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Name: Jie He UTA ID#: 1000568567 Experiment: SEM 1. Introduction The Scanning Electron Microscope (SEM) is a microscope that uses electrons rather than light to form an image.…

Documents Basic Imaging Modes 1.Contact mode AFM 2.Lateral Force Microscopy ( LFM) 3.Scanning tunneling...

Slide 1 Basic Imaging Modes 1.Contact mode AFM 2.Lateral Force Microscopy ( LFM) 3.Scanning tunneling microscopy Slide 2 Position sensitive Photo-detector Review last lecture…