USB 2.0 Test Report For Peripheral - holtek.com.t · Connector Type: Untethered (Tethered means no standard B or special B connector) Basic Speed Upstream Signal Quality: Pass Fail

USB 2.0 Test Report

For

Peripheral

Company Name: Holtek Semiconductor Inc.

VID (Dec or Hex): 0x04D9 The VID for the company who apply the USB-IF logo.

Model Name: HT66FB582

Product Type: Keyboard

Report Date: 2016/05/13

Test Result: PASS

Tester: Alex Huang

Authorized Signature:

1 Project ID：KB-HOK-USB-027 Document Number：AR-TRL011413

USB

Legal Disclaimer

1. TEST RESULT IS VALID ONLY TO THE ORIGINAL TESTED DEVICE MODEL. ALLION

RESERVES THE RIGHT TO PROHIBIT OTHERS TO DISTORT, ISOLATE, FALSIFY, COPIED

AND/OR BY ANY PROCESS TO CHANGE THE CONTENT OF THIS TEST REPORT UNLESS

IT IS PRIOR APPROVED BY ALLION.


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Company Information:

Company Company Name: Holtek Semiconductor Inc. Company Address:

Technical Contact Name: 王冠中 Phone Number: 03-5631999 # 1236 E-Mail: [email protected] FAX Number: 03-5641557

Marketing Contact Name: Phone Number: E-Mail: FAX Number:


USB

High Speed & Basic Speed Compliance Tests

A4.4: Device High-speed Signal Quality Pass Fail N/A

These tests measure the ability of transmitters to do valid high speed signaling. High speed signal quality is measured on upstream ports. A high speed scope with differential probes is used. Signaling data is captured with the scope and then translated to an eye pattern. The signal quality eye patterns obtained from the measurements must agree with the transmit eye patterns in the USB 2.0 Specification.

Connector Type: (Tethered means no standard B or special B connector)

EL_2: Transmitter Data Rate Pass Fail N/A

EL_4: Eye Pattern (Template 1) Pass Fail N/A

EL_5: Eye Pattern (Template 2) Pass Fail N/A

EL_6: Rising and Falling Time Pass Fail N/A

EL_7: Monotonic Data Transition Pass Fail N/A

A4.5: Device Packet Parameters Pass Fail N/A

This test measures the amount of time it takes hosts and devices to respond. It also verifies device generated SYNCs and EOPs.

EL_21: (32bit) bit Pass Fail N/A

EL_22-Step1: (>=8bit and <=192bit) bit Pass Fail N/A

EL_22-Step2: (>=8bit and <=192bit) bit Pass Fail N/A

EL_25: (8bit) bit Pass Fail N/A

A4.6: Device CHIRP Timing Pass Fail N/A

This test examines the basic timings and voltages of both upstream ports during the speed detection protocol. (Device reset from Full Speed)

EL_28: (>=2.5us and <=6ms) Pass Fail N/A

EL_29: (>=1ms and <=7ms) ms Pass Fail N/A

EL_31: (<=500us) us Pass Fail N/A


USB

A4.7: Device Suspend/Resume/Reset timing Pass Fail N/A

This test verifies that a device can be suspended and resumed while operating in high speed and also that the device can be reset from the suspended state.

EL_38: (>=3ms and <=3.125ms)

ms Pass Fail N/A

EL_39: Pass Fail N/A

EL_40: Pass Fail N/A

EL_27: (>=3.1ms and <=6ms) ms Pass Fail N/A

EL_28: (>=2.5us and <=6ms) Pass Fail N/A

A4.8: Device Test J/K, SE0_NAK Pass Fail N/A

The USB-IF no longer requires EL_8: Test_J and Test_K to be performed as a condition for USB Certification. Measurement of EL_9: Test_J, Test_K and SE0 are still a requirement for certification. EL_9 is defined in the USB 2.0 Test Specification and measures the data line voltage when not driven. For detail information please reference as below link:

EL_9

Test Mode Voltage (mV)

