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Zinc oxide thin-films by spray pyrolysis
with low deposition temperature
by
Jonas Köhling
a Thesis submitted in partial fulfillment
of the requirements for the degree of
Doctor of Philosophy
in Physics
Approved Dissertation Committee
__________________________________
Prof. Dr. Veit Wagner
Prof. Dr. Gerd-Volker Röschenthaler
Prof. Dr. Ralf Anselmann
Date of Defense: 22 April 2021
Department of Physics and Earth Sciences
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Statutory Declaration
Family Name, Given/First Name Köhling, Jonas
Matriculation number 20331904
What kind of thesis are you submitting: Bachelor-, Master- or PhD-Thesis
PhD-Thesis
English: Declaration of Authorship I hereby declare that the thesis submitted was created and written solely by myself without any external support. Any sources, direct or indirect, are marked as such. I am aware of the fact that the contents of the thesis in digital form may be revised with regard to usage of unauthorized aid as well as whether the whole or parts of it may be identified as plagiarism. I do agree my work to be entered into a database for it to be compared with existing sources, where it will remain in order to enable further comparisons with future theses. This does not grant any rights of reproduction and usage, however. This document was neither presented to any other examination board nor has it been published. German: Erklärung der Autorenschaft (Urheberschaft) Ich erkläre hiermit, dass die vorliegende Arbeit ohne fremde Hilfe ausschließlich von mir erstellt und geschrieben worden ist. Jedwede verwendeten Quellen, direkter oder indirekter Art, sind als solche kenntlich gemacht worden. Mir ist die Tatsache bewusst, dass der Inhalt der Thesis in digitaler Form geprüft werden kann im Hinblick darauf, ob es sich ganz oder in Teilen um ein Plagiat handelt. Ich bin damit einverstanden, dass meine Arbeit in einer Datenbank eingegeben werden kann, um mit bereits bestehenden Quellen verglichen zu werden und dort auch verbleibt, um mit zukünftigen Arbeiten verglichen werden zu können. Dies berechtigt jedoch nicht zur Verwendung oder Vervielfältigung. Diese Arbeit wurde noch keiner anderen Prüfungsbehörde vorgelegt noch wurde sie bisher veröffentlicht.
………………………………………………………………………………………………………. Date, Signature
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Abstract Many different future applications like bendable and transparent displays or functional clothing require
relatively low process temperatures (e.g. ~ 249 °C as upper temperature limit for polyimide) for
deposition of the active material, e.g. solution-processed semiconductors. Metal oxides such as zinc
oxide have good electrical properties but processing those from solution requires relatively high
temperatures (e.g. spray pyrolysis of zinc acetate at ~ 360 °C). This thesis pursues three fundamentally
different approaches to lower the process temperature of zinc oxide produced by spray pyrolysis.
Tailored organic molecules are used as a post-deposition treatment to passivate surface traps, i.e.
hydroxy groups or chemisorbed water, as the first approach. A successful passivation of surface defects
improve the electrical properties of the zinc oxide that occur at low process temperatures. Therefore
tailored passivation molecules, i.e. 1,3-diketones, are presented. Their binding towards zinc is studied
and their passivating properties of solution processed zinc oxide thin-film transistors analyzed.
Fluorinated zinc carboxylate derivates are analyzed as novel potential zinc oxide precursors with focus
on lower deposition temperatures as a second approach. FTIR (Fourier transform infrared spectroscopy)
and TGA (Thermogravimetric analysis) reveal whether a precursor thermally decomposes to zinc oxide
and identifies the decomposition temperature.
The third approach: High-speed picoliter droplet analysis gives deeper understanding of droplet
interactions with the substrate depending on the temperature under real deposition conditions. A novel
model for top-view analysis of dynamic and static advancing contact angles and a comprehensive
determination of thermodynamic properties like Leidenfrost point, critical heat flux and thermodynamic
boiling regimes is presened. Additionally, a novel hovering state of very small droplets above the
substrate at room temperature is presented. This state is similar to the Leidenfrost point and enables
the deposition of smooth layers at low temperatures (T < 100 °C). Overall, this analysis allows a fast
screening for suitable solvent and substrate combinations for the deposition of precursors that are not
processable with standard solvents to find beneficial deposition conditions at low temperatures.
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Table of Contents
Acronyms and chemical formulae ......................................................................... ix
1 Introduction ......................................................................................................... 1
2 Spray pyrolysis ................................................................................................... 5
2.1 Airblast atomization ................................................................................................................. 6
2.2 Ultrasonic atomization ............................................................................................................. 7
2.3 Atomization of liquids and behavior of falling droplets ............................................................ 8
2.4 Wetting, contact angles, and evaporation of droplets at hot surfaces ................................... 11
2.5 Thermodynamic boiling regimes ............................................................................................ 14
2.6 Deposition of precursor ......................................................................................................... 15
3 Metal oxide thin-film transistors ..................................................................... 19
3.1 History of and basics of field-effect transistors ...................................................................... 19
3.2 Charge transport .................................................................................................................... 22
4 Experimental and theoretical methods ........................................................... 24
4.1 Density functional theory ....................................................................................................... 24
4.2 Atomic force microscopy ....................................................................................................... 27
4.3 X-ray photoelectron spectroscopy ......................................................................................... 28
4.4 Nuclear magnetic resonance spectroscopy .......................................................................... 29
4.5 Thermogravimetric analysis ................................................................................................... 32
4.6 Fourier-transform infrared spectroscopy ............................................................................... 32
4.7 Scanning electron microscopy ............................................................................................... 35
5 Tailored organic surface passivation for metal oxide semiconductors ...... 37
5.1 Concept of surface traps passivation by tailored organic molecules .................................... 37
5.2 1,3-diketone molecules: theoretical characterization ............................................................ 39
5.3 Chemical binding of passivation molecules to zinc oxide surfaces ....................................... 42
5.4 Passivation process monitoring ............................................................................................. 49
5.5 Performance of passivated thin film transistors ..................................................................... 52
5.6 Fabrication and characterization of thin-film transistors ........................................................ 55
5.7 Conclusion and outlook ......................................................................................................... 57
6 Fluorinated Carboxylates as zinc oxide precursor ........................................ 59
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7 High-speed real-time analysis of picoliter droplets under spray pyrolysis
conditions ............................................................................................................... 63
7.1 Cross-section analysis of droplet diameter after atomization ................................................ 63
7.2 Raytracing and droplet appearance ...................................................................................... 66
7.3 Sessile and moving droplets: Indicator for Leidenfrost temperature ..................................... 68
7.1 Formation of sessile droplets and their interaction with the environment ............................. 71
7.2 Evaporation model of sessile droplets: Ad hoc extraction of the contact angle .................... 73
7.3 Thermodynamic boiling regimes, critical heat flux and Leidenfrost temperature .................. 80
7.4 Novel meta-stable hovering state of very small droplets – Bypass to the Leidenfrost effect 81
7.5 Experimental setup and video acquisition ............................................................................. 85
7.6 Conclusion and outlook ......................................................................................................... 87
8 Concluding remarks ......................................................................................... 90
List of publications ................................................................................................. 93
8.1 Journal paper ......................................................................................................................... 93
8.2 Patent applications ................................................................................................................ 93
8.3 Conference contributions ....................................................................................................... 94
References .............................................................................................................. 96
Acknowledgments ................................................................................................ 105
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ix
Acronyms and chemical formulae
m : Micrometer XPS : X-ray photoelectron spectroscopy
AFM : Atomic force microscopy ZnO : Zinc oxide
BE : Binding energy
CHF : Critical heat flux
DFT : Density functional theory
EDG : electron-donating group
Eh : Hartree
EPD : Electronic paper display
EWG : electron-withdrawing group
FT-IR : Fourier-Transform Infrared
spectroscopy
FWHM : Full width half maximum
GTO : Gaussian type orbital
H2O : water
HOMO : highest occupied orbital
IC : Integrated circuit
KE : Kinetic energy
LCD : Liquid crystal display
LED : Light-emitting diode
LFP : Leidenfrost point
LTPS : Low-temperature polycrystalline
silicon
LUMO : lowest unoccupied orbital
NMR : Nuclear magnetic resonance
OLED : Organic light-emitting diode
pL : picoliter
SiSiO2 : Silicon/Silicon dioxide
STO : Slater type orbital
TGA : Thermogravimetric analysis
TIR : Total internal reflection
UV/O : Ultraviolet ozone
UV-VIS : Ultraviolet-visible
VLSI : very largescale integration
VMD : Volume mean diameter
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Introduction
1
1 Introduction
Robert Noyce applied for the first patent on an integrated circuit (IC) fabricated on a single-
crystal substrate in 1959.[1] He used for his first chip novel photolithography and diffusion
processes and enabled new applications. In the early 1960s, the first microprocessors went
into mass production, and a technical revolution had begun. Since then, the integration of
passive elements like resistors and advanced manufacturing technologies have made
transistors smaller, and hence the number of transistors on a chip has increased. Today, the
transistor density is one of the primary indicators for the performance of ICs. Nowadays, the
first manufacturers produce chips with more than 11.8 billion transistors per chip in a 5 nm
process.
However, many application areas, such as displays or sensors, which utilize ICs and
semiconductors per se, do not require remarkably shrunk dimensions and high transistor
densities. State of the art displays of high-end smartphones, for example, consists of pixels that
are about 50 m in size (Figure 1.1). Such small pixels cannot be recognized by the human eye
anymore and imitate a continuous realistic picture to the observer. Much larger displays with a
comparable pixel resolution like TVs or monitors have a lower pixel density, and the individual
pixel size is up to a magnitude larger.
Figure 1.1 Microscopy image of pixel arrays. Each pixel consists of three colored subpixels (red, green,
and blue). The pixels' size and alignment vary with technology (a: OLED: Organic light emitting diode,
b: LCD: Liquid crystal display).
Thin-film transistors that switch the pixels in displays thus have much more space compared to
transistors in processors. In most cases, they require different properties like high transparency
and mechanical durability. Therefore, thin-film transistor materials that can replace the standard
material silicon and their deposition technologies are of particular interest in these fields instead
of further shrinking their size.
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Introduction
2
Extensive research has revealed that some metal-oxides meet the optoelectronic requirements
to serve as silicon substitute in thin-film transistors. Nowadays, research focuses on
significantly better understanding and optimizing existing deposition technologies for those
metal oxides as the active material or as electrodes, while they already substitute silicon. There
is great potential to save resources by switching from vacuum-based technologies like
CVD/PVD (chemical/physical vapor deposition) or sputtering to liquid deposition processes like
spray pyrolysis, spin coating, and inkjet printing. Another main focus is the reduction of the
usually high process temperatures of metal oxides.
One of the main application areas for metal oxide thin-film transistors is the display market. It
includes liquid crystal displays (LCD), organic light-emitting diodes (OLED), and electronic
paper displays (EPD), also known as e-ink displays. Each of these display technologies has its
strengths, and all are part of today's products. For example, LCDs can provide contrast-rich
images with a broad color spectrum even with intense ambient light combining dynamic
backlighting with anti-reflective surfaces. OLEDs can be switched off entirely and therefore
achieve an almost perfect black. Since OLEDs do not require backlighting, they make the
construction of transparent displays possible. Compared to classic LCD displays, they consume
significantly less energy. EPDs, on the other hand, can display content without energy
consumption for an unlimited time. Energy is only required to update the displayed content.
Compared to LCDs and OLEDs, EPDs have a prolonged refresh rate and are suitable for eBook
readers or digital price displays in retail stores, for example.
Since 2005 displays based on field-effect transistors dominate the market. They belong to the
class of thin-film transistors. Since then, they have undergone rapid development, and the
demands for improved modern displays technologies increase almost every year. Technical
engineers mastered the hurdles for properties such as a 90-inch screen diagonal or extreme
dynamic range (contrast 1.000.000: 1), with fast response time (< 1 ms), high viewing angle
(178°), a resolution of 8K (7680 x 4320 pixels), or 3D technology already by today.
In novel displays, millions of thin-film transistors switch the individual pixels and control their
brightness. Initially, low-cost a-Si:H (hydrogenated amorphous silicon) was the primary active
semiconductor material. It achieves with its amorphous structure a charge carrier mobility of
about = 1 cm2/Vs. With such low carrier mobility, no transparency, and mechanical rigidity, it
is not suitable for high-end display applications.[2–4]
One way to overcome parts of the issues is further crystallization and conversion into LTPS
(low-temperature polycrystalline silicon) after the deposition of amorphous silicon. This method
increases the charge carrier mobility of silicon to = 50 cm2/Vs and higher. Different sized
crystals and an uneven distribution of grain boundaries lead to fluctuations in performance.
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Introduction
3
Therefore, LTPS works only for relatively small displays. Also, only a few substrate classes
resist the crystallization process temperatures above 650 °C.[3,5]
With good electrical conductivity and optical transparency in the electromagnetic spectrum's
visible region, metal oxides represent the groups of TSOs (transparent semiconducting oxides)
and TCOs (transparent conducting oxides). They combine the necessary properties for use in
optoelectronic devices like displays and are suitable materials for transparent electrodes and
transparent active semiconducting layers. With their properties, they find use in high-end
display applications. The charge carrier mobility of metal oxides at lower process temperatures
is comparable to LTPS.
Recent highlights enabled by new materials are curved and, to a certain extent, flexible displays
in 2015, rollable OLED displays in 2019, and in 2020, subways with transparent OLED displays
instead of regular windows. The latter transparent displays allow the familiar outside view and
provide live-information about the next stops and the railway network additionally at the same
time.
However, many different future applications are conceivable. Automotive concepts include
interactive transparent windscreens with live traffic and navigation information. Ideas of
adaptive billboards that adapt to the individual viewer, functional clothing, or displays printed
on the skin that, for example, provides vital data of a patient or surgery information and
instructions to the treating doctor, are considered realistic. Finally, the further development of
devices that are already in use today, such as monitors, cell phones, and e-book readers,
continues and leads to further advances and new technologies/categories. Such exciting
applications rely on novel materials like metal-oxide semiconductors.
This thesis aims to reduce process temperatures for processing metal oxide semiconductors
active layers used in thin-film transistors by improving transistor performances, finding novel
precursors, and a deeper understanding of the deposition process itself. Therefore the following
three approaches are pursued.
1. Improved stability and performance of solution-processed zinc oxide thin-film transistors
processed at low temperatures by organic surface defect passivation:
• Theoretical description of organic passivating molecules
• Electrical characterization of passivated zinc oxide thin-film transistors
• Monitoring of passivation process and identifying the binding situation at the surface
2. Experimental evaluation of possible novel zinc oxide precursors
• Experimental evaluation of decomposition temperatures for suitable zinc oxide
precursor candidates
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Introduction
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3. Gain a deeper understanding of picoliter droplets at hot surfaces under real application
conditions
• Investigate the Leidenfrost point and contact angles of water under deposition
conditions
• Understanding of picoliter size droplet behavior at hot surfaces
• Identifying beneficial deposition conditions
The following chapters introduce the core topics: spray pyrolysis, metal oxides, and thin-film
transistors. An explanation of the basics of the used theoretical and experimental methods
follows. The final chapters present and discuss the theoretical and experimental results on the
previously listed approaches. Concluding remarks, as a final chapter, summarize the work.
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Spray pyrolysis
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2 Spray pyrolysis
Spray pyrolysis is, in general, a processing method for the production of (thin) coatings and
powders from precursor solutions. The process itself usually divides into three phases. First:
Droplet generation, second, droplet transport, and third, material deposition and conversion.
The sprayed precursor solution undergoes within these phases one or more of the following
processes: atomization and recombination of droplets, evaporation of the solvent, distribution
of solutes, thermolysis, or decomposition of the precursor, annealing of the precursor, and
forming particles.
Four standard methods exist for the droplet generation from a solution, which is also known as
atomization: Airblast atomization, ultrasonic atomization, pressurized nozzles, and electrostatic
atomization. Depending on the method, a typical spray pyrolysis setup consists of an atomizing
nozzle generating droplets or a nebulizer with piezoelectric crystal generating aerosols. After
generation, droplets fall accelerated by an electric field, gravity, or carried by pressurized gas
towards a target. Depending on droplet size and density, they can create a laminar or turbulent
flow within the spray stream. Common precursor solutions contain pure or mixtures of dissolved
metallic salts, organic molecules, or dispersed colloidal particles.
After reaching the target, droplets suddenly heat up to elevated temperatures, and the solvents
evaporate when they enter an oven or reach a heated surface. The solutes precipitate or
thermally convert to produce either powders or single/multi-component layers. Droplets from
atomizing nozzles usually pyrolyze at heated substrate surfaces producing layers. Aerosols
from nebulizers usually flow through tube furnaces and pyrolyze producing powders before
reaching their target destination. In general, the spray pyrolysis process can produce
morphologies including spheres, 1D structures like nanorods or porous, ceramic, or dense
layers. Produced layers for electrical applications mainly act as electrodes or active material in
thin-film transistors, sensors, and solar-cells.
Chapters 2.1 and 2.2 describe the nozzles' design and the atomization methods for this work:
air blast and ultrasonic atomization. Chapter 2.3 introduces some of the essential characteristic
parameters of fluid mechanics and fields that use fine droplets. Chapter 2.4 describes the
wetting and dewetting of arrived droplets at surfaces, the contact angle, and evaporation.
Chapter 2.5 introduces the thermodynamic boiling regimes and their impact on spray pyrolysis.
Finally, Chapter 2.6 explains how precursors are deposited on surfaces by spray pyrolysis.
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Spray pyrolysis
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2.1 Airblast atomization
One possibility to atomize a fluid into small droplets is the airblast atomization. Compressed air
or other pure (mostly inert) gases like N2, Ar, or O2 atomize a dosed liquid by high pressure and
high flow rate. The atomizing gas flow also has the second use to carry the droplets towards a
target. It usually generates droplets with a wide droplet diameter distribution and accelerates
them to a high velocity. Typical values are mean droplet diameters of 80 m and velocities of
more than 10 meters per second.[6] The distribution of the droplets becomes broader with higher
velocity. Various industry applications and artists use this popular and cost-efficient method to
deposit functional layers, coatings, and paint. Deposition of functional coatings/layers or spray
cooling are examples of scientific applications. Even the simplest version of the airbrush guns,
a perfume dispenser, can deposit fully functional zinc oxide layers.[7] Figure 2.1 shows a typical
airbrush gun and schematically its construction as a cross-sectional sketch. The main parts are
the needle, a double-action trigger, an air valve, and the liquid source.
Figure 2.1 a) Sketch of an airbrush construction as a cross-sectional sketch b) Commercially available
IWATA HP-B Plus airbrush used in this work, connected through a particle filter to pressurized nitrogen.
The liquid source feeds the gun with a precursor solution either by gravity or through a siphon.
The gravity feed can atomize even the tiniest volumes (V < 25 L) at comparatively low
pressures, resulting in finer droplets. In comparison, a siphon liquid feed can provide larger
volumes but requires higher pressures because the solution is pulled through a stem and thus
atomized. The gravity feed described first is more suitable for this work due to the small volumes
and finer droplets. For both cases, atomization occurs because the airflow rips the solution
apart.
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The droplets can mix after atomization with the carrier gas either internally or externally. Internal
mixing means that the fluid is atomized at the airflow center, providing a more spherical pattern.
External mixing means that the gas comes sidewise and provides a more elliptical pattern.
Finally, a double-action trigger controls the whole spraying process. It can turn the airflow and
activate the liquid feed. In this work, a commercially available IWATA HP-B Plus airbrush with
a nozzle diameter of 200 m deposits the thin-film zinc oxide for thin-film transistors.
2.2 Ultrasonic atomization
Ultrasonic atomization is a method to atomize fluids into fine droplets with an ultrasonic atomizer
nozzle (described here) or an ultrasonic nebulizer. Therefore, the fluid enters through a narrow
capillary the atomization platform. Piezoelectric transducers induce oscillations at the
atomization platform at very high frequencies (30 kHz < f < 130 kHz). Figure 2.2 shows a typical
ultrasonic atomizer with spray shaper and schematically its construction as a cross-sectional
sketch. The main parts are the liquid source with a flow restrictor, piezoelectric transducers,
and the atomization platform. The atomization process at the atomization platform is also
illustrated.
Figure 2.2 a) Sketch of an ultrasonic atomizer cross-section b) atomization process c) Commercially
available ultrasonic atomizer Sonaer NS130K (left) with self-made spray shaper (right).
The liquid solution is wetting the atomization platform with a constant flow rate forming a film.
Piezoelectric transducers induce the oscillation of the film until it gets atomized. Generated
droplets then fall, accelerated by gravity until they reach equilibrium velocity due to friction with
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Spray pyrolysis
8
the surrounding atmosphere. A spray shaper located around the atomizing platform can inject
air or inert gases to accelerate the droplets. Droplets accelerated this way form into a spray
that is shaped circular or elongated, depending on the spray shaper geometry. Ultrasonic
atomizers yield finer droplets at higher frequencies. Mean droplet diameters of approximately
20 – 25 m are achievable with a comparable high frequency (f = 130 kHz). Increasing power
at the atomizing platform sharpens the droplet diameter distribution. Ultrasonic atomizers are
limited to Newtonian fluids with low viscosities. Exemplary scientific and industrial applications
are thin-film coating, micro etching, microbead production, and spray drying. The atomizing
nozzle used in this work is a Sonaer NS130K.
