554 Deformation-induced grain growth and twinning in nanocrystalline palladium thin films Aaron Kobler *1,2 , Jochen Lohmiller 3 , Jonathan Schäfer 4 , Michael Kerber 2 , Anna Castrup 1,2 , Ankush Kashiwar 5,6 , Patric A. Gruber 3 , Karsten Albe 4 , Horst Hahn 1,2 and Christian Kübel *2,7,§ Full Research Paper Open Access Address: 1 Technische Universität Darmstadt (TUD), KIT-TUD Joint Research Laboratory Nanomaterials, 64287 Darmstadt, Germany, 2 Karlsruhe Institute of Technology (KIT), Institute of Nanotechnology (INT), 76021 Karlsruhe, Germany, 3 Karlsruhe Institute of Technology (KIT), Institute for Applied Materials (IAM), P.O. Box 3640, 76021 Karlsruhe, Germany, 4 Technische Universität Darmstadt (TUD), Petersenstr. 32, 64287 Darmstadt, Germany, 5 Department of Metallurgical and Materials Engineering, Visvesvaraya National Institute of Technology (VNIT), Nagpur 440 010, Maharashtra, India, 6 Department of Materials Engineering, Indian Institute of Science (IISc), Bangalore 560 012, Karnataka, India and 7 Karlsruhe Institute of Technology (KIT), Karlsruhe Nano Micro Facility (KNMF), 76021 Karlsruhe, Germany Email: Aaron Kobler * - [email protected]; Christian Kübel * - [email protected] * Corresponding author § Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany; Tel.: +49 721 608 28970; Fax: +49 721 608 26368 Keywords: ACOM-TEM; deformation mechanism; nanostructured metals; tensile testing; XRD Beilstein J. Nanotechnol. 2013, 4, 554–566. doi:10.3762/bjnano.4.64 Received: 14 June 2013 Accepted: 26 August 2013 Published: 24 September 2013 This article is part of the Thematic Series "Advances in nanomaterials" and is dedicated to Prof. Horst Hahn on the occasion of his 60 th birthday. Guest Editors: H. D. Gleiter and T. Schimmel © 2013 Kobler et al; licensee Beilstein-Institut. License and terms: see end of document. Abstract The microstructure and mechanical properties of nanocrystalline Pd films prepared by magnetron sputtering have been investigated as a function of strain. The films were deposited onto polyimide substrates and tested in tensile mode. In order to follow the defor- mation processes in the material, several samples were strained to defined straining states, up to a maximum engineering strain of 10%, and prepared for post-mortem analysis. The nanocrystalline structure was investigated by quantitative automated crystal orientation mapping (ACOM) in a transmission electron microscope (TEM), identifying grain growth and twinning/detwinning resulting from dislocation activity as two of the mechanisms contributing to the macroscopic deformation. Depending on the initial twin density, the samples behaved differently. For low initial twin densities, an increasing twin density was found during straining. On the other hand, starting from a higher twin density, the twins were depleted with increasing strain. The findings from ACOM- TEM were confirmed by results from molecular dynamics (MD) simulations and from conventional and in-situ synchrotron X-ray diffraction (CXRD, SXRD) experiments. 554
Deformation-induced grain growth and twinning in nanocrystalline palladium thin films
Jun 27, 2023
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