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CST Advanced Training 2004CST Advanced Training 2004@ @
DaedeokDaedeok Convention Town (2004.03.24)Convention Town
(2004.03.24)
CSTCST EM EM StudioStudioTMTM:: ExamplesExamples
Chang-Kyun PARK (Ph. D. St.)
Thin Films & Devices (TFD) Lab.Thin Films & Devices
(TFD) Lab.Dept. of Electrical Engineering,Dept. of Electrical
Engineering,
Hanyang University @ Hanyang University @ AnsanAnsan Campus,
KOREACampus, KOREA
E-mail: [email protected]
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OOUTLINEUTLINE
Introduction
Example
E-staticElectrometer
CST EM CST EM StudioStudioTMTM v.2.0v.2.0
M-staticRotary Encoder
J-staticCircuit Breaker
TrackingElectron gun
RJ 45 LAN connectorVariable capacitor
Floating PotentialField EmitterTapered-type gated FEA
LFEddy current sensor
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TFD Lab.TFD Lab.Hanyang UniversityHanyang UniversityProfessor:
JinProfessor: Jin--SeokSeok ParkPark
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TFD Lab. TFD Lab. TFD Lab.
Thin films and devices lab. for electronic displays and
communications
http://tfd.hanyang.ac.kr
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CST CST EM StudioEM Studio
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MAFIAMAFIA
CST MAFIA
MAFIA (Maxwells Equations by the Finite Integration
Algorithm)MAFIA is an interactive program package for the
computation of electromagnetic fields. It is based directly on the
fundamental equations of electromagnetic fields, Maxwells
equations.
MAFIA is a modular program, it is divided in preprocessor,
postprocessor and solvers for different special cases of Maxwells
equationsMAFIA includes an optimizer, it runs
interactively as well as in batch or semi interactive using
predefined command sequences. It has a powerful command language
for automation and optimizing purposes and an advanced interactive
graphical output with thousands of display options
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MAFIA ModuleMAFIA Module
MAFIA Module
CST MAFIA
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MAFIAMAFIA
The Following modules are available (I)
CST MAFIA
M : Preprocessor, includes solid modeler, CAD import, 3D
graphics P : Postprocessor, includes 3D graphics and calculation of
deduced quantities like far field and impedanceS : Static field
module, solves electrostatics, magnetostatics, heat flow problems,
stationary current flow problems and electro-quasistaticproblemsT3
: Time domain module, simulates time dependent wave propagation,
most general and versatile in application. Uses Cartesian
coordinates TS3 : Time domain module, simulates charged particle
movement in time dependent fields including the interaction of
particles and fields. Uses Cartesian coordinates only TS2 : Time
domain module, simulates charged particle movement in time
dependent fields including the interaction of particles and fields
in cylinder symmetrical structures
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MAFIAMAFIA
The Following modules are available (II)
CST MAFIA
E : Frequency domain eigenmode module, finds modes in resonators
and waveguidesW3 : Frequency domain module, covers the whole
frequency rangeH3 : Thermodynamic module, solving thermodynamic
problems in time domain in either Cartesian or polar coordinate
systemT2 : Time domain module, simulates time dependent wave
propagation within cylinder symmetrical structures. Not yet
available under GUIOO : Optimizer with many built in strategies.
Optimizing capabilities not yet completely available under GUIA3 :
Time domain acoustic solver. Not yet available under GUI
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The Simulation MethodThe Simulation MethodBackground of the
Simulation Method
CST EM Studio
CST EM STUDIO is a general-purpose electromagnetic simulator
based on the Finite Integration Technique (FIT), first purposed by
Weiland in 1976/1977.
Finite Integration + PBA(Statics to THz)
Maxwell Grid Equations
E-static
0=t
ita
0
t
M-static
J-static
Tracking
Frequency Domain (j>0)
Eigenvalue Problem (j=0)
Implicit
ExplicitTime
Domain
PICMAFIA
EMS MWS
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CSTCST EM StudioEM StudioExample: EExample: E--staticstatic
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SS--static 1: Electrometer static 1: Electrometer
Introduction
CST EM Studio
PEC
This Example deals with the simulation of a simple electrometer
device, which can be used for voltage measurements. The model used
for the electrometer consists of three parts: the electrometers
scale, the ground, and the pointer.Results of interest: the
capacitance and the torque for different angles of the pointer
The main dimensions of the electrometer device (unit: cm)
Pointer(PEC, 1,000V)
Scale(Dielectric, =10)
Ground(PEC, 0V)
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SS--static 1: Electrometer static 1: Electrometer
Summary
CST EM StudioMeshcells: 294,528
48min, 10secTotal solver time
AngleFrom 20 to 70 (11steps)
Parameter sweep
294,528Meshcells
ElectrostaticSolver
Mesh generation
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SS--static 1: Electrometer static 1: Electrometer
Potential
CST EM Studio
E-Field
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SS--static 1: Electrometer static 1: Electrometer
CST EM Studio
Torque vs angle
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SS--static 2: RJ 45 Connector static 2: RJ 45 Connector
Introduction
CST EM Studio
This example shows the calculation of the capacitance matrix of
a RJ45 connection. The model consists of the connector and the
corresponding socket, each containing eight wires for the signal
transmission. The wires of the socket are fixed to a substrate
plate, every other of them additionally connected to a metallic
ground plane. This provides some kind of shielding effect for the
transmission of the wire signals.
