RIFLE: a Research Instrument for FLash Evaluation AT Active Technologies.
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RIFLERIFLE: : aa RResearchesearch IInstrumentnstrument forfor FLFLashash
EEvaluationvaluation
AActive TTechnologies
Active Technologies - RIFLE presentation - October 2003
PresentationPresentation
This file contains a RIFLE instrument presentation
A RIFLE’s user demo is shown in the Rifle demo file
This demo has been designed for Office 2002, but it may run quite well under Office 2000
Active Technologies - RIFLE presentation - October 2003
IndexIndex
• Introduction ( 1 min. 15”)
• Hardware features ( 7 min. 10”)
• System performances ( 1 min. 55”)
• Software architectureSoftware architecture ( 2 min. 10”)
• Scientific references ( 1 min. 10”)
• Role of Active Technologies and N-plus-T ( 20”)
• End of presentation
Select the section to visit by clicking on the section nameSelect the section to visit by clicking on the section nameSelect the section to visit by clicking on the section nameSelect the section to visit by clicking on the section name
Active Technologies - RIFLE presentation - October 2003
Project historyProject history
• 1996 – Kick-off of the RIFLE project, at the Università di Ferrara, Italy
• 1998 – First prototype: beginning of research activity
• 2001 – First industrialized release
• 2002 – Second industrialized release
• 2003 – Creation of the Academic spin-off Active Technologies for RIFLE commercialization and support
Active Technologies - RIFLE presentation - October 2003
Aims of the projectAims of the project
• Development of a “flexible” instrument for research/characterization activities
• ATE-like hardware performances
• Standard software support (C, C++ languages and LabVIEW)
• Ultra-friendly use
Active Technologies - RIFLE presentation - October 2003
Flexible instrument: whyFlexible instrument: why
• New products development and characterization require high flexibility (data acquisition, signal
waveforms, voltages, …)
• “What if” philosophy
• Possibility of identify and track selected cells
• Possibility of evaluating the impact of any modification on long-term reliability
• Possibility of immediate availability of measure’s results
Active Technologies - RIFLE presentation - October 2003
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Index page
End of presentation
Active Technologies - RIFLE presentation - October 2003
Instrument architecture
Active Technologies - RIFLE presentation - October 2003
FeaturesFeatures
P.C.I. BUS
• Standard Bus
• DUTDUT (Device Under Test) is treated as an extension of the PC memoryextension of the PC memory: it is simply accessed like an array structure during read/write cycles
• PC’s storing and computational capabilities PC’s storing and computational capabilities are fully exploitedare fully exploited
• Storing and computational capabilities can Storing and computational capabilities can be upgraded by upgrading the PCbe upgraded by upgrading the PC
• Address spaceAddress space: 512Mbytes
• Bus widthBus width: 8, 16, 32 bits
• Bus speedBus speed: up to 33 MHz
Active Technologies - RIFLE presentation - October 2003
A Programmable state machine translates the PCI cycles into the DUT cycles to match its timing requirements
Timing Generator
Active Technologies - RIFLE presentation - October 2003
Waveform generators
Unused slots for waveform generators can be used to plug-in customized plug-in customized cards cards to add new hardware features new hardware features
RIFLE can be equipped with up to 16 arbitrary waveform generators16 arbitrary waveform generators.