2.3 Atomization of liquids and behavior of falling droplets
The understanding and observation of small droplets and their impingement on heated solid-
state surfaces is an already well-established research field. However, there are still many open
questions. It is also a very crucial topic for many areas in the industry. Exemplary applications
and conducted research studies are:
• Spray pyrolysis[7–10]: E.g., Electrical stability enhancement of produced thin zinc oxide
layers and analysis of layer morphologies produced with different droplet sizes.
• Direct fuel injection[11–14]: E.g., Analysis of droplet size, velocity, and volume flux for
predominant port fuel injection technology used in combustion engines.
• Desalination and refrigeration[15–18]: E.g., Effects of spray density, overall heat transfer
coefficient, inlet stream velocity for use in horizontal-tube falling film evaporators
• Spray cooling[19–21]: Studies of droplet diameter and velocity impact heat flux in
thermodynamic regimes: film, transitional, and nucleate boiling.
In those applications, wall temperatures can range from 60 °C to 500 °C, e.g., for aqueous
droplets. The broad temperature range, different boiling regimes, and many process
parameters underline that these applications' processes are highly complex and depend on
numerous parameters. The main parameters are droplet diameter and impact velocity[22] and
material properties like density, viscosity, and surface tension of the selected liquid[23] and wall
properties like wettability,[24] surface roughness,[25] and surface temperature.[26] Those complex
processes in real application conditions were already recorded with a high-speed camera
approach[20], but detailed droplet behavior is not analyzed so far on such datasets.
Furthermore, environmental parameters like pressure and turbulences have to be considered.
Top-view observation of droplets can often be easily integrated in existing set-ups. Droplet
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observation close to hot surfaces in real-time under real process conditions gives valuable
insights into the crucial droplet dynamics.
Previous research already allows a good understanding of the formation and the expected
behavior of droplets in motion with varying sizes for intensively used regimes, where others still
lack fundamental research.
A few basic descriptors help with an initial assessment for a better comparison between
different technologies and setups. Therefore, it is essential to know that in principle, six forces
affect falling droplets through a gas: Gravity, surface tension, viscosity and inertia of the liquid,
and inertia and viscosity of the gas. The often applied descriptors and dimensionless
parameters Weber number, Reynolds number, and Ohnesorge number set theses forces into
meaningful ratios that support the mathematical description of droplets.
The Weber number, named after Moritz Weber, describes the ratio of inertia and surface
tension (drag force and cohesion force) of a fluid. That ratio can describe, for example, the
deformation behavior of a flowing fluid when it interfaces with another fluid. A simple example
is a falling raindrop in air. Its inertia promotes deformation, while the surface tension stabilizes
its shape. The Weber number is
𝑊𝑒 = Inertia
Surface tension=
𝜌𝑣2𝐿
𝜎
with is the density [kg/m3] of the fluid, v [m/s] its velocity, L its characteristic length [m] and σ
its surface tension [N/m]. The Weber number qualitatively characterizes the droplet properties
after atomization, for example, by an ultrasonic atomizer. In general, as the Weber number
increases, a liquid breaks down more strongly into smaller droplets. Also, with larger Weber
number (We ≥ 1)[27], the droplets are subject to greater deformation and move further away from
the ideal spherical shape (We << 1).[27]
The Reynolds number predicts whether the flow pattern of fluids and gases tends to be
preferably laminar or turbulent. The concept itself was introduced by George Stokes in 1851
and named after Osborne Reynolds. The Reynolds number is
𝑅𝑒 = 𝜌𝐿𝑣
𝜇
with is the density [kg/m3], L its characteristic length [m], v the velocity [m/s] and μ the dynamic
viscosity [Pa ∙ s] of the liquid. The flow of a liquid or gas at Reynold numbers below the critical
Reynolds number (Re < Recrit, Recrit = 2340 for pipes) is usually laminar, and the droplets move
within a sheet-like flow. With increasing Reynold number (Re > Recrit), the flow becomes
turbulent, where the flow and thus the droplets strongly vary in speed and movement direction.
It is necessary to set the Reynolds number for the experiment below the turbulence onset
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Spray pyrolysis
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(Re = Recrit) in spray pyrolysis. In this regime, the droplets need no direction to the target
position and are mainly falling because of gravity. The turbulent flow does not change to a
laminar flow does not occur exactly at Recrit it is more like a transition point. Turbulences can
occur below Recrit but decay fast. Otherwise, at higher Reynold numbers (Re > Recrit) or in a
turbulent environment, a required carrier gas dominates the droplets' behavior and directs them
to the target.
Wolfgang von Ohnesorge defined in 1936 the Ohnesorge number (Oh) that combines Weber
number and Reynolds number to eliminate the velocity of the liquid. It relates viscous forces to
inertial and surface tension forces.
𝑂ℎ = viscous forces
√inertia x surface tension=
√𝑊𝑒
𝑅𝑒=
𝜇
√𝜌𝐿𝜎
Where μ is the dynamic viscosity [Pa ∙ s] of the liquid, ρ is the density [kg/m3] of the liquid, L its
characteristic length [m], and σ is the surface tension [N/m]. In fluid dynamics, the interpretation
of the Ohnesorge number, together with the Reynolds number, describes the formation of
droplets at nozzles before applying external power in three regimes: droplets (dripping), waves,
and droplets, and atomization, which Figure 2.3 visualizes.
Figure 2.3 Ohnesorge number vs. Reynolds number for an aqueous system. The diagram delimits the
three regimes under which a water stream without external energy breaks up into droplets, into waves
and droplets and atomizes.[28]
The droplets analysis in this thesis (Chapter 7) requires droplets with a mean diameter around
D0 = 25 m and a falling velocity of u0 < 50 mm/s, corresponding to We = 10-4 and
Oh = 2 x 10-2. The thin-film transistor production (Chapter 5) requires to atomize small volumes
(V ≤ 50 L).
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Spray pyrolysis
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Generating water droplets in air (ρwater = 997.0 kg/m^3, water = 0.890 × 103 Ns/m2, air Ns/m2,
1.225 kg/m³, air 18.5 Ns/m2, at 25 °C) with a conventional high-pressure nozzle with an internal
diameter of 0.8 mm (Oh = 4 x 10-3) requires to press the solution through the nozzle with
pressures of up to 100 bar to operate in the atomization regime, according to Figure 2.3. This
high pressure delivers droplets with a broad diameter distribution and larger diameters than
required. Also, the high pressures accelerate the droplets to velocities that are 100 m/s and
faster. Also, for small volumes, it is technically hard to build up such high pressures. Because
of that reason, additional energy from the ultrasonic atomizer or pressurized gas in the airblast
atomization is required to provide the right size of droplets for analysis and small atomized
volumes for deposition.
2.4 Wetting, contact angles, and evaporation of droplets at hot surfaces
The wetting of surfaces by droplets and their evaporation (at heated surfaces) has been subject
to previous theoretical and experimental research for decades.[29–31] Figure 2.4 shows the most
common scenarios droplets undergo from the first contact to the surface until evaporation.
Depending on the solvents' polarity and surface properties, the droplets either wet the surface
or are repelled from the surface after impact (Figure 2.4 a and b). For example, a water droplet
repels from a hydrophobic surface and wets a hydrophilic surface due to matching or
mismatching surface energies. After wetting the surface, the droplets settle with a defined
contact angle[32,33].
This is shown in (Figure 2.4 a) or it undergoes secondary atomization[34], where they break
down into secondary and much smaller droplets (Figure 2.4 c). After settling, droplets begin to
evaporate, which takes place for larger droplets (V > pL), where surface tension is not the
dominating force, in a bubble and pattern boiling[35] with visible gas evolution within the droplet
(Figure 2.4 d). The evaporation mechanism of droplets depends on their contact angle. In
general, a systems' contact angle Θ takes a value between the larger advancing Θa and the
smaller receding Θr contact angle.
Droplets with a contact angle larger than their receding contact angle have a pinned edge[36]
(Figure 2.4 e). A droplet with a pinned edge evaporates with a constant contact area towards
the substrate until the contact angle is equal to the receding contact angle.
Otherwise, the system evaporates with a constant contact angle and a shrinking contact area
towards the substrate. The constant contact angle is equal to the receding contact angle (Figure
2.4 f). The droplets' contact angle can decrease while evaporation and the evaporation
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mechanism can switch from a decreasing contact angle with a constant area to a constant
contact angle with a shrinking area until the whole droplet volume is evaporated.
Figure 2.4 Possible scenarios of droplets after colliding with the surface: a) wetting of the surface, b)
repelling at the surface, c) secondary atomization, d) boiling with or without bubbles, e) pinned
evaporation (with decreasing contact angle), and f) evaporation with constant contact angle.
Standard methods for contact angle determination (Θa: advancing, Θr: receding) are a droplet
on a tilted substrate[37], a dynamic sessile droplet into which volume is pumped in/out, or the
Wilhelmy method, which studies the wettability by a dipping a plate[38] (Figure 2.5).
Figure 2.5 Standard methods for contact angle measurement: a) droplet on a tilted substrate, b)
dynamically pumped droplet on a surface, and c) Wilhelmy method with a dipped plate.
A sessile droplet on a leveled substrate has, in the ideal case, the same contact angle in every
direction (pointing from the center). If the substrate is now slightly tilted, gravity deforms the
droplet towards the substrate's lowest position. The deformation causes a larger contact angle
at the lowest position and a smaller contact angle at the highest position than the initial contact
angle. These changes increase with further tilting of the substrate until the droplet starts moving.
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Spray pyrolysis
13
The larger contact angle corresponds to the advancing and the lower to the receding contact
angle by reaching this point.
For the second method, the droplets' volume on a substrate increases through a capillary. The
contact angle increases meanwhile until it reaches the advancing contact angle. The contact
angles are equal when the contact area starts to increase, too. Afterward, a pump reduces the
volume through the capillary until the contact area starts to shrink. The contact angle is now
equal to the receding contact angle.
For the third method, a substrate dips into the liquid. The contact angle increases until the liquid
wets more surface of the substrate. The contact angle corresponds to the advancing contact
angle. Afterward, the substrate retracts out of the solution until the dewetting starts. The contact
angle then corresponds to the receding contact angle.
The previous descriped advancing and receding contact angles are denoted as static contact
angles where the contact line is not in motion. For the case that the contact line is in motion the
advancing and receding contact angles are denoted as dynamic. Therefore the contact angle
depends on the velocity of the contact line as shown in Figure 2.6. The increase/decrease of
the advancing and receded contact angle is limited at high velocities of the contact line.
Figure 2.6 Dependence of static and dynamic advancing and receding contact angles Θ on the velocity u
of the contact line.[39]
Also, more complex methods exist as cryo-AFM (atomic force microscopy)[40–45], ESEM
(environmental scanning microscopy)[46–48], and cryo-SEM (scanning electron
microscopy).[49–51] These methods analyze solidified static momentary states of droplets in
frozen environments in vacuum and ambient atmosphere. Top-view analysis of large droplets'
light interference fringes allows the extraction of contact angles for huge droplets.[52]
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Spray pyrolysis
14
However, very few reports investigate pico-liter droplets in general[53–55] even though an
increasing number of fields use pico-liter droplets due to their extraordinary properties and their
generation methods' availability.[56–58]
In Chapter 7, a new method for a simple and statistically meaningful determination of static and
dynamic advancing and receding contact angles Θ is introduced.
2.5 Thermodynamic boiling regimes
The previous description of droplets reaching the surface states that repelling occurs in the
simplest case because the phobicity of liquid and surface doesn't match, inhibiting the wetting
itself.[59] A more complex scenario is the Leidenfrost behavior at higher temperatures. To
explain Leidenfrost behavior, three different thermodynamic boiling regimes of liquids at hot
surfaces are introduced (see Figure 2.7). An often made but wrong assumption is that with
increasing temperature, the heat flux increases proportional, and thus, a drop evaporates
faster. After an expected increase in heat transfer, it reaches a maximum, also known as the
critical heat flux (CHF). The thermodynamic boiling regime until the CHF is the nucleate boiling.
Droplets' lifetime decreases with increasing temperature.
At higher temperatures than the CHF temperature, the heat flux decreases. The heat flux
reaches its minimum at the Leidenfrost point. The thermodynamic regime between those two
points is the transition boiling. Droplets' lifetimes increase with increasing temperature.
At this point, with increasing temperature, droplets evaporate in the film boiling regime. The
previously mentioned scenario of the Leidenfrost behavior starts. A droplet stops wetting the
surface but also stops to repel from it. It starts to levitated close above the surface. This is
possible due to the droplet's evaporation towards the surface, creating an own sacrificial vapor
phase below. The additional gas layer between the surface and droplet is isolating the heat
flux. The droplets experience a drastically increased lifetime, because of the general bad heat
conduction through gaseous phases.
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15
Figure 2.7 Droplet lifetime / Evaporation time and heat flux/evaporation rate vs. superheat T of the heated
surface. Critical heat flux (CHF, maximum evaporation rate, minimum lifetime), and the Leidenfrost point
(LFP, minimum evaporation rate, maximum lifetime) delimit the thermodynamic boiling regimes (nucleate
boiling, transition boiling, and film boiling).
2.6 Deposition of precursor
From the heat transfer perspective, the wall temperature plays a significant role and determines
the lifetime of droplets on the surface and whether the droplets are sessile or levitating.
Therefore, the temperature has to be determined and controlled as precisely as possible.
The deposition of precursor layers (or their thermally converted form) from picoliter droplets for
different applications is possible in all mentioned temperature regimes. It is of high importance
to distinguish whether the deposition occurs at temperatures below the LFP in the nucleate
boiling and transition boiling regime where the droplets wet the surface. Or if the surface
temperature is higher than the LFP and deposition occurs in the film boiling regime with droplets
levitating above the surface (Figure 2.8).
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Spray pyrolysis
16
Figure 2.8 Layer deposition at temperatures below LFP in a) nucleate boiling and b) transition boiling
regimes. Deposition at temperatures above LFP in the film boiling regime c).
Sessile droplets slowly evaporate at relatively low temperatures (T < LFP) in the nucleate
boiling regime, and the solutes start to precipitate at the border. In this case, a droplet leaves
behind the very well known coffee stain ring. Residuals of multiple droplets don't interfere unless
their evaporating position overlaps.
Sessile droplets experience rapid evaporation at elevated temperatures close to the CHF and
above in the nucleate boiling regime. Coffee stains are not observable anymore. Instead,
droplets burst, and their solutes spread around the landing position. The residuals of multiple
droplets can now interfere even if the initial droplets are separated.
Functional layers deposited in these temperature regimes from sessile droplets are usually very
rough because the solutes are distributed unevenly. Because of the low surface temperatures,
especially in the nucleate boiling regime, deposition on various substrates such as flexible and
transparent polymers or even fabrics is possible. A drawback might be that many precursor
systems might not thermally convert at these low process temperatures. These films (layers)
perform fundamentally different from smooth films because of the high surface roughness,
resulting in grain boundaries, and not or only partly converted precursors.[60]
Deposition at temperatures above the LFP undergoes different mechanisms since the droplets
are now levitating above the surface and move laterally. Three known mechanisms are the
One-droplet-one-particle (ODOP), One-droplet-many-particle (ODMP), and a chemical vapor
deposition like mechanism (CVD) (Figure 2.9). In the case of ODOP and ODMP, a droplet
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Spray pyrolysis
17
shrinks due to evaporation. If the precursor concentration exceeds the solubility, one or more
particles precipitate, respectively. In the latter case of a CVD-like mechanism, the levitating
droplet distributes single molecules, which reach the surface by Brownian motion.
Figure 2.9 Deposition mechanisms at temperatures above the Leidenfrost point LFP in the film boiling
regime a) One-droplet-one-particle ODOP, b) One-droplet-multiple-particles, c) chemical vapor deposition
CVD.
All mechanisms usually distribute the precursor (or its thermally converted form) evenly over
the surface and deliver smooth films. Deposition at these high temperatures often already
provides the necessary energy for a precursor's thermal conversion. Otherwise, post-annealing
processes convert precursors that require higher energies for conversion.
After introduction of mechanisms by which material can be applied to surfaces by spray
pyrolysis, suitable solution-processable precursors for metal-oxides are briefly introduced.
Popular inorganic precursors are halides and nitrate salts or nanoparticles of the target
compound. Popular organic precursor compounds are alkoxides, carboxylates, and
acetylacetonate derivatives. These precursors can be dissolved and processed from aqueous
solutions and dissolved in most polar organic solvents like alcohols. Some combinations need
adding of the corresponding acid to stabilize the solution, increase the solubility, and avoid
precipitation of insoluble reaction products before deposition. There is not an optimal precursor
for every application. A decision for a precursor depends much more on which morphology is
to be obtained, which deposition process and which reaction mechanism are used or whether
the final layer needs doping. If one precursor candidate is to be highlighted in the present
context of zinc oxide production, it is zinc acetate, because it can be deposited with different
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Spray pyrolysis
18
methods and is widely used throughout different applications. Its advantageous deposition
mechanism of zinc acetate is explained in Chapter 6, together with fluorinated derivatives.
Besides the heat transfer in different thermodynamic boiling regimes and the precursor, multiple
droplets' interaction is also relevant. If one droplet meets another droplet before it has
evaporated, its lifetime increases and influences the heat transfer from the surface into the
droplet. Resulting temperature inhomogeneities within a droplet leads to the Marangoni
Effect[61], further influencing the evaporation behavior for depositions at higher droplet densities.
At higher densities, knowledge of the processes between droplets is just as essential as the
heat transfer.
The evaporation regimes and droplet interactions and the properties of a produced layer via a
precursor in the droplets, e.g., morphology or electrical performance, depend highly on
deposition temperature. The deposition of ultra-thin metal oxide semiconducting layers from
solution-based spray pyrolysis require a wall temperature above LFP to achieve CVD-like
(chemical vapor deposition) growth of the oxide layer to achieve acceptable electrical
performance.[10,62] The deposition temperature for this process is also limited by the requirement
to provide sufficient activation energy to convert precursor molecules (e.g. ~ 350 °C as lower
temperature limit for zinc acetate) and prevent thermal decomposition of solutes and the
substrate (e.g. ~ 249 °C as upper temperature limit for polyimide).
To match the right surface temperature for the solvent and precursor can become challenging.
For solutes with strict thermal requirements and selective solubility, it can even become
impossible.
Previous systematic research describes the suitable deposition parameters for metal oxide
semiconductors such as zinc oxide[62] and indium oxide[10]. It indirectly describes the Leidenfrost
point and the optimal deposition temperature by investigating the produced films' morphology,
electrical properties, and precursor residues.
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Metal oxide thin-film transistors
19
3 Metal oxide thin-film transistors
3.1 History of and basics of field-effect transistors
The history of field-effect transistors began with their invention by William B. Shockley, John
Bardeen, and Walter H. Brattain in the 1940s in the Bell Lab.[63–65] It is undisputed that modern
devices such as processors or displays based on integrated circuits are only possible through
field-effect transistors' invention. It is consequent that the three inventors are members of the
Hall of Fame for patents.
Field-effect transistors have undergone enormous development since then, but the general
operating principle is the same: A transistor, in general, is a three-electrode device. The gate
contact controls the channel resistance between source and drain contacts. One member of
the field-effect transistor is the metal oxide semiconductor field-effect transistor (MOSFET). The
channel resistance is controlled capacitively by applying an electric field between source and
gate. The gate is separated from the other parts by a gate dielectric forming a capacitor. A very
well-known MOSFET system is silicon with silicon dioxide as gate dielectric (SiSiO2) introduced
by Atalla in 1960.[66]
A field-effect transistor can be built in various geometries. Typically, the position of the source,
drain, and the gate is described with respect to the semiconductor. A bottom-gate, bottom-
contact transistor, for example, implies that the dielectric has been deposited on top of a gate.
The source and drain contacts are located directly on top of the dielectric. The semiconductor
is deposited as the last layer on top. This configuration has advantages if the semiconductor
properties are studied because, after its deposition, no further process steps are necessary that
could influence the properties itself. This configuration is shown in Figure 3.1, together with the
measurement circuit and a microscopy image of source and drain contacts.
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Metal oxide thin-film transistors
20
Figure 3.1 a) Schematic side view of bottom-gate bottom-contact MOSFET b) a simplified version of
measurement circuit for thin-film transistor measurements c) Microscopic top view of the finger-like source
and drain contacts with W/L = 100 on SiO2 (scalebar = 500 m) for a L = 2000 m transistor.
In field-effect transistors, the conducting channel is formed either by e- (n-type channel) or holes
(p-type channel). For n-type channels a positive gate-source voltage pulls the electrons into the
conduction channel. Conversely, for p-type, the channel becomes conductive at negative gate-
source voltages. Conductivity increases in both cases with increasing absolute voltage.
The transistor is normally-on if it is conductive at 0 V gate bias and operates in depletion mode.
In case the channel conductivity is very low at 0 V gate bias, the transistor is described as
normally-off and operates in enhancement mode. The transistor switches its state when the
gate-source voltage exceeds the threshold voltage Vth.
Zinc oxide, which serves in this thesis as a model semiconductor for the group of metal-oxide
semiconductors, is an n-type semiconductor that is normally-off and operates in enhancement
mode.
If there is a voltage applied between Drain and Source, the channel material acts as a resistor.
