Shen 8/30/2002 X X - - ray Microscopy 2002 ray Microscopy 2002 July 29 July 29 – – August 2, 2002, August 2, 2002, Grenoble Grenoble , France , France Main Organizer: Jean Main Organizer: Jean Susini Susini (ESRF) (ESRF) • • Oral & poster presentations Oral & poster presentations • • 239 registrants 239 registrants • • 49 PhDs 49 PhDs • • Visit to ESRF Visit to ESRF • • Dinner at Chateau Dinner at Chateau d’Herbelon d’Herbelon Highlights of XRM'02 Highlights of XRM'02 • • Novel optics Novel optics • • Phase contrast Phase contrast • • More hard x More hard x - - rays rays • • Lots of applications … Lots of applications …
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Shen 8/30/2002
XX--ray Microscopy 2002ray Microscopy 2002July 29 July 29 –– August 2, 2002,August 2, 2002, GrenobleGrenoble, France, France
Main Organizer: Jean Main Organizer: Jean Susini Susini (ESRF)(ESRF)
•• Oral & poster presentationsOral & poster presentations•• 239 registrants239 registrants•• 49 PhDs49 PhDs•• Visit to ESRFVisit to ESRF•• Dinner at Chateau Dinner at Chateau d’Herbelond’Herbelon
Highlights of XRM'02Highlights of XRM'02
•• Novel opticsNovel optics•• Phase contrastPhase contrast•• More hard xMore hard x--rays rays •• Lots of applications … Lots of applications …
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Background on XBackground on X--ray Microscopyray Microscopy
• All types of materials are studied, from biological to magnetic
• Increasing number of SR imaging microscopes worldwide due to availability of => high-resolution lens-like optics: zone plates, KB mirrors, CRLs=> high-brilliance synchrotron sources
Complex zone platesComplex zone plates:: Di Fabrizio (Elettra)Wilhein (Remagen, Germany)
2 spots
4 spots
⇒⇒ Multiple focal spots in single or Multiple focal spots in single or multiple focal plane for differential multiple focal plane for differential interference contrast microscopyinterference contrast microscopy
⇒⇒ Complete beam shaping for Complete beam shaping for masklessmaskless lithography & xlithography & x--ray ray induced CVD
2 spots longitudinal
induced CVD
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Differential InterferenceDifferential InterferencePhase Contrast with ZP DoubletPhase Contrast with ZP Doublet
Wilhein et al. APL 78, 2082 (2001).ESRF, ID21, 4 keV
PMMA 2µm-thick: 98.7% transmission
Giant moss spores of Dawsonia superba
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XX--ray Shearing Interferometerray Shearing Interferometer::C. David (PSI)
Calculation
ExperimentSi phase grating beam splitter
polystyrene spheres of 0.1mm and 0.2mm
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Some Examples on ApplicationsSome Examples on Applications
Nano-tomography on AMD K6: C.G. Schroer (Aachen) A. Snigirev (ESRF)
Magnetic imaging with XMCD: P. Fischer (MPI, Stuttgart)G. Denbeaux (ALS)
3D XRD mapping of grains: H. Poulsen (Riso)B. Larson (ORNL) @ IUCr
Element mapping in biological samples: C.G. Schroer (Aachen)A. Snigirev (ESRF)
Spectromicroscopy of polymers: A.P. Hitchcock (McMaster)
!! absorptionabsorption!! phase contrastphase contrast!! dark fielddark field
=> simultaneous detection=> simultaneous detectionof both of both δδ and and ββ on the on the same sample areasame sample areamulti-element 80x80 CCD
3 x-rays/pixel@ 3keV uncooled
Phase contrast modesPhase contrast modes::
!! 11stst momentmoment
!! 11stst momentmoment
!! measures phase gradientmeasures phase gradient
),( iii yxIxx ∑ ⋅=
),( iii yxIyy ∑ ⋅=TXMTXM
TXM and STXMTXM and STXM::
!! related by related by optical reciprocityoptical reciprocity!! detector in STXM detector in STXM "" extended source in TXM
STXMSTXM
extended source in TXM
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M. Feser, Ph.D Thesis (2002).
⇒ phase-contrast below C K-edge for biological specimens?
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Phase Retrieval in PhasePhase Retrieval in Phase--Contrast ImagingContrast Imaging
Phase Retrieval: I(u, v) # ρ(x, y) = ?
Propagation based method:
Teague, J. Opt. Soc. Am. 4, 118 (1987) Gureyev et al., J. Opt. Soc. Am. 12, 1942 (1995)Nugent et al., PRL 77, 2961 (1996)Paganin & Nugent, PRL 80, 2586 (1998)
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$ Phase is defined by: (i) index of refraction n(r)
n = 1 – δ + i β k = n k0 eikz ~ k0∫ n(x,y,z) dz
(ii) energy flow S(r)
E = E(r) eik⋅r = E(r) eiφ(r) ∇ φ = ∇ (k⋅r) = k = propagation direction
High Resolution XHigh Resolution X--ray Microscopy ?ray Microscopy ?
TEM like TEM like microscropymicroscropy for hard Xfor hard X--raysrays? ?
object plane back focal plane image plane
Thin crystal
• Would it be possible to image atomic planes (atoms) in a crystal thin enough for x-rays?
• TEM without sample preparation !!!
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•• XX--ray microscopy is an exciting field due to ray microscopy is an exciting field due to advances in focusing optics, 2D detectors, better advances in focusing optics, 2D detectors, better sources, precise mechanics, & phasing algorithmssources, precise mechanics, & phasing algorithms
SummarySummary
•• Lots of ‘old’ ideas for TEM and optical Lots of ‘old’ ideas for TEM and optical microscope are now being tested and applied microscope are now being tested and applied for hard xfor hard x--raysrays
•• Lots of application possibilities … Lots of application possibilities …
•• CHESS can make substantial contributions due CHESS can make substantial contributions due to our existing interests in optics, detectors, ERL, to our existing interests in optics, detectors, ERL, xx--ray physics, phasing methods, & nanofabricationray physics, phasing methods, & nanofabrication