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We really need to check all the results showed
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We really need to check all the results showed. We change the GEM from the fully-well-shielded to the less shielded one (top- bottom-fan out with aluminum)

Jan 19, 2016

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Irene Stevens
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Page 1: We really need to check all the results showed. We change the GEM from the fully-well-shielded to the less shielded one (top- bottom-fan out with aluminum)

We really need to check all the results showed

Page 2: We really need to check all the results showed. We change the GEM from the fully-well-shielded to the less shielded one (top- bottom-fan out with aluminum)

0

5

10

15

160 170 180 190 200 210 220 230

Erf FIT SIgma versus run number

Strips Sigma

PS1 Pads Sigma

PS2 Pads Sigma

Erf

Sig

ma

RunNumber: T2_JW0...

We change the GEM from the fully-well-shielded to the less shielded one (top-bottom-fan out with aluminum)

We moved from the table to the nitrogen flushed box

H.V. Connected to the GEM

Sigma Mean Value of two channels…. Just to have an idea of the evolution. Look at the other plots to have a more precise description

Independents Analog and Digital Power SupplyIndependents Analog and Digital Power Supply

PRELIMINARY

Page 3: We really need to check all the results showed. We change the GEM from the fully-well-shielded to the less shielded one (top- bottom-fan out with aluminum)

0

5

10

15

160 170 180 190 200 210 220 230

Erf FIT SIgma versus run number

Strips Sigma

PS1 Pads Sigma

PS2 Pads Sigma

Erf

Sig

ma

RunNumber: T2_JW0...

Dig

gn

d c

on

nec

ted

to

th

e ea

rth

of

its

po

wer

su

pp

ly

An

gn

d f

loat

ing

Dig

gn

d c

on

nec

ted

to

th

e ea

rth

of

its

po

wer

su

pp

ly

An

gn

d c

on

nec

ted

to

th

e ea

rth

of

its

po

wer

su

pp

ly

Dig

gn

d c

on

nec

ted

to

th

e ea

rth

of

its

po

wer

su

pp

ly

An

gn

d c

on

nec

ted

to

th

e D

ig g

nd

on

th

e p

ow

er

sup

ply

Dig

gn

d f

loat

ing

An

gn

d f

loat

ing

Dig

gn

d f

loat

ing

An

gn

d f

loat

ing

Dig

gn

d f

loat

ing

an

d A

n g

nd

flo

atin

g

bu

t co

nn

ecte

d t

og

eth

er

Dig

gn

d f

loat

ing

An

gn

d f

loat

ing

Dig

gn

d f

loat

ing

- A

n g

nd

co

nn

ecte

d t

o t

he

test

bea

m g

nd

We change the GEM from the fully-well-shielded to the less shielded one (top-bottom-fan out with aluminum)

We moved from the table to the nitrogen flushed box

H.V. Connected to the GEM

Dig

gn

d f

loat

ing

An

gn

d f

loat

ing

H.V

. O

FF

H.V

. -1

00V

H.V

. -1

00V

+ C

AE

N F

ilter

H.V

. -1

00V

+ C

AE

N F

ilter

Dig

gn

d f

loat

ing

An

gn

d f

loat

ing

Dig

gn

d f

loat

ing

An

gn

d

con

nec

ted

to

th

e g

nd

of

the

test

bea

m z

on

e th

rou

gh

th

e H

.V. f

ilter

fix

ed o

n t

he

tab

le

PRELIMINARY

Page 4: We really need to check all the results showed. We change the GEM from the fully-well-shielded to the less shielded one (top- bottom-fan out with aluminum)

0

5

10

15

160 170 180 190 200 210 220 230

Erf FIT SIgma versus run number

Strips Sigma

PS1 Pads Sigma

PS2 Pads Sigma

Erf

Sig

ma

RunNumber: T2_JW0...

We change the GEM from the fully-well-shielded to the less shielded one (top-bottom-fan out with aluminum)

We moved from the table to the nitrogen flushed box

H.V. Connected to the GEM

We start to see differences between the two VFATs plugged on pads ps1 and ps2 connecting the H.V.When we connect the analog gnd to the test beam gnd through the box of the H.V. filter fixed on the table, this difference disappear and the sigma come back to the best value (I.e. as with the fully shielded chamber, without the H.V. plugged and on the table).If you look at the threshold scan instead it’s seems better without this connection of the analog gnd with the test beam gnd

PRELIMINARY

Page 5: We really need to check all the results showed. We change the GEM from the fully-well-shielded to the less shielded one (top- bottom-fan out with aluminum)

WITH THE NEW POWERING SCHEME:ANALOG AND DIGITAL SEPARATED

-The An gnd have to be referenced to a good gnd otherwise:-Latency problems (inefficiency, worse sigma)

-If the dig gnd is directly linked to the An gnd it’s seems that we have more cross talking effect. (when we are in test beam zone we have the problem of the trigger line that in any case link digital and analog gnd if the analog is referred to the test beam zone gnd).

-If we leave the analog gnd floating, without any connection with the digital part we don’t see cross talking (but the results from the threshold scan that we use to see this cross talking are in some way crazy!)