Results of interest: capacitance Matrix
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SS--static 2: RJ 45 Connector static 2: RJ 45 Connector Define
Potential
CST EM Studio
Potential 1(PCB PEC, 0V)
Potential 2(PCB PEC, 1V)
Potential 3(PCB PEC, 1V)
Potential 4(PCB PEC, 1V) Potential 5
(PCB PEC, 1V)
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SS--static 2: RJ 45 Connector static 2: RJ 45 Connector
Potential
CST EM Studio
E-Field
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SS--static 2: RJ 45 Connector static 2: RJ 45 Connector
Capacitance Matrix
CST EM Studio
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SS--static 3: Variable Capacitor static 3: Variable Capacitor
Introduction
CST EM Studio
The variable capacitor example demonstrates the parameter sweep
feature in combination with the capacitance calculation.
Plate(PCB PEC, 0V)
Plate(PCB PEC, 1V)
Epsilon(Dielectric, =100)
Parameter Sweep
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Capacitance Vs Alpha
CST EM Studio
SS--static 3: Variable Capacitor static 3: Variable
Capacitor
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SS--static 4: Floating Potential static 4: Floating Potential
Introduction
CST EM Studio
This examples demonstrates how to consider floating potentials
in an electrostatic calculation. It consists of four metallic
plates and two plates of high dielectric material (relative
permittivity 10000). On the two larger metallic plates a potential
is defined, the other two metallic plates carry a charge of 0C.
Plate(PCB PEC, -1V)
Plate(PCB PEC, 1V)
PECFloating Potential
High dielectric material (relative permittivity 10000) Applied
charge value: 0C
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Result: Electric Field Distributions
CST EM Studio
1V
-1V
0.469V
-0.469V
0.467V
-0.467V
SS--static 4: Floating Potential static 4: Floating
Potential
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Result: Electric Field Distributions
CST EM Studio
SS--static 4: Floating Potential static 4: Floating
Potential
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Only PEC Conditions
CST EM Studio
SS--static 4: Floating Potential static 4: Floating
Potential
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Result: Potential Distributions
CST EM Studio
1V
-1V
0.469V0V
0V-0.469V
SS--static 4: Floating Potential static 4: Floating
Potential
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Result: Electric Field Distributions
CST EM Studio
SS--static 4: Floating Potential static 4: Floating
Potential
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X-cut Plane
Cathode (0V)
Isolated Electrode Ballast layer, a-Si
Insulator, SiO2
Gate (30V)
CNT
Anode (50V)
10m
SS--static 5: Field emitter static 5: Field emitter
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Material Property Unit: m
CNT(PEC)
Diameter: 0.040Height: 1Tip radius: 0.020
Base: a-Si
Height: 2
Diameter: 0.040
SS--static 5: Field emitter static 5: Field emitter
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PotentialUnit: m
Cathode(0V)
Gate(30V)
Anode(50V)
SS--static 5: Field emitter static 5: Field emitter
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Floating Potential Unit: m
Isolated Electrode
CNT
SS--static 5: Field emitter static 5: Field emitter
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Results: Potential Distribution
Isolated Electrode: 26V
Tip Region: 27V
SS--static 5: Field emitter static 5: Field emitter
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Results: Electric Field Distribution
SS--static 5: Field emitter static 5: Field emitter
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Results: 1D Plot
SS--static 5: Field emitter static 5: Field emitter
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Geometry
Cathode (0V) Inter-dielectric Ballast layer, a-Si
Insulator, SiO2
Gate (50V) Parameter Sweep
CNT-Floating Potential (0C)
Monitoring Point
SS--static 6: Taperedstatic 6: Tapered--type Gatedtype
Gated--FEA FEA
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45o
68o
90o
Parameter Sweep (Pierce Electrode angle: 90o~12.5o)Result:
Potential Distributions
SS--static 6: Taperedstatic 6: Tapered--type Gatedtype
Gated--FEA FEA
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Parameter Sweep (Pierce Electrode angle: 90o~12.5o)
45o
68o
90o
Result: Electric Field Distributions
SS--static 6: Taperedstatic 6: Tapered--type Gatedtype
Gated--FEA FEA
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ICP Reactor
SS--static 7: ICPstatic 7: ICP--Reactor Reactor
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Simulation of ICP Reactor under DC Bias Conditions
