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Authors: Dr. James Michels, Dr. Sunil Labroo Department of Physics & Astronomy - SUNY Oneonta Magnetic Thin Film Analyses using an Optical Modulation System Objective • Assess Magnetic Thin Film Alloy Physical Properties • Provide Educational Research Project (Solid State Physics) Approach • Investigate Magnetic Hysteresis Effects • Two Experimental Methodologies: (1) Extraordinary Hall Effect Resistance Measurements (2) Magneto-Optic Kerr Effect (MOKE) Data Prior Extraordinary Hall Effect Data and Observations Prior Magneto Optical Analyses 0.83 mT 2.0 mT 5.0 mT 8.1 mT 12.0 mT 0.00 0.50 1.00 1.50 2.00 -25 -20 -15 -10 -5 0 5 10 15 20 25 Hall Resistance (mΩ) B (mT) Hall Resistance vs B-Field 20% Cu in Ni Increasing B-field Decreasing B-field Increasing B-field Ordinary Hall Effect (metals and semi-conductors) x ( ) L d q E v B F Extraordinary Hall Effect (concentrations of magnetic materials) 0 0 e EH RB R M R t 0 H H RB V R I t 0 Current Ordinary Hall Coefficient I R 0 Extraordinary Hall Resistance Extraordinary Hall Coefficient Permeability of free space Magnetization EH e R R M Extraordinary Hall Effect Experimental Setup Sample Specifications • Film thicknesses of 2300-2500 Å Current results for the 20% Ni in Cu setup • Other sample compositions: 1%, 5%, and 10%, Ni in Cu • Atomic fractions prepared using arc melting / thermal evaporation drift velocity d v B electric field vector E H V Lorentz Force t h I I B B y x z e F e v L F d v + + + + + + + + + + + + - - - - - - - - - - - - - H V - + Magnet Pole Magnet Pole Magnetic Field Vector Hall Voltage Hall Resistance Magneto - Optic Kerr Effect (MOKE) Apparatus H V H V Future Magneto-Optical Analyses Kerr Cell Analyses Birefringence Analyses Structural Analysis Magnetostriction (stress / strain) Optical Communications Spectral Analyses Laser Polarizer Polarizer (Analyzer) Electomagnet Poles Photoelastic Modulator (PEM) Light Detector Thin Film Light Chopper Lock-in Amplifier Oscilloscope Computer [1] [Tb 0.4 Fe 0.4 /Fe 0.5 Co 0.5 ] 3 multilayer film [2] Gd-Co film at several optical wavelengths References [1] Cerne, J., Magneto-Polarimetry Advanced Lab, Univ. Buffalo. [2] Sata, K., Jap. J. of Applied Physics, Vol. 20, No. 12, Dec. 1981 CuNi alloy thin films Concentrations of Ni in Cu (1%, 5%, 10%, 20%, 50%) Alternative Magneto-Optical Applications
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Magnetic Thin Film Analyses using an Optical Modulation System

May 07, 2022

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Page 1: Magnetic Thin Film Analyses using an Optical Modulation System

Authors: Dr. James Michels, Dr. Sunil Labroo Department of Physics & Astronomy - SUNY Oneonta

Magnetic Thin Film Analyses using an Optical Modulation System

Objective • Assess Magnetic Thin Film Alloy Physical Properties

• Provide Educational Research Project (Solid State Physics)

Approach • Investigate Magnetic Hysteresis Effects

• Two Experimental Methodologies:

(1) Extraordinary Hall Effect Resistance Measurements

(2) Magneto-Optic Kerr Effect (MOKE) Data

Prior Extraordinary Hall Effect Data and Observations

Prior Magneto – Optical Analyses

0.83 mT

2.0 mT

5.0 mT

8.1 mT

12.0 mT

0.00

0.50

1.00

1.50

2.00

-25 -20 -15 -10 -5 0 5 10 15 20 25

Hall R

esis

tan

ce

(m

Ω)

B (mT)

Hall Resistance vs B-Field 20% Cu in Ni

Increasing B-field

Decreasing B-field

Increasing B-field

Ordinary Hall Effect

(metals and semi-conductors)

x( )L d

q E v BF

Extraordinary Hall Effect

(concentrations of magnetic materials)

0 0e

EH

R B R MR

t

0H

H

R BVR

I t

0

Current

Ordinary Hall Coefficient

I

R

0

Extraordinary Hall Resistance

Extraordinary Hall Coefficient

Permeability of free space

Magnetization

EH

e

R

R

M

Extraordinary Hall Effect Experimental Setup

Sample Specifications

• Film thicknesses of 2300-2500 Å

• Current results for the 20% Ni in Cu setup • Other sample compositions: 1%, 5%, and 10%, Ni in Cu • Atomic fractions prepared using arc melting / thermal evaporation

drift velocitydv

B

electric field vectorE

HV

Lorentz Force

t

h

I I

B

B

y

x

z

eF

ev

LF

dv

+ + + + + + + + + + + +

- - - - - - - - - - - - -

HV- +

Magnet

Pole

Magnet Pole Magnetic

Field Vector

Hall

Voltage

Hall Resistance

Magneto - Optic Kerr Effect (MOKE) Apparatus

HV

HV

Future Magneto-Optical Analyses

• Kerr Cell Analyses

• Birefringence Analyses

• Structural Analysis – Magnetostriction (stress / strain)

• Optical Communications

• Spectral Analyses

Laser

Polarizer

Polarizer

(Analyzer)

Electomagnet

Poles

Photoelastic

Modulator (PEM)

Light

Detector Thin

Film

Light

Chopper

Lock-in

Amplifier Oscilloscope

Computer

[1] [Tb0.4Fe0.4/Fe0.5Co0.5]3

multilayer film [2] Gd-Co film at several

optical wavelengths

References

[1] Cerne, J., Magneto-Polarimetry Advanced Lab, Univ. Buffalo.

[2] Sata, K., Jap. J. of Applied Physics, Vol. 20, No. 12, Dec. 1981

• CuNi alloy thin films • Concentrations of Ni in Cu (1%, 5%, 10%, 20%, 50%)

Alternative Magneto-Optical Applications