Documents 1 Radiation damage effects in Monolithic Active Pixel Sensors Implemented in an 0.18µm CMOS process...

Folie 1 1 Radiation damage effects in Monolithic Active Pixel Sensors Implemented in an 0.18µm CMOS process Dennis Doering, Goethe-University Frankfurt am Main on behalf…

Documents Radiation hardness studies with combined irradiated MAPS

* Radiation hardness studies with combined irradiated MAPS Dennis Doering*1, Samir Amar-Youcef 1,3,Michael Deveaux1, Melissa Domachowski1, Ingo Fröhlich1, Christian Müntz1,…