Einstein College of Engineering EC64 VLSI DESIGN SYLLABUS UNIT I CMOS TECHNOLOGY A brief History-MOS transistor, Ideal I-V characteristics, C-V characteristics, Non ideal…
What is JTAG? JTAG, as defined by the IEEE Std.-1149.1 standard, is an integrated method for testing interconnects on printed circuit boards (PCBs) that are implemented…
Module 8 Testing of Embedded System Version 2 EE IIT, Kharagpur 1 Lesson 41 Boundary Scan Methods and Standards Version 2 EE IIT, Kharagpur 2 Instructional Objectives After…
Slide 1 TAP (Test Access Port) JTAG course June 2006 Avraham Pinto Slide 2 Some Introduction (quick overview) on Boundary Scan Boundary scan is a methodology allowing complete…