System summary
OS: MS Windows XP V.5.1 SP1 Model: Intel Zeon (SE7505VB2) 2 CPU
Process: Genuine Intel ~2790Mhz Memory: 1,024.00MB Graphic Adapter:
Quadro4 980XGLSimulation summary
Tool: CST EM Studio TM v 1.3 (CST GmbH) Simulation field:
Electrostatic Solver Number of nodes: 1,074,480 Mesh generation
time: 130 s Solver time: 13 s
Modeling of ICP Reactor
SS--static 7: ICPstatic 7: ICP--Reactor Reactor
Simulation
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Conditions Simulation Results Under 300 V Conditions
Potential distribution
SS--static 7: ICPstatic 7: ICP--Reactor Reactor
Electric Field distribution
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Conditions Simulation Results Under -450 V Conditions
Potential distribution
SS--static 7: ICPstatic 7: ICP--Reactor Reactor
Electric Field distribution
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CSTCST EM StudioEM StudioExample: MExample: M--staticstatic
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MM--static 1: Rotary Encoderstatic 1: Rotary
EncoderIntroduction
CST EM Studio
In this tutorial a rotary encoder consisting of two iron yokes,
a permanent magnet and two hall sensors is analyzed.
Both yokes form a magnetic circuit, which is driven by a
cylindrical permanent magnet. Two hall sensors are placed in the
air gap between the yokes to measure the flux density in the gap.
By twisting the yokes the B-field changes linear with the rotation
angle.
Upper Yoke(Iron 1000)
Bottom Yoke(Iron 1000)
Magnet
Hall Sensor
0.2 T|z
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MM--static 1: Rotary Encoderstatic 1: Rotary Encoder
B-Field
CST EM Studio
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MM--static 1: Rotary Encoderstatic 1: Rotary Encoder
Parameter Sweep
CST EM Studio
Field Watch Position
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CSTCST EM StudioEM StudioExample: LF (Low Example: LF (Low
Frequency) SolverFrequency) Solver
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LF: Eddy Current SensorLF: Eddy Current SensorIntroduction
CST EM Studio
In this example and eddy current sensor is modeled to simulate
non-destructive material test. You will analyze an eddy current
sensor driven by a low frequency coil generating eddy currents in
an aluminum probe plate.
The structure depicted above consists of the sensor, represented
by an excitation current coil embedded in iron material. Below this
sensor the probe plate is given as a lossy aluminum material,
allowing the flow of eddy current. Inside this plate a material
defect is modeled as a gap, which should be detected by the
changing voltage at the coil.
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LF: Eddy Current SensorLF: Eddy Current Sensor
CST EM Studio
B-Field (0o) Eddy Current (90o)
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CSTCST EM StudioEM StudioExample: Stationary Example: Stationary
Currents SolverCurrents Solver
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SC: Circuit BreakerSC: Circuit BreakerIntroduction
CST EM Studio
In this example, you will analyze a circuit breaker consisting
of two contact springs connected by a bridge.
One matter of concern is the current flow from one contact over
the bridge to the other contact. Therefore two current port are
defined for the stationary current solver. After the solver run the
fields are visualized and then used as a source field for a
subsequent carried out magnetostatic calculation.
Cupper(J-port, -0.05V)
Cupper(J-port, 0.05V)
Contact pad(PEC)
Bridge(PEC)
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SC: Circuit BreakerSC: Circuit Breaker
CST EM Studio
Current Density
Loss Power (P): 6.856485e+001 [W]R = V2/P=0.1*0.1/P =
1.458473e-4I = P/V = V/R = 685.65 [A]
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SC: Circuit BreakerSC: Circuit Breaker
CST EM Studio
H-Field
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CSTCST EM StudioEM StudioExample: Tracking Example: Tracking
SolverSolver
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Tracking 1: Electron GunTracking 1: Electron GunIntroduction
CST EM Studio
This example demonstrated how a particle tracking can be
performed. Two types of field results were used here, an
electrostaic field is used to accelerate electrons being emitted
from a cathode and a magnetostatic field which is caused by a
helmholz coil in order to focus the electron beam.
Anode(PEC, 1000V)
Cathode(PEC, 0V)
Focus coil(0.4A)
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Tracking 1: Electron GunTracking 1: Electron Gun
Particle Source
CST EM Studio
Emission Site(electron)
Particle Tracking