CONFIRMED SPEAKERS • W. B. Doriese, NIST Boulder, USA • P. Glatzel, ESRF Grenoble, France • S. Huotari, University of Helsinki, Finland • Y. Kayser, PTB Berlin, Germany • F. Luccarelli, INFN Florence, Italy • M. Manso, University of Lisbon, Portugal • F. Salvat, University of Barcelona, Spain • G. Seidler, University of Washington, USA • J. Szlachetko, Jan Kochanowski University of Kielce, Poland • P. Van Espen, University of Antwerp, Belgium • G. Vanko, Wigner Research Centre for Physics, Budapest, Hungary • K. Vogel-Mikuš, University of Ljubljana, Slovenia • H. Yoneda, Institute for Laser Science & RIKEN Spring-8, Japan PUBLIC LECTURE SPEAKER: • Prof. Dr. Alexander Föhlisch, Helmholtz-Zentrum Berlin TOPICS • Interactions of X-rays with matter and fundamental parameters • XRS Instrumentation (X-ray sources, optics and detectors) • Quantification methodology and metrology • TXRF, GIXRF and related techniques • Microbeam techniques, confocal XRF and X-Ray imaging • Mobile and portable XRF • Synchrotron XRS, XAFS, high resolution XES, and RIXS • PIXE instrumentation and applications • Electron induced XRS • WDXRS • X-ray diffraction (XRD) • XRS in Art and Cultural Heritage • XRS in Advanced Materials and Nanoscience • XRS in Earth and Environment sciences • XRS in Industrial Quality and Process Control • XRS in Life Sciences and Forensics • Recent Scientific Developments by XRS Instrumentation Manufacturers CONTACT: [email protected] https://exrs2018.ijs.si DEADLINES: • Abstract submission: • Early registration: • Manuscript submission: March 31 2018 April 30 2018 September 1 2018 ORGANIZED BY: IN COLLABORATION WITH: SUPPORTED BY: European Conference on X-Ray Spectrometry Ljubljana, Slovenia, 24 - 29 June 2018 EXRS 2018, Ljubljana, Slovenia Jožef Stefan Institute 24 – 29 June 2018 [email protected]
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CONFIRMED SPEAKERS• W. B. Doriese, NIST Boulder, USA• P. Glatzel, ESRF Grenoble, France• S. Huotari, University of Helsinki, Finland• Y. Kayser, PTB Berlin, Germany• F. Luccarelli, INFN Florence, Italy• M. Manso, University of Lisbon, Portugal• F. Salvat, University of Barcelona, Spain• G. Seidler, University of Washington, USA• J. Szlachetko, Jan Kochanowski University of Kielce,
Poland• P. Van Espen, University of Antwerp, Belgium• G. Vanko, Wigner Research Centre for Physics,
Budapest, Hungary• K. VogelMikuš, University of Ljubljana, Slovenia• H. Yoneda, Institute for Laser Science & RIKEN
Spring8, Japan
PUBLIC LECTURE SPEAKER:• Prof. Dr. Alexander Föhlisch, HelmholtzZentrum
Berlin
TOPICS
• Interactions of Xrays with matter and fundamental parameters
• XRS Instrumentation (Xray sources, optics and detectors)
• Quantification methodology and metrology• TXRF, GIXRF and related techniques• Microbeam techniques, confocal XRF and XRay
imaging• Mobile and portable XRF• Synchrotron XRS, XAFS, high resolution XES,
and RIXS• PIXE instrumentation and applications• Electron induced XRS• WDXRS• Xray diffraction (XRD)• XRS in Art and Cultural Heritage• XRS in Advanced Materials and Nanoscience• XRS in Earth and Environment sciences• XRS in Industrial Quality and Process Control• XRS in Life Sciences and Forensics• Recent Scientific Developments by XRS
Instrumentation Manufacturers
CONTACT:[email protected]://exrs2018.ijs.si
DEADLINES:• Abstract submission:• Early registration:• Manuscript submission:
March 31 2018April 30 2018September 1 2018
ORGANIZED BY: IN COLLABORATION WITH: SUPPORTED BY:
European Conference on XRay Spectrometry Ljubljana, Slovenia, 24 29 June 2018
EXRS 2018, Ljubljana, Slovenia Jožef Stefan Institute 24 – 29 June 2018 [email protected]
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