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A G R E A T E R M E A S U R E O F C O N F I D E N C E 1 A G R E A T E R M E A S U R E O F C O N F I D E N C E 1 Advances.
Mar 28, 2015
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A G R E A T E R M E A S U R E O F C O N F I D E N C E
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Advances In Testing: New Techniques for Reducing the Cost of Test
4.28.2005
Presented by Jason Chonko, Sr. Applications Engineer
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Agenda
• Introduction
• Quick optimization steps
• Measurement tuning
• Test sequencing
• New technologies for drastic reduction in test time
• Component test example
• Summary
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New technology brings new challenges for test
CCD image sensor
LED flash
External OLED
Varistors, capacitors,inductors
GMR heads in HDD for MP3 player
Internal OLED
Display driver ICs
RFICs, PAs
Keypad backlight
Longer battery life
New communicationstandards
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Introduction
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Quick Optimization
• Disable unused instrument functions– Displays
– Beepers
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Quick Optimization
• Avoid autoranging– Use fixed source and measurement ranges
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Measurement Optimization
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Measurement Optimization (Cont’d)
• Optimize integration setting (NPLC)
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Measurement Optimization (Cont’d)
• Disable filtering, if not needed
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Measurement Optimization (Cont’d)
• Disable autozero (zero reference measurement)
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New Techniques
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Typical Test
• Controlling PC• “Rack and Stack” instruments connected to PC via
communications bus (GPIB)
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The Communications Bottleneck
PC then must control many aspects of test• Back-and-forth communication can be slow!• PC triggering and decision making is slow!
Tests are chatty: High frequency, small packet size• USB and Ethernet are equivalent to GPIB speeds
Test Time (10%)
Setup and Data Transfer (40%)
Probe Movement (50%)
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New Alternatives
• New classes of instruments have distributed processors.• Powerful features:
– Lessen communications time by holding more of the test sequence in the instrument.
– Powerful instrument level calculations and math capabilities enable extended control of digital I/O, and other resources can enhance total system throughput.
SLOW FAST
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Traditional LED Testing
• Forward voltage (Vf)• Reverse leakage (Ir)• Light intensity (L)
SourceMeasure Unit
Ammeter
PC
CommunicationCable
Detector
Wafer
TriggerCable
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PC
Detector
WaferCommunication
Cable
Alternative LED Tests
• Test sequence stored and controlled by processor in instruments.– Lessens communication frequency– Eases multi-instrument integration
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The Keithley 2600 Series System SourceMeter®
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Keithley Test Script Processor (TSP™): High-speed automation
• Processor in instrument runs embedded test scripts– Create custom source-measure functions that are
called from a single GPIB command– Create fully automated test scripts that run
independent of a control PC
• Increases throughput– Eliminates GPIB traffic between instrument and PC– Automated tests are typically 10 times faster than
PC controlled tests
• Easier to use than other instrument test sequencers– Intuitive language vs. cryptic commands– Test Script Builder development software creates,
modifies, and debugs test scripts quickly
startscript
-- Declare variablesOutputOn = 1OutputOff = 0Current = 0Voltage = 0
-- Send SMU control commandssmua.reset( )smua.measure.nplc = 1.0smua.source.rangev = 1.0smua.measure.rangei = 1.0
-- Run simple sweepsmua.source.output = OutputOnfor Voltage = 1,10 do smua.source.levelv = Voltage Current = smua.measure.i( ) Resistance = Voltage / Current print ("Resistance=“..Resistance)endsmua.source.output = OutputOff
endscript
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Increased Scalability: TSPLink™
Expandable backplane: Keithley TSPLinkTM
• Features:– Enables parallel or complicated test sequencing– Eases multiple instrument synchronization – Improves scalability over mainframe based test systems - No slot limits or
backplane support issues
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Summary
• Many settings and adjustments can be made to existing setups to increase throughput:– Disable displays and beepers
– Disable autoranging: Use appropriate fixed ranges
– Use filtering only if needed
– Select correct measurement aperture (NPLC) for your measurement
– Autozero may be disabled for short time periods with little effect on accuracy
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Summary
• More powerful processors at the instrument are enabling high throughput and easing complicated testing procedures.
• Expandable backplanes, such as TSPlinkTM, allow flexible and scalable test systems without the mainframe.
• Throughput can be further optimized by:– Keeping test sequence code simple.
– Understanding your instrument’s capabilities.
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Related Information from Keithley
Application Notes:
• Increasing Production Throughput of Multi-pin Devices using a Keithley 2600 Series System SourceMeter Instruments
• Converting a Series Model 2400 SourceMeter SCPI Application to a Series Model 2600 System SourceMeter Script Application
On-line seminars with additional testing techniques and solutions:
• Understanding Measurement Uncertainty
• Tips, Tricks, and Traps for Advanced SMU DC Measurements
• How to Make Sensitive DC Measurements
• How to Get the Most from Your Low Current Measurement InstrumentsVisit http://www.keithley.com for a collection of more than two dozen application notes
and tech briefs for making SMU measurements.
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Contact Keithley with Your Questions:
• 1-888-KEITHLEY, ext. 3960, within the USA
• 001-440-248-0400 Outside the USA• 010-82251886 in China• 089/84 93 07-40 in Germany/Europe• 0118-9 29 75 00 in Great Britain• 3-5733-7555 in Japan• 2-574-7778 in Korea• 3-5729077 in Taiwan
See www.keithley.com for additional worldwide officesVia e-mail to [email protected]
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A Greater Measureof Confidence
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