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Analog Integrated Circuits Lecture 6: Noise Analysis Analog Integrated Circuits Lecture 6: Noise Analysis ELC 601 – Fall 2013 Dr. Ahmed Nader Dr. Mohamed M. Aboudina [email protected] [email protected] Department of Electronics and Communications Engineering Faculty of Engineering – Cairo University
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Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

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Page 1: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

Analog Integrated Circuits

Lecture 6: Noise Analysis

Analog Integrated Circuits

Lecture 6: Noise Analysis

ELC 601 – Fall 2013

Dr. Ahmed Nader

Dr. Mohamed M. Aboudina

[email protected]

[email protected]

Department of Electronics and Communications Engineering

Faculty of Engineering – Cairo University

Page 2: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

• The phenomenon of noise and its effect on analog circuits.

• Noise characteristics in the frequency and time domains.

– Thermal noise

– Shot noise (in BJT)

– Flicker noise

• Methods of representing noise in circuits.

• Noise in single-stage and differential amplifiers.

Noise Overview

Page 3: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

� Noise is a random process, which means the

value of noise cannot be predicted at any

time.

� How can we incorporate noise in circuit

analysis? This is accomplished by observing

the noise for a long time and using the

measured results to construct a “statistical

model” for the noise. While the

instantaneous amplitude of noise cannot be

predicted, a statistical model provides

knowledge about some other important

properties of the noise that prove useful and

adequate in circuit analysis.

Statistical Characteristics of Noise

Page 4: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

High-power random signalLow-power random signal

Since the signal are not periodic, the measurement must be carried out over a

long time:

( )

∫+

−∞→=

2/

2/

21lim

T

TL

Tav dt

R

tx

TP

where x(t) is a voltage quantity.

Average Power of Random Signals

Page 5: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

To simplify calculations, we write the definition of Pav as

( )∫+

−∞→=

2/

2/

21lim

T

TTav dttx

TP

where Pav is expressed in V2 rather than W.

In analogy with deterministic signals, we can also define a root-mean-square

(rms) voltage for noise as avP .

Average Noise Power

Page 6: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

• Calculation of noise spectrum

� Power spectral density (PSD):

The spectrum shows how much power the signal

carries at each frequency. More specifically, the

PSD, SX(f), of a noise waveform x(t) is defined as

the average power carried by x(t) in a one-hertz

bandwidth around f. SX(f) is expresses in V2/Hz.

� We can apply x(t) to a bandpass filter with center

frequency f1 and 1-Hz bandwidth, square the output,

and calculate the average over a long time to obtain

SX(f1). Repeating the procedure for different center

frequencies, we arrive at the overall shape of SX(f).

� It is also common to take the square root of SX(f),

expressing the result in HzV / .

� In summary, the spectrum shows the power

carried in a small bandwidth at each frequency,

revealing how fast the waveform is expected

to vary in the time domain.

Noise Spectrum

Page 7: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

• White spectrum (white noise)

• Noise shaping by a transfer function

• Example: Spectral shaping by telephone BW

( ) ( ) ( ) 2fHfSfS XY =

Noise Shaping

Page 8: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

• Two-sided and one-sided noise spectra

• Folded white spectrum

Since SX(f) is an even function of f for real x(t), the total power carried by

x(t) in the frequency range [f1 f2] is equal to

( ) ( ) ( )∫∫∫+

+

+

+

−=+= 2

1

2

1

1

221

2,

f

f X

f

f X

f

f Xff dffSdffSdffSP

Spectrum Power

Page 9: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

• Probability density function (PDF)� Probability density function (PDF): By observing the noise waveform for a long

time, we can construct a “distribution” of the amplitude, indicating how often each

value occurs. The distribution of x(t) is defined as

pdf(x)dx = probability of x < X < x +dx,

where X is the measured value of x(t) at some point in time.

� Gaussian PDF is defined as ( )

2

2

2exp

2

1)(

σπσmx

xpdf−−

= ,

where σ and m are the standard deviation and mean of the distribution,

respectively.

Amplitude Distribution

Page 10: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

Uncorrelated noise Correlated noise

We add two noise waveforms and take average of the resulting power:

( ) ( )[ ]

( ) ( ) ( ) ( )

( ) ( )∫

∫∫∫

+

−∞→

+

−∞→

+

−∞→

+

−∞→

+

−∞→

++=

++=

+=

2/T

2/T21

T2av1av

2/T

2/T21

T

2/T

2/T

2

2T

2/T

2/T

2

1T

2/T

2/T

2

21T

av

dttxtx2T

1limPP

dttxtx2T

1limdttx

T

1limdttx

T

1lim

dttxtxT

1limP

correlation

Correlated and Uncorrelated Sources

Page 11: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

• Thermal noise of a resistor

The thermal noise of a resistor R can be modeled by a series voltage source, with the

one-sided spectral density

2nV = Sv(f) = 4kTR, f ≥ 0,

where k = 1.38×10−23

J/K is the Boltzmann constant and Sv(f) is expressed in V2/Hz.

