Complementary Techniques for High Resolution Surface Investigation Svetlana Santer SEM and AFM: Freiburger Materialforschungszentrum Freiburg, 06.07.2004 Institut für Mikrosystemtechnik…
Slide 1 Basic Imaging Modes 1.Contact mode AFM 2.Lateral Force Microscopy ( LFM) 3.Scanning tunneling microscopy Slide 2 Position sensitive Photo-detector Review last lecture…