For small Drain-Source voltages, the transistor operates in the linear regime, and the current
ideally scales proportionally to the drain applied voltage.[67]
𝐼𝐷,𝑙𝑖𝑛 = 𝑊𝐶𝑖
𝐿𝜇 (𝑉𝐺𝑆 − 𝑉𝑡ℎ −
𝑉𝐷𝑆
2) 𝑉𝐷𝑆
Where W and L are the channel width and length [m], Ci is the gate insulator capacitance
[F/cm2], and the charge carrier mobility [cm2/Vs]. From this, the linear mobility of the charge
carriers calculates as
µ𝑙𝑖𝑛 = 𝐿
𝑊 𝑉𝐷𝑆𝐶𝑖
𝑑𝐼𝐷
𝑑𝑉𝐺𝑆
and characterizes how quickly an electron moves for a given electric field. The linear mobility
is proportional to the conductivity. A few electrons with high mobility can result in the same
conductivity as many electrons with low mobility. In a semiconductor, the electron mobility
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Metal oxide thin-film transistors
21
depends on impurity concentrations, defect concentrations, temperature, and charge carrier
concentration. High electron mobility is desirable for semiconductors in transistors.
Increasing Drain-Source voltage leads to a transistor operating in the saturation regime, where
the Drain current ID saturates. This point is called pinch-off and is reached when VDS = VGS – Vth.
Substituting VDS into the equation describing ID,lin describes the current in the saturation ID,sat
regime:
𝐼𝐷,𝑠𝑎𝑡 = 𝑊𝐶𝑖
2𝐿µ(𝑉𝐺𝑆 − 𝑉𝑡ℎ)2
With further increase of the Drain-Source voltage, the Drain current remains essentially
constant and independent of the Drain-Source voltage.
Figure 3.2 Transfer (current between Drain and Source for variable gate bias) (a) and output (current
between Drain and Source for fixed gate bias) (b) characteristic of a zinc oxide thin-film transistor. Onset-
voltage VOnset (ID = 10-7 A) and threshold voltage Vth (at onset of current) are shown in the half-logarithmic
and linear plots of the drain current.
The Vissenberg-Matters model[68] for charge transport provides additional physical information
for highly disordered systems. It assumes that the charge transport occurs in the tail of an
exponential density of states, specifically between localized states. Charge carrier mobility is
then correlated to VGS by a power law:
µ = µ0 (𝑉𝐺𝑆 − 𝑉𝑡ℎ
𝑉𝑎𝑎
)𝛾
where 0 is the charge carrier mobility at VGS – Vth = Vaa and the disorder parameter. is
directly related to the width of DOS where charge transport occurs and, therefore, a measure
for the system's disorder.[69] For an ideal semiconductor is 0.
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Metal oxide thin-film transistors
22
3.2 Charge transport
Charge transport in solids is a broad research topic with already many existing models of charge
transport mechanisms. For this topic, the differentiation between highly ordered and disordered
semiconductors is essential. Extreme examples are defect-free crystalline solids for highly
ordered and disordered molecular or amorphous solids for disordered systems.
Figure 3.3 a) Schematic diagram of the density of energy states of a crystalline compound. Ec denotes as
the conduction band's energy, Ev as the valence band's energy, EF as Fermi energy. b) Band diagram of
the previous DOS. EG is the band gap energy. For n-type band transport occurs in the conduction band
upon the applied electric field.
Band transport occurs in the first case. Charges move through delocalized molecular
wavefunctions (valence and conduction bands) that expand over the entire crystal volume. This
molecular wavefunctions form the valence and conduction band. The difference between the
valence band's highest energetic states and the conduction band's lowest energetic state is the
band gap with the energy Egap. Materials with band gaps smaller than 0 eV (overlapping valence
and conduction band) or larger than 4 eV are metals and isolators. Conduction in materials with
band gaps between those energies is possible when free charges are available. Charges are
available after thermal excitation or through absorption of photons. The introduction of filled
states close to the conduction band (n-type) or empty states close to the valence band (p-type)
by dopants also provides free charges. Prominent examples are silicon doped with either
Phosphorus (n-type) or Boron (p-type).
With an increasing number of defects, more and more localized states exist within the band
gap. Defects can have multiple natures. A distortion of the lattice by extra, missing, or misplaced
atoms is one cause. Grain boundaries, where the lattices of multiple grains don't match or
dangling bonds that are satisfied with problematic groups like hydroxyl (OH), is another. A few
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Metal oxide thin-film transistors
23
traps already influence the transport of charge carriers, and the transport is called multi-trap
and release transport. Many electron-accepting states can cause the exponential tail in the
density of states that the Vissenberg Matters model accounts for, as described in the previous
chapter, and the transport is then hopping transport. In this case, conduction is energy
activated, and charges have to overcome barriers or tunnel between two states. Passivation of
such trap states can be done, for example, by chemical reaction with suitable molecules or
adding layers of passivating materials.
Figure 3.4 a) Schematic diagram of the density of states of a disordered compound. Exponential tail states
(shallow states) are marked in green; deep states within the gap are marked in red. b) Band diagram of
the previous DOS. Upon applying an electric field, Multi-trap and release transport or hopping transport
can occur.
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Experimental and theoretical methods
24
4 Experimental and theoretical methods
4.1 Density functional theory
Density functional theory (DFT) is a quantum mechanical ab initio method to investigate the
electronic structure (i.e., the ground state) of many-body systems based on the spatially
dependent electron density. It is widely used in physics, chemistry, and material science to
predict molecules and crystals' properties. The two Hohenberg-Kohn-Theorems[70] are the
theoretical basis of DFT. The first states that a specific electron density allows a connection to
the underlying external potential. The second states that the basic properties such as the
ground state energy of a many-electron system directly depends on the electron density (𝑟).
The energy of a system E[] is calculated as:
E[ρ] = F[ρ] + Ene[ρ]
Where F is the universal functional and E𝑛𝑒 the nucleus-electron interaction. Exchange-
correlation and kinetic energy are calculated by Kohn-Sham functions[71], which generate the
same density for a system of non-interacting electrons as any given system with interacting
electrons.
(−ℏ2
2𝑚∇2 + υeff(𝑟)) 𝜑𝑖(𝑟) = 휀𝑖𝜑𝑖(𝑟)
𝜌(𝑟) = ∑|𝜑𝑖(𝑟)|2
𝑁
𝑖
i is the orbital energy of a Kohn-Sham orbital i, eff is the Kohn-Sham potential and N is the
number of particles in the system. With the given Kohn-Sham theory the energy of a system
E[] is calculated as:
E[ρ] = T[ρ] + Ene[ρ] + Eee[ρ]
with kinetic energy T[], nucleus-electron interaction Ene[] and electron-electron interaction
Eee[]. The latter is the sum
E𝑒𝑒[ρ] = J[ρ] + EXC[ρ]
where J[] is the classical electrostatic repulsion of electrons and EXC is the exchange-
correlation term that accounts for the non-classical effects. Kohn-Sham equation are solved in
Page 34
Experimental and theoretical methods
25
self consistent manner. This is done by starting with an initial guess, i.e. of a molecule geometry,
and is followed by a Self Consistent Field (SCF) cycle. Within the cycle the Kohn-Sham orbitals
i are calculated for the given guess of and eff .for the geometry. For the calculated orbitals
the and eff are obtained. The self consistent field calculation is carried out until convergence
criteria are met and the energy and electron density for the given geometry is found. The
properties of the system are described by a functional of the electron density. The first
functionals used a local-density approximation (LDA). The functional uses the properties of a
free electron gas with constant electron density given by the local density at the point where it
is evaluated. It was further developed towards a local spin-density approximation (LSDA)
functional with accounting also for the spin. However, more accurate results are obtained by
generalized gradient approximation (GGA) functionals, which are taking the non-homogeneity
of the electron density into account. Another option are hybrid functionals that include a portion
of the exact exchange energy calculated by the Hartree-Fock theory. A widely used hybrid
functional is B3LYP (Becke three-parameter Lee-Yang-Parr),[72–76] which is also used for this
work's calculations. The exchange-correlation part calculates as
𝐸𝑥𝑐𝐵3𝐿𝑌𝑃 = (1 − 𝑎)𝐸𝑥
𝐿𝐷𝐴 + 𝑎𝐸𝑥𝐻𝐹 + 𝑏∆𝐸𝑥
𝐵 + (1 − 𝑑)𝐸𝑐𝐿𝐷𝐴 + 𝑐𝐸𝑐
𝐿𝑌𝑃
where a = 0.1161, b = 0.9262, d = 0.8133, x is the exchange part, c the correlation, B stands
for Becke functional and LYP for Lee-Yang-Parr.
In practical DFT calculations, the wave-function is represented with a set of known functions,
i.e. basis set:
𝜑𝑖 = ∑ 𝑐𝑖𝑗𝜒𝑗
𝑗
A distinction is made between basis sets composed of localized functions (linear combination
approach) for molecules or plane waves, which are used for solid-state calculations. In the
former case, typically Slater-type orbitals (STOs) or Gaussian-type orbitals (GTOs) are used.
Integrals involving Gaussian-type orbitals can be evaluated with less computational effort and
are thus usually preferred. However, GTOs make compared to STOs two qualitative mistakes:
1. GTOs have a no cusp close to the core (r → 0)
2. GTOs decay faster then STOs (r → ∞)
To compensate for this, one uses a linear combination of GTOs (contract atomic orbitals) to
instead of pure GTOs.
A commonly used Gaussian basis set family is the Pople basis set, [77–80] which is designated
as x-yzG. x stands for the number of Gaussians combined per core atomic orbital. Valence
orbitals are described by two functions (y and z) which are a linear combination of y or z
Gaussians, respectively. In this case, it is a split valence double zeta basis set. Higher zeta
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Experimental and theoretical methods
26
basis sets can also be used. Depending on the atoms being calculated, additional d and f
orbitals can be added to account for diffusion and polarization.
DFT provides not only the energy and the ground state density, but also forces on atoms which
can be used for geometry optimization. The geometry optimization is finished when for sum of
forces acting on the atoms is below a given threshold. Once this is done, for of a single molecule
and its relaxed electronic ground state in vacuum has been obtained, basic properties like bond
lengths, bond angles, electron density, or molecular orbitals (HOMO, LUMO) can be extracted
and visualized (Figure 4.1).
Figure 4.1 Left: DFT input of a molecular structure of a candidate for zinc oxide passivation. Right:
Visualized electronic ground state properties of a single molecule in a vacuum after geometry optimization
with B3LYP/6-31G.
The obtained electron density from the DFT calculation allows with further calculations to
determine of the following parameters among others:
• Accurate predictions of NMR shielding tensors and magnetic susceptibilities are usually
made with the Gauge-Independent Atomic Orbital (GIAO) method[81–85]. The Self-
Consistent Reaction Field (SCRF) is used with a polarizable continuum model (PCM)[86]
to account for solvation effects.
• Reliable estimation of XPS Core energies is done using the Koopmans theorem[87],
which states that the ionization energy is equal to the orbital's negative energy. After
geometry optimization, the requested electron is 'lifted' into the LUMO. The steepest
descent SCF calculates the difference in energy of this unstable state compared to the
ground state.[88]
• Calculation of total charge per atom in the molecule by e.g. Atomic polar tensors[89] (this
work), Mulliken[90], Hirshfeld[91] population analysis and others.
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Experimental and theoretical methods
27
4.2 Atomic force microscopy
Atomic force microscopy (AFM) is a high-resolution method[92] for raster-imaging the
topography of surfaces by monitoring the interaction of an (oscillating) probe with the sample.
AFMs can operate in three different modes: contact mode, tapping mode, and non-contact
mode. Today, tapping mode is the most common AFM mode and the applied mode in this
thesis. A cantilever oscillates at its resonant frequency (frequency modulation) or near its
resonant frequency (amplitude modulation) in tapping mode. Van der Waals forces, dipole-
dipole interactions, and electrostatic forces modulate the amplitude during the probe's
intermittent contact with the surface. A photodetector is measuring a laser reflection by the tip
of the cantilever during the oscillation. A controller compensates for the measured change in
the amplitude of the oscillation by adjusting the cantilever's height above the surface. Monitoring
the height of the controller gives the topography image. Additionally, the phase changes reveal
varying stiffness or different adhesion of the probe at the surface (Figure 4.2). Due to the precise
control with piezo elements, a resolution of sub-nanometers is achievable, which is up to 1000
times better than the resolution of an optical microscope at the diffraction limit.
Figure 4.2 a) Schematic setup of an AFM with height controlled oscillating cantilever, laser, photodiode,
and moving sample surface b) exemplary topography of ZnO.
By statistical analysis of the topography, different moment-based parameters like the mean
height Ra and the root mean square roughness Rq can be determined.
Ra =1
N∑ zn
N
n=1
and Rq = √1
N∑(zn − z̅)2
N
n=1
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Experimental and theoretical methods
28
4.3 X-ray photoelectron spectroscopy
X-ray photoelectron spectroscopy (XPS)[93] is a qualitative and quantitative element analysis
method at the surface of a sample. The intensity and energetic position of core photoelectron
peaks reveal the atomic composition of a sample and its chemical bonding. For this purpose, a
sample is irradiated in ultra-high vacuum (UHV) with X-rays generated by e.g. a Al or Mg source
with characteristic photon energies. Other common photon sources are UV lamps (UPS), lasers
or synchroton radiation. Due to the photoelectric effect, core electrons in the first 1 - 3 nm of
the surface absorb the energy and escape the material at the surface into the vacuum. The
kinetic energy (KE) of those emitted electrons is
𝐾𝐸 = ℎ𝑣 − 𝐵𝐸 − 𝛷𝑠𝑎𝑚𝑝𝑙𝑒
where BE is binding energy with respect to the samples Fermi energy, and Φsample is the work
function of the measured sample. Photoelectrons that pass an aperture and an entrance slit
enter a hemispherical electron analyzer. This analyzer filters photoelectrons by their kinetic
energy and is coupled with a channel electron multiplier to count the photoelectrons that pass
the exit slit.
A single peak is observable for s orbital electrons. Due to spin-orbit splitting, two peaks are
observable for electrons with non-zero angular momentum, i.e. p, d, and f orbitals. These peaks
show a defined area ratio depending on the orbital. Additionally, X-ray induced Auger peaks
and satellites are visible while measuring XPS spectra. Electrons from higher shells fill in the
vacancies of lower shells. The Auger electron from a third energetic shell is emitted by the
excess energy. Their peak positions are other than the X-ray photoelectrons discussed before
independent from the excitation energy. Other peaks that can be observed in the XPS spectra
are satellite peaks. They come from a second transition in the X-ray source. E.g., the less
intense radiation of Al Kα1,3 has 9.6 eV less energy and only 7.8% of the intensity.
For analysis of the chemical bonding, the chemical shift is calculated from the expected and
measured BE. This shift is usually in the range of a few meV to eV. Removing valence electrons
(oxidation), adding valence electrons (reduction), and the electronic effects of neighboring
atoms influence it the most. A fitted pseudo-Voigt function with Shirley background function
allows the precise extraction of peak position and full width half maximum (FWHM).
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Experimental and theoretical methods
29
Figure 4.3 a) Typical XPS measurement setup with photon source, sample, aperture, entrance and exit
slit, hemispherical analyzer, and detector and b) examplary XPS measurement plot.
4.4 Nuclear magnetic resonance spectroscopy
Nuclear magnetic resonance (NMR) spectroscopy is a standard method for the structure
elucidation mainly of organic molecules, but also inorganic compounds.[94] NMR also allows
verifying if a reaction occurs, quantifying the progress of a reaction and whether products are
pure or mixtures. In the health sector, magnetic resonance imaging is nowadays one of the
most important medical imaging methods.
In general, atomic nuclei give rise to a magnetic dipole moment that stems from their associated
spin-angular momentum (spin). When a nucleus is exposed to an external magnetic field 𝐵0⃗⃗⃗⃗ ⃗ it
splits into multiple energetic states. E.g., for a nucleus with a degenerated spin of 1/2 it can split
into the states -1/2 and 1/2. The energetically favored state is a parallel alignment with the
external magnetic field (spin α), and the less energetically favored state is the anti-parallel
alignment (spin ß). The energy difference between two spins is the Zeeman-energy and is
defined as
∆𝐸 = 𝛾 ∙ ℏ ∙ 𝐵0
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Experimental and theoretical methods
30
Where 𝛾and ℏ denote the gyromagnetic ratio and the reduced Planck's constant, respectively.
Because of quantization, the nuclear spin does not fully align with the external magnetic field
𝐵0⃗⃗⃗⃗ ⃗ and precesses around the z-axis of the magnetic field with the Larmor frequency. The
transition from the state spin α to the state spin ß can be excited by providing the resonance
energy ∆𝐸. Since the resonance energy is typically small compared to thermal energy (kB ∙ T)
and relatively easy to overcome, the population of both spin states is almost equal at room
temperature. The ratio depending on the absolute temperature T [K] can be described as a
Boltzmann distribution (kB = Boltzmann constant).
𝑁ß
𝑁𝛼
= 𝑒−∆𝐸𝑘𝐵𝑇 ≈ 1 −
∆𝐸
𝑘𝐵𝑇= 1 −
𝛾 ∙ ℏ ∙ 𝐵0
𝑘𝐵𝑇
Of course, only nuclei with a spin-quantum number 𝐼 ≠ 0 can be investigated by NMR. The
spin-quantum number depends on the exact composition of the respective nucleus, as
summarized in Table 4.4.1. Nuclei like 12C or 16O with an even number of protons and an even
number of neutrons have a nuclear spin of 0 and are thus NMR inactive. Popular NMR active
nuclei for liquid NMR measurements are 1H, 13C, 19F, 15N, and 31P (see Table 4.4.1).
Table 4.4.1 Overview of NMR active and not active nuclei. Red indicates no nuclear spin, thus no magnetic
moment and not NMR active. Green indicates a nuclear spin, thus a magnetic moment and NMR active.
Z (atomic number), N (neutrons) Nuclear spin number I examples
Z + N = even number Further distinction needed,
Z and N = even number I = 0 12C, 16O
Z and N = uneven number I = 1, 2, 3, … 2H, 10B, 14N
Z + N = uneven number I = 1/2, 3/2, 5/,2 …. 1H, 13C
An important factor for performing NMR experiments is the natural abundance of the respective
isotope. For example, the natural abundance of 1H is 99.9%, and thus high when compared to
13C, which only has a natural abundance of 1.1%. A lower abundance of course increases the
experimental time, but also, due to the spin dilution, does not allow to easily extract distance
information based on dipolar couplings between adjacent nuclei.
For the measurement, the sample is exposed to an electromagnetic wave to perturbate the
equilibrium nuclear magnetic dipole moment multiple times. The frequency of that pulse needs
to be sufficiently close to the Larmor frequency for the nuclear spins (depends on the measured
nucleus), and, for typically magnetic field strengths, lies in the radio-frequency (rf) range (MHz).
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Experimental and theoretical methods
31
The sample emits a time-dependent rf signal while return to Boltzmann equilibrium. The typical
NMR spectrum is then obtained by a Fourier transformation of the time-domain signal.
Figure 4.4.1 NMR setup with magnetic field B0 induced by magnets, sample, rf transmitter and rf receiver.
The resonance of for an isotope, namely the chemical shift δ, depends on its surrounding
electron density and is independent of the external magnetic field strength.
𝛿 =frequency shift from the reference [Hz]
spectrometer resonance frequency [MHz]ppm
A higher electron density shields the nucleus and leads to resonances at higher fields. Vice
versa, unshielded nuclei with lower surrounding electron density have a resonance towards
higher frequencies. Chemical binding, hybridization, and different neighboring atoms vary the
electron density around a nucleus. For example, an electron-donating neighboring group results
in a more shielded nucleus. Thus, the chemical shift is characteristic of nuclei in similar binding
situations.
Since NMR is quantitative, the integral ratios in e.g. 1H NMR spectra allow to determine the
number of protons in different chemical surroundings. Integral ratios of hydrogen resonance
signals reveal the atomic ratio in the measured substance. This information can help to identify,
for example, whether a keto- or an enol tautomeric form of a molecule is present by analyzing
the number of hydrogen atoms next to the ketone functional group.
The so-called direct spin-spin coupling, or J-coupling causes a splitting of the signal for
chemically bonded atomic nuclei. The number of observed resonances, the multiplicity, can be
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Experimental and theoretical methods
32
calculate for spin -1/2 isotopes like 1H as 1 + N, where N represents the number of coupled
nuclei. The coupling constants J are usually smaller than 5 Hz for 1H-1H-coupling. More
complex 2D experiments furthermore allow correlating the signals of different isotopes in
different chemical environments with each other.
4.5 Thermogravimetric analysis
Thermogravimetric analysis (TGA) is a method to monitor the change in mass of a sample over
time and temperature. This method allows measuring physical processes like evaporation or
sublimation. An increase or decrease in a sample's mass can also occur due to thermal
decomposition or chemical reduction/oxidation. Other processes that occur are phase
transitions, absorption, adsorption, chemisorption, and desorption.
During the measurement, a microscale continuously monitors the weight of the sample. An
oven heats the sample at a constant rate or a controlled rate with constant mass loss. Thermal
reactions can be monitored under defined atmospheres like ambient air, reducing atmosphere
(hydrogen), oxidating atmosphere (oxygen), or inert atmospheres (nitrogen, argon) and
different pressure regimes like a high vacuum, high pressure, and constant or controlled
pressure.
