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ffiMffi #ffiffiffi Japan lnstitute of Flant fu'!aintenanee 0n+ fapltai *ity Fiaza, $uite 1 t7fl 335* F,eachtree ll$*C, Atlanta S,4\ 3$325 T*L : 4tl4-365-61{}0 FAX : 4C4,:}S5-S1fli Septernber 9, 1999 Mr. Clifford Se5rmour Manufacturing/TPM Engineer Fairchild S emiconductor 333 Western Ave. South Portland, Maine 04106 Dear Mr. Seymour: On behalf of the Japan Institute of Plant Maintenance, I would like to extend my sincere thanks to you, John Bye, and Alice Jenkins for your superb presentation that was delivered at our TPM Kaizen Conference held on August 26-27, 1999, in Stone Mountain, Georgia. We were very pleased to have received your gracious letter commending the conference. We appreciate very much the time and effort exuded for such a fine presentation as yours. Your presentation was well received by all in attendance. Sharing your kaizen ideas and experience in focused improvement directly contributed to the value and overall success of this conference. Once again, thank you for your cooperation. Please let us know if there is anything we can do to help support your TPM implementation. We hope your plant strives to continue its kaizen efforts for world-class manufacturing status. (<?,d__ Karyn HydF' Conference Coordinator/Asst. Mgr. Training Best regards, chiio Watanabe eneral Manager
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Page 1: Awards

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Japan lnstitute of Flant fu'!aintenanee

0n+ fapltai *ity Fiaza, $uite 1 t7fl335* F,eachtree ll$*C, Atlanta S,4\ 3$325T*L : 4tl4-365-61{}0 FAX : 4C4,:}S5-S1fli

Septernber 9, 1999

Mr. Clifford Se5rmour

Manufacturing/TPM EngineerFairchild S emiconductor333 Western Ave.South Portland, Maine 04106

Dear Mr. Seymour:

On behalf of the Japan Institute of Plant Maintenance, I would like to extend my sincerethanks to you, John Bye, and Alice Jenkins for your superb presentation that was deliveredat our TPM Kaizen Conference held on August 26-27, 1999, in Stone Mountain, Georgia.

We were very pleased to have received your gracious letter commending the conference.We appreciate very much the time and effort exuded for such a fine presentation as yours.Your presentation was well received by all in attendance. Sharing your kaizen ideas andexperience in focused improvement directly contributed to the value and overall success ofthis conference.

Once again, thank you for your cooperation. Please let us know if there is anything wecan do to help support your TPM implementation. We hope your plant strives to continueits kaizen efforts for world-class manufacturing status.

(<?,d__Karyn HydF'Conference Coordinator/Asst. Mgr. Training

Best regards,

chiio Watanabeeneral Manager

Page 2: Awards

QS 9000 is off and running with all ofthe 20 elements assigned to individualsacross the lnterface & Logic Group.

Current activities are focusedon reviewing ISO 9000, QS 9000 stan-dards, and creating a gap analysis withcorrective actions. Once this is complet-ed, both the QS Core Team and internalauditors will review compliance to theQS 9000 standard.

Since South Portland is theheadquarters for the lnterface & LogicGroup, many documents originate here.Because of this, the CoreTeam has

spent a significant amount of time align-ing with the lnterface & Logic Group'sassembly site in Penang.

The upcoming QS 9OOOschedule is:Decem berFill in the gaps & get preparedJanuaryPenang pre-audit with externalassessorFe b r ua?yPortland pre-audit with externalassessorMarchPenang final auditMaySouth Portland final auditJunelnterface & Logic Group is QS 9000certified

Things to rememberFairchild's quality policy is found inQuality Manual (FSC-QM000l) whichcontains Fairchild's Mission Statementand Strategic lmperatives. SouthPortland-specific clarifications are avail-able in the manual's Maine Addendum.This Addendum also provides site-spe-cific references to standards compli-ance and may hold the answers to anyof your questions.

What you can do to helpSupport the QS 9000 team:Get familiarwith FSC's Quality Manual and MaineAddendum.

The QS 9000 process helps thelnterface & Logic Group make betterproducts on time, using documentedprocesses at all stages, from concept anddesign to manufacturing and delivery.

Glassl continuedaverage of 100 reclaimed wafers per period (at

$ l5 each)-a 90 percent reduction in costs!

The team then focused on training

operators on all shifts to use the new procedure.

A new standard operating procedure (SOP) and

Spec was written and on-line trainers wereinstructed in use of the new method. An opera-

tor on each shift was designated to read the par-

ticle wafers for acceptability after completion ofthe cleaning process.This helped maintain the

team's momentum.

According to Carolyn Chapman, Particle

WaferTeam leader, organization was l<ey to the

team's success. "We had to ensure that the effortwas organized and its implementation easy," she

notes. "For example, by simply placing a rack in a

centralized area where the particle wafer boxes

could be stored,we were able to streamline thejob of keeping the particle wafers in order whilemaking the job easier for operatorsl'

Other organization tasl<s include clearly

labeling wafer boxes, staging wafers properly, and

writingTestWafer SOPs for each process.

Many people contributed to the team's

success, some on their own initiative and time,

attending regular meetings designed to improve

their work area. A number of individuals in Thin

Films and Etch have also played an integral role in

recleaning test wafers.

The Particle Wafer Team's effort, withsubstantial support site-wide, has proven once

again that teamworl< is the key to success as

Fairchild maintains its focus on cost-effective man-

ufacturing to help maintain a competitive edge.

In late August, Alice Jenkins, John Bye and Cliff Seymour from Fairchild

traveled to a national JIPM conference in Atlanta, Georgia to present a

paper on Predictive Maintenance using data acquisition. Their presentation

focused on the Sputter workcell group and the development of an automated

system with operator reaction paths that pre-

dict and prevent product scrap on the Varian

3180. The trio received an award for their

outstanding contribution to the conference.

FAIFICHILtr'S= M ICONDLJ CTC]R*

Page 3: Awards

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