University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell Previous lecture Reflectance I BRDF, BTDF, BSDF Ideal specular model Ideal diffuse (Lambertian) model Phong
Dec 19, 2015
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Previous lecture
Reflectance IBRDF, BTDF, BSDF
Ideal specular model
Ideal diffuse (Lambertian) model
Phong
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Microfacet Reflectance Models
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Outline
Microfacet modelsDiffuse
Oren-Nayar
SpecularTorrance-Sparrow
BlinnAshikhmin-Shirley (anisotropic)
WardSchlick
Lafortune’s modelTwo layer models
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Microfacet Models (Text ch. 9.4)
Model surface as set of polygonal facetsCapture surface roughness effectsMicrofacets can be diffuse or specularUse facet distribution to model roughness
Statistical model of microscopic effects gives macroscopic appearance
More realistic, particularly at high incidence angles
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Basic microfacet modeling
Surface normal distributionHow the surface normals of the facets are distributed about the macroscopic normal
Facet BRDFAre the facets diffuse or specular?
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Microscopic geometry
Masking – viewer can’t see a microfacet
Shadowing – light can’t see a microfacet
Interreflection – light off one facet hits another
Aim is to capture these effects as efficiently as possible
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Oren-Nayar model (Text ch. 9.4.1)
Model facet distribution as Gaussian with s.d. (radians)
Facet BRDF is LambertianResulting model has no closed form solution, but a good approximationSample using cosine-weighted sampling in hemisphere
tansincos,0max, oiior BAf
oi
oi
B
A
,min
,max09.0
45.0
33.021
2
2
2
2
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Oren-Nayar effects
Lambertian Oren-Nayar
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Torrance-Sparrow (Text ch. 9.4.2)
Specular BRDF for facets
Arbitrary (in theory) distribution of facet normals
Additional term for masking and shadowing
Explicit Fresnel term
i
n h
o
Half vector – facet orientation to produce specular transfer
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Torrance-Sparrow BRDF
G(o , i) handles microfacet geometry
D(h) is the microfacet orientation distribution evaluated for the half angle
Changing this changes the surface appearance
Fr(o) is the Fresnel reflection coefficient
io
orhioior
FDGf
coscos4
),(,
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Geometry term
Masking:
Shadowing:
Together:
oh
ohiomaskG
nn2
,
ioshadowiomaskio GGG ,,,,1min,
oh
ihioshadowG
nn