The impact on device performance and long term reliability of any shape any shape and duration modification in the waveform and duration modification in the waveform applied during writing operations can be easily evaluated
Active Technologies - RIFLE presentation - October 2003
Waveform generators
DA
C
Top
Bottom
ControlBlock
The generator architecture is based on a high speed 32ksample (or 128ksample) SRAM, managed as a FIFOFIFO, where the waveform samples are stored during the measurement setup
Active Technologies - RIFLE presentation - October 2003
Waveform generators
DA
C
Top
Bottom
ControlBlock
When the waveform is generated, its samples are poppedpopped from the FIFO memory and convertedconverted into an analog signal by a high speed (125 Msps) D/A converter and a current feedback output buffer (140Mhz Bandwidth, 2500 V/s Slew-Rate)
Active Technologies - RIFLE presentation - October 2003
Waveform generators
DA
C
Top
Bottom
ControlBlock
• Output buffer performances:Output buffer performances:
• Output voltage range: up to ± 13 V (trimmerable)• Maximum output current: ± 50 mA• Bandwidth: 140 MHz• Slew rate: 2500 V/s
• Different requirements can be obtained by substituting the output buffer or by pluggingplugging a specific generator into the motherboard
Active Technologies - RIFLE presentation - October 2003
Waveform generators
DA
C
Top
Bottom
ControlBlock
Single pulseSingle pulse or periodicperiodic arbitrary waveforms can be generated
The sampling rate is programmable:
- The maximum time resolutionmaximum time resolution is 10 ns (@100Mhz) with a maximum pulse duration of 327.68 s
(with a 32K sample FIFO) - The minimum time resolutionminimum time resolution is 327.68 s with a
maximum pulse duration of 10.7 s (with the clock signal divided by 32768)
Active Technologies - RIFLE presentation - October 2003
Waveform generator synchronization
RIFLE has advanced synchronization capabilities to keep the timing RIFLE has advanced synchronization capabilities to keep the timing requirements of the DUT and to synchronize all its data acquisition requirements of the DUT and to synchronize all its data acquisition and generation circuits:and generation circuits:
All generators can be simultaneously triggeredAll generators can be simultaneously triggered
All generators can be triggered by external events All generators can be triggered by external events
Waveforms can be arbitrarily and mutually delayedWaveforms can be arbitrarily and mutually delayed
3 specific waveform generators have the alternative function of 3 specific waveform generators have the alternative function of synchronization generatorssynchronization generators to generate the trigger events for the to generate the trigger events for the analog acquisition circuits or for the other arbitrary waveform generatorsanalog acquisition circuits or for the other arbitrary waveform generators
Analog signal acquisitions can be synchronized with the applied voltage Analog signal acquisitions can be synchronized with the applied voltage waveformswaveforms
Active Technologies - RIFLE presentation - October 2003
General purpose I/O
16 digital outputs and 8 digital inputs are provided 16 digital outputs and 8 digital inputs are provided to drive the DUT internal logic circuitsto drive the DUT internal logic circuits
Active Technologies - RIFLE presentation - October 2003
Level Translators
• All All the the digital signal levels are translateddigital signal levels are translated into the programmable DUT power supply voltage level to support devices with different power requirements
• The DUT power supply can be programmed from 5V down to 1.2 V5V down to 1.2 V
• The DUT power supply is provided by a 3Amp3Ampss programmable voltage generatorprogrammable voltage generator
Active Technologies - RIFLE presentation - October 2003
Current Generator
A programmable Current GeneratorCurrent Generator provides the reference currentreference current required for read and verify operations
Active Technologies - RIFLE presentation - October 2003
Direct Memory Access
A circuit called DMADMA is provided to measure the current current characteristicscharacteristics of any cell.
Both 2D or 3D2D or 3D characteristic can be evaluated.