Resistor Thermal Noise (1/3)

Page 12: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

• Example: low-pass filter

We compute the transfer function from VR to Vout: ( )1

1

+=

RCss

V

V

R

out

From the theorem, we have ( ) ( ) ( )14

14

2222

2

+==

fCRkTRf

V

VfSfS

R

outRout π

.

The total noise power at the output:

C

kT

u

uu

C

kTdf

fCR

kTRP outn =

=

∞==

+= −∞

∫0

tan2

14

4 1

0 2222, ππ (V

2)

Resistor Thermal Noise (2/3)

Page 13: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

• Representation of resistor thermal noise by a current

source

• Example

R

kT

R

VI n

n

42

22 == (A

2/Hz)

� Since the two noise sources are uncorrelated, we add the powers:

+=+=

21

22

21

2,

114

RRkTIII nntotn

� The equivalent noise voltage is given by

( ) ( )21

2

212,

2, 4 RRkTRRIV totntotn ==

Resistor Thermal Noise (3/3)

Page 14: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

MOSFET Thermal Noise

• Thermal noise of a MOSFET

• Output noise voltage

For the MOS devices operating in saturation, the channel noise

can be modeled by a current source connected between the drain

and source terminals with a spectral density: mn gkTI γ42 = ,

where γ is equal to 2/3 for long-channel transistors and may be a

large value (2) for submicron MOSFETs.

2222 4 omonn rgkTrIV γ==

Page 15: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

• Dangling bonds at the oxide-silicon interface

� As charge carriers move at the interface, some are

randomly trapped and later released by such energy

states, introducing flicker noise in the drain current.

� The flicker noise is modeled as a voltage source in

series with the gate and roughly given by

fWLC

KV

ox

n

12 ⋅= , where K is a process-dependent

constant on the order of 10−25

V2F.

� The flicker noise is also called 1/f noise, and it does

not depend on the bias current or the temperature.

� It is believed that PMOS devices exhibit less 1/f

noise than NMOS transistors because the former

carry the holes in a “buried channel”, i.e., at some

distance from the oxide-silicon interface.

Flicker Noise (1/2)

Page 16: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

• Concept of flicker noise corner frequency

For 1/f noise, the drain noise current per unit bandwidth

is 222

/1,2

/1,

1m

ox

mfnfn gfWLC

KgVI ⋅⋅=⋅= .

For the thermal noise, the drain noise current per unit

bandwidth is

= mthn gkTI

3

242

, .

Thus, the 1/f noise corner, fC, of the output current is

determined by kT

gWLC

Kf m

ox

C8

3= , which depends on

device dimensions and bias current.

Flicker Noise (2/2)

��� �

����

����.�

����/����

� �����

����.�

����/��)

Page 17: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

MOS Noise

��� �

����

����.�

����/����

� �����

����.�

����/��)

Page 18: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

Lemma

Assignment 4a:Prove this Lemma

Page 19: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

• How to quantify the effect of noise?

• Example

The natural approach would be to set the

input to zero and calculate the total noise

at the output due to various sources of

noise in the circuit.

( )22

22,

2/1,

2,

2,

41

3

24 D

D

m

ox

m

DRnfnthnoutn

RR

kTg

fWLC

KgkT

RIIIVD

+⋅⋅+=

++=

Noise in Circuits (1/2)

Page 20: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

• Determination of input-referred noise voltage

� If the voltage gain is Av, then we have 2,

22, innvoutn VAV = , that is, the input-referred

noise voltage is given by the output noise voltage divided by the gain.

� The input-referred noise indicates how much the input signal is corrupted by the

circuit’s noise, i.e., how small an input the circuit can detect with acceptable SNR.

� The input-referred noise is a fictitious quantity in that it cannot be measured at the

input of the circuit.

Noise in Circuits (2/2)

Page 21: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

• CS stage

• Discussion

222,

41

3

24 D

D

m

ox

moutn RR

kTg

fWLC

KgkTV

+⋅⋅+=

fWLC

K

RggkT

A

VV

oxDmmv

outn

inn

11

3

24

22

2,2

, +

+==

Voltage Amplification Current Generation

� How can we reduce the input-referred noise

voltage? It implies that the transconductance

of M1 must be maximized.

� The transconductance must be maximized if

the transistor is to amplify a voltage signal

applied to its gate [Fig.(a)] whereas it must

be minimized if the transistor operates as a

current source [Fig.(b)].

Common-Source Stage (1/3)

Page 22: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

• Example: calculate the input-referred thermal noise voltage of the amplifier

Thermal noise: ( )221212,

3

2

3

24 oommoutn rrggkTV

+=

Voltage gain: |Av| = gm1(ro1||ro2)

The total noise voltage referred to the gate of M1 is

+=

+=

21

2

12

1

212,

3

2

3

24

1

3

2

3

24

m

m

mm

mminng

g

gkT

gggkTV

It reveals the dependence of 2,innV upon gm1 and gm2, confirming that gm2

must be minimized because M2 serves as a current source.

Common-Source Stage (2/3)

Page 23: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

• How to design a CS stage for low-noise

operation?

