1. VLSI Test Technology and Reliability Said HamdiouiDelft University of TechnologyComputer Engineering LabMekelweg 4, 2628 CD DelftThe [email protected]://ce.et.tudelft.nl/~saidSkype:…
Slide 11 IEC 61508 – IEC 61511 Presentation Document last revised October 1st 2005 G.M. International Safety Inc. P.O. Box 25581 Garfield Heights, OH 44125 USA www.gmisafety.com…