Active Technologies - RIFLE presentation - October 2003
Direct Memory Access
I/V ConvertersA/D
A/D
Data BusVoltage
Generator
Sw
itch
Matr
ix
I
By means of a switch matrix two data bus linestwo data bus lines are selected and a voltage is appliedvoltage is applied by means of a voltage generator
Active Technologies - RIFLE presentation - October 2003
Direct Memory Access
I/V ConvertersA/D
A/D
Data BusVoltage
Generator
Sw
itch
Matr
ix
I
The currents supplied on these lines are converted into voltages and then digitized in parallelparallel by two 12 bit ADCs with a 2.5s conversion time
Active Technologies - RIFLE presentation - October 2003
Direct Memory Access
The trigger command can be generated by means of a synchronism generator so that the acquisition can start at any any desired and synchronized timedesired and synchronized time
I/V ConvertersA/D
A/D
Data BusVoltage
Generator
Sw
itch
Matr
ix
I
Active Technologies - RIFLE presentation - October 2003
Power Zero
RIFLERIFLE has a circuit called Power ZeroPower Zero that performs synchronized high speed current waveform measurementssynchronized high speed current waveform measurements on anyany DUT signal
Active Technologies - RIFLE presentation - October 2003
Power Zero
Video Diff. Amp.ADC FIFO
control signals
Switch Matrix
By means of a switch matrixswitch matrix anyany DUT signal (power supply included) can be selected and connected to the PW0 unit
Active Technologies - RIFLE presentation - October 2003
Video Diff. Amp.ADC FIFO
control signals
Switch Matrix
Power Zero
Pulse Generator
A pulse generatorpulse generator applies a waveform on the selected device pin
Active Technologies - RIFLE presentation - October 2003
Video Diff. Amp.ADC FIFO
control signals
Switch Matrix
Power Zero
A high speedhigh speed differential differential AmplifierAmplifier reads the voltage drop across a sensing resistance due to the current flowing
Pulse Generator
Active Technologies - RIFLE presentation - October 2003
Video Diff. Amp.ADC FIFO
Pulse Generator
control signals
Switch Matrix
Power Zero
Third state
AnyAny pin of the DUT can also be connected to an alternative voltage generatoralternative voltage generator
Active Technologies - RIFLE presentation - October 2003
Video Diff. Amp.ADC FIFO
Pulse Generator
control signals
Switch Matrix
Power Zero
The current waveformcurrent waveform is then sampled at up to 40Msps40Msps by a 10 bit10 bit A/D converter
Active Technologies - RIFLE presentation - October 2003
Video Diff. Amp.ADC FIFO
Pulse Generator
control signals
Switch Matrix
Power Zero
The samples are stored in a FIFOstored in a FIFO memory (4Ksample deep)
Active Technologies - RIFLE presentation - October 2003
Power Zero
Video Diff. Amp.ADC FIFO
Pulse Generator
control signals
Switch Matrix
The current waveform conversion and storing can be triggered by means of a synchronism generator so that the waveform acquisition can start at any waveform acquisition can start at any desired time, synchronously with the applied pulsedesired time, synchronously with the applied pulse
Active Technologies - RIFLE presentation - October 2003
Calibration
The hardware calibration is made during the first factory system testing and doesn’t need any user intervention.
A further software fine calibration can be periodically executed by the user.
By means of a dedicated calibration board and a multimeter, the user can adjust both the offset and gain errors of all analog circuits following the step by step procedure of the calibration software provided with the calibration board.