A TGA curve is understood as the measurement plotted as absolute or relative mass loss
versus time or temperature. The first derivative of that curve, the differential thermal analysis
(DTG) curve, allows further analysis and more in-depth insight into a reaction's kinetics.
Other analysis methods can be a useful addition to the TGA. Popular methods for TGA are
mass and IR spectroscopy and, lately, NMR. A coupled method can detect and identify reaction
and degradation products and assign them to a certain point of mass loss.
4.6 Fourier-transform infrared spectroscopy
Fourier-transform infrared spectroscopy is a method to obtain infrared absorption, emission, or
reflection spectra of solids, liquids, and gases.[94] It is based on the fact that molecules absorb
electromagnetic radiation at frequencies that match their vibrational frequency. These
frequencies depend, for example, on the molecular shape and the mass of the atoms. This
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Experimental and theoretical methods
33
method is useful for identifying substances or functional groups by analyzing their characteristic
molecular or lattice vibrations (see Figure 4.2). The measured spectra are usually plotted
against wave numbers (1/ in reciprocal centimeters [cm-1])
Figure 4.2 Overview of typical infrared absorptions of different functional groups and bond types.[95]
Molecules have 3N degrees of freedom depending on the number of atoms (N). These degrees
are divided into translational, rotational and vibrational degrees of freedom. A monoatomic
“molecule” has only the three translational degrees of movement which arrives from the ability
to move in space (three directions in Cartesian coordinate system). Linear and non-linear
molecules have additionally 2 and 3 rotational degrees of freedom, respectively. Subtracting
the translational and rotational degrees of freemdom from the total amount of degrees of
freedom (3N) results in 3 x N - 5 vibrational degrees of freedom for linear molecules and
3 x N – 6 vibrational degrees of freedom for non-linear molecules. To be IR active, a vibration
must have a dipolemoment.
For example, N2 has 1 degree of freedom, and H2O has 3 degrees of freedom. The nitrogen
molecule would not be visible in an IR spectrum because the vibration causes no change in the
dipole. It is Raman active instead. A two atomic molecule that is IR active would be carbon
monoxide (CO). IR spectroscopy is not limited to molecules with 2 or 3 atoms and can also
measure large molecules' molecular vibrations.
The molecules' vibrations are classified into stretching (symmetric and asymmetric) and
bending or deformation (scissoring, twisting, wagging, rocking, and torsion), as Figure 4.3
visualizes.
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Experimental and theoretical methods
34
Figure 4.3 Vibrational modes: a) symmetrical stretching and asymmetrical stretching, and b) in-plane
bending (rocking and scissoring) and out-of-plane bending (wagging and twisting).
A Michelson interferometer is a popular setup to measure an FTIR (Fourier transform infrared
spectroscopy) spectrum (Figure 4.4). Other than a traditional spectrometer, it measures an
interferogram, which is afterward converted to a useful spectrum by (fast) Fourier
transformation (FFT). Instead of measuring the absorption by changing the wavelength like a
traditional dispersive spectrometer, the sample is exposed to a broad IR radiation range. The
recorded interferogram is a function of the relative position of the scanning mirror in the setup.
This way, the FTIR spectrometer can collect data with a high resolution over a wide spectral
range.
The right sample preparation is essential for IR measurements to avoid the scattering effects
of large crystals. Standard sample preparation for solids is to 'dilute' a ground powder of the
sample with salts like KBr (potassium bromide), which is IR active at wave numbers below
< 200 cm-1. The mixture is then pressed at high pressures to a pellet, which IR radiation can
penetrate.
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Experimental and theoretical methods
35
Figure 4.4 a) Standard Michelson interferometer setup for measurement of transmission FTIR spectra.
The basic setup consists of a (broad range) IR source, collimator, beam splitter, two mirrors, and a
detector. It yields b) interferograms converted by Fourier transformation (FFT) to c) IR absorption spectra.
4.7 Scanning electron microscopy
Scanning electron microscopy (SEM) is a method of raster-imaging surfaces in a UHV chamber
using a focused electron beam.[96]
Electrons are emitted by either a thermionic, a Schottky or a field-emission cathode and
accelerated by a voltage difference (0.1 eV – 50 keV) between anode and cathode. This beam
is then demagnifed by an electron-lens system from its initial size (50 m – 10 nm, depending
on the source) to a probe size of 1 – 10 nm. The current at the speciem usually varies between
10-9 to 10-12 A
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Experimental and theoretical methods
36
Figure 4.5 SEM setup with Cathode, Anode, Condenser,Probe-forming lens, speciem and secondary
electron analyzer.
Elastic and inelastic scattered electrons at the speciem surface are analyzed. They are divided
by their gradual energy loss into secondary electrons (main 2 – 5 eV and up to 50 eV) ,
backscattered electrons (above 50 eV), Auger electrons (50 eV – 2 keV) and low-loss electrons
(energy close to the energy of primary electrons). The signal from secondary electrons were
used in this work and therefore explained in more detail. They origin from a few top layers (a
few nm) of a surface and are very susceptible for scattering. They can also be generated by
back scattered electrons besides their generation by primary electrons. The secondary
electrons are then collected by a positively biased collector grid and accelerated onto a
scintillator for quantization. The material contrast is achieved by the varying yield of secondary
electrons for different materials (depending on atomic number, chemical bonding and charges).
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Tailored organic surface passivation for metal oxide semiconductors
37
5 Tailored organic surface passivation for metal oxide
semiconductors
This chapter aims for the first approach to reduce process temperatures by utilizing a
specifically for this purpose tailored organic molecule class for surface trap passivation of zinc
oxide thin-film transistors. The theoretical characterization of the molecules, the passivation
process, and performance of the resulting thin-film transistors are discussed in chronological
order.
At first, the molecule class 1,3-diketone is introduced in general and theoretically described by
density functional theory calculations. This chapter's focus lies in the description of effective
charges at the oxygen atoms and the possibility to tailor these by different substituents.
Afterward, their chemical binding towards zinc oxide nanoparticles is investigated by 1H NMR
experiments to evaluate how and if they bind to a zinc atom.
For the passivation of zinc oxide thin-film transistors, the chemical bonding at the surface is
monitored by X-ray photoelectron spectroscopy and the stacking of the molecules at the surface
by atomic force microscopy.
At the end of the chapter, the increase in the transistors' performance and their stability against
positive and negative bias stress is evaluated. This is followed by a brief overview of the
experimental parameters used, a conclusion, and an outlook.
5.1 Concept of surface traps passivation by tailored organic molecules
Amorphous and polycrystalline transparent semiconducting oxides such as ZnO,[97–99] SnO2,[100]
In2O3, or In-Ga-Zn-O (IGZO)[101] are promising materials for optoelectronic applications.[102,103]
The combination of their semiconducting properties and transparency in the visible part of the
electromagnetic spectrum makes them suitable candidates for novel applications such as
transparent displays and electronics. Compared to expensive vacuum deposition methods,
cost-efficient alternatives for thin film deposition are solution-processing methods such as spray
pyrolysis. This deposition technique can be used with water as a solvent and therefore offers
the advantage of complying with green chemistry standards. However, as the main drawback,
these materials reveal instability against moisture at ambient atmosphere under electrical
operation.[104,105] Since the fabrication of electric circuits requires stable transistor
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Tailored organic surface passivation for metal oxide semiconductors
38
performances, several investigations about the origin of trap states and their passivation have
been carried out, showing that with decreasing layer thickness (d < 30 nm), the instability
increases. The instability for thin layers is caused by surfaces states that act as trap states
when they are sufficient close to the conducting channel.[8]
Besides annealing at elevated temperatures,[106] one approach to fabricate electrically stable
oxide layers under ambient atmosphere is to deposit a second oxide layer like Y2O3,[107]
Al2O3,[108] SiO2, [108]
HfO2[108,109] or MgO,[110] a nitride layer SiN[111] or a fluoride layer by SF6
plasma treatment ZnF[112] on top of the semiconducting oxide layer to minimize the influence of
the surrounding atmosphere. However, by using such an approach, the newly introduced
surface between the two oxide layers or the oxide/nitride layer or oxide/fluoride layer becomes
the main drawback besides the cost-intensive vacuum processes and higher material
requirements.
Earlier, Ortel et al. found that a self-assembled monolayer of hexafluoropropylene oxide
(HFPO) is increasing the long-term stability and electrical performance of solution-processed
zinc oxide thin-film transistors by passivating surface trap states.[113] HFPO is applied as gas
and has no chemical positions to vary the molecule properties via side groups systematically.
Similar approaches to successfully functionalize zinc oxide surfaces through the chemical
binding of organic molecules through an oxygen anchor atom are reported in the literature.[114]
However, the electrical performance and stability of such functionalized zinc oxide
nanoparticles was not investigated.
In the following parts of this chapter, the passivation process of 1,3-diketones on solution-
processed zinc oxide transistors is monitored. The electrical performance and stability are
investigated after passivation. There general structure and possible binding are shown in
(Figure 5.1).
Figure 5.1 a) Hydroxide group adsorbed at a dangling bond of zinc oxide b) the molecular structure of
functionalized 1,3-diketones coordinating to a zinc atom at the zinc oxide surface to passivate surface
state induced trap states. Depending on the surface structure, sigma bonding to one of the oxygens might
be possible as well (not shown). [reused with permission[9]]
Compared to the previous binding of organic molecules with a single oxygen anchor atom,
diketones offer two oxygen anchor atoms. These diketones can also be systematically tailored
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Tailored organic surface passivation for metal oxide semiconductors
39
compared to HFPO or alcohols for the specific goal of surface passivation. Changing between
four different functional groups at the phenyl ring influences the partial charge distribution of the
molecule. Functional groups vary from strong electron-withdrawing properties (EWG) (NO2, F,
and Cl) towards weak electron-donating properties (EDG) (Me) to tailor the partial charge
distribution of the molecule. Diketones of this class appear under ambient conditions as an
amorphous solid and can be handled therefore as more safe and controllable passivation than
a gas.
5.2 1,3-diketone molecules: theoretical characterization
The following part describes the electronic ground states of 1,3-diketones with focus on the
effective charge at the oxygen anchor atoms and the manipulation of those by tailoring with
different substituents.
Molecular structures often represent only one of the multiple possible organic molecules'
arrangements, even though other molecular structures can describe the same molecule. In
most cases, the chosen molecular structure represents the most probable configuration (the
predominant form under given conditions). Other molecular structures are energetically less
favorable or inhibited forms and called tautomers. Tautomeric structures represent these.
Ketones like the 1,3-diketones are subject to keto-enol tautomerism and form four different enol
structures (each oxygen atom can form an E and a Z enol form) in addition to the diketone
structure shown in Figure 5.2. The predominant and experimentally observable forms of
1,3-diketones are Enol 2 and 4. A coordinative hydrogen-oxygen bond is forming a six-ring and
thus energetically stabilizing the tautomer. This stabilization does not occur for the diketone as
well as Enol 1 and 3. However, all tautomeric forms are possible candidates to bind to the zinc
oxide surface chemically.
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Tailored organic surface passivation for metal oxide semiconductors
40
Figure 5.2 Molecular structures of diketone structure, where Enol 1 & 3 indicate the E configuration and
Enol 2 & 4 indicate the Z configuration (experimentally observable free molecule form). Red arrows
indicate the tailoring of the electron density at both oxygen atoms depending on the substituent and a
trifluoromethyl group as a strong electron-withdrawing group at the other side. [reused with permission[9]]
From a theoretical point of view and evaluating the total energy calculated by DFT is that the
Enol 1 configuration is energetically favored. This trend is valid for all substituents. The total
energy is reduced by 7.6–7.7 mEh (millihartree), compared to the Diketone form as a reference.
However, further evaluation is done only for the Diketone form because it exists in liquid and
gaseous states[115] and is the intermediate state the keto-enol tautomerism undergoes. It is
representing a trend throughout the different substituents that all five tautomeric forms follow.
The calculated total energies and the net charges at the oxygen atoms are listed in Table 5.2.1.
Table 5.2.1 Calculated energies using the DFT functional B3LYP and the basis set 6-31-G* for the
functionalized 1,3-diketones and their tautomeric forms and the calculated effective charge for both
oxygen atoms.
Form Substituent E (B3LYP) [Eh] ΔE compared
to Diketone [Eh] Effective charge
oxygen #1 Effective charge
oxygen #2
Diketone
CH3 −874.5581 0 −0.725 −0.542
Cl −1294.8343 0 −0.720 −0.540
F −934.4726 0 −0.709 −0.539
NO2 −1039.7365 0 −0.691 −0.537
Enol 1
CH3 −874.5657 −0.0077 −0.808 −0.733
Cl −1294.8419 −0.0076 −0.804 −0.729
F −934.4802 −0.0076 −0.793 −0.720
NO2 −1039.7442 −0.0077 −0.777 −0.715
Enol 2
CH3 −874.5369 0.0211 −0.768 −0.741
Cl −1294.8131 0.0211 −0.776 −0.742
F −934.4512 0.0215 −0.766 −0.731
NO2 −1039.7052 0.0314 −0.773 −0.726
Enol 3
CH3 −874.5384 0.0196 −0.706 −0.604
Cl −1294.8136 0.0207 −0.700 −0.601
F −934.4517 0.0210 −0.690 −0.597
NO2 −1039.7045 0.0320 −0.683 −0.593
Enol 4
CH3 −874.5425 0.0156 −0.775 −0.612
Cl −1294.8126 0.0217 −0.770 −0.659
F −934.4509 0.0217 −0.763 −0.662
NO2 −1039.7037 0.0328 −0.763 −0.662
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Tailored organic surface passivation for metal oxide semiconductors
41
As introduced before, one advantage of 1,3-diketones is the possibility of tailoring the net
charge at the oxygen anchor atoms. Substitution at the para-position of the phenyl ring is
directly influencing the electronic structure of the whole molecule. Different substituents
increase or decrease the effective charge, described by the partial atomic tensor, at both
oxygen anchor atoms. For example, a methyl group is a weak electron-donating group (EDG)
with a positive inductive effect. A substitution with a methyl group results in higher absolute net
charges. Chlorine and fluorine are weak electron-withdrawing groups (EWG) that can be
substituted. Their negative inductive effect results in lower absolute net charges at the oxygen
anchors. Its negative mesomeric effect makes the nitro group a strong EWG. Substitution with
such strong EWGs results in the smallest absolute net charges. Figure 5.3 visualizes the results
of the calculation. The calculated electron density of the substituted molecules is on the right
side next to the relaxed geometries. Red, white and blue colors indicate the electrostatic
potential.
The trend of systematic changes in the electronic structure is visible in the electrostatic potential
at the substituent itself and the para-carbon position in the phenyl ring. The substituents replace
the hydrogen at this carbon atom. The other carbon atoms within the ring are exposed less to
the electron-withdrawing or donating effect but pass on the effect towards the oxygen anchor
atoms. All modifications from negative (methyl group) to neutral (chlorine) and to
positive/neutral (fluorine and nitro) can reach the oxygen atoms. However, the relaxed
geometries of all molecules are not affected by the substitution of the para position of the phenyl
and ring and show no observable change.
A comparison between the oxygen atoms reveals that the oxygen atom (#2) near the strongly
electron-withdrawing trifluoromethyl group generally shows fewer negative net charges and
smaller relative changes than oxygen atom (#1). The phenyl ring next to the oxygen atom can
explain the smaller effect with its general rather electron-donating nature. By modifying the
phenyl ring with the groups mentioned above, it acts as a “buffer” against the oxygen atom (#1).
This buffer explains two effects. First, the absolute net charge at the oxygen atom (#1) does
not decrease as much as it does near the trifluoromethyl group. Second, the systematic
variation at the phenyl ring causes the net charge at both oxygen atoms to decrease less than
in a comparable structure where there is no phenyl ring between the substituent and carbon
atom bonded to the oxygen atom (#1). The final effective net charge of the oxygen atom (#1)
decreases from -0.725, -0.720, -0.709 to -0.691 by increasing the substituent’s electron-
withdrawing effect.
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Tailored organic surface passivation for metal oxide semiconductors
42
Figure 5.3 Relaxed structures (left) and electron density surfaces (0.1 e−/a03) (right) (variated at the para-
carbon position) calculated with DFT (B3LYP/6-31G*) with the substituent a) CH3 b) Cl c) F and d) NO2
(color coding: atoms: H: white, C: grey/black, N: blue, O: red, F: cyan and Cl: green, surface potential:
red = negative, blue = positive). [reused with permission[9]]
5.3 Chemical binding of passivation molecules to zinc oxide surfaces
The previous chapter discussed the electronic structure of the passivation molecules' ground
states and quantified their electron withdrawing/donating character. This chapter analyzes the
binding of passivation molecules towards zinc and should answer the following questions:
1. Does the passivation molecule chemically bind towards zinc oxide?
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Tailored organic surface passivation for metal oxide semiconductors
43
2. Can NMR give information about the exact binding situation or at least narrow down
the possible binding situations?
The analysis is done on the passivation molecule with R = F because of the additional fluorine
resonance in 19F NMR (one signal comes from CF3 and the other from the fluorine bond to the
para-carbon position of the phenyl ring).
For the monitoring of the reaction, pure passivation molecules were dissolved in deuterated
acetonitrile (acetonitrile-D3). Several of these solutions are mixed with ZnO nanoparticles in
different molar ratios and reacted for 1 day. 1H, 13C, and 19F NMR spectra were measured for
the resulting solutions.
The previous chapter introduced the tautomerism of 1,3-diketones. Therefore, all spectra that
are discussed in this chapter show resonances of energetically less favorable tautomeric forms.
Additionally to those signals, other signals from different residuals, additional resonance signals
from ZnO nanoparticles, and the deuterated solvent are visible throughout the different spectra.
However, all these resonances (besides the deuterated solvent resonance signal) show a minor
intensity (<< 1 %) and are not commented on. Only resonances with relevant integral (protons)
or significant resonance intensity (fluorine, carbon) are considered for the discussion. The
residual solvent resonance is used as an internal reference.
At first, the 1H NMR spectra of the pure passivation molecule (Figure 5.4) are discussed. The
resonance signals of the protons in the molecule are the status quo compared to the resonance
signals of molecules bound to zinc.
Figure 5.4 1H NMR of pure passivation molecule with R = F in acetonitrile-D3.
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Tailored organic surface passivation for metal oxide semiconductors
44
The three main resonance signals are visible at chemical shifts around 7 – 8 ppm in the low
field and are marked in blue, red, and green. These signals integrate for 5 protons. The signal
shifted to the lowest field at a chemical shift of d 𝛿 = 8.12 ppm are assigned to the two protons
in meta-carbon position at the phenyl ring and the signal at 𝛿 = 7.31 ppm to the remaining two
protons of the phenyl ring at the ortho-carbon position. The signal at 𝛿 = 6.80 ppm integrates
for only one proton and is assigned to the carbon atom between the ketones. The resonance
signal of the hydrogen atom bond to oxygen as an alcohol functional group is not visible and is
typically expected as a very broad resonance signal for this substance class at a chemical shift
of ~ 16 ppm[115], which is beyond the measured frequency range. Thus, the integral of the single
proton resonance signal proves that the most energetically favorable form of the molecule is an
enol form, where only one hydrogen atom is bound to the bridging carbon (see Figure 5.5:
Hydrogen atoms highlighted by a green dotted circle). The previous DFT calculations showed
that Enol 1 is the energetically favorable form. This NMR experiment confirms the presence of
mainly an enol form.
Figure 5.5 Keto-enol tautomerism of 1,3-diketones with highlighted hydrogen atoms at the bridging carbon
atom. Both enol forms have a cis and trans form.
At this point, some hypothetical binding situations of diketones towards a zinc atom are
discussed before analysis of the 1H NMR spectra of reacted molecules with zinc oxide. This
discussion describes which NMR spectra to expect for a particular binding situation. Reactions
leading to some of those binding situations require hydrogenation of the compound or other
additional reactions (which are unlikely under the given reaction conditions). Some might be
energetically very unfavorable and thus would not be measurable under normal conditions.
However, they are still mentioned to present a comprehensive list of possible binding
configurations. Sixteen (two possibilities per molecular structure) of these hypothetical binding
situations, where the molecule binds through one or both oxygen atoms (coordinative and/or
covalent) towards the zinc atom, are visualized in Figure 5.6.
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Tailored organic surface passivation for metal oxide semiconductors
45
Figure 5.6 Sixteen (two per enumeration) hypothetical binding situations of diketone molecules towards a
zinc atom (other bonds of zinc atom not displayed). CF3 or p-C6H4F are either bound as R´ or R´´.
If the passivation molecules bind in any of those molecular structures, additionally to the
resonance signals for the 4 protons of the phenyl ring, additional characteristic resonance
signals for the remaining protons are expected. Each particular binding situation (Figure 5.6
a) – e)) results in a combination of a number of resonance signals and a number of protons in
the 1H NMR spectra. Cases a) and d) can involve additionally a coordinative binding of the other
oxygen atom towards zinc (not shown). The protons bond to the bridging carbon for the cases
d), e), and f) are diastereotopic hydrogens and thus count as non-equivalent hydrogens
because their neighboring carbon atom(s) is/are chiral. They are expected to yield two signals.
These combinations for the shown molecular structures are listed in Table 5.3.1.