SE0_NAK D+

SE0_NAK D-

Test J D-

Test K D+ (-20mV to 20mV)


USB

A4.9: Device Receiver Sensitivity Pass Fail N/A

These tests check the receive characteristics of upstream ports

EL_18 Pass Fail N/A

EL_17 Positive: (<= +200mV) + mV Pass Fail N/A

EL_17 Negative:(>= -200mV) - mV Pass Fail N/A

EL_16 Positive: (>= +100mV) + mV Pass Fail N/A

EL_16 Negative:(<= -100mV) - mV Pass Fail N/A

Basic Speed Signal Quality Test Result Pass Fail

Connector Type: Untethered (Tethered means no standard B or special B connector)

Basic Speed Upstream Signal Quality: Pass Fail

Inrush Current Test: Pass Fail

Back Voltage Test Result Pass Fail

Enumerate before / after

Pin Voltage (mV)

D+ 0 0

D- 0 0

VBus 0 0 (All values <= 400mV)

Miscellaneous: Pass Fail

Bypass Capacitance Check: Pass Fail

BC 1.2 Implemented Check: Support N/A

If the upstream port has BC 1.2 capability, all items of BC 1.2 Portable Device category should be tested under this port for USB-IF certification.


USB

Frameworks Test Result (USB20CV) Pass Fail

This test primarily covers USB-IF testing of devices and hubs for compliance with the standard commands in Chapters 9 and 11 of the USB 2.0 specification. This specification does not describe the full set of USB-IF tests and assertions for these devices.

High-Speed:

VID: PID:

Chapter 9 Test: Pass Fail N/A

Interface: MAX Power: mA Remote Wakeup:

MSC Class Test: Pass Fail N/A

UVC Class Test: Pass Fail N/A

HID Class Test: Pass Fail N/A

Basic-Speed:

VID: 04d9 PID: e004

Chapter 9 Test: Pass Fail

Interface: 1 MAX Power: 100 mA Remote Wakeup: Yes





USB

Frameworks Test Result (USB30CV) Pass Fail

All USB peripherals are required to enumerate on a SuperSpeed host controller and pass all applicable tests within USB30CV. Failure framework test in USB30CV will prevent certification.

High-Speed:

VID: PID:

Chapter 9 Test: Pass Fail N/A

Interface: MAX Power: mA Remote Wakeup:




Basic-Speed:

VID: 04d9 PID: e004

Chapter 9 Test: Pass Fail

Interface: 1 MAX Power: 100 mA Remote Wakeup: Yes





USB

Power Current Test Result Pass Fail

High-Speed: Pass Fail N/A

Unconfiguration Power: mA (<= 100mA)

Configuration Power: mA (<= Max Power <= 100mA for Low Power) (<= Max Power <= 500mA for High Power)

Suspend Mode Power without Remote Wakeup: uA Suspend Mode Power with Remote Wakeup Enabled: uA Suspend Mode Power with Remote Wakeup Diabled: uA (<= 2500uA for Self Power Hub or Non Compound Device) (<= 12500uA for Bus Power Hub or Compound Device)

Powered’ State Suspend Mode Power: uA (<= 2500uA for not Supporting USB Battery Charging) (<= 100mA for Supporting USB Battery Charging)

Operating Power: mA (<= Max Power <= 100mA for Low Power) (<= Max Power <= 100mA for Self Power) (<= Max Power <= 500mA for High Power)

Basic-Speed: Low Powered Device Pass Fail

Unconfiguration Power: 12.43 mA (<= 100mA)

Configuration Power: 12.44 mA (<= Max Power <= 100mA for Low Power) (<= Max Power <= 500mA for High Power)

Suspend Mode Power without Remote Wakeup: N/A uA Suspend Mode Power with Remote Wakeup Enabled: 350 uA Suspend Mode Power with Remote Wakeup Diabled: 350 uA (<= 2500uA for Self Power Hub or Non Compound Device) (<= 12500uA for Bus Power Hub or Compound Device)