PRELIMINARY

Page 6: We really need to check all the results showed. We change the GEM from the fully-well-shielded to the less shielded one (top- bottom-fan out with aluminum)

Latency scan with the analog gnd floating Latency scan with the analog gnd floating (Vcal 200, Th 50, MSPL 1clk)(Vcal 200, Th 50, MSPL 1clk)

PRELIMINARY

Page 7: We really need to check all the results showed. We change the GEM from the fully-well-shielded to the less shielded one (top- bottom-fan out with aluminum)

Latency scan with the analog gnd referenced Latency scan with the analog gnd referenced (Vcal 230, Th 40, MSPL 2clk)(Vcal 230, Th 40, MSPL 2clk)

PRELIMINARY

Page 8: We really need to check all the results showed. We change the GEM from the fully-well-shielded to the less shielded one (top- bottom-fan out with aluminum)

External Strips - Threshold Scand vs MSPL

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0 10 20 30 40 50 60 70

VTh

Mea

n O

N[%

] ove

r Tr

igge

r pe

r C

hann

el

MSPL=1clk

MSPL=2clk

MSPL=3clk

MSPL=4clk

Internal Strips - Threshold Scand vs MSPL

0

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25

30

35

40

45

50

0 10 20 30 40 50 60 70

VTh

Mea

n O

N[%

] ove

r Tr

igge

r pe

r C

hann

el

MSPL=1clk

MSPL=2clk

MSPL=3clk

MSPL=4clk

PS13 Pads - Threshold Scand vs MSPL

0

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10

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40

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0 10 20 30 40 50 60 70

VTh

Mea

n O

N[%

] ove

r Trig

ger p

er C

hann

el

MSPL=1clkMSPL=2clkMSPL=3clkMSPL=4clk

PS12 Pads - Threshold Scand vs MSPL

0

5

10

15

20

25

30

35

40

45

0 10 20 30 40 50 60 70

VTh

Mea

n O

N[%

] ove

r Tr

igge

r pe

r C

hann

el

MSPL=1clkMSPL=2clkMSPL=3clkMSPL=4clk

c

Averaged Noise Occupancy per channel

PRELIMINARY

Page 9: We really need to check all the results showed. We change the GEM from the fully-well-shielded to the less shielded one (top- bottom-fan out with aluminum)

We tried with/without this connection

Top

Gnd Studies: the more clean situation

PRELIMINARY

Page 10: We really need to check all the results showed. We change the GEM from the fully-well-shielded to the less shielded one (top- bottom-fan out with aluminum)

• This MSPL noise dependence tested on:– Separated Digital/Analog power supply:

• Only one gnd ref: trigger gnd from Counting Room• Another gnd ref in Test Beam Zone (directly

connected on the GEM gnd plane )

– Common Power Supply for Analog/Digital through Transition Board (Gnd only from Trigger line)

• VFATs without/with gnd connection on the Hybrids(*)

(*) under study….we start just now the tests with the hybrids with this connection, it’s seems that we have the same effect, but we have to investigate its magnitude.

PRELIMINARY

Page 11: We really need to check all the results showed. We change the GEM from the fully-well-shielded to the less shielded one (top- bottom-fan out with aluminum)

Th=100

Th=60

With power from TBAnalog Digital together

Measurements with the an/dig power supply directly from TB:It seems better…..

PRELIMINARY

Page 12: We really need to check all the results showed. We change the GEM from the fully-well-shielded to the less shielded one (top- bottom-fan out with aluminum)

Th=90

Th=110

Th=130

Th=150 Th=160

Int Strips

Particles ..?..

3.6kV on the GEM

With power from TBAnalog Digital together If strips are at high

threshold no signal on pads!This is not possible!

PRELIMINARY

Page 13: We really need to check all the results showed. We change the GEM from the fully-well-shielded to the less shielded one (top- bottom-fan out with aluminum)

PRELIMINARY

Page 14: We really need to check all the results showed. We change the GEM from the fully-well-shielded to the less shielded one (top- bottom-fan out with aluminum)

C~20pF

Noise~400e-+40/60 e-/pF

COMPASS

Noise ~400e- ~1 bin~1600e- ~4 bin

PRELIMINARY

Page 15: We really need to check all the results showed. We change the GEM from the fully-well-shielded to the less shielded one (top- bottom-fan out with aluminum)

Noise~400e-+40/60 e-/pF ~1bin+1.5bin/pF

Noise ~400e- ~1 bin VFAT alone ~1600e- ~4 bin

Between Between

5.5 & 75.5 & 7

Between Between

5 & 65 & 6

Between Between

3 & 53 & 5

INTERNAL STRIPSINTERNAL STRIPS EXTERNAL STRIPSEXTERNAL STRIPS PADSPADS

~7bin -> ~40pF PRELIMINARY

Page 16: We really need to check all the results showed. We change the GEM from the fully-well-shielded to the less shielded one (top- bottom-fan out with aluminum)

VFAT

PRELIMINARY

Page 17: We really need to check all the results showed. We change the GEM from the fully-well-shielded to the less shielded one (top- bottom-fan out with aluminum)

PRELIMINARY

Page 18: We really need to check all the results showed. We change the GEM from the fully-well-shielded to the less shielded one (top- bottom-fan out with aluminum)

Possible tests for the signal/noise

• We will try to use a chip without protection

• If it is possible we can try to inject charge directly on the readout board (strips/pads).

• Come back in the Nov06 test beam setup.

PRELIMINARY