Active Technologies - RIFLE presentation - October 2003
End of SectionEnd of Section
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Index page
End of presentation
Active Technologies - RIFLE presentation - October 2003
Performances
Current unit resolutions and full-scales
DMADMA current measurement unit:
2 full-scales: 2 full-scales: ±500 ±500 A, 12 bit resolutionA, 12 bit resolution
±± 50 50 A, 12 bitA, 12 bit resolutionresolution
Active Technologies - RIFLE presentation - October 2003
Performances
PW0PW0 current measurement unit:
3 full-scales:
500 500 A, 10 bit resolutionA, 10 bit resolution
5 mA, 10 bit resolution5 mA, 10 bit resolution
50 mA, 10 bit resolution50 mA, 10 bit resolution
Current unit resolutions and full-scales
Active Technologies - RIFLE presentation - October 2003
Performances
Current generatorCurrent generator:
2 full-scales:
600 600 A, 12 bit resolutionA, 12 bit resolution
60 60 A, 12 bit resolutionA, 12 bit resolution
Current unit resolutions and full-scales
Active Technologies - RIFLE presentation - October 2003
The time requirements for standard operations strongly depend on device speed and bandwidth
Time limitations are usually imposed by the device itself
The following time requirements refer to a 8.6 Mbit sector of a commercial device
Performances
Time requirements (examples)Time requirements (examples)
Active Technologies - RIFLE presentation - October 2003
Minimum read cycleMinimum read cycle (@32 bit bus width, 0 wait-states):
4 clock periods 200 ns200 ns (@20Mhz) (@20Mhz)
Performances
Time requirements (examples)Time requirements (examples)
Active Technologies - RIFLE presentation - October 2003
ProgrammingProgramming:
1 sector (8.6 Mcells), with verify, 1 single pulse applied to each cell, 8bit parallelism: 1.9 1.9 ss
Performances
Time requirements (examples)Time requirements (examples)
Active Technologies - RIFLE presentation - October 2003
ErasingErasing:
8.6 Mcells sector, with verify, 1 pulse applied: 1.201.20 s s
Performances
Time requirements (examples)Time requirements (examples)
Active Technologies - RIFLE presentation - October 2003
Performances
Threshold Voltage DistributionsThreshold Voltage Distributions
with 20 resolution levels: 1818 s s
Time requirements (examples)Time requirements (examples)
Active Technologies - RIFLE presentation - October 2003
Threshold Voltage MapsThreshold Voltage Maps
with 20 resolution levels: 1’ 29 1’ 29 ss
PerformancesTime requirements (examples)
Active Technologies - RIFLE presentation - October 2003
Criterion based subset identificationCriterion based subset identification:
identification of 1000 cells complying with a particular requirement (i.e., the lowest, the highest, etc.): 40.140.1 s s
PerformancesTime requirements (examples)
Active Technologies - RIFLE presentation - October 2003
VVthth tracking for subset of cells tracking for subset of cells:
threshold voltage measure of the identified 1000 cells : 5.45.4 s s
PerformancesTime requirements (examples)
Active Technologies - RIFLE presentation - October 2003
End of SectionEnd of Section
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Index page
End of presentation
Active Technologies - RIFLE presentation - October 2003
Software
RIFLEinstrument
Architecture
The instrument software is hierarchically organized to hide the implementation details and, by means of different programming languages, to create a powerful and easy to use environment
Active Technologies - RIFLE presentation - October 2003
Software
RIFLEinstrument
Instrument Driver
At the lowest level, just above the hardware, there is the instrument driver. It belongs to the PC Operating System and it must not be modified by the user. It’s written in “C” and assembler languages.
System Level Interface: Virtual Device Driver
Active Technologies - RIFLE presentation - October 2003
Software
RIFLEinstrument
System Level Interface: Virtual Device Driver
Application Program Interface: Dynamic Link Libraries
API
At a higher layer we find the API. It’s a library of functions that work as an interface between the driver routines and the higher level programming languages. Also this layer must not be modified by the user.
Active Technologies - RIFLE presentation - October 2003
Chip Dependent Interface
This is the first layer that can be modified by the user.
It consists of a library of functions specific for the DUT.
It’s written in “C” or “C++” to achieve high efficiency and must be implemented for any new device.
Software
RIFLEinstrument
System Level Interface: Virtual Device Driver
Application Program Interface: Dynamic Link Libraries
Chip Dependent Interface: Dynamic Link Libraries
Active Technologies - RIFLE presentation - October 2003
SoftwareHigh level Program Interface
The High Level Program Interface is written in the “G” language of the National Instrument LabVIEW program.
At this level, by means of several panels, the user can control any instrument operation, execute measurements and graphically analyze data.
