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Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1 ,S 1 K 2 ,S 2
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Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Jan 19, 2018

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Page 1: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Well Tests to Characterize Idealized Lateral Heterogeneities

by

Vasi PassinosK1,S1

K2,S2

Page 2: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Faults

Steeply Dipping Beds

Page 3: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Igneous Rocks

Facies Change

Reef

Marine Clay

BatholithBatholith Country Country rockrock

Dike

Channel sand

Floodplain deposits

Page 4: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Confined Aquifer Unconfined Aquifer

Page 5: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Conceptual Models

Local NeighboringT1 S1 T2 S2

L L

2-Domain Model 3-Domain Model

Matrix MatrixStrip

Tm SmTm Sm

L Lw

Ts

Ss=Sm

Page 6: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Analysis

2

2

2

2

yh

xh

th

TS nnn

n

n

Governing Equation

on htyxh )0,,(Initial Condition

when 0),,( tyxhn yx or

rh

rTQ n

rn

0

lim2

Boundary Conditions

Page 7: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Analysis – 2-Domain• Conditions at the contact

tyLxxh

TT

tyLxxh

,,,, 2

1

21

Lxhh at 21

L

1 2

Page 8: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Analysis – 3-Domain• Conditions at the contact

tywLxx

hTT

tywLxxh m

s

ms ,,,,

wLxhh ms at m ms

L w

Page 9: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Method – Analytical• Transient analytical solution using Method

of Images (Fenske, 1984)

),,(1

1,,,,111 Lyxf

dtErSrTtyx

dtEds

12

2112

1,,,,STST

tESTtyxs

drrd 2

1

14rStT

td

Page 10: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Methods – Numerical• Transient numerical model using MODFLOW

• 2-Domain – Tr and Sr were varied• 3-Domain - Tr and w of the strip were varied.

• Grid optimized for small mass balance errors

• The properties of the model were selected so that the drawdown and time from the numerical model were dimensionless

Page 11: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Dimensionless Time• Drawdowns were evaluated at three

dimensionless times to illustrate effects during development of drawdown fields.

• Dimensionless time used for type curves

• Dimensionless time used in drawdown fields

21

14LS

tTtdL

21

14rStT

td

Page 12: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

2-Domain Model T Contrast

Tr=10

Tr = 1

Tr=0.1

tdLA tdLB tdLC

- 2 0 2 40

2

4

Page 13: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

2-Domain Model S Contrast

Sr = 10

Sr = 1

Sr = 0.1

tdLA tdLB tdLC

- 2 0 2 40

2

4

Page 14: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

3-Domain Model T Contrast

Tr = 10

Tr = 1

Tr = 0.1

tdLB tdLC tdLD

- 4 - 2 0 2

Page 15: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

2-Domain T Contrast – 0.125L

0

24

68

10

1214

16

0.1 10 1000 100000td

s d

homogeneous No Flow T1/T2=10T1/T2=100 T1/T2=5 T1/T2=0.1T1/T2=0.01 T1/T2=0.5 CH

0

1

2

0.1 10 1000 100000td

dsd/d

ln(t d

)

Page 16: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

2-Domain T Contrast – 0.5L

0

2

4

6

8

10

12

14

0.1 10 1000td

s d

homogeneous No Flow T1/T2=10T1/T2=100 T1/T2=5 T1/T2=0.1T1/T2=0.01 T1/T2=0.5 CH

0

0.5

1

1.5

2

0.1 10 1000td

dsd/d

ln(t

d)

Page 17: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

2-Domain S Contrast – 0.125L

0

0.2

0.4

0.6

0.8

1

1.2

1.4

0.1 10 1000 100000

td

m =

ds d

/dln

(t d)

0

2

4

6

8

10

12

0.1 10 1000 100000

td

s d

S1/S2=1 S1/S2=10 S1/S2=100 S1/S2=0.1 S1/S2=0.01

Page 18: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

2-Domain S Contrast – 0.5L

012345678910

0.1 10 1000td

s d

S1/S2=1 S1/S2=10 S1/S2=100 S1/S2=0.1 S1/S2=0.01

0

0.2

0.4

0.6

0.8

1

1.2

1.4

0.1 10 1000td

m =

ds d

/dln

(td)

Page 19: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Graphical Evaluation – 2-DomainEstimate Aquifer Properties

0

2

4

6

8

10

12

14

16

0.001 0.01 0.1 1 10 100 1000tdL

s d to = 0.029 S = 0.017s = 2.3 T = 1

to = 0.42 S = 0.35s = 4.1 T = 0.55

Page 20: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Graphical Evaluation – 2-DomainEstimate Aquifer Properties

0

2

4

6

8

10

12

0.01 0.1 1 10 100 1000

tdL

s d

to = 2.7 S = 0.136s = 4.1 T = 0.55

Page 21: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

TE=1SE=0.0179TTLL=0.55=0.55SL=0.25

TE=1SE=0.0179TTLL=0.55=0.55SL=0.136

TTLL=0.55=0.55SL=0.06

TTLL=0.55=0.55SL=0.27

TTLL=0.55=0.55SL=0.021

TTLL=0.55=0.55SL=0.068

TTLL=0.55=0.55SL=0.029

TTLL=0.55=0.55SL=0.021

L

L L

Page 22: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Critical Region• An early semi-log straight line can be

determined by

• The second derivative was compared to plots with a variety of curves. An early SLSL could be identified by a second derivative of 0.2 or less from 0.3<tdL<2.5.

