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Effect of Power Optimizations on Soft Errors With advances in technology scaling, CMOS circuits are increasingly more sensitive to transient pulses caused by single event…

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Prepared by : AP,MGB,GV Page 1 EC6201 ELECTRONIC DEVICES L T P C 3 0 0 3 UNIT I SEMICONDUCTOR DIODE 9 PN junction diode, Current equations, Diffusion and drift current densities,…