Table 5.3.1 Number of expected resonance signals and protons for hypothetical molecular structures
(Proton signals and counts of R-groups excluded). The expected chemical shift 𝛿 [ppm] is additionally
given as an machine learning approach estimation.[116]
Molecular structure a) b) c) d) e) f) g) h)
Number of resonance signals 1 2 1 3 4 5 3 3
Number of protons 1 2 2 3 4 5 3 3
Expected chemical shift [ppm] ~ 6.2 ~ 5.0
~ 6.0 ~ 4.0
~ 3.3
~ 3.7
~ 5.5
~ 2.2
~ 2.4
~ 4.0
~ 5.1
~ 2.1
~ 2.3
~ 2.8
~ 4.4
~ 4.9
~ 3.2
~ 5.6
~ 5.8
~ 5.2
~ 5.9
> 10
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Tailored organic surface passivation for metal oxide semiconductors
46
At this point, the result of the 1H NMR of the reaction between passivation molecules with zinc
oxide nanoparticles (d < 100 nm) in a 1:1 ratio (molecules per zinc atom) is discussed, and the
identified relevant signals are compared to the resonance signals of the pure molecule and a
reference measurement of pure zinc oxide nanoparticles (see Figure 5.7).
Figure 5.7 Comparison of 1H NMR spectra of zinc oxide nanoparticles (top), pure passivation molecules
(bottom) and the reaction product of a 1:1 mixture (middle). Highlighted protons belong to the phenyl ring
(blue), the bridging carbon (red), hydroxyl groups at zinc oxide surface (green), and different solvent
residuals (grey & yellow).
The spectra reveal 5 groups of signals (blue, red, green, grey, and yellow). The resonance
signals highlighted in blue and red (shifted to the lower field) correspond to the protons of the
passivation molecule as discussed before (blue: phenyl ring, red: bridging carbon between the
ketones) and integrate in both measurements for 4 and 1 protons, respectively. All three signals
shift after the reaction with zinc oxide towards a higher field and are now located at 𝛿 = 8.05,
7.24, and 6.43 ppm. These shifted signals are the first indicator for chemical binding of the
molecules towards zinc oxide nanoparticles. Since there is only one resonance signal of the
passivation molecule that integrates for one proton (additional to the signals for the protons of
the phenyl ring), the measurement indicates the binding situation a) (see Figure 5.6 and Table
5.3.1). This binding situation can be reached by a simple condensation reaction between
hydroxyl at the zinc oxide surface and the passivating molecule.
The resonance signals highlighted in green are assigned to hydroxyl groups and chemisorbed
H2O present at the surface of zinc oxide.[114,117] The broadening of those peaks arises due to
different chemical environments for hydroxyl groups on the surface of the ZnO nanoparticles.
The signals shifts from 𝛿 = 2.13 ppm before passivation to 𝛿 = 2.33 ppm. The existence of the
peak after passivation in a 1:1 ratio indicates that not all chemisorbed water molecules and
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Tailored organic surface passivation for metal oxide semiconductors
47
hydroxyl groups are replaced by passivations molecules yet. However, the resonance signal is
shifted due to the new chemical environment of the zinc oxide surface, which is now partly bond
to passivation molecules. The remaining resonance signals are assigned to the deuterated
solvent acetonitrile-d3 (grey) and n-hexane or n-pentane (yellow) residuals.
The binding situation a) of the molecule does not specify whether the molecule is bound towards
the oxygen atom close to the phenyl ring or on the other side of the molecule close to CF3.
Comparing the expected chemical shifts of either molecule will not finally answer this question
but gives a tendency (see Figure 5.8).
Figure 5.8 Comparison of simulated 1H NMR resonance signals with the experimentally measured
resonance signals.
Variation of the molar ratio between zinc and the molecules by increasing the molecule
concentration reveals how many molecules can bind per zinc atom. For example, if two
molecules can bind to one zinc atom and the molar ratio is 1:4, then the ratio of free molecules
per bound molecules is expected to be 1:1. The expected ratio is plotted against the molar ratio
in Figure 5.9 for the cases that 1 molecule binds per zinc atom (red), 1.5 molecules bind per
zinc atom (yellow), 2 molecules bind per zinc atom (green), and three molecules bind per zinc
atom (blue). The measured ratios extracted from 1H NMR by integrating the hydrogen between
both carbonyl groups are shown as black stars and are in good agreement with the case that
one zinc atom can bind up to two molecules for the case that the zinc atome is isolated.
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Tailored organic surface passivation for metal oxide semiconductors
48
Figure 5.9 Molar ratio of zinc and passivation molecules vs. the ratio of free molecules to bound molecules
plotted for the cases where 1 (red), 1.5 (yellow), 2 (green), or 3 (blue) molecules chemically bind per zinc
atom. Measured ratios are extracted from the 1H NMR integrals are plotted as black stars.
Finally, all measurements are shown as an overview in Figure 5.10.
8 7 6 5 4 3 2 1
diketone-F
5:1
4:1
3:1
2:1
1:1
chemical shift [ppm]
ZnO
1H NMR in ACN
mol ratio molecule : zinc atom
exce
ss o
f p
assiv
atio
n
JK509
JK510
JK511
JK512
JK513
JK514
JK515
Figure 5.10 1H NMR measurements of zinc oxide nanoparticles (pure), 1,3-diketone with R = F, and
mixtures of both in different molar ratios. The experiments were measured in acetonitrile.
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Tailored organic surface passivation for metal oxide semiconductors
49
5.4 Passivation process monitoring
The previous chapter describes the chemical binding of diketone passivation molecules to zinc
oxide in solution. This chapter describes the morphology and presence of the diketone
passivation molecules on a solid-state zinc oxide surface. It also confirms whether the zinc
oxide weakly adsorbs the passivation molecules or chemically binds to them when they
passivate through a vacuum instead of reacting in solution.
AFM measurements help identify the surface's coverage by the diketones and characterize
their growth behavior. For that purpose, the diketone molecule with the methyl substituent
passivated the zinc oxide surface for a series of deposition times (0 s, 30 s, and 3600 s). The
other variations of the diketones are assumed to behave similarly, based on the similar
geometric and electronic ground state properties calculated by the DFT. The passivation
process divides into three phases, which Figure 5.11 visualizes in parts a, b, and c. Each part
shows a sketch of the observed surface, the respective topography with a dimension of
2.5 x 2.5 m2, and extracted height profiles. The non-passivated sample (Figure 5.11 a,
passivation time = 0 s) shows a surface of accumulated small spheres typical for zinc oxide
after deposition with a roughness of Ra = 0.57 nm. After a passivation time of 30 s (Figure 5.11
b), an almost closed self-assembled passivation layer is visible on top of the bare zinc oxide
surface. This surface is with a roughness of Ra = 1.74 nm, slightly rougher than zinc oxide. The
two extracted height profiles show the 2D topography of stacked molecules (red) and still
exposed underlying zinc oxide (blue). Both profiles differ in terms of the hill/valley distance and
height. The step height between a stack of molecules and zinc oxide is around 4 – 5 nm and,
therefore, as large as the height difference between two stacks of molecules. That corresponds
to approximately 4 – 5 molecules for their longest dimension from the optimized geometry by
DFT. After a passivation time of 3600 s (Figure 5.11 c), a fully closed bulk layer of passivation
molecules is visible on top of zinc oxide. The surface roughness significantly increased to
Ra = 9.5 nm. Zinc oxide spheres and molecule stacks are not visible anymore. The bulk
passivated surface is essential for electrical evaluation of the passivation performance since
incomplete organic layers close to the surface reduce the performance and even cause an
initial worsening of the zinc oxide.[118]
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Tailored organic surface passivation for metal oxide semiconductors
50
Figure 5.11 The schematic side view (left), AFM topography (center), and extracted height profile (right)
of a) 12 nm thick bare ZnO layer deposited by spray pyrolysis, b) ZnO surface passivated for 30 s with
the molecule shown above (R = CH3) and c) ZnO surface passivated for 60 min with the same molecule.
[reused with permission[9]]
The NMR spectra indicated that diketones chemically bind to zinc oxide nanoparticles from
solution. It is essential for passivated transistors to know whether the zinc oxide weakly adsorbs
in vacuum-deposited organic passivating molecules or if, in this case, a chemical binding
occurs. Comparing three XPS spectra of bare ZnO, bulk passivated ZnO, and the passivation
itself gives information about the different binding situations. Bare zinc oxide is compared to the
bulk passivated sample to achieve a good contrast between the binding energies. A sample
with shorter passivation time includes signals of both passivated and non-passivated areas.
Silicon peaks and part of the oxygen signal come from silicon with natural oxide, which is the
substrate in all three cases. The measurement of pristine diketones with methyl substituent is
the reference spectra. Figure 5.12 shows the measured overview spectra, and Table 5.4.1 lists
the detailed information about the fitted binding energies and FWHM.
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Tailored organic surface passivation for metal oxide semiconductors
51
Figure 5.12 XPS measurement of top/black: bare zinc oxide, middle/blue: passivated zinc oxide surface
60 min (R = CH3) and bottom/red: passivation molecule only (R = CH3). [reused with permission[9]]
The highlighted signals (Zn 2p 1/2, Zn 2p 3/2, and F 1s) allow following the molecules'
presence and thus to monitor the passivation process. A deposited passivation layer at the
surface reduces the Zn 2p signal compared to bare zinc oxide, and additionally, an F 1s signal
is observable. The binding energy of Zn 2p 3/2 decreases from 1029.5 eV (bare zinc oxide) to
1025.3 eV (passivated zinc oxide). The first is the characteristic binding energy of zinc bonds
in zinc oxide, and the second is zinc bonds to oxygen from an organic molecule.
The 1H NMR results of zinc oxide showed resonance signals that belong to the surface species
of zinc oxide, i.e. chemisorbed water or hydroxyl groups. Before passivation, two O 1s signals
with binding energies of 532.2 eV and 533.9 eV are attributed to the oxygen (O2−) within the
zinc oxide crystal and the aforementioned oxygen species (OH or H2O) at the surface,
respectively. Both signals disappear after passivation. The now observable O 1s has a new
binding energy of 534.6 eV, which corresponds to the passivation molecule's oxygen. The
passivation molecules (binding energy of 534.6 eV) replace hydroxyl groups or chemisorbed
water (533.9 eV) and other species at the surface.
Two C 1s signals of the molecule shift by 0.2 – 0.3 eV towards higher binding energy while the
binding energy of the C 1s signal from the CF3 group decreases by 0.4 eV. These findings
validate the NMR results that the molecules bind chemically to the ZnO surface.
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Tailored organic surface passivation for metal oxide semiconductors
52
Figure 5.13 XPS measurement of Zn 2p 3/2, F 1s, O 1s and C 1s for top: bare zinc oxide, middle:
passivated zinc oxide surface 60 min (R = CH3) and bottom: passivation molecule only (R = CH3).
Considering the shift of all binding energies of Zn 2p, F 1s, and C 1s reveals an unsystematic
shift that seems not to be induced by a change in the work function. A shift induced by
workfunction would shift all binding energies by the same amount.
The resulting composition of Zn:C:O:F is 2.0 : 12.3 : 3.6 : 3.1, indicates one passivation
molecule per two zinc atoms present in the XPS measurement volume.
Table 5.4.1 Measured Zn 2p 3/2, F 1s, O 1s, and C 1s binding energies (FWHM) for bare ZnO, passivated
ZnO, and the molecule (both R = CH3).
Bare ZnO (FWHM) [eV]
passivated ZnO (FWHM) [eV]
Molecule (R = CH3)
(FWHM) [eV]
Zn 2p 3/2 1029.5 (2.78) 1025.3 (2.90) –
F 1s – 690.8 (2.78) 690.5 (2.80)
O 1s 532.2 533.9
(2.58) 534.6 (2.85) 534.6 (2.82)
C 1s – 287.3 290.1 294.8
(2.61) 287.0 289.9 294.4
(2.61)
5.5 Performance of passivated thin film transistors
Electrical measurements of the ZnO thin-film transistors in the form of transfer curves are
carried out to evaluate the electrical performance and stability against BIAS stress before and
after passivation. From these data, the on-set voltage and hysteresis are extracted.
A theoretical curve has been fitted to the IV transfer characteristic according to the equation in
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Tailored organic surface passivation for metal oxide semiconductors
53
chapter 3.1 [68,69] to extract the electron mobility μ0 and disorder exponent for fixed Vaa = 50 V.
The passivated sample by the diketone with CH3 as a substituent is investigated regarding the
exposure time as representative for the other molecules. Stability after positive and negative
bias stress (PBS/NBS) was investigated for all molecules after two days of storage under an
ambient atmosphere. Some improvements in electrical properties are attributed to storing thin
zinc oxide films, which explains the lower off-current compared to the initial sample after
production and passivation. Figure 5.14 a shows that the hysteresis is clearly reduced
compared to a not passivated thin film transistor with about H = 6.0 V to H = 2.2 V after 5 s
exposure time and to H < 1 V for longer passivation times. The threshold voltage shifts from
Vth = 4.4 V to Vth = −7.3 V with increasing exposure time. Also, with longer passivation times,
the off-current increases and does not depend on the gate-voltage anymore. The disorder
parameter is raising from = 1.53 for 5 s passivation time to = 1.74 after 30 s passivation time
and then decreases to = 1.32 for 1 min and even further to = 1.08 after 60 min passivation
time. The smaller value of the disorder parameter indicates that there are fewer trap states
within the channel, and thus a more ideal TFT behavior is observable. Also, the electron mobility
follows the same trend and is dropping from μ0 = 3.14 cm2/V for a 5 s exposure time to
μ0 = 2.28 cm2/V for 30 s passivation time. For 1 min passivation time, the mobility is rising to
μ0 = 3.60 cm2/V and for 60 min further to μ0 = 5.22 cm2/V. TFTs utilizing the other three
passivation molecules achieve μ0 = 5.71 cm2/V and = 1.35 for Cl, μ0 = 4.60 cm2/V
and = 1.13 for F and μ0 = 4.54 cm2/V and = 1.23 for NO2 as substituents after 60 min of
passivation time. The initial worsening of mobility and disorder parameter below 1 min of
passivation time is caused by incomplete coverage of the surface by passivation molecules.
Improvement of the performance is observed after full coverage[118].
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Tailored organic surface passivation for metal oxide semiconductors
54
Figure 5.14 a) Transfer characteristic for different passivation times at VDS = 2 V for the molecule
(R = CH3) b) transfer characteristics for a 60 min passivated TFT before and after PBS/NBS stress with
VGS = ± 20 V for 4000 s at VDS = 5 V. [reused with permission[9]]
Analyzing the effect of negative and positive bias stress (4000 s) on the transistors electrical
performance after 60 min of passivation time shows an onset-voltage (ΔVOnset) shift (NBS/PBS)
of −1/3 V for CH3 (Figure 5.14 b), 0/4 V for Cl, 0/10 V for F and −0.5/12 V for NO2 (Figure 5.15).
Compared to an unpassivated zinc oxide TFT, which experiences an onset-voltage shift of
ΔVOnset = 14 V/19 V, all passivation molecules result in improved stress stability. All molecules
strongly reduce the effect of the negative BIAS stress, most of them even to ΔVOnset = 0 V. The
effect of positive BIAS stress correlates to the effective charge at the oxygen anchor atoms
calculated by DFT. Utilizing molecules with more electron density in the phenyl Ring (CH3 and
Cl) and, therefore, a more negative effective charge at the oxygen atoms results in higher
stability against positive BIAS stress. The best performance is observed for the molecule
(R = CH3).
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Tailored organic surface passivation for metal oxide semiconductors
55
Figure 5.15 Onset shift after PBS/NBS stress for bare ZnO and passivated samples with the substituent
R = CH3, Cl, F, and NO2 respectively after 60 min passivation and the effective charge for oxygen atom
#1 of the respective molecule. [reused with permission[9]]
5.6 Fabrication and characterization of thin-film transistors
Parts of the experimental parameters for this section are adapted with permission.[9]
Synthesis of 1,3-diketones is described in literature R = Me,[119–121] F,[119] Cl,[119–121], and NO2.[122]
Fabrication of ZnO thin-film transistors: Highly n-doped silicon wafers with predefined
source/drain contacts were used as substrates for ZnO thin-film transistors in a bottom-gate-
bottom-contact configuration. The thermally grown SiO2 layer (230 nm) and the silicon served
as gate dielectric and gate contact. 30 nm Au and 10 nm ITO served as source/drain contacts.
The predefined channel length was 20 m with a channel width of 2000 m. Before ZnO
deposition, the substrates were cleaned by 2 min ultrasonication in acetone (tech. grade),
followed by 10 min ultrasonication in a mixture of acetone and isopropanol (1:1, VLSI grade)
and finally rinsed with deionized water (18.3 MΩ) for 1 min. The substrates were dried first with
nitrogen and then on a hotplate at 120 °C before 10 min UV/ozone treatment. After the cleaning
steps, ZnO was deposited by spray pyrolysis using a custom setup utilizing an IWATA HP-B
Plus airbrush. The distance between the airbrush and the substrates was set to 250 mm, and
nitrogen was used as the carrier gas. 350 L of a 0.3 M zinc acetate dihydrate in deionized
water was sprayed under ambient conditions with 14 spray pulses (25 L each) at a substrate
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Tailored organic surface passivation for metal oxide semiconductors
56
temperature of 360 °C to deposit 12 nm thin zinc oxide layers. The samples were then annealed
at 500 °C for 45 min before analyzing and passivation. During the passivation process, samples
were placed in an evacuated desiccator at a pressure below 40 mbar upside down above the
passivation molecules with a distance of 20 mm. Passivation times of 5 s, 30 s, 1 min, and
60 min were used.
Chemicals: The Si/SiO2 substrates with predefined source and drain electrodes were obtained
from Fraunhofer IPMS. Zinc acetate dihydrate (99.999% metal trace basis) and used solvents
were ordered from Sigma-Aldrich. All materials were used as received, if not other mentioned,
without further purification.
Characterization methods: Electrical characterization of the transistors were conducted under
ambient atmosphere with a Keithley 2612A sourcemeter. If not other mentioned, samples were
characterized directly after production. The drain-source voltage VDS was kept constant at 2 V,
while the gate-source voltage VGS was swept from -20 V to 50 V and reverse. Onset-voltage
(Vonset) was extracted at 10-7 A and the hysteresis (H) at 10-6 A.
Positive and negative bias stress were conducted by applying a drain-source voltage of
VDS = 5 V and a gate-source voltage VGS = 20 V and -20 V, respectively, for 4000 s. Surface
topography imaging was carried out using a Veeco atomic force microscope (AFM). For X-ray
photoelectron spectroscopy, a Specs PHOIBOS 100 hemispherical energy analyzer and non-
monochromatized Al Kα1,2 radiation (E = 1486.6 eV) was used. The fitting of the XPS data was
done by the program CASA:XPSTM. A pseudo-Voigt-function was employed to fit the curves,
and a homogenous layer model was assumed.
1H NMR (400 MHz), 13C NMR (100 MHz), and 19F NMR (376 MHz) were recorded on a JEOL
ECX 400 MHz spectrometer.1H, 13C, and 19F NMR chemical shifts (𝛿) are reported in ppm from
tetramethylsilane (TMS), and CFCl3, using the residual solvent resonance as an internal
reference. Coupling constants (J) are given in Hz.
Computational methods: For all molecules and their tautomeric structures, geometries were
optimized. Calculations were done by density functional theory (DFT) with B3LYP (Becke
three-parameter Lee-Yang-Parr)[72–76] exchange-correlation functional and the Gaussian 09
code[123]. 6-31G*[79] was used as a basis set for all atoms (H, C, N, O, F and Cl). Afterward, the
frequency calculations were carried out, and it was ensured that no imaginary vibrations were
calculated. Avogadro[124] software was used to visualize the computational structures, where
the electron density is visualized with an iso value of 0.1 e-/a03. The electrostatic potential is
visualized by a color-coding with red, white, and blue referring to negative, neutral and positive
potentials, respectively. Atom colors are assigned as the following: H: white, C: grey/black, N:
blue, O: red, F: cyan, and Cl: green.
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Tailored organic surface passivation for metal oxide semiconductors
57
NMR resonance shifts were simulated by a machine learning algorithm of commercially
available software.[116]
5.7 Conclusion and outlook
This chapter described the passivation of solution-processed zinc oxide thin film transistors.
DFT was applied to calculate diketone properties before experimental passivation. Those
calculations revealed the diketones' systematic variation by utilizing substituents with an
electron-donating group (CH3) and electron-withdrawing groups (Cl, F, and NO2). The
substitution took place at the para carbon position of the phenyl ring. The methyl group as an
electron-donating group caused the highest electron density (most negative effective charge)
at the oxygen anchor atoms. The substitution by chloride, fluoride, and nitro continuously
decreased the electron density at the oxygen anchor atoms due to their increasing electron-
withdrawing effect. The electrostatic potential revealed that the electron density in the phenyl
ring significantly varies with different substituents.
The chemical binding of 1,3-diketones was shown for zinc oxide nanoparticles by 1H NMR
experiments and compared to theoretically expected and simulated resonance signal shifts.
The passivation of the zinc oxide surface was realized by evaporation of the diketone
molecules. Chemical bonding was further confirmed by XPS and the presence of the molecules
on the surface could be clearly followed by monitoring the F 1s peak. AFM measurements
additionally showed that the molecules deposited at the surface in stacks of 4 - 5 molecules.
