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Documents Electron Microscopy Lab Introduction to scanning electron microscopy The aims of this course are:...

Slide 1 Electron Microscopy Lab Introduction to scanning electron microscopy The aims of this course are: ● to introduce the principles of scanning electron microscopy…

Documents Final Exam Review. Material-Process-Geometry Relationships 2 Function Process MaterialGeometry Role....

Slide 1 Final Exam Review Slide 2 Material-Process-Geometry Relationships 2 Function Process MaterialGeometry Role of Prod Engr Role of Mfg Engr Slide 3 3 Materials in Manufacturing…

Documents Advanced Methods of Materials Characterization (Lecture 3) March 14 th, 2014.

Advanced Methods of Materials Characterization (Lecture 3) March 14th, 2014 Last week we talked about… Electromagnetic Spectrum Photons are the basic units of all the electromagnetic…

Documents IE 337: Materials & Manufacturing Processes Lecture 4: Mechanics of Metal Cutting Chapter 21.

IE 337: Materials & Manufacturing Processes Lecture 4: Mechanics of Metal Cutting Chapter 21 * Last Time Assignment #1 – Due Tuesday 1/19 How we can modify mechanical…

Documents Electron Energy Loss Spectroscopy (EELS) Suggested Reading:

Problem: How can we gain information on unoccupied electronic states of the system IPES—good, but low count rates, few labs do this. Auger spectroscopy—common, high count…

Documents Cell Adhesion to Polymer Surfaces George Tulevski Colloids and Surface phenomena.

Cell Adhesion to Polymer Surfaces George Tulevski Colloids and Surface phenomena Introduction Cell adhesion to polymer surfaces has obvious implications in the field of tissue…

Documents Sem Contamination Paper

Contamination Specification for Dimensional Metrology SEMs András E. Vladár, K. P. Purushotham and Michael T. Postek National Institute of Standards and Technology (NIST),…

Documents Electron Energy Loss Spectroscopy (EELS) Suggested Reading: Used electron spectrometer Used TEM...

Problem: How can we gain information on unoccupied electronic states of the system IPES—good, but low count rates, few labs do this. Auger spectroscopy—common, high count…

Documents Advanced Methods of Materials Characterization (Lecture 3)

Advanced Methods of Materials Characterization (Lecture 3) March 14th, 2014 Last week we talked about… Electromagnetic Spectrum Photons are the basic units of all the electromagnetic…

Documents N anoscale M aterials C haracterization F acility

Nanoscale Materials Characterization Facility The Nanoscale Materials Characterization Facility (NMCF) is a state-of-the-art user facility located with the Materials Science…