X-Ray Physics of XRF XRF is a non destructive analytica X-Ray Fluorescence Spectroscop material that has been excited b be used to investigate metals, g geochemistry, forensic science a are studying the analyses of maj when they interact with radiatio radiation like x-rays, they becom knock out an inner electron the a electron will fall into the place of Energy is released due to the dec to the outer orbital. The energy termed fluorescent radiation. T elements that are present in the y Fluorescence Lab Report Nydia Esparza Victoria Rangel al technique that is used for elemental and che py is the emission of characteristic secondary x-r by bombarding with high energy gamma rays or glass, ceramics and building materials, and for r and archaeology. In the case of the geological m jor trace elements is made possible by the beha on. When a material is excited short wave lengt me ionized. When the energy of the radiation is atom that is knocked out becomes unstable and of the missing inner electron, as shown in figure (Figure 1) crease in binding energy of the inner electron o y that is being let off is released in the form or x- The fluorescent x-rays are used to detect the abu e sample. emical analysis. rays from a x-rays. XRF can esearch in materials that we avior of atoms th high-energy sufficient it will d an outer 1. orbital compared -rays, this is undance of
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X-Ray
Physics of XRF
XRF is a non destructive analytical technique that is used for elemental and chemical analysis.
X-Ray Fluorescence Spectroscopy is the emission of characteristic secondary x
material that has been excited by bombarding with
be used to investigate metals, glass, ceramics and building materials, and for research in
geochemistry, forensic science and archaeology.
are studying the analyses of major trace
when they interact with radiation.
radiation like x-rays, they become i
knock out an inner electron the atom
electron will fall into the place of the missing inner electron, as shown in figure 1.
Energy is released due to the decrease in binding energy of the
to the outer orbital. The energy that is
termed fluorescent radiation. The
elements that are present in the sample.
Ray Fluorescence Lab Report Nydia Esparza Victoria Rangel
XRF is a non destructive analytical technique that is used for elemental and chemical analysis.
Ray Fluorescence Spectroscopy is the emission of characteristic secondary x-rays from a
material that has been excited by bombarding with high energy gamma rays or x
metals, glass, ceramics and building materials, and for research in
geochemistry, forensic science and archaeology. In the case of the geological materials that we
analyses of major trace elements is made possible by the behavior of atoms
when they interact with radiation. When a material is excited short wave length high
rays, they become ionized. When the energy of the radiation is
atom that is knocked out becomes unstable and an
on will fall into the place of the missing inner electron, as shown in figure 1.
(Figure 1)
is released due to the decrease in binding energy of the inner electron orbital compared
The energy that is being let off is released in the form or x-
radiation. The fluorescent x-rays are used to detect the abundance of
elements that are present in the sample.
XRF is a non destructive analytical technique that is used for elemental and chemical analysis.
rays from a
high energy gamma rays or x-rays. XRF can
metals, glass, ceramics and building materials, and for research in
In the case of the geological materials that we
is made possible by the behavior of atoms
When a material is excited short wave length high-energy
onized. When the energy of the radiation is sufficient it will
unstable and an outer
on will fall into the place of the missing inner electron, as shown in figure 1.
inner electron orbital compared
-rays, this is
ays are used to detect the abundance of
Instrumentation
(Figure 2)
We used a portable X-ray Fluorescence gun to perform this lab. The model we used was X-MET
3000TXV+ , figure 2 is a similar representation of the device that was used for the lab.
XRF Project Results
Project Team
(Nydia Esparza and Victoria Rangel)
Materials and Methodology
There were three clay ceramic samples provided for analysis as can be observed in the figures
below. The samples were labeled 17153Q, 17153S, and 17297D respectively.
The samples were analyzed using the XMET3000TXV+ which consisted of aluminum casing
protected with lead tape to prevent radiation from escaping. The handheld device provided x-
rays for the elemental analysis by running at 40 kV and 7mA. The device was ran at 300
seconds at a time to provide the spectrum for each sample. These spectrums were then
analyzed using PyMca.