Passivated thin-film transistors show clearly improved electrical properties regarding electron
mobility, hysteresis, and disorder parameter gamma. Also, there is a systematic shift of the
threshold-voltage to more negative values indicating less trapped electrons. The thin-film
transistors are stable under electrical stress, i.e., hysteresis is reduced to H < 1 V, and onset-
voltages do not shift under negative BIAS stress. Overall, the unreliable electrical performance
of solution processed zinc oxide thin film transistor induced by the trap states induced by, e.g.,
hydroxyl groups at the surface, can be significantly improved by diketone passivation. The
smallest improvement corresponds to diketones having side groups with electron-withdrawing
groups, while the best results are shown for thin-film transistors passivated by diketones with
the methyl group as a substituent due to the most negative effective charge at the anchoring
oxygen atoms.
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Tailored organic surface passivation for metal oxide semiconductors
58
Follow up research on this topic might be utilizing additional carbonyl groups in the molecules
with the same functional distance, namely triones or quadrones. The latter might polymerize at
the surface as they are known to produce polymers by reaction with zinc. Another possibility is
to reduce or increase the carbonyl groups' functional distance, which would inhibit or enhance
the enol tautomerism, respectively. The introduction of heteroatoms could increase the affinity
of the molecules towards zinc and is known from medicinal approaches.
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Fluorinated Carboxylates as zinc oxide precursor
59
6 Fluorinated Carboxylates as zinc oxide precursor
This chapter aims for the second approach to reduce spray pyrolysis process temperatures by
identifying precursors with decomposition temperatures. In this thesis, perfluorinated zinc
carboxylate derivatives are investigated as new precursors for zinc oxide synthesis. After a
short motivation, the presence of FTIR absorption bands of zinc oxide for annealed precursor
is analyzed to prove that these compounds are suitable for zinc oxide production. Afterward,
the necessary reaction temperature for the conversion of the precursors to zinc oxide is
determined by TGA measurements. At the end of the chapter, a conclusion and an outlook are
given.
Perfluorinated zinc carboxylates are an interesting molecule class with the potential to be
utilized as a precursor for zinc oxide synthesis. The molecule class is a derivative of zinc
carboxylates, such as zinc acetate, that was used as the zinc oxide precursor in chapter 5. It is
known for zinc acetate that the transition to zinc oxide occurs at temperatures higher than
T = 325 °C in two main steps. First, acetic anhydride is split off after heating, and a tetranuclear
‘basic’ zinc acetate cluster is formed. After reaching temperatures higher than T = 360 °C, this
cluster decomposes into zinc acetate and acetic anhydride (see Figure 6.1).
Figure 6.1 Thermal conversion of zinc acetate to zinc oxide. (Ac = Acetic).
Such tetranuclear cluster analogue are also known as a stable intermediate for fluorinated zinc
carboxylate derivates in literature and were synthesized for different purposes, such as
transesterification of ß-keto-esters.[125] Also, methyl zinc-containing or TMEDA
(Tetramethylethylendiamin) containing fluorocarboxylates were used as atomic layer deposition
(ALD) zinc oxide precursors.[126] These precursors have the main drawback of decomposing to
zinc fluoride at higher temperatures. This thesis is utilizing the pure perfluorinated carboxylate
complexes without additional methyl or TMEDA groups. An exemplary optimized structure by
DFT (B3LYP/6-31G*) of a basic tetranuclear trifluoro zinc acetate cluster is shown in
Figure 6.2.
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Fluorinated Carboxylates as zinc oxide precursor
60
Figure 6.2 Optimized geometry of a tetranuclear basic trifluoro zinc acetate cluster by DFT
(B3LYP/6-31G*). Color coding: C: grey/black, O: red, F: cyan and Zn: violet.
For the investigation, whether the fluorinated zinc carboxylates Zn(RCOO2)2 (R = CF3, C2F5,
C3F7) are suitable precursors for thermal conversion to zinc oxide, the precursor were annealed
to 500 °C for 1 hour in a quartz crucible and the residue was analyzed by FTIR. The spectra
were compared to the spectra of zinc oxide nanoparticles (200 nm) and the spectra of zinc
acetate and trifluoro zinc acetate as examples of unreacted precursor molecules in Figure 6.3.
Figure 6.3 FTIR spectra of pure precursor zinc acetate (pink) and trifluoro zinc acetate (yellow), zinc oxide
nanoparticles (200 nm, black) and annealed precursor (500 °C, 1 h) zinc acetate (red), trifluoro zinc
acetate (green), pentafluoro zinc butyrate (blue) and heptafluoro zinc propionate (cyan).
All spectra show at around 3500 cm-1 a weak absorption band from adsorbed water or the water
of the atmosphere . Some spectra also show a weak absorption band for atmospheric CO2 at
around 2300 – 2400 cm-1. Both precursors show an absorption band for C=O at around
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Fluorinated Carboxylates as zinc oxide precursor
61
1500 cm-1 for zinc acetate and 1670 cm-1 for zinc trifluoro acetate. Zinc acetate shows four more
absorption bands at 1010 cm-1, 953 cm-1, 699 cm-1 and 615 cm-1 which are attributed to C-C
and C-H bonds. For trifluoro zinc acetate analogue absorption bands can be seen at
1440 cm-1, 1160 cm-1, 850 cm-1, 800 cm-1, and 725 cm-1. They are attributed to C-C and C-F
bonds. Furthermore, the zinc oxide reference shows the three typical merged strong absorption
bands around 500 cm-1.
The annealed spectra show that a major part of the pure precursors' absorption bands almost
completely disappear and the characteristic absorption band for ZnO is visible in all cases. This
can be interpreted as an almost full conversion of the precursors into zinc oxide, which makes
the precursors suitable for zinc oxide production. The presence of some impurities can be
caused due to the closed quartz crucible, where byproducts and fumes cannot fully evaporate
and escape. Pulsed spray pyrolysis allows processing of such precursors, where byproducts
can evaporate between two pulses and the impurities of the resulting layers are reduced.
The thermal degradation of the fluorinated zinc carboxylates and zinc acetate was then
analyzed by a TGA to determine the thermal degradation temperature.
50 100 150 200 250 300 350 400
0
20
40
60
80
100
mass lo
ss p
erc
en
t (%
)
temperature (°C)
Zn(OC(O)CH3)
2
Zn(OC(O)CF3)
2
Zn(OC(O)C2F
5)
2
Zn(OC(O)C3F
7)
2
Normalized to (0,100)
Figure 6.4 TGA measurements of zinc acetate (black), trifluoro zinc acetate (red), penta fluoro zinc
butyrate (green) and heptafluoro zinc propionate (blue).
Zinc acetate (black) as standard precursor shows that the first conversion into basic zinc
acetate occurs between 75 – 100 °C and is followed by a plateau. The second reaction step,
the conversion to zinc oxide, then begins at 200 °C and is fully converted at 360 °C. Zinc
trifluoroacetate (red) shows the initial conversion to basic zinc trifluoroacetate over a broad
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Fluorinated Carboxylates as zinc oxide precursor
62
temperature range between 50 – 275 °C. The final thermal conversion to zinc oxide occurs at
360 °C, which is higher then the process temperature of zinc acetate.
Pentafluoro zinc butyrate (green) shows analog to the trifluoro zinc acetate a thermal
conversion that occurs over a wide temperature range of 50 - ~250 °C. The higher temperature
limit can not be clearly defined, as there is no clear plateau. This means that the basic zinc
pentafluoro butyrate already reacts to zinc oxide while the first conversion step is still ongoing.
The final temperature where zinc oxide is obtained is 325 °C.
The two conversion steps of heptafluoro zinc propionate (blue) merge even more together and
temperature limits can be clearly defined. The final conversion to zinc oxide occurred for this
precursor at 250 °C, which is advantageous compared to zinc acetate for zinc oxide production.
From the point of view to reduce process temperatures for thin-film zinc oxide production by
spray pyrolysis, the latter precursors heptafluoro zinc propionate is a suitable candidate.
However, the precursor does not dissolve in water or other non-hazardous solvents like
alcohols and thus, the processing as an aqueous solution or other environment-friendly solution
is at this point not possible and was not further pursued.
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High-speed real-time analysis of picoliter droplets under spray pyrolysis conditions
63
7 High-speed real-time analysis of picoliter droplets under
spray pyrolysis conditions
This chapter aims for the third approach to reduce process temperatures by (mainly) top-view
video of recording picoliter droplets with a high-speed camera under real application conditions,
i.e., in a spray pyrolysis setup. The primary deposition relevant processes from droplet
generation to evaporation mechanisms at hot surfaces are discussed in chronological order.
At first, the extraction of meaningful physical parameters from droplet images is explained and
then directly applied to determine the droplet diameter distribution after atomization. The mean
diameter is a fundamental parameter for this chapter.
Afterward, raytracing is introduced. Throughout the rest of the chapter, the droplet appearance
is compared to theoretically rendered droplets with extracted physical parameters to verify the
experimental findings.
After a short discussion of the two types of observed droplets, static and moving, an explanation
of the formation and interaction of sessile droplets follows. An evaporation model for sessile
droplets is presented and allows straightforward extraction of static and dynamic contact angles
depending on the contact line's velocity.
At the end of the chapter, a novel Leidenfrost like meta-stable hovering state of picoliter droplets
at low temperatures is presented, followed by experimental parameters, a conclusion, and an
outlook.
7.1 Cross-section analysis of droplet diameter after atomization
After detecting a droplet in an image, different methods allow the extraction of its edge position
and subsequently properties like diameter, circumference, area, roundness, or the mean
intensity of the pixels within a droplet. A straight forward approach is a binarization of the image
by a threshold value. In the simplest case, the threshold is a fixed value. In an 8-bit grayscale
image (the recorded images in this work) where the minimum value is 0 and the maximum is
255, a fixed threshold lies in between these two values. For example, if the threshold should be
at 50% of the intensity value, it would take the value 127. After binarization, pixel values below
the threshold become 0, and values above become 1.
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High-speed real-time analysis of picoliter droplets under spray pyrolysis conditions
64
Ideally, for the droplet analysis, droplets now appear as black circles separated from a white
background. However, this approach is prone to unstable or uneven illumination. The
background intensity can vary, for example, because of droplet clusters flying through the
optical path, reducing the illumination intensity temporarily. Also, droplets' pixels can become
blurred and vary in their intensity depending on how well focused a droplet is by the optics.
Droplets that are entirely in focus appear darker. Also, multiple droplets can overlay and appear
darker together. A filter could remove droplets that are not suitable for analysis, which would
drastically reduce the number of drops included in the statistics.
Advanced binarization algorithms can tackle the illumination problem with adaptive threshold
values. The adaptive threshold value is calculated, for example, as a Gaussian kernel for each
pixel individually depending on the pixel value and the values of its pixel neighborhood. It is not
fixed for a whole image like a static threshold value and depends highly on the number of
considered neighboring pixels and a subtracted offset constant. The optimal parameters can
fluctuate within a dataset and between different datasets.
However, varying the threshold value for each pixel might help detect droplets’ edges in images
with varying illumination and throughout a dataset with thousands of images where the
background is unstable. On the other hand, with varying threshold values, the precise extraction
of droplets’ edges is not accurate and does not yield physically meaningful contact lines.
At this point, the cross-section analysis is introduced. For example (see Figure 7.1), the cross-
sections of a droplet in X and Y direction (a), and the same rotated be 45° (b), are analyzed.
The droplet edge is located where the slope of the intensity is the highest. This can be easily
mathematically determined by the first derivative of the cross-sections that reveal the highest
intensity increase or decrease in the profile with the position of its maximum and minimum
(marked in Figure 7.1 as big colored circles). Thus, both extreme points in a cross-section
represent the exact position of the contact line (c), and the distance between both is the
diameter of the droplet. The latter is statistically determined by this technique from multiple
cross-sections and can also handle droplets that are not entirely focused. Thus, this technique
delivers meaningful and consistent physical data.
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Figure 7.1 Cross-section analysis of sessile droplet. Cross-sections in X and Y direction a), and cross-
sections in XY and YX plane b) yield a mean diameter of 19.7 m. The extracted position of the contact
line is superimposed onto the droplet c) (1 pixel ~ 3 m).
As the starting point for the droplet analysis, the atomized droplets are characterized by
applying the cross-section analysis. Therefore, Figure 7.2 a) shows a recorded side-view image
of droplets that leave the nozzle after atomization. The nozzle's atomization platform is visible
as a blurred black silhouette at the top of the image. Droplets in focus are visible as black
circles. Other not entirely focused droplets appear blurred and lighter in intensity. Analysis of
droplets in 5000 frames with 2 kHz framerate for different atomization power (varying amplitude
of the atomization platform) gives a histogram of the droplet diameter distribution. The diameter
distribution is plotted in Figure 7.2 b). For visualization purposes, the curve was smoothed by
a kernel density estimation (by Gaussian mixture model). The used ultrasonic atomization
nozzle generates asymmetric distributions of droplet sizes at an atomization frequency
f = 130 kHz. Each distribution has a shoulder to larger diameters (D > 30 m). Higher power
generates droplets with a sharper distribution and a larger mean diameter compared to lower
power. The majority of droplets have diameters from 10 to 30 m. However, the calculation of
droplet properties in the following chapters is done only for a single droplet diameter of
d = 25 m.
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Figure 7.2 a) Generated droplets leaving the atomizing platform (black silhouette at the top of the image)
with scale bar = 50 m b) Kernel density estimation (by Gaussian mixture model) of diameter distribution
for different atomization powers.
7.2 Raytracing and droplet appearance
Rendering of photorealistic images is based on the principle of raytracing and was first
introduced by Appel in 1968[127] and Goldstein and Nagel in 1971[128]. Raytracing is mostly
applied in the entertainment industry for digital film production and video games, in which the
image quality has been significantly improved in recent years through real-time raytracing. In
this thesis, ray tracing is used to render certain top-view scenes of drops near a silicon surface
to simulate droplets' appearance at a different height. It also allows the comparison of measured
sessile droplets with known contact angle Θ and flying droplets to their theoretically expected
appearance to verify the extracted droplet parameters. The basic principle of raytracing is that
rays emitted by a source are tracked through a scene, in this case, the droplet on the substrate
and the surrounding atmosphere, until they reach an observer or camera. Raytracing was done
in this thesis using in the working group already existing self-coded raytracing scripts.
Physical processes such as reflection at object surfaces or refraction while propagating from
one medium into another can be precisely calculated using the material properties. With this
approach, images can be rendered whose realism is very close to real pictures. Besides the
scene's geometry, the wavelength of the light ( = 447.5 nm), the optical constants n and k
depending on the wavelength (nair = 1.00, nwater = 1.33, nSi = 4.70, kSi = 1.04 x 10-9 @ 447.5 nm),
and the F-number of the optics (F = 8) are needed to render the image. More realism can be
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achieved by taking spherical aberrations or interference into account. Also, the number of
reflections until a ray is being dismissed can be increased. 4 Reflections were taken into
account in this work. Figure 7.3 a) shows an incoming tracked ray 1 (black) with a path through
the air towards a sessile water droplet on a silicon surface. At the surface of the droplet,
reflection 1 and refraction occur 2. Lighter red indicates attenuated light intensities due to beam
splitting. After reflecting at the silicon surface, part of the ray undergoes TIR (total internal
reflection) within the droplet 3, and a significant part of the ray is leaving the droplet 4. Figure
7.3 b) illustrates the fully rendered image showing the sessile droplet in top view (XY-plane) on
the silicon surface. Light is observable in the middle of the droplet, where a major part of the
light propagates through the droplet and is reflected at the silicon surface towards the camera.
The intensity of the reflected light reduces drastically when proceeding towards the edge of the
droplet, where major parts of the light are reflected at the surface of the droplet at an angle that
is not received by the optics.
Figure 7.3 Raytracing example of a 65.45 pL H2O sessile droplet on Si surface with a contact angle
Θ = 19.8°, illuminated with monochromatic blue light ( = 447.5 nm), and a F-number of 8: a) Side view
of traced ray. Black indicates initial light intensity where decreasing intensities are shown by lighter getting
red. The scene contains reflection, refraction, and propagation through media (1,2,4) and total internal
reflection (TIR, 3). b) Rendered top view image (XY-plane) of the sessile droplet where more white
indicates higher light intensities and blacker the opposite.
Recorded top-view images in a perpendicular arrangement with respect to the monitored silicon
surface do not provide height information about the droplet above the surface until it becomes
sessile. Raytracing allows limiting the height of a droplet into 4 categories, without further need
of side-view images (see Figure 7.4). A droplet that is approaching the surface (1) but is still far
away (100 – 1000 m) appear blurred because of the used optics. Droplets closer to the
surface (10 – 100 m) appear as sharp black circles (2). A droplet that crosses the height of
10 m and approaches the surface very close (3) can be identified by a vigorous white intensity
that is almost filling the full visible circle. Here the drop acts like a microlens in focal distance
above the surface. Once a droplet makes contact with the surface (4), the larger visible area is
clearly visible due to spreading and a small spot of high light intensity in the center.
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Figure 7.4 Illustrated droplets at different heights a) and the expected appearance rendered with raytracing
b). 1) 100 – 1000 m: blurred appearance, “) 10 – 100 m: sharp black visible circle, 3) 10 m: strong
light intensity filling almost the full visible circle, and 4) the sessile droplet: enlarged visible area with a
small spot in the center of high light intensity.
7.3 Sessile and moving droplets: Indicator for Leidenfrost temperature
A significant change in the behavior of droplets at hot surfaces occurs at the Leidenfrost
temperature TL. Droplets start hovering on their own (sacrificial) vapor layer without direct
contact with the surface. The initial and most trivial assessment of the Leidenfrost temperature
is to monitor whether droplets come into direct contact with the surface forming a sessile
droplet, or hover above the surface. For that, three states can be distinguished in the droplet
analysis: 1. spherical droplet moving at velocity v above the surface, 2. from a side perspective
(slightly) elliptically shaped droplet experiencing the Leidenfrost phenomenon and moving near
the surface, and 3. sessile droplet with a direct interface to the heated substrate surface.
Representative image sequences for droplets with status 1 and 3 are shown in Figure 7.5 a).
The schematic side view in Figure 7.5 b) illustrates that the droplets at the bottom of the field
of view do not experience the Leidenfrost phenomenon and therefore wet the substrate surface
after making contact. This can be seen in the frame sequence by following the red dotted
droplet. After wetting the surface, this droplet is heated immediately to boiling temperature on
the surface and begins to evaporate. This evaporation process is visualized for 4.5 ms.
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Figure 7.5 a) Continuously evaporating sessile evaporating water drop on a silicon wafer (red dotted circle)
visualized over a 4.5 ms time interval recorded below the Leidenfrost temperature for a substrate
temperature of T = 140 °C. b) Schematic side view of drops below the Leidenfrost temperature. Shown
are sessile drops with a direct interface to the heated surface, moving drops close to the surface (single
appearance and optically sharp), and further above moving drops, which are quadrupled due to pulsed
illumination and/or optically blurred along their trajectory due to their velocity. [reused with permission[129]]
In addition to the highlighted sessile droplet, other free moving droplets are visible. Optically
sharp droplets can be recognized as being close to the surface (10 – 100 m from raytracing).
Some droplets are very close to the surface ( < 10 m from raytracing) and can be identified
due to the intense white light reflex in the droplet center. The main force acting on the droplets
is the surface tension, which maintains for droplets with such small volumes (V < 100 pL) their
spherical shape. Their area appears smaller than the initial area of a droplet after wetting the
surface, where it spreads. These droplets are illustrated in the schematic as droplets close to
the surface but not in contact. They differ from the higher moving droplets by a noticeably slower
speed of movement. The remaining droplets move faster and with a larger distance to the
surface. They appear more blurred when they are beyond the field of view of the used optics.
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It can also be observed that due to their relatively high speed, these droplets blur along their
trajectory and thus appear stretched. The fastest droplets appear as four single sharp droplets
with higher brightness along their trajectory. The quadruple pulsed exposure achieves this
optical superimposing during the acquisition of a frame. These droplets are illustrated in the
schematic in the upper part of the field of view.
Figure 7.6 a) Moving drop experiencing the Leidenfrost phenomenon (red dotted circle) with an
observation time of 7.5 ms recorded above the Leidenfrost temperature for a substrate temperature of
T = 210 °C. b) Schematic side view of drops at and above the Leidenfrost temperature. Shown are moving
drops experiencing the Leidenfrost phenomenon, moving drops close to the surface (individually and
sharply visible), and further above moving drops, which are quadrupled due to pulsed illumination and
optically blurred along their trajectory due to their velocity. [reused with permission[129]]
Figure 7.6 a) highlights with the red dotted circle a droplet that is moving through the camera's
lateral field of view. This droplet experiences the Leidenfrost phenomenon and glides with
constant speed on its own gas phase. The base area of the droplet does not decrease during
the 7 ms observation time. The evaporation rate is very low because of the vapor layer that
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thermally isolates the droplet from the surface. A small light reflex is visible in the droplet center
that gives the information that the droplet hovers at a height around 10 m above the surface.
Droplets experiencing the Leidenfrost phenomenon are illustrated in Figure 7.6 b) at the bottom
close to the substrate surface. Droplets that move at a greater distance from the substrate
surface are described and illustrated in the same way as in Figure 7.5. By observing the droplets
of interest as described in Figure 7.5 and Figure 7.6, the temperature range of the LFP can be
narrowed down with little effort. From this simple approach, a Leidenfrost temperature of
TL = 210 °C is measured for picoliter droplets on a silicon wafer. An exact determination based
on the observed evaporation rate is made by statistical evaluation in chapter 7.3.
