting
DeconvolutionNon-Inverting
Juan Valls - LECC03 Amsterdam18
Signal to Noise Ratios
~500 Hz
~0.5 Hz
Use Ru106 beta source and cosmic rays
Simple cluster algorithm based on S/N thresholds
S/N>5
S/N>2
S/N
S/N=14.1 S/N=14.9
S/N=14.7 S/N=15.3
S/N=23.2 S/N=25.9
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Efficiencies, Strip Occupancies
The FEDs will run a cluster finding algorithm (zero-suppression) during data taking
Only strips associated with clusters will be readout (LVL1 100 kHz Occupancies < 1.8%)