Tag: nearest good tsv

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years test conference

Documents L i a b l eh kC o m p u t i n gL a b o r a t o r y Yield Enhancement for 3D-Stacked Memory by...

Presentation Guide Yield Enhancement for 3D-Stacked Memory by Redundancy Sharing across Dies Li Jiang, Rong Ye and Qiang Xu Presenter: Qiang Xu CUhk REliable Computing Laboratory…

Documents Optimal Selection of ATE Frequencies for Test Time Reduction Using Aperiodic Clock Sindhu Gunasekar....

Presentation Guide Optimal Selection of ATE Frequencies for Test Time Reduction Using Aperiodic Clock Sindhu Gunasekar Vishwani D. Agrawal 1 The slide guide is available…

Documents Electronic Presentation Guide

Presentation Guide Electronic Presentation Guide 2013 North Atlantic Test Workshop (Origin: ITC) 08/17/2012 V16.2 1 The slide guide is available in the following file: slidesV16.2.ppt:…

Documents Yield Enhancement for 3D-Stacked Memory by Redundancy Sharing across Dies

Presentation Guide Yield Enhancement for 3D-Stacked Memory by Redundancy Sharing across Dies Li Jiang, Rong Ye and Qiang Xu Presenter: Qiang Xu CUhk REliable Computing Laboratory…

Documents On Effective TSV Repair for 3D-Stacked ICs

Presentation Guide On Effective TSV Repair for 3D-Stacked ICs Li Jiang†, Qiang Xu† and Bill Eklow§ †CUhk REliable Computing Laboratory Department of Computer Science…