7.1 Formation of sessile droplets and their interaction with the
environment
The formation of sessile droplets (as described Figure 7.7) is a key factor for the quality of a
process in many applications below the Leidenfrost temperature. The following formation
scenarios could be observed.
Figure 7.7 Temporal sequence of sessile droplets formation at a heated surface. Incoming droplet(s) at 0
ms, spreading at the surface at 0.5 ms, and the full spread sessile droplet at 1 ms. Showing for the trivial
case (a) of one droplet hitting the surface and complex cases of up to 5 droplets (b - e) incoming and
spreading simultaneously resulting in a single sessile droplet. Droplet events were observed in a
temperature range of T = 115 – 170 °C. [reused with permission[129]]
A single droplet approaches the surface in the trivial case until it makes contact. Wetting creates
an interface with the substrate surface (Figure 7.7 a). The droplet is visible before wetting and
overlaps as a sessile droplet with a formed interface at the substrate surface within a frame due
to the quadruple pulsed exposure. In this scenario, it can be assumed that the volume of the
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sessile droplets Vsub is equal to the volume of the droplet in air Vair before making contact. For
droplets of this size, the contact and spreading on the surface takes ~ tr (introduced in the next
subchapter), which is less than 125 s (experimental resolution, time period between two light
pulses), and their appearance is proportional to the rate of incoming droplets.
A sufficiently high droplet flow and a high local and temporal droplet density near the substrate
allow further sessile droplet formation scenarios. Single droplets that do not follow the trivial
case described above now reach the substrate surface by merging with two or more droplets.
Figure 7.7 (b-e) shows how several droplets (up to five in this example) collide and combine
their volumes on the substrate surface. The wetting and spreading of these droplets on the
substrate surface take place in the same time frame as the trivial case. The volume of the
resulting droplet Vsub is the sum of the initial droplets in air Vair,n. Multi-droplet formations result
in an increased lifetime of the sessile droplets compared to sessile droplets formed from a
single droplet.
In a third scenario (shown in the evaporation model discussion), droplets that have not yet
followed the trivial case meet already sessile evaporating. The combined volume and the
adjusted temperature of both droplets affect the already running evaporation process and
contact angle. The second and third scenarios extend the trivial view of the first scenario that
the lifetime and evaporation dynamic of the droplets depend not only on the average volume of
the generated droplets but also on the interaction of several droplets with each other. At low
temperatures, the third scenario leads to complete coverage of the surface by the liquid if the
total incoming flow rate is higher than the evaporation rate and the volume increases faster
than the evaporation process occurs.
In Figure 7.8 a), the interaction of an evaporating sessile droplet with neighboring droplets
below the Leidenfrost temperature is recognizable. As known by literature, a sessile droplet
evaporates predominantly at the edge.[55] Due to the additional hot gas volume created locally
around the droplet, the local pressure increases, resulting in the acceleration of the neighboring
droplets (red) near the substrate away from the droplet. This effect is visible within the first
500 s after evaporation starts. The horizontal flow of air along the substrate surface creates
further turbulence, creating a suction towards the evaporating droplet. Nearby droplets (green)
at the suction level are accelerated in the evaporating droplet's direction, which takes place with
a time delay of about 500 – 1000 s after the evaporation starts.
At surface temperatures above the LFP, the interaction of evaporating droplets with nearby
droplets is neither repulsive nor attractive. This finding suggests that the droplets that come
critically close to the substrate at temperatures greater than or equal to the LFP do not
evaporate locally at the edges, and not such unequal pressure conditions are created. In
Figure 7.8. b) a droplet is shown, which comes critically close to the substrate with a surface
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temperature just above the LFP and undergoes secondary atomization. The secondary smaller
droplets are accelerated so fast that they are only weakly recognizable in the next light pulse
and have already left the field of view in the following frame.
Figure 7.8 Interaction of evaporating drops a) below the Leidenfrost temperature and b) above Leidenfrost
temperature (T = 210 °C). While below the Leidenfrost temperature, drops near the substrate surface are
repelled from the evaporation center, higher moving drops are attracted to the evaporation center with a
time delay. Above the Leidenfrost temperature, no interaction with neighboring drops can be observed.
Here the evaporating droplet undergoes secondary atomization (yellow arrows). [reused with
permission[129]]
7.2 Evaporation model of sessile droplets: Ad hoc extraction of the
contact angle
Temperature evolution of the substrate
For pico-liter droplets (rair ≤ 12.5 m) gas bubbles or bubble ring formations are not observed,
in contrast to other studies on evaporation behavior of larger droplets. This holds for boiling
below the Leidenfrost temperature. Therefore, the observed area and diameter can be directly
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used for analysis without the need to account for any gas bubbles inside the droplet, which
would increase the volume.
Droplet processes as the impact at the surface, spreading, oscillations of the droplet shape at
the surface, and flow of droplets is commonly characterized by the Ohnesorge number (Oh),
Weber number (We), and Reynolds number (Re).
The characteristic heat diffusion length L for time t after contact with a hot surface is L = (αt)0.5
with α the thermal diffusivity.
For water (α = 0.143x10-6 m2/s at 25 °C) and after a frame-to-frame period t = 500 s, the heat
diffusion length is L = 8.5 m. This is about 2/3 of the droplet height at the center. The
evaporation is expected to start immediately within the first frame at the edge of the droplet
where the local height goes to zero. Correspondingly, for the further evaluation evaporation at
the edge of the droplet is assumed as also reported in literature.[55]
To verify, that the silicon substrate temperature remains essentially unaffected by the drop
evaporation process, the corresponding heat equation in the substrate was numerically solved
(details in experimental part). The calculation shows that the substrate temperature variation
remains small and less than 1 °C (see Figure 7.3).
Figure 7.9 a) Temperature change over time at different positions relative to the droplet, b) spatial
temperature change at specific times at r = 0. [reused with permission[129]]
An initial cooling of the substrate can be seen close to t = 0 ms, when the droplet is initially
heated up to boiling temperature and starts to evaporate. This depends on the place on the
substrate, i.e., the local drop height. Afterward, the temperature change stays almost constant
for the full evaporation time. The substrate heats up to the initial temperature as soon as there
is no more contact with the drop. Figure 7.3 a) shows that this occurs at different places on the
substrate at different times and with different temperature transfer. The substrate provides the
remaining energy for the evaporation of the droplet in the center of the droplet and cools down
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further until it heats up to the initial temperature. Figure 7.3 b) shows that the change of
temperature in the center of the drop is the highest at any time. However, as mentioned above,
the temperature change of the substrate is less than 1 °C and thus for the experimental
temperatures observerd in this thesis less then 1% and is neglected in the further analysis.
Evaporation model
The experimental setup allows to measure the visible droplet radius in air rair from phase 1 and
the visible droplet radius on the substrate rsub after landing while evaporating (phase 2 and
phase 3).
Thus, the temporal change of rsub(t) during the droplet's lifetime T on the surface is known. For
the following evaporation model it is assumed that the volume evaporation rate is proportional
to the circumference of the droplet
�̇� = −𝒄 ∗ 𝒓𝒔𝒖𝒃 (4)
with proportional constant c. Knowing the initial volume 𝑽𝟎 =𝟒𝝅
𝟑𝒓𝒂𝒊𝒓
𝟑 we can determine this
constant c to
𝒄 = 𝑽𝟎
∫ 𝒓𝒔𝒖𝒃(𝒕)𝒅𝒕𝑻
𝟎
(5)
The volume of the droplet on the surface during evaporation (phase 2 and 3) is given by
integrating over time as
𝑽(𝒕) = 𝑽𝟎 − 𝒄 ∫ 𝒓𝒔𝒖𝒃(𝒕′)𝒅𝒕′𝒕
𝟎 (6)
Knowing the volume V and the contact radius rsub and assuming a spherical cap shape and
contact angles smaller than 90° allows straight forward calculation of the contact angle Θ for
any time while the droplet resides on the surface.
𝐭𝐚𝐧 (𝜽
𝟐) = 𝒌 −
𝟏
𝒌 with 𝒌 = (√𝟏 + (
𝟑𝑽
𝝅𝒓𝒔𝒖𝒃𝟑 )
𝟐
+𝟑𝑽
𝝅𝒓𝒔𝒖𝒃𝟑 )
𝟏
𝟑
(7)
Finally, the ß spread factor calculates as ß = 𝑟𝑠𝑢𝑏
𝑟𝑎𝑖𝑟 .
The visible area of a droplet as a function of time is divided into three phases as mentioned
before (Figure 7.10). In the initial phase the incoming droplet is spherical and freely moving
above the surface. In this phase, the droplet has no direct contact with the substrate and
experiences no significant temperature increase. The second phase begins after the droplet
hits the surface, and the enlarged visible area has formed. For picoliter droplets in this work no
relevant over-spreading is expected.[130] For a droplet with a diameter d = 25 m the receding
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motion of the contact line starts after impact and initial spreading at tr ~ 15 s.[130] Thus, the
overall formation time is very short (< 125 s) and below the experimental resolution. The
droplet starts to heat up, and significant evaporation begins. This is attributed to phase 2. The
beginning of this phase is marked on the time scale as t = 0.
Figure 7.10 Temporal evolution of the visible area of an evaporating sessile droplet divided into three
phases. 1: Droplet in air, 2: evaporation with pinned area beginning with static contact angle Θa until it
decreases to static contact angle Θr, 3: evaporation with moving contact line and a dynamic receding
contact angle Θdr. Calculated contact angle is shown in blue and calculated volume is shown in red. ß
spread factor is shown as crosses. Transition between static advancing and receding contact angle and
dynamic receding contact angle is indicated by a grey zone. Above the graph selected images from the
droplet over time together with simulated images by raytracing. Enlarged images of the mapped droplet
are available in the SI. [reused with permission[129]]
This phase is characterized by a constant visible area indicating a pinned outer contact line.
The evaporation where the visible area is decreasing linearly is attributed as phase 3. The
evaporation occurs with dynamic receding contact angle Θdr. Finally, the droplet is fully
evaporated. The total lifetime of a sessile droplet is therefore the sum of phase 2 and 3. The
observed linear decrease of the contact area with time correlates mathematically with an
evaporation rate proportional to the contact radius when assuming a constant contact angle.
Obtained contact angles agree with raytracing simulation of the observed droplet images
(Figure 7.10 Upper part). Droplets evaporate in phase 2 with a pinned constant contact area
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and a dynamically decreasing contact angle starting with the advancing contact angle Θa. until
Θr is reached. After transition to phase 3 the contact angle now depends on the contact line
movement and is referred to as dynamic receding contact angle Θdr
For DI-water on silicon with natural oxide at T = 110 °C an advancing contact angle
Θa = 37.2 ± 3.3° and a receding contact angle Θdr = 9.1 ± 1.6° was measured by analysis of
36 droplets and is consistent with the apparent contact angle reported in literature for very thin
SiO2 layers.[131]
The transition from a static contact angle regime to the dynamic contact angle regime is
visualized in Figure 7.11.
Figure 7.11 Droplet appearance at different evaporation points: a) static contact angle evaporation regime
(Θa ≥ Θ ≥ Θr), b) transition between static and dynamic evaporation regime, and c) dynamic contact angle
evaporation regime (Θr ≥ Θ ≥ Θdr). Each stage is visualized by simulated top-view, experimental top, a
side-view sketch and side-view with reflection image. [reused with permission[129]]
As mentioned in chapter 7.1 as the third scenario, under real conditions it can occur that
droplets can collaps into already evaporating sessile droplets. They combine their volume and
start to evaporate as a sessile droplet with increased volume. In general, this evaporation event
of multi-droplets can be analyzed analogous to single droplets . V0 is the combined volume of
all droplets that evaporated together as a single sessile droplet. For ß spread factor calculation,
rair is calculated from the combined volumes from the time points on, where the second (or
further droplets) droplet merged into the sessile droplet. For this kind of event four different
cases can be distinguished (see Figure 7.12).
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Figure 7.12 Different cases of a droplet that collides into a sessile evaporating droplet. Either the new
droplet hits the evaporating droplet at the contact line with a) Vsecond drop < Vevap (small volumes), and b)
Vsecond drop >> Vevap. Or it hits the droplet from the top with c) Vsecond drop ≤ Vevap, and d) Vsecond drop > Vevap.
The incoming droplet can hit the evaporating sessile droplet at the contact line (Figure 7.12
a and b) or from the top (Figure 7.12 c and d). For cases a and b, the visible area of the droplet
is increased in any case. If the volume of the incoming droplet is too small to compensate for
the evaporated volume and the increased visible area, the contact angle Θ is smaller than the
static advancing contact angle Θa. This case is visualized in Figure 7.13.
Figure 7.13 Temporal evolution of the visible area of an evaporating sessile droplet that is hit by a second
droplet. The evaporation is divided into three phases. 1: Droplet in air, 2: evaporation of a single droplet
analogue to figure 4, and 3: droplet is hit by another droplet and volume, area and contact angle increase,
before evaporation continues. Calculated contact angle is shown in blue and calculated volume is shown
in red. ß spread factor is shown as crosses (d0 is the combined volume of both droplets from phase 3 on).
Above the graph selected images from the droplet over time together with simulated images by raytracing.
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For case b, in which the volume of the incoming droplet is sufficient large enough, the contact
angle Θ can take values up to dynamic advancing contact angle Θda. The latter occurs if the
incoming volume is so large that the contact angle for the new volume and contact area is larger
than the static advancing contact angle Θa. The contact line velocity increases and the visible
area is spreading. While spreading and with moving contact line, the system can take contact
angles up to the maximum dynamic advancing contact angle Θda. As soon as the contact line
velocity is 0 the contact angle is equal to the static advancing contact angle Θa.
For case c, the volume of the evaporating droplet is refilled if the volume of the incoming droplet
is smaller or equal to the already evaporated volume. The contact angle can become at
maximum the static advancing contact angle Θa. In case d, the volume of the incoming droplet
is larger than the already evaporated volume, the contact line will have to expand to avoid larger
contact angles than the dynamic advancing contact angle Θda. During expansion the contact
angle will take a value between the static and dynamic advancing contact angles. Case d is
analog to the landing event and evaporation of a single droplet and is very suitable for
monitoring the contact angles.
Finally, the detailed analysis of such dynamic events allows the extraction of the static and
dynamic receding and advancing contact angle Θ depending on the velocity of the contact line,
which is visualized exemplary for one evaporating picoliter droplet at T = 90 °C in Figure 7.14.
Figure 7.14 Contact angle measured as a function of the contact line velocity for an evaporating picoliter
droplet at T = 90 °C.
This method uses for the dynamic contact angle Θd extraction the very short spreading phase
(contact line velocity >> 0) and a significantly longer evaporation phase with reducing visible
area (contact line velocity < 0). Thus the number of measured contact angles for the latter is
significantly larger. The static contact angles Θa and Θr are extracted when the contact line is
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not in motion as maximum and minimum, respectively. In summary this contact angle Θ
extraction allows to fully record all dynamic and static contact angles an observed system can
take within a few milliseconds and could deliver a considerable quantity of statistical contact
angle data for various systems.
7.3 Thermodynamic boiling regimes, critical heat flux and Leidenfrost
temperature
Essential for the use of sessile droplets or droplets experiencing the Leidenfrost effect, the
knowledge of the thermodynamic properties of the used solvent, i.e., the boiling temperature
Tb, the temperature where critical heat flux (CHF) occurs, and the Leidenfrost temperature. The
latter two depend not only on the liquid properties itself but also on the used substrate. All of
them depend on the surrounding atmospheric conditions. They mark the temperature span of
the three thermodynamic boiling regimes, i.e., nucleate boiling, transition boiling, and film
boiling. By monitoring the evaporation of sessile droplets, the rate at which the visible area
decreases linearly as a measure of the evaporation rate allows determining the CHF and
Leidenfrost temperature and the three aforementioned thermodynamic boiling regimes.
Therefore in Figure 7.15, the linear area decrease rate in phase 3 is plotted against the
temperature range of 110 °C ≤ T ≤ 205 °C as a measure of the evaporation rate.
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Figure 7.15 Visible area evaporation rate as a function of substrate temperature. Divided into three
regimes: Nucleate boiling (red), transition boiling (green) and film boiling (blue). Leidenfrost temperature
at T = 200°C. [reused with permission[129]]
Based on the average evaporation rate, the CHF can be recognized as maxima at T = 155°C
with a rate of ~ 1550 m2/ms. Below this temperature, the nucleate boiling regime is located
and above this temperature starts the transition boiling regime. The latter ends at the local
minimum at a temperature of T = 200 °C with a rate of ~ 1000 m2/ms, corresponding to the
LFP. Above this temperature, the evaporation rate increases, and sessile droplets are still
occasionally observed until the temperature exceeds 210 °C. The temperature range above the
LFP is assigned to the film boiling regime. The droplets show a strongly increased lifetime and
start to glide on their own gas phase. The observed temperatures are consistent with the
reported temperatures for water and silicon wafers in the literature.[132]
7.4 Novel meta-stable hovering state of very small droplets – Bypass to
the Leidenfrost effect
This chapter presents a novel hovering meta-stable droplet state that is not described yet by
the standard literature as shown in the previous chapters. Droplet evaporation was categorized
before at warm or hot surfaces by the boiling temperature, critical heat flux, and the Leidenfrost
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82
point. Critical heat flux was described as the temperature where maximum heat flux from the
surface into the droplet occurs, and Leidenfrost point as the temperature where the droplets
are lifted on its evaporating vapor and begin to hover. Direct contact to the surface does not
exist from this temperature on anymore.
The Leidenfrost effect is only observable for temperatures higher than the boiling temperature
and the critical heat flux and simultaneously represents the minimum in the observed heat flux
into the droplet above the critical heat flux temperature. As extracted before (see Chapter 7.3),
the Leidenfrost temperature for water is found to be around 205 °C on a silicon wafer covered
with natural oxide.
It was also shown that the droplets become sessile below this temperature after making direct
contact with the surface. At such low temperatures, the material deposition by droplets
frequently suffers from the coffee stain effect or ring-like inhomogeneities due to material
deposition being restricted to the droplet landing site. So far this unwanted effects can only be
avoided at higher temperatures beyond the Leidenfrost effect where sessile droplets don't exist.
However, these higher temperatures are often not compatible with the surface material, process
requirements, the solvent used or the material being deposited.
The new meta-stable state allows small droplets to hover close to a warm surface if their
approach was slow enough. They evaporate slowly at the surface without forming a sessile
droplet and experience an increased lifetime. Within this state, the droplets avoid direct contact
with the surface. Thus material deposition from droplets in this meta-stable state does not suffer
from the coffee stain effect or layer inhomogeneities. Therefore, by utilizing the new meta-stable
hovering effect the Leidenfrost effect and the with it related temperature limitations are
bypassed.
This new discovered meta-stable state can not be described as a Leidenfrost effect anomaly
for small droplets at low temperatures. It clearly differs from the Leidenfrost situation in that
point, that if a direct contact of the droplet with the surface was made, a droplet below the
Leidenfrost temperature, i.e. in the meta-stable state, remains irreversibly in direct contact with
the surface and the meta-stable state is lost. In contrast, a Leidenfrost droplet is lifted again by
its own evaporated vapor and breaks direct contact with the surface again.
The meta-stable state requirements are that the droplet must be small enough. Gravitational,
inertial, or other driving forces towards the surface remain small enough compared to repelling
forces occurring during the warm or hot surface approach and the onset of accelerated droplet
evaporation. E.g. it was found that water droplets driven by gravity towards a surface at 60 °C
require a droplet diameter smaller than d = 40 m for the formation of the meta-stable state
(see Figure 7.16).
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83
Figure 7.16 Camera side-view images of freely falling water droplets approaching a Si-wafer heated to
60 °C well below the Leidenfrost temperature. Due to light reflection at the substrate, the droplet is seen
twice. 1) a larger droplet normally lands with direct contact to the surface and forms a static sessile droplet.
2) a smaller droplet approaches the surface but enters the hovering meta-stable state above the surface
and remains mobile for lateral movements. [133]
The meta-stable state formation is demonstrated by observing first a normal landing of a larger
droplet and second a sufficiently small droplet with a slower approach entering the hovering
meta-stable state. All images show the water droplet twice, i.e. directly and via the substrate
reflection, to monitor the distance between the droplet and the surface accurately.
The first droplet makes contact with the surface. Afterward, it evaporates as a sessile droplet.
The droplet and its reflection image appear as one object. In contrast, the second droplet does
not directly contact the surface and remains in the novel hovering meta-stable droplet state.
The droplet and its reflection image remain as two distinct objects.
From the image series, the height of the approaching droplet can be extracted quantitatively
over time. For the second case of the novel hovering meta-stable state, this approach is shown
in Figure 7.17.
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84
Figure 7.17 Monitored height (m) of the center of the meta-stable hovering droplet showed before and
the observed height of its reflection relative to the surface at 0 m. The droplet does not come into contact
with the surface at any time.[133]
To utilize this meta-stable state it is important to investigate whether material can be deposited
on the surface in the same quality as it can be done exploiting the Leidenfrost effect. Therefore,
magnesium acetate tetrahydrate was dissolved in DI-water (0.05 M) and atomized by an
ultrasonic atomization nozzle with the same parameters used for previous experiments.