Data and Results
The graphs below are in log scale for each sample and were modeled using a computer
program. In each image, we can appreciate that two peaks failed to be modeled. The modeling
provided the data in the tables seen below each image which include the elements present, the
counts of each element, and the mass fraction of each element found. The following images
are the data plots for the three samples. The data is represented by lines in three colors. The
descriptive meaning for each line color is described below:
:Spectrum-source data,
: Fit-Fitted curve
: Pileup-Background
Sample 17153Q
Data plot for sample 17153Q in log scale
Table A: Data for sample 17153Q
Element Group Fit Area
K K 2.51E+03
Ca K 4.40E+03
Ti K 2.27E+03
Cr K 6.25E+02
Mn K 1.43E+03
Fe K 8.34E+04
Ni K 1.92E+02
Cu K 5.45E+02
Zn K 2.91E+03
Ga K 2.20E+02
As K 6.33E+02
Rb K 3.74E+03
Sr K 1.81E+04
Y K 2.69E+03
Zr K 1.95E+04
Nb K 2.83E+03
Ag K 8.92E+03
W L 4.13E+02
Au L 8.37E+03
in log scale
Table A: Data for sample 17153Q
Sigma Area Mass fraction
6.37E+01 0.004524
9.03E+01 0.001773
5.75E+01 0.0001238
3.28E+01 8.67E-06
5.00E+01 1.20E-05
1.18E+03 0.0004445
2.07E+01 4.99E-07
2.94E+01 1.12E-06
7.00E+01 4.66E-06
3.01E+01 2.91E-07
4.78E+01 5.80E-07
1.24E+02 1.96E-06
3.03E+02 8.40E-06
1.21E+02 1.11E-06
3.30E+02 7.25E-06
1.28E+02 9.49E-07
2.25E+02 1.88E-06
6.35E+01 6.25E-07
1.68E+02 8.02E-06
Sample 17153S
Data plot for sample 17153S in log scale
Table B: Data for sample 17153S
Element Group Fit Area
K K 2.51E+03
Ca K 4.40E+03
Ti K 2.27E+03
Cr K 6.25E+02
Mn K 1.43E+03
Fe K 8.34E+04
Ni K 1.92E+02
Cu K 5.45E+02
Zn K 2.91E+03
Ga K 2.20E+02
As K 6.33E+02
Rb K 3.74E+03
Sr K 1.81E+04
Y K 2.69E+03
Zr K 1.95E+04
Nb K 2.83E+03
Ag K 8.92E+03
W L 4.13E+02
Au L 8.37E+03
in log scale
: Data for sample 17153S
Sigma Area Mass fraction
6.37E+01 0.004524
9.03E+01 0.001773
5.75E+01 0.0001238
3.28E+01 8.67E-06
5.00E+01 1.20E-05
1.18E+03 0.0004445
2.07E+01 4.99E-07
2.94E+01 1.12E-06
7.00E+01 4.66E-06
3.01E+01 2.91E-07
4.78E+01 5.80E-07
1.24E+02 1.96E-06
3.03E+02 8.40E-06
1.21E+02 1.11E-06
3.30E+02 7.25E-06
1.28E+02 9.49E-07
2.25E+02 1.88E-06
6.35E+01 6.25E-07
1.68E+02 8.02E-06
Sample 17297 D
Data plot for sample 17297D in log scale
Table C: Data for sample 17297D
Element Group Fit Area Sigma
K K 2.31E+03
Ca K 3.54E+03
Ti K 2.85E+03
Cr K 6.18E+02
Mn K 1.24E+03
Fe K 1.62E+05
Ni K 1.40E+02
Cu K 4.88E+02
Zn K 2.28E+03
Ga K 2.90E+02
As K 4.78E+02
Rb K 4.46E+03
Sr K 2.65E+04
Y K 3.30E+03
Zr K 1.80E+04
Nb K 3.31E+03
Ag K 1.20E+04
W L 1.54E+01
Au L 8.64E+03
in log scale
297D
Sigma Area Mass fraction
5.41E+01 0.004171
6.58E+01 0.001425
5.80E+01 0.0001554
3.42E+01 8.58E-06
4.70E+01 1.04E-05
8.73E+02 0.0008605
2.19E+01 3.66E-07
2.91E+01 1.01E-06
5.57E+01 3.65E-06
3.08E+01 3.84E-07
4.68E+01 4.38E-07
1.22E+02 2.33E-06
2.43E+02 1.23E-05
1.26E+02 1.36E-06
2.15E+02 6.67E-06
1.35E+02 1.11E-06
2.08E+02 2.53E-06
6.46E+01 2.34E-08
1.34E+02 8.28E-06
In each table, the data of importance for this lab was the fit area which gave the counts of each
element. The fit area does not give the amount of the respective element present in the
sample. The mass fraction is the amount of the element in each sample and this data is given
for each element found in each sample.
Graphs:
Plots of the highest counts were taken which are given by the fit area in the tables above and
compared between the three samples. These plots can be appreciated in the figures below.
The elements with the highest counts common to all three samples included: Fe, Ag, Au, As, Cr,
and Cu. Two elements were compared at a time between all three samples for a total of fifteen
plots. Sample 17153Q is represented by a red triangle, Sample 17153S by a green diamond,