RIFLEinstrument
System Level Interface: Virtual Device Driver
Application Program Interface: Dynamic Link Libraries
Chip Dependent Interface: Dynamic Link Libraries
High Level Program Interface:LabVIEW Virtual Instrument Libraries
Active Technologies - RIFLE presentation - October 2003
High level software structure
Any measurement can be set up and launched in a completely graphical environment developed under the National Instruments LabVIEW platform
Active Technologies - RIFLE presentation - October 2003
Executing standard measurements
By means of a navigator window it is possible to set up the parameters for any measurement (program, erase, IV measures, distributions and maps, stresses, ..), to browse among 2D and 3D maps and distributions of threshold voltages or current gains, 2D and 3D I-V characteristics
Active Technologies - RIFLE presentation - October 2003
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Active Technologies - RIFLE presentation - October 2003
Scientific referencesScientific references
RIFLE has been extensively used for research purposes at the Università di Ferrara
Several papers have been published on international journals or presented at international conferences thanks to RIFLE
A list of paper published on int. journals is here reported
Active Technologies - RIFLE presentation - October 2003
Scientific referencesScientific references
P. Pellati et al, “Automated Test Equipment for Research on Nonvolatile Memories” IEEE Trans. Instrum. Meas. vol. 50, p. 1162, Oct. 2001
A. Chimenton et al, "Threshold voltage spread in Flash memories under a constant DQ erasing scheme", Microelectronic Engineering, vol. 59, p. 109, Nov. 2001
A. Chimenton et al. "Analysis of Erratic Bits in Flash Memories", IEEE Trans. on Device and Materials Reliability, vol. 1, p. 179, Dec. 2001
G. Cellere et al., "Radiation Effects on Floating-Gate Memory Cells", IEEE Trans. on Nucl. Sc., vol.48, p. 2222, Dec 2001
A. Chimenton et at, "Constant Charge Erasing Scheme for Flash Memories", IEEE Trans. on Electron Devices, vol. 49, p. 613, Apr.2002
G. Cellere et al., "Anomalous charge loss from Floating-Gate Memory Cells due to heavy ions irradiation", IEEE Trans. on Nucl. Sc., vol. 49, p. 3051, Dec. 2002
Active Technologies - RIFLE presentation - October 2003
Scientific referencesScientific references
A. Chimenton et al., "Erratic bits in Flash Memories under Fowler-Nordheim programming", Jpn. J. Appl. Phys., vol. 42, p. 2041, April 2003
A. Chimenton et al., "Flash Memory Reliability: an Improvement Against Erratic Erase Phenomena Using the Constant Charge Erasing Scheme", Jpn. J. Appl. Phys., vol. 42 , p. 2025, Apr. 2003
A. Chimenton et al., "An Insight Into Flash Memory Reliability: Erratic, Fast and Tail bits", Proceedings of the IEEE, Vol. 91, p. 617 - 626, Apr. 2003
A. Chimenton et al., “Erratic Erase in Flash Memories (part I): Basic Experimental and Statistical Characterization” IEEE Trans. on Electron Devices, Vol. 50, p. 1009, Apr. 2003
A. Chimenton et al., “Erratic Erase in Flash Memories (part II): Dependence on Operating Conditions” IEEE Trans. on Electron Devices, Vol. 50, p. 1015, Apr. 2003
Active Technologies - RIFLE presentation - October 2003
End of SectionEnd of Section
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Index page
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Active Technologies - RIFLE presentation - October 2003
Role of Role of ATAT and and N-plus-TN-plus-T
RIFLE production Service and maintenance Test head design and production
RIFLE commercialization
Active Technologies - RIFLE presentation - October 2003
Role of Role of ATAT and and N-plus-TN-plus-T
Training Software upgrade Driver design
&&
Active Technologies - RIFLE presentation - October 2003
End of SectionEnd of Section
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Index page
End of presentation
Active Technologies - RIFLE presentation - October 2003
The staff of The staff of Active TechnologiesActive Technologies thanks you for your kind thanks you for your kind
attentionattention
www.activetechnologies.itwww.activetechnologies.it
info@activetechnologies.itinfo@activetechnologies.it
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