Generated droplets fell driven by gravity towards a silicon wafer that was held at a surface
temperature Ts = 150 °C. This temperature is significantly lower than the in the previous chapter
determined Leidenfrost temperature for this system (water/silicon wafer), which is at
T = 205 °C. The deposition lasted for 2 min with a constant precursor solution feed rate at
50 l/min. The result of the deposition was analyzed by SEM (scanning electron microscopy).
The residues of two different deposition modes were found by analysis of the material contrast
and shown in Figure 7.18.
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85
Figure 7.18 SEM images of a) deposited coffee stain structure by conventional sessile evaporating droplet
and b) deposited defect-free layer utilizing droplets with the novel hovering meta-stable state. [133]
For droplets that exceed the minimum required size a coffee stain is visible (see Figure 7.18
a)). It results from a droplet that evaporated sessile at the surface and leaves the material as
an inhomogenoues structure that is not applicable for producing homogenous smooth layers.
If the deposition occurs with sufficient small droplets the intended smooth featureless layer is
produced and is comparable to layers deposited at high temperatures where the Leidenfrost
effect occurs. The existence of a deposited homogeneous layer was verified by a simple
scratching experiment.
Thus, the novel meta-stable state allows the deposition of homogenous layers at low
temperatures. This can possibly open up a new field of applications with materials that cannot
withstand high temperatures. The previous mentioned maximum droplet diameter was so far
observed as d = 40 m for a surface temperature of 60 °C.
7.5 Experimental setup and video acquisition
Video acquisition was done using a Teledyne Dalsa Genie Nano camera with an ONsemi
Python 300 CMOS monochromatic sensor (640 x 480 pixel, pixel size = 4.8 x 4.8 m). If not
mentioned otherwise, a video clip consists of 5000 frames. A recorded frame has a resolution
of 256 x 256 pixels. The side length of a pixel is between 1.47 to 3.00 m depending on the
optical magnification. The pixels are recorded in monochromatic 8-bit color dept and thus take
values between 0 and 255. The exposure time of the pixels was set to 400 s, while the
illumination pulses and frame rate were synchronized and triggered externally by a Keithley
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86
K3390 function generator at 1 or 2 kHz. The real illumination time of a pixel is due to pulsed
operation way shorter and accumulated to 10 s while the illuminating LED is turned on. A
Luxeon Rebel LED (910 mW, royal blue, 447.5 nm, LXML-PR01-0500) was used as a light
source and pulsed by a homemade LED driver. The pulse intervals were set to 125 s for
quadruple illuminated videos and 500 s for single illuminated videos. The recording starts with
a delay after atomization is turned on to allow the stream to stabilize. The optical system has a
theoretical optical resolution of 4 m. A schematic representation of the beginning of a
recording for a video with quadruple pulse per frame is shown in Figure 7.19.
Figure 7.19 Schematic representation of the recording sequence. The spray nozzle is stabilized in a run-
up time of 5 s. During the recording of a frame, the LED is pulsed four times with a duration of 2.5 s with
a period of 125 s. The time per frame is 500 s. [reused with permission[129]]
As ultrasonic atomizer a Sonaer 130 kHz ultrasonic atomization nozzle (model: NS130K) was
used and was operated with a power of 1.0 - 3.0 Watt to atomize the solvents. The atomization
platform has a diameter of 3.8 mm. The fine droplets are accelerated by gravity towards the
substrate. DI-water (18.3 MΩ) is used as the solvent and pumped with a rate of 0.6 ml/min into
the nozzle. 5 x 5 cm2 in lateral dimension and 375 m thick silicon with natural oxide at the
surface was used as a substrate and held at the target temperature by a thermocouple-
controlled hotplate. The surface roughness is Sa = 130.6 pm and Sq = 164.4 pm for a 5 x 5 m
area as measured by a Veeco Picoforce AFM (see Figure 7.20).
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87
Figure 7.20 AFM topography image of silicon with natural oxide.
The atomization starts after the heating plate's temperature is stable and deviates maximum
± 0.5 °C from the target temperature. The volume mean diameter (VMD) was according to the
manufacturer (Sonaer Inc) simulated by the controller to be VMD = 20 – 25 m.
For image data evaluation the 8-bit single channel images were resized with a bicubic
interpolation over a 4x4 pixel neighborhood for droplet detection. Subsequently, an adaptive
threshold was used for the binarization of the images. This threshold is composed of the sum
of the mean pixel intensity in a suitable pixel neighborhood size and a suitable offset, depending
on the illumination and droplet density on the respective frame. Image processing was done
utilizing the OpenCV library (v. 4.4.0.46)[134].
7.6 Conclusion and outlook
This chapter described the cross-section analysis of picoliter droplets under real application
conditions. Beginning with the droplet diameter distribution and the extraction of droplet
properties like diameter and area by cross-section analysis.
It was shown that the droplet appearance close to surfaces (distance ≤ 100 m) could be
described well by raytracing, which has been used to confirm the calculated properties of the
droplets. Monitoring of these droplets close to the surface revealed that sessile droplets below
Leidenfrost point and moving droplets above Leidenfrost could be clearly identified and used
as a indicator for the boiling regime.
The knowledge of the volume of the droplet before becoming sessile allows the straightforward
calculation of the contact angle directly after landing. With an evaporation model the contact
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88
angle could be obtained at any time in the sessile stage. The advancing and receding contact
angles could then be extracted as the minimum or maximum of the calculated contact angles
for the contact line velocity of 0 (static) and the contact line in motion (dynamic) for the
evaporation of water on a silicon wafer at T = 110 °C.
Analysis of sessile droplet evaporation allows determining evaporation properties for almost
any solvent/substrate system precisely and quickly. The thermodynamic regimes nucleate
boiling, transition boiling, and film boiling regimes are determined as well as the critical heat
flux and the Leidenfrost point, by analyzing the recorded visible droplet area over time.
The observation of many very small droplets shows which non-trivial processes take place on
the substrate surface. It was shown that the formation of sessile droplets depends not only on
the volume flow arriving at the substrate surface but also on the local droplet density. At higher
droplet densities, several droplets can combine to form sessile droplets with larger volumes and
longer lifetime.
For the observed system, it was found that very small droplets can experience an Leidenfrost-
like phenomenon far below their actual Leidenfrost temperature and levitate at surface
temperatures that are even 150 °C lower than the Leidenfrost point.
In depth understanding of sessile and hovering droplet evaporation can be especially helpful in
understanding the deposition of functional layers, where an understanding of the evaporation
kinetics is crucial. Microscopically, droplets can have significantly longer lifetimes than is
macroscopically assumed from the incoming volume flow and the energy available for
evaporation over time.
At higher droplet densities, the interaction of evaporating droplets with their environment can
be observed. Picoliter droplet evaporation can create turbulence at the edge of the droplet,
accelerating droplets near the surface and repels them from the evaporation center, attracting
higher droplets by a suction. The latter favors that an evaporating droplet increases its volume
by suctioning other droplets and extending its lifetime. The evaporation of such multi-droplet
events can be evaluated analog to single sessile droplet evaporation.
The new method of top-view monitoring of very small droplets opens up new possibilities and
fields for further and deeper research. The recording of contact angles versus the contact line
movement should be done with temperature as a further dimension and compared to results
from macroscopically methods. Also the measurement of various combinations of liquids and
substrates should give more insight into the physics behind the evaporation of very small
droplets. The method itself would benefit from video recordings at higher framerates and better
resolutions.
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89
The tracking of droplets and the data evaluation can highly benefit from automated evaluation
by advanced deterministic algorithms, machine learning or a combination of both. Either can
be assisted by raytracing.
Sophisticated research can be done on the new meta-stable droplet state in terms of physics
behind this effect and maximum droplet size. Gaining control over the droplet movement can
open up possibilities like lab on the chip, mini reactors or 3D deposition techniques. Other
exciting applications might be possible as well.
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Concluding remarks
90
8 Concluding remarks
Chapter one began with a general introduction and named the core topics of the thesis. The
focus was on investigating the following topics:
1. Improved stability and performance of solution-processed zinc oxide thin-film transistors
processed at low temperatures by organic surface defect passivation:
2. Experimental evaluation of possible novel zinc oxide precursors
3. Gain deeper understanding of picoliter droplets at hot surfaces under real application
conditions
Chapters two, three, and four provided general information about spray pyrolysis, metal oxide
thin-film transistors and basics of applied theoretical and experimental methods in this thesis.
The chapter Tailored organic surface passivation for metal oxide semiconductors
(chapter 5) discussed investigations concerning the first core topic. Tailored diketones were
used to passivate defect states at the surface of solution-processed zinc oxide thin film
transistors. Trifluoroacetylacetophenone was tailored for this purpose by the introduction of
electron-withdrawing or electron-donating substituents at the phenyl ring. After quantifying the
relative change of electron density by DFT, the general bonding of the molecules was examined
by NMR experiments. NMR also narrowed down the possible binding situations to one solution,
where zinc binds to an oxygen of the enol replacing water or hydroxide at the surface. The
passivation on a zinc oxide thin-film was achieved by diketone deposition in a vacuum. The
presence and morphology of the final passivating layer were confirmed by XPS and analyzed
by NMR. Finally, the electrical characterization of the passivated zinc oxide active layer
revealed that all diketones improve the transistor stability for positive and negative bias stress,
in general. Also, the passivated transistors showed improved electrical properties with
increased electron mobility and decreased disorder parameter. The threshold voltages shift
systematically to negative values and the hysteresis clearly reduces. The improved electrical
properties correlate with the effective electron density at the anchoring oxygen atoms of the
passivation molecules. The highest negative charge, which was found for methyl substitution
at the phenyl ring, resulted in the best performance.
These findings show that specifically tailored passivation molecules stabilize solution-
processed thin-film transistors. Further investigations on this topic could lead to different
organic molecules that can further manipulate the electrical properties of thin-film transistors by
surface passivation.
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Concluding remarks
91
The chapter Fluorinated Carboxylates as zinc oxide precursor (chapter 6) showed that the
fluorination of zinc carboxylates leads to suitable precursors for zinc oxide productions. All
precursors show the characteristic absorption band of zinc oxide after thermal decomposition.
FTIR identified impurities for some precursors, which most likely originate from the annealing
procedure. TGA measurements revealed that especially heptafluoro zinc propionate might be
a beneficial precursor, which decomposes at a lower temperature at 250 °C. It can be
potentially processed at significantly lower temperatures compared to zinc acetate, which
decomposes at 360 °C. However, these precursors can not be dissolved in water or other
environment-friendly solvents and were therefore not used for active layer deposition.
Further investigations and the application as precursors are possible after the identification of
a suitable solvent for deposition. The search for such solvent can be assisted by the findings of
chapter 7, which allows the quick determination of thermodynamic properties of a solvent under
deposition conditions.
The chapter High-speed real-time analysis of picoliter droplets under spray pyrolysis
conditions (chapter 7) discussed the investigations on the third core topic. For that purpose,
high-speed images of free-falling picoliter and subpicoliter water droplets generated by an
ultrasonic atomizer were recorded. The physically meaningful extraction of properties of these
droplets was done by cross-section analysis of the droplet borderline and compared to the
expected appearance of the droplets obtained from raytracing. For the analysis of such a small
droplet falling onto a heated silicon substrate, an almost perfect spherical shape was assumed
due to the dominating surface tension. Because of this, a spherical cap was also assumed for
sessile drops. With these constraints, a new model was presented that allowed the extraction
of the contact angle Θ directly after landing and the calculation of static and dynamic advancing
and receding contact angles. The recording yield the velocity of the contact line at any time of
observation. In addition, thermodynamic properties like critical heat flux (CHF) and Leidenfrost
point (LFP) were determined by the extracted evaporation rate. The evaporation regimes:
nucleate boiling, transition boiling and film-boiling can be clearly defined by CHF and LFP.
Furthermore, different complex scenarios of interactions between droplets were observed for
sessile droplets formation and during the evaporation process.
Finally, a novel meta-stable hovering state of very small droplets at ambient temperatures was
discovered, which clearly differs from the Leidenfrost effect. Droplets with a sufficient small
droplet diameter hover close to the surface and evaporate without direct contact.
These hovering droplets allow drastically reduced process temperatures for the processing of
solution-processed thin-film transistors. Also, manipulating droplets at the surface or complex
scenarios like a lab on the chip are possible future scenarios.
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Concluding remarks
92
It is also very interesting to monitor the contact angle by the top-view analysis versus
temperature and especially above the individual boiling point for further investigations. The
short lifetime of the droplets and the possibility of simultaneously monitoring a large number of
droplets allow a statistically meaningful determination of dynamic and static advancing and
receding contact angles.
The top-view analysis also facilitates the adaption of new spray pyrolysis systems
(solvent/substrate combinations) because the determination of necessary thermodynamic
properties and beneficial deposition parameters can be easily measured under deposition
conditions.
Page 102
List of publications
93
List of publications
8.1 Journal paper
Köhling, J., Kalinovich, N.,Pajkert, R., Lork, E., Wagner, V., Röschenthaler, G.-V., Oxamates
as 1,2-Diketone Equivalents: The Effect of Fluorine, ChemistrySelect, 2021, 6(8), 1882-1886
Köhling, J., Wagner, V., High speed picoliter droplet top-view analysis for advancing and
receding contact angles, boiling regimes and droplet-droplet interaction. Int. J. Heat Mass
Transf. 2021, 169, 120939.
Köhling, J., Jovanov, V., Kalinovich, N., Röschenthaler, G.-V., Wagner, V., Tailored β-
diketones as effective surface passivation for solution processed zinc oxide thin film transistors.
Org. Electron. 2020, 105906.
Köhling, J., Kozel, V., Jovanov, V., Pajkert, R., Tverdomed, S. N., Gridenco, O., Fugel, M.,
Grabowsky, S., Röschenthaler, G.-V., Wagner, V. Synthesis and Characterization of
Oxazaborinin Phosphonate for Blue OLED Emitter Applications ChemPhysChem, 20(5), 665–
671, 2019.
Huth, M., Chen, C.-W., Köhling, J., Taffa, D. H., Wark, M., Wagner, V. Prediction of
delamination state of 2D filler materials in cyclic olefin copolymer for enhanced barrier
applications. Compos. Struct., 202, 853–859, 2018.
Huth, M., Chen, C.-W., Köhling, J., Wagner, V. Influence of Hansen solubility parameters on
exfoliation of organophilic fluoromica. Appl. Clay Sci., 161, 412–418, 2018.
8.2 Patent applications
Wagner, V., Köhling, J., Novel hovering droplet state at warm and hot surfaces for small
droplets, 2020, DE 10 2020 133 536.9
Köhling, J., Merkulov, A., Brendt, J., Direkt-strukturierbare Formulierungen auf der Basis von
Metalloxid-Prekursoren zur Herstellung oxidischer Schichten, WO/2018/145907, 2018.
Page 103
List of publications
94
8.3 Conference contributions
Jonas Köhling and Veit Wagner, Poster: Influence of long chain carboxylates as precursor on
the performance of ZnO TFTs, HL 64.8, Frühjahrestagung der Deutsche Physikalische
Gesellschaft (DPG) Dresden, Germany, 2017
Cristian Telescu, Jonas Köhling and Veit Wagner, Poster: Influence of the pH value of the
precursor solution on ZnO TFTs, HL 64.7, Frühjahrestagung der Deutsche Physikalische
Gesellschaft (DPG), Dresden, Germany, 2017
Torsten Balster, Jonas Köhling, Marlis Ortel, and Veit Wagner, Oral presentation: Polymer
passivated zinc oxide thin film transistors, HL 38.3, Frühjahrestagung der Deutsche
Physikalische Gesellschaft (DPG), Dresden, Germany, 2017
Talha Nisar, Torsten Balster, Jonas Köhling, and Veit Wagner, Oral presentation:
Characterization of electrochemically deposited MoSx layers for thin film transistors, HL 86.4,
Frühjahrestagung der Deutsche Physikalische Gesellschaft (DPG), Dresden, Germany, 2017
Jonas Köhling, Marlis Ortel, Nataliya Kalinovich, Gerd-Volker Röschenthaler and Veit Wagner,
Poster: ß-diketone passivated solution processed zinc oxide nano-layers for application in thin
film transistors, International Meeting on Information Display (IMID), Seoul, Korea, 2017.
Jonas Köhling, Marlis Ortel, Nataliya Kalinovich, Gerd-Volker Röschenthaler and Veit Wagner,
Oral presentation: Effect of β-diketone passivation on solution processed zinc oxide nano-
layers used in thin film transistors, ASS I T5, 16th International Conference on the Formation
of Semiconductor Interfaces (ICFSI), Hannover, Germany, 2017.
Jonas Köhling, Nataliya Kalinovich, Gerd-Volker Röschenthaler and Veit Wagner, Oral
presentation: DFT assisted tailoring of fluorine-containing molecules for passivation of zinc
oxide layers in thin film transistors, HL 40.2, Frühjahrestagung der Deutsche Physikalische
Gesellschaft (DPG), Berlin, Germany, 2018
Michael Huth, Jonas Köhling, and Veit Wagner, Oral presentation: Influence of Hansen
solubility parameters on a shear exfoliation process of organophilic layered silica in chloroform,
DS 12.12, Frühjahrestagung der Deutsche Physikalische Gesellschaft (DPG), Berlin, Germany,
2018
Jonas Köhling, Nataliya Kalinovich, Gerd-Volker Röschenthaler and Veit Wagner, Oral
presentation: Binding mechanism of fluorine-containing ketones on zinc oxide surfaces for thin
film transistor passivation, DS 3.8, Frühjahrestagung der Deutsche Physikalische Gesellschaft
(DPG), Regensburg, Germany, 2019
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List of publications
95
Juliana Nair, Jonas Köhling, Gerd-Volker Röschenthaler and Veit Wagner, Poster: Molecular
design of 𝜆6-phosphorous compounds for OLED applications, CPP 37.22, Frühjahrestagung
der Deutsche Physikalische Gesellschaft (DPG), Regensburg, Germany, 2019
Jonas Köhling, Gerd-Volker Röschenthaler and Veit Wagner, Oral presentation: Molecular
design strategy of λ5σ6-phosphorous compounds for OLED applications, MT03.13.10, Materials
Research Society Fall Meeting (MRS), Boston, USA, 2019
Jonas Köhling, Kavish Tyagi and Veit Wagner, Oral presentation: High speed real time single
droplet analysis to improve spray pyrolysis deposition process, FF04.03.04, Materials Research
Society Fall Meeting (MRS), Boston, USA, 2019
Jonas Köhling, Gerd-Volker Röschenthaler, and Veit Wagner, Oral presentation: Substituent
approach in molecular design of phosphorous compounds for OLED emitters, CPP 3.11,
Frühjahrestagung der Deutsche Physikalische Gesellschaft (DPG), Dresden, Germany,
2020 – Canceled due to Corona crisis
Jonas Köhling and Veit Wagner, Oral presentation: Real time video analysis of droplets in
spray pyrolysis deposition process, DS 13.2, Frühjahrestagung der Deutsche Physikalische
Gesellschaft (DPG), Dresden, Germany, 2020 – Canceled due to Corona crisis
Page 105
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96
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Acknowledgments
First of all, I would like to express my gratitude to my PhD supervisor Prof. Dr. Veit Wagner. It
was a particularly educational time with a great atmosphere in your research group. The
continuous support, patience and guidance could not be given for granted. I am especially
grateful for the interesting multidisciplinary research topic, that I could also follow my own
research interests and present my results at many conferences.
I would like to thank Prof. Dr. Gerd-Volker Röschenthaler for being part of my dissertation
committee and for reviewing my dissertation. It was a very interesting collaboration during my
time at Jacobs University, with many productive discussions, a lot of support and with a great
insight into Fluorine chemistry.
Furthermore, I would like to thank Prof. Dr. Ralf Anselmann for his participation in my
dissertation committee and for reviewing my dissertation. Furthermore, also for my previous
time at Evonik GmbH, during which I got to know Jacobs University and which made this
dissertation possible.
Special thanks also go to my colleagues in the research group for moral and scientific support,
as well as a motivating and relaxed atmosphere. Special thanks go to Dr. Torsten Balster, Dr.
Vladislav Jovanov, Dr. Michael Huth, Dr. Oliver Gomez, Dr. Nataliya Kalinovich, Talha Nisar,
Arne Müller, Vladimir Bacic and Jonas Koppe, as well as all the others including Master and
Bachelor students I had the chance to work with.
Big thanks also go to Britta and Ronja for their constant organizational support.
From Jacobs University I would also like to thank Prof. Dr. Dr. Arnulf Materny,
Prof. Dr. Ulrich Kleinekathöfer, Prof. Dr. Jürgen Fritz, Prof. Dr. Ulrich Kortz, and
Dr. Achim Gelessus whose resources I was allowed to use.
Of course, I would also like to thank my family for their endless support in all kinds of situations.
This includes especially my parents Annette and Ludger. Thanks to my dad for endless proof-
reading. Thanks to my sisters, brothers-in-law with my nieces and nephew. Special thanks to
my cousin Christoph, who accompanied my whole studies. I think it is clear that I would not be
here without you all.
I want to also thank my fiancée Sara, for all the emotional support und keeping me focused.
I am very excited for our time together yet to come.
Last but not least, I would like to thank Chava and Ivan, whom I got to know and appreciate as
really good friends during my time at Jacobs University.