dLdL tyx

tyx

dLdL

d eyxeyxttd

sd2222 2

22222

2

21ln

Page 23: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Critical Region• Observation points confined to a region that

is within 0.3 to 0.5 of the distance between the pumping well and the linear discontinuity

-1.0 -0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8 1.0

0.2

0.4

0.6

0.8

1.0

Page 24: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

02468101214

0.01 0.1 1 10 100 1000tdL

s d

Distance to the Contact

tc = 7.3

78.11

1

STt

L cStreltsova, 1988

Page 25: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

02468

10121416

0.1 10 1000 100000td

s d

homogeneous No Flow T1/T2=10T1/T2=100 T1/T2=5 T1/T2=0.1T1/T2=0.01 T1/T2=0.5 CH

0

0.5

1

1.5

2

0.1 10 1000 100000td

m =

ds d

/dln

(t d)

3-Domain T Contrast - 0.125L

Page 26: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

3-Domain T Contrast - 0.5L

02468

101214

0.1 10 1000td

s d

homogeneous No Flow T1/T2=10T1/T2=100 T1/T2=5 T1/T2=0.1T1/T2=0.01 T1/T2=0.5 CH

0

0.5

1

1.5

2

0.1 10 1000td

m =

ds

d/d

ln(t

d)

Page 27: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Strip Transmissivness & Conductance• Hydraulic properties of the strip depend on

strip conductivity and width• Strip K greater than matrix

• Strip K less than matrix

LKwKT

a

sssd

a

sd K

LwK

C

wKT sss

wK

C s

Page 28: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Strip Transmissivness & Conductance

010 52.1 98831minmin1

.CB.A

B

CmCm

AssdT

18.1 094.01max

max2

BA

B

mmAdC

0.1

1

10

100

1000

10000

0 0.5 1mmin

Tss

d

0.001

0.01

0.1

1

10

1 1.5 2mmax

C d

Page 29: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Graphical Evaluation – 3-DomainEstimate Aquifer Properties

0

2

4

6

8

10

12

14

0.001 0.1 10 1000 100000

tdL

s d

to = 0.09 S = 0.054s = 2.3 T = 1

to = 0.028 S = 0.017s = 2.3 T = 1

Page 30: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Determine Properties of Strip• SLSL analysis on the first line will give

T and S of the area near the well.• Take the derivative of time and

determine the maximum or minimum slope.

• Using equations from curve fitting determine Tssd or Cd of the layer.

• Solve for Tss or C

Page 31: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Non-Uniqueness

s

s

Log (t) Log (t)

Dual Porosity Overlying Leaky Layer without storage

Unconfined Aquifer w/delay yield from storage

Overlying Leaky Layer with storage

Streltsova, 1984

Streltsova, 1988 Streltsova, 1984

Neuman, 1975

Page 32: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Field Example

500 feet

DownUp

Ridge

stream

Nstream

fault

Page 33: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Field Case - Site Map

N

500 feet

BW-109

BW2

L

B-4

Felsic

Mafic

Page 34: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Drawdown from Pumping Well

0

5

10

15

20

25

30

35

40

45

50

10 100 1000 10000 100000

t (min)

s

0

0.5

1

1.5

2

10 100 1000 10000

t (min)

m =

ds/

dln(

t)

Page 35: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Drawdown from Piezometers

0123456789

0.0001 0.01 1

t/r2

s

BW-109 BW-2

0

0.5

1

0.0001 0.001 0.01 0.1

t/r2 (min)

m =

ds/

dln(

t)

Page 36: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

• Using Semi-Log Straight-Line Analysis :

• Minimum slope using the derivative curve is 0.5

• Tssd=34=Ksw/KaL

• Tss = 24 ft2/min w = 10 to 20 ft

Determining Hydraulic Properties

L = 280 ft Distance to fault

b = 21.5 ft screened thickness

Tm = 0.05 ft2/minSm = 2x10-4 ???

Ts = 26 to 52 ft2/minTs/Tm = 500 to 1000

0

3

6

9

1 10 100 1000 10000

s

0

0.5

1

0.0001 0.001 0.01 0.1 1t/r2

ds/d

ln(t)

Page 37: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Conclusions 2-Domain Model

Using the Jacob method to analyze well tests:• Piezometers r < 0.25L gives T, S of local

region.

• Piezometers r > 0.25L gives average T of both regions.

• Piezometers r > 0.25L unable to predict S

Page 38: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Conclusions – 2-Domain• Piezometers in neighboring region also give

average T of both regions.

• L can be determined from intersecting SLSLs using a piezometer within the critical region

Page 39: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Conclusions 3-Domain Model• Drawdown for low conductivity vertical layer

controlled by conductance.

C=Ks/w

• Drawdown for high conductivity vertical layer controlled by strip transmissivness.

Tss=Ks*w

• Feasible to determine properties of a vertical layer from drawdown curves.

Page 40: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Conclusions

• Analyzing piezometers individually is a poor approach to characterizing heterogeneities.

• Drawdown curves non-unique. Require geological assessment.

Page 41: Well Tests to Characterize Idealized Lateral Heterogeneities by Vasi Passinos K 1,S 1 K 2,S 2.

Acknowledgments

• Funding– Geological Society of America– Brown Foundation– National Science Foundation

• Others…