� For thermal noise, we must maximize gm by increasing the drain current or the device

width. A higher ID translates to greater power dissipation and limited output voltage

swings while a wider device leads to larger input and output capacitance. We can also

increase RD, but at the cost of limiting the voltage headroom and lowering the speed.

� For 1/f noise, the primary approach is to increase the area of the transistor. If WL is

increased while W/L remains constant, then the device gm and its thermal noise do not

change but the device capacitances increase.

� These observations point to the trade-offs between noise, power dissipation,

voltage headroom, and speed.

fWLC

K

RggkT

A

VV

oxDmmv

outn

inn

11

3

24

22

2,2

, +

+==

Common-Source Stage (3/3)

Page 24: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

� Since the input impedance of the source follower is quite

high, the input-referred noise current can usually be

neglected for moderate driving source impedance.

� Compute the input-referred thermal noise:

2

21

11

22

2,

112

= oo

mbm

nMoutn rrgg

IV (thermal noise)

and

1

21

1

21

1

11

1

m

oo

mb

oo

mbv

grr

g

rrg

A

+

=

then

+=+=

21

2

12

2,2

12,

1

3

242

m

m

mv

Moutn

ninng

g

gkT

A

VVV

Source Followers (1/2)

Page 25: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

� Compute the input-referred 1/f noise:

( )( )

( )( )22

2

2

1

1

2,

11outm

ox

outm

ox

outn RgfWLC

KRg

fWLC

KV +=

and outmvoo

mbm

out RgArrgg

R 121

11

,11

=

=

then ( ) ( )

+==

21

22

2

2,2

,

1

m

m

oxv

outn

inngWL

g

WLfC

K

A

VV

Source Followers (2/2)

Page 26: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

• Representation of input-referred noise by voltage and current sources

• Calculation of input-referred noise voltage (source impedance = 0)

• Calculation of input-referred noise current (source impedance = ∞)

Input-Referred Noise

Page 27: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

Common Gate Stage (1/2)

� Since the input impedance of the source follower is quite

low, the input-referred noise current cannot be neglected

especially for high driving source impedance.

Page 28: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

Common Gate Stage (2/2)

� Equate the output noise voltage when the

input is short circuit and divide by Av

� Equate the output noise voltage when the input

is open circuit and divide by output impednace

Page 29: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

M1, RD: Since the noise currents of M1 and RD flow

through RD, the noise contributed by these

two devices is quantified as in a CS stage:

+=

Dmm

RMinnRgg

kTVD 2

11

,2,

1

3

24

1

M2: In Fig.(b), if the channel length modulation in M1

is neglected, then In2 + ID2 = 0, and hence M2 does

not affect Vn,out.

In Fig.(c), the voltage gain from Vn2 to the output

is quite small if the impedance at node X is large.

At high frequencies, the total capacitance at node

X, CX, gives rise to a gain:

( )sCg

R

V

V

Xm

D

n

outn

/1/1 22

,

+−

increasing the output noise.

�Noise of M2 modeled by (b) a current

source and (c) a voltage source

Cascode Stage

At high frequencies, noise of cascode devices

start to show up.

Capacitor at sources of cascode devices

shorts this point to ground ���� Gain from

cascode to output increases at high

frequencies ���� Effect of noise increases.

Page 30: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

• Differential pair circuit

• ISS contribute common-mode

noise only

• Circuit including input-referred noise source

For low-frequency operation,

the magnitude of 2,innI is

typical negligible.

Differential Pairs (1/2)

Page 31: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

With the inputs shorted together, we have

21

11

,221 Dn

Dn

Moutn RI

RI

V +=

221

2, 1 DnMoutn RIV = (if RD1 = RD2 = RD)

Similarly, 222

2, 2 DnMoutn RIV = .

( ) 222

21,

2, 21 DnnMMoutn RIIV +=⇒

Taking into account the noise of RD1 and RD2, the total output noise:

( ) ( )

+=

++=

DDm

DDnnMMoutn

RRgkT

kTRRIIV

2

222

21,

2,

3

28

4221

And, |Av| = gmRD, we have

CSinn

Dmmv

outn

inn VRgg

kTA

VV 2

,22

2,2

, 21

3

28 ≈

+== stage

Differential Pairs (2/2)• Calculation of input-referred noise of a differential pair

Page 32: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

• Output noise spectrum of a circuit

The total output noise:

∫∞

=0

2,

2,, dfVV outntotoutn

and ∫∞

=⋅0

2,

20 dfVBV outnn

Noise bandwidth (Bn): Bn allows a fair comparison of circuits that exhibit the same

low-frequency noise, V02, but different high-frequency transfer

functions.

Noise Bandwidth

Page 33: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

• Calculate the input referred thermal noise voltage (neglect

both channel and body effects)

Assignment 4b:

Page 34: Analog Integrated Circuits Lecture 6: Noise Analysisscholar.cu.edu.eg/?q=anader/files/elc601_lecture6_noise_analysis.pdf · Analog Integrated Circuits Lecture 6: Noise Analysis ELC

Assignment 4b (cont):