GLAST LAT Project March 24, 2003 5C Tracker Peer Review, WBS 4.1.4 1 GLAST Large Area GLAST Large Area Telescope: Telescope: Tracker Subsystem WBS 4.1.4 5C: Silicon Detector Procurement Hartmut F.-W. Sadrozinski Santa Cruz Institute for Particle Physics University of California at Santa Cruz Tracker Subsystem Scientist Gamma-ray Large Gamma-ray Large Area Space Area Space Telescope Telescope
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GLAST Large Area Telescope: Tracker Subsystem WBS 4.1.4 5C: Silicon Detector Procurement
Gamma-ray Large Area Space Telescope. GLAST Large Area Telescope: Tracker Subsystem WBS 4.1.4 5C: Silicon Detector Procurement Hartmut F.-W. Sadrozinski Santa Cruz Institute for Particle Physics University of California at Santa Cruz Tracker Subsystem Scientist [email protected]. - PowerPoint PPT Presentation
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GLAST LAT Project March 24, 2003
5C Tracker Peer Review, WBS 4.1.4 1
GLAST Large Area Telescope:GLAST Large Area Telescope:
Tracker SubsystemWBS 4.1.4
5C: Silicon Detector Procurement
Hartmut F.-W. SadrozinskiSanta Cruz Institute for Particle PhysicsUniversity of California at Santa CruzTracker Subsystem Scientist
Gamma-ray Large Gamma-ray Large Area Space Area Space TelescopeTelescope
GLAST LAT Project March 24, 2003
5C Tracker Peer Review, WBS 4.1.4 2
LAT TKR Silicon Detector Procurement LAT TKR Silicon Detector Procurement
• Applicable LAT documents:– Specifications– LAT-DS-00011 LAT SSD Technical Specifications– LAT-DS-00026 LAT Flight SSD Drawings– LAT-DS-00027 LAT Test Structure Drawings– LAT-CR-00082 LAT SSD Quality and Reliability Assurance– LAT-TD-00085Testing Procedures for the GLAST LAT SSDs– Test Results– LAT-TD-00086LAT Review of SSD RHA Test Results – LAT-TD-00128Results from Heavy Ion Irradiation (SSD)– LAT-QR-01078 Q/A OF THE GLAST LAT SSD: RHA
• GLAST has driven the 6” wafer technology- Area: 8.95 cm x 8.95 cm- Thickness: 400 um, pitch 228 um- Very aggressive specs
(leakage currents, bad strips, dicing)
- Complete testing by HPK
• Q/A- Every wafer has flight SSD and test
structures (coupons, “cut-offs”)- Cut-off has full length, 8 channel SSD
(“Skinny”) and assorted other detectors
- Flight SSD and “Skinny” are marked with same ID#
- Cut-offs are used for RHA, long-term testing, glueing, wire bonding, etc.
GLAST Flight SSD
GLAST LAT Project March 24, 2003
5C Tracker Peer Review, WBS 4.1.4 4
TKR SSD RHA at Hiroshima UniversityTKR SSD RHA at Hiroshima University
• RHA and Production Q/A for one SSD from each shipping lot- The LAT SSD Q/A provisions LAT-CR-00082 define the
irradiations to be performed as part of the procurement process. One irradiation with 60Co per shipping lot has to be performed on coupons made on the same wafers as the flight SSDs, and several critical electrical parameters measured pre- and post-rad.
- It turns out that the radiation monitoring has been carried out on 77 production runs and no problem has been found.
• Procedures- The monitor sensors were irradiated up to a TID of 10
krad(Si), with a dose rate of 3.8 rad(Si)/s. - Of the 77 test sensors, 21 were biased during irradiation at
150 V. After the irradiation, these monitor sensors were kept under 150 V bias at 20 oC until they were electrically characterized for one week after irradiation. The rest of 56 sensors were not biased during irradiation and the one week annealing period.