Powered’ State Suspend Mode Power: 350 uA (<= 2500uA for not Supporting USB Battery Charging) (<= 100mA for Supporting USB Battery Charging)

Operating Power: 12.88 mA (<= Max Power <= 100mA for Low Power) (<= Max Power <= 100mA for Self Power) (<= Max Power <= 500mA for High Power)


USB

Interoperability Test Overall Result Pass Fail

Operating System: Win8.1

EHCI Host Controller: Enumeration and Driver installation Pass Fail Check operation of device Pass Fail Interoperability – Operate all devices Pass Fail Hot plug test – A Plug Pass Fail Hot plug test – B Plug Pass Fail N/A Warm Boot test Pass Fail Remote Wake-up Test Pass Fail N/A S3 Active Standby Test Pass Fail S3 Active Standby Resume Test Pass Fail Root Port Test Pass Fail S4 Active Hibernate Test Pass Fail S4 Active Hibernate Resume Test Pass Fail


USB

Battery Charging 1.2 Compliance Test

Portable Device (PD) Pass Fail N/A

B-UUT Initial Power-up Test Pass Fail N/A

Data Contact Detect Test – With Current Source

Pass Fail N/A

Data Contact Detect Test – No Current Source

Pass Fail N/A

DCP Detection Test Pass Fail N/A

CDP Detection Test Pass Fail N/A

SDP Detection Test Pass Fail N/A

ACA-Dock Detection Test Pass Fail N/A

ACA-A Detection Test Pass Fail N/A

ACA-B Detection Test Pass Fail N/A

ACA-C Detection Test Pass Fail N/A

ACA-GND Detection Test Pass Fail N/A

Common Mode Test - Full Speed Pass Fail N/A

Common Mode Test - High Speed Pass Fail N/A

Dead Battery Provision Test Pass Fail N/A


USB

More Detail Test Result:

1. Basic Speed Upstream Signal Quality: Pass

Overall result: pass! Sync result:

sync passes Signal eye:

eye passes EOP width: 166.44 ns

EOP width passes Measured signaling rate: 11.9946 MHz

signal rate passes Edge Monotonicity: 23 mV

Monotonic Edge passes Crossover voltage range: 1.55 V to 1.62 V, mean crossover 1.58 V

(first crossover at 1.62 V, 10 other differential crossovers checked) crossover voltages pass

Consecutive jitter range: -297.975 ps to 359.526 ps, RMS jitter 253.255 ps Paired JK jitter range: -140.466 ps to -1.134 ps, RMS jitter 99.328 ps Paired KJ jitter range: -114.991 ps to 47.189 ps, RMS jitter 66.634 ps

jitter passes

Additional Information

Rising Edge Rate: 343.25 V/us (Equivalent risetime = 7.69 ns) Falling Edge Rate: 371.61 V/us (Equivalent falltime = 7.10 ns) Edge Rate Match: 7.94% (limit +/-10%)


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SignalData and Eye


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2. Inrush Current: Pass

Overall result: pass! Inrush at 5.000 V: 35.3319 C

Inrush passes Region 1 Start: 0.00012 ms - End: 0.188 ms = 35.33 C

Hot Plug (Attach) Current Draw


USB

Test Procedure Reference: 1. Universal Serial Bus Implementers Forum Device High-speed Electrical Test Procedure

For Tektronix Test Equipment, version: 1.5 2. Universal Serial Bus Implementers Forum Full and Low Speed Electrical and

Interoperability Compliance Test Procedure, Version: 1.3 3. USB-IF Compliance Update Page---Interoperability Gold Tree Update

http://compliance.usb.org/resources/GoldSuite%20Test%20Procedure.pdf 4. USB Battery Charging 1.2 Compliance Plan, Revision: 1.1 Notice: Test result is valid only to the original tested device model. The content of test report may not be copied or re-transmitted (except for the entire report) unless it is prior approved by Allion.

USB 2.0 Test Report For Peripheral - holtek.com.t · Connector Type: Untethered (Tethered means no standard B or special B connector) Basic Speed Upstream Signal Quality: Pass Fail

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