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Documents Introduction to Sentaurus TCAD-1

Introduction to Sentaurus TCAD David Pennicard – University of Glasgow - [email protected] For more information on Sentaurus TCAD, visit: http://ppewww.physics.gla.ac.uk/det_dev/activities/threedee/Documents/BarcelonaSeminar.html…

Documents Introduction to Sentaurus TCAD David Pennicard – University of Glasgow.

Slide 1Introduction to Sentaurus TCAD David Pennicard – University of Glasgow Slide 2 Overview Introduction to Sentaurus TCAD software Building the device structure Running…

Documents Lehrstuhl Technische Informatik - Computer Engineering Brandenburgische Technische Universität...

Folie 1 Lehrstuhl Technische Informatik - Computer Engineering Brandenburgische Technische Universität Cottbus Transient and Permanent Faults in Nanoelectronic ICs: Compensation…

Engineering 7. dopant diffusion 1,2 2013 microtech

Microelectronics Technology Dopant Diffusion DOPANT DIFFUSION To form source and drain regions in MOS devices and also to dope poly-Si gate material. Used to form base regions,…

Documents Comprehensive Radiation Damage Modeling of Silicon Detectors

Comprehensive Radiation Damage Modeling of Silicon Detectors Petasecca M.1,3, Moscatelli F.1,2,3, Scarpello C.1, Passeri D.1,3, Pignatel G.U.1,3 1DIEI - Università di Perugia,…

Documents 1 Polarized photocathode R&D Feng Zhou SLAC Collaborators: Brachmann, Maruyama, and Sheppard...

Polarized photocathode R&D Feng Zhou SLAC Collaborators: Brachmann, Maruyama, and Sheppard ALCPG09/GDE09 09/28-10/03/09 Outline Major parameters – cathode requirements…

Documents Trento, Feb.28, 2005 Workshop on p-type detectors 1 Comprehensive Radiation Damage Modeling of...

Comprehensive Radiation Damage Modeling of Silicon Detectors Petasecca M.1,3, Moscatelli F.1,2,3, Scarpello C.1, Passeri D.1,3, Pignatel G.U.1,3 1DIEI - Università di Perugia,…

Documents 18HFET

1 [email protected] # 18 SDM-2, ©Michael Shur 1999-2009 Heterostructure Field Effect Transistors 2 [email protected] # 18 SDM-2, ©Michael Shur 1999-2009 Outline HEMT (HFET) principle…

Documents Modeling and Design for Large Scale Heterogeneous Integration Neil Goldsman Dept. of Electrical and....

Modeling and Design for Large Scale Heterogeneous Integration Neil Goldsman Dept. of Electrical and Computer Engineering, UMCP Collaborators: B. Jacob, A. Akturk, Z. Dilli,…

Documents Semiconductor Modeling And Test Chip Design for Characterization of Radiation Effects

Semiconductor Modeling And Test Chip Design for Characterization of Radiation Effects Sotiris Athanasiou National Trainee, TEC-EDM Supervisors: Boris Glass, Richard Jansen…