s c r a p s o r t i n g a n d m e t a l s a n a l y s i s Lightweight, hand-held, XRF analyzer s c r a p s o r t i n g a n d m e t a l s an a l y s i s q u a l i t y c o n t r o l an d m a t e r i a l v e r i f i c a t i o n m e a s u r e m e n t o f h e a v y m e t a l s i n s o i l s X-MET 3000TX X-MET 3000TX Lightweight, hand-held, XRF analyzer
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X-MET3000TX · verification functions where metals and plastics analysis is required. With the introduction of the WEEE/RoHS/ELV and Packaging directives, this has become even more
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- In-built safety features mean extra user protection
5 year X-ray tubewarranty
2 year instrumentwarranty
the longestwarranty in theindustry!
Extensive andCustomizable AlloyLibraryAs standard, the X-MET3000TX has anintegrated alloy librarycontaining :
• Nickel Alloys
• Stainless Steels
• Cobalt Alloys
• Low Alloy Steel
• Tool Steels
• Copper Alloys
• Titanium Alloys
• Aluminum Alloys(heavy alloyingelements)
Customize by addingnew alloys quickly andeasily
Simple SampleMeasurement savestime and trouble• Analyze large or small
samples, solid or chip,turnings or shavings
• Automaticcompensation fordistance and shape ofthe sample
Maximize flexibilitywith choice ofanalysis modes• Fundamental
Parameter (FP)
- Universal metal calibration that can measure 25 elements between Ti-U, regardless of concentration
- Fast and Easy to Use
- No calibration standards required
• Empirical Calibrations
- Calibrated measurement of customized element ranges
- When accuracy and speed is required for special applications or for specific tramp element detection
- Soils Analysis Package – detect the presence of heavy metals in soil
• Software includesdifferent analysismethods:
- Grade ID
- Quantitative chemistries
- Identification mode
ARE YOU WEEE/RoHS/ELVaware?
New European directivesnow severely restrict thepresence of Pb, Hg, Cd, Cr(VI), PBB/PBDE’s in all end-use consumer goods. The
best measurementtechnique is XRF.
*For measurement ofaluminum and carbonsteel scrap, please askfor details on ARC-MET8000, OxfordInstruments’ OpticalEmission Spectrometer(OES)
X-MET3000TX
PDA basedtechnology forflexibility andsimplicity
• bright colortouchscreendisplay
• easy-to-use menu
• wireless transferof data
• off-the shelfcommercial PDA
• easily replaced ifdamaged
• full Windows CEfunctionality
• PC compatible
• full back-up flashcard as standard
• customizable
• transferable
• unlimited storageof results
Easy to Use
• brief operatortraining
• point and shootanalysis
• no specialknowledgerequired
• intuitive userinterface
Profit throughAccuracy
quality control and material verification(Positive Material Identification PMI)
The importance of quality control in everyaspect of our lives is paramount.
Oxford Instruments’ X-MET3000TX hasbeen designed specifically for materialverification functions where metals andplastics analysis is required.
With the introduction of the WEEE/RoHS/ELV and Packaging directives,this has become even more critical,especially to those companies that exportor sell goods within Europe.
Now the testing processes along the wholesupply chain have become a vital part ofproduction.
For example: the inspection of incominggoods, testing during production andmanufacturing of goods, not forgetting theroutine maintenance essential in any plant.
Accuracy – Fast,precise measurement• 304/321 separation in 5
seconds
• Sn or Sb analysis downto 0.1% in less than 10seconds
- In-built safety features mean extra user protection
5 year X-ray tubewarranty
2 year instrumentwarranty
the longestwarranty in theindustry!
X-MET3000TX
PDA basedtechnology forflexibility andsimplicity
• bright colortouchscreendisplay
• easy-to-use menu
• wireless transferof data
• off-the shelfcommercial PDA
• easily replaced ifdamaged
• full Windows CEfunctionality
• PC compatible
• full back-up flashcard as standard
• customizable
• transferable
• unlimited storageof results
Easy to Use
• brief operatortraining
• point and shootanalysis
• no specialknowledgerequired
• intuitive userinterface
Profit throughAccuracy
measurement of heavy metals in soilsX-MET3000TX
PDA basedtechnology forflexibility andsimplicity
• bright colortouchscreendisplay
• easy-to-use menu
• wireless transferof data
• off-the shelfcommercial PDA
• easily replaced ifdamaged
• full Windows CEfunctionality
• PC compatible
• full back-up flashcard as standard
• customizable
• transferable
• unlimited storageof results
Easy to Use
• brief operatortraining
• point and shootanalysis
• no specialknowledgerequired
• intuitive userinterface
Profit throughAccuracy
There is a growing focus throughout theworld on cleaning up the environment forhealth and safety reasons.
Legislation now imposes severe restrictionson land quality, especially where plots nearcities are converted into cultivated land.
Pollution problems, ignored for years, arenow coming to the surface, and in manycountries the importance of heavy elementanalysis of soil is increasing.
Oxford Instruments’ X-MET3000TXS is adedicated soil analyzer, designedspecifically for measuring heavy metals insoil – offering accurate and reliableidentification of pollutants and fastanalysis of their concentrations.
High Performance• All required heavy
elements in soil aredetectedsimultaneously – suchas Pb, As, Cr, Cu, Zn,Ni, Cd, Co, Se, Mo, Hg,Sb, Ag and Ba
• Typically, onemeasurement takes 15-120 seconds,depending on theelements of interestand accuracy required
• Low detection limits
• Results areimmediately available,ensuring valuable timeis spent on analysis,not waiting for results,and are easilytransferred to a PC
• Full compliance withUS EPA Method 6200
Save Time and Moneyby Screening on Site• Quickly identify
polluting elements anddefine the limits of“hotspots”
• No need to waste timewaiting for lab resultsto progress the analysiswork
• Focus further analysiswork only on thoseelements present inthe contaminated soil
Sample Measurementis Fast and Simple• Save time and money
on easy samplepreparation
• In the field, directsurface measurementcan be done withoutany preparation
• Place soil in a plasticbag or sample cup
• More accurate resultsare obtained if thesample is dried, sieved,ground or pressed
Maximize flexibilitywith choice ofanalysis modes• Fundamental
Parameter (FP)
- Universal calibration that can measure 25 elements between Ti-U, regardless of concentration
- Fast and easy to use in a wide range of soil types
- No calibration standards required
• Empirical Calibrations- Measurement
of customized element concentration
- Site specific empirical calibration available to optimize accuracy
- In-built safety features mean extra user protection
5 year X-ray tubewarranty
2 year instrumentwarranty
the longestwarranty in theindustry!
Oxford Instruments, at High Wycombe, UK, operates Quality Management Systems approved to the requirements of BS EN ISO 9001. This publication is thecopyright of Oxford Instruments Analytical Limited and provides outline information only which (unless agreed by the company in writing) may not be used,applied or reproduced for any purpose or form part of any order or contract or be regarded as a representation relating to the products or services concerned.Oxford Instruments’ policy is one of continued improvement. The company reserves the right to alter, without notice, the specification, design or conditions ofsupply of any product or service. Oxford Instruments acknowledges all trade marks and registrations.
click onto www.oxford-instruments.com for more information
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With a comprehensive trainingagenda for technical engineersand end users combined with a
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