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2008 Chapter-14L03: "Embedded Systems - Architecture, Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc. 1 Testing, Simulation and Debugging Testing, Simulation and Debugging Techniques and Tools : Techniques and Tools : Lesson-3 Laboratory Tools
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Inc. Chapter-14L03: Embedded Systems - … Chapter-14L03: "Embedded Systems - Architecture, Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc. 3 Hardware Diagnostic Laboratory

May 30, 2018

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Page 1: Inc. Chapter-14L03: Embedded Systems - … Chapter-14L03: "Embedded Systems - Architecture, Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc. 3 Hardware Diagnostic Laboratory

2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

1

Testing, Simulation and Debugging Testing, Simulation and Debugging Techniques and Tools :Techniques and Tools :

Lesson-3

Laboratory Tools

Page 2: Inc. Chapter-14L03: Embedded Systems - … Chapter-14L03: "Embedded Systems - Architecture, Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc. 3 Hardware Diagnostic Laboratory

2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

2

1. Hardware Diagnostic Laboratory Tools1. Hardware Diagnostic Laboratory Tools

Page 3: Inc. Chapter-14L03: Embedded Systems - … Chapter-14L03: "Embedded Systems - Architecture, Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc. 3 Hardware Diagnostic Laboratory

2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

3

Hardware Diagnostic Laboratory ToolsHardware Diagnostic Laboratory Tools

• Volt-Ohm meter─ useful for checking the power supply voltage at source and voltage levels at chips power input pins, and port pins initial at start and final voltage levels after the software run, checking broken connections, improper ground connections, and burnout resistances and diodes.

Page 4: Inc. Chapter-14L03: Embedded Systems - … Chapter-14L03: "Embedded Systems - Architecture, Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc. 3 Hardware Diagnostic Laboratory

2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

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Hardware Diagnostic Laboratory ToolsHardware Diagnostic Laboratory Tools

• LED test ─ useful for testing port outputs and when using port conditions 1 or 0 for debugging a particular set of conditions

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2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

5

Hardware Diagnostic Laboratory Tools…Hardware Diagnostic Laboratory Tools…

• Logic Probe• Oscilloscope• Logic Analyser• Bit Rate meter• ICE• System Monitor Codes

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2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

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2. 2. Use of Logic ProbeUse of Logic Probe

Page 7: Inc. Chapter-14L03: Embedded Systems - … Chapter-14L03: "Embedded Systems - Architecture, Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc. 3 Hardware Diagnostic Laboratory

2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

7

Use of Logic ProbeUse of Logic Probe

• Simplest hardware test device. • Handheld pen like device with LEDs –

Glows green for ‘1’ and red for ‘0’• Important tool when studying the long

port-delay effects (>1s).• Delay program tests the presence of

system clock ticks

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2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

8

3. 3. Use of OscilloscopeUse of Oscilloscope

Page 9: Inc. Chapter-14L03: Embedded Systems - … Chapter-14L03: "Embedded Systems - Architecture, Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc. 3 Hardware Diagnostic Laboratory

2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

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Uses of OscilloscopeUses of Oscilloscope• Screen to display two signal voltages

as a function of time• Displays analog as well as digital

signals as a function of time • Noise detection tool• Mal-function detection of a sudden

transitions between '0' and '1' states during a period.

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2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

10

4. 4. Use of Logic AnalyzerUse of Logic Analyzer

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2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

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Uses of Logic AnalyserUses of Logic Analyser• A powerful hardware tool for

checking multiple lines carrying address, data and control bits, IO buses, ports, peripherals and clock.

• Recognizes only discrete voltage conditions, '1' and '0'.

Page 12: Inc. Chapter-14L03: Embedded Systems - … Chapter-14L03: "Embedded Systems - Architecture, Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc. 3 Hardware Diagnostic Laboratory

2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

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Logic Analyser …Logic Analyser …• Collects, stores and tracks multiple

signals and bus transactions simultaneously and successively.

• Reads multiple input lines (24 or 48) and later displays, using this tool, each transaction on each of these on computer monitor (screen) observed

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2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

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Logic Analyser …Logic Analyser …• Also shows states on the horizontal

axis instead of time in its state mode of display.

• Displays the logic states of a particular line as a function of ‘0’ and ‘1’ on another line.

• Catches intermittent bugs

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2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

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Logic Analyser …Logic Analyser …

• Does not help on a program halt due to a bug.

• Does not show processor register and memory contents, if the processor uses caches then a bus examination alone may not help.

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2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

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Logic Logic AnalyserAnalyser ……

• Cannot modify the memory contents and input parameters and study their effects [simulator needed as that helps in studying these effects]

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2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

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Logic Analyzer two modes of functioningLogic Analyzer two modes of functioning

� One mode─ to show time on x-axis, and logic states of the clock signal, bus signals and other signals on y –axis.

� Second mode ─ to give address, data bus and other signal states from a trigger point to examine illegal op-codes, access in protected address space and other states as a function of a reference state.

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2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

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5. 5. Use of Bit rate meterUse of Bit rate meter

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2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

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Use of Bit rate meterUse of Bit rate meter• A measuring device that finds

numbers of ‘1’s and ‘0’ in the pre-selected time spans.

• Measures throughput.• can estimate bits ‘1’s and ‘0’s in a

test message and then use bit rate meter to find whether that matches with the message.

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2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

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SummarySummary

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2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

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We learntWe learnt� Volt Ohm meter� LED� Logic probe� Oscilloscope used to test the fast changing

signals, their wave forms, overshoots and undershoots at transitions.

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2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

21

We learntWe learnt� Logic analyser used to measure logic

states on many connections simultaneously.

� Bit rate meter to test by measuring number of bit changes in given time span and expected ones

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2008Chapter-14L03: "Embedded Systems - Architecture,

Programming and Design" , Raj Kamal, Publs.: McGraw-Hill, Inc.

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End of Lesson-3 of chapter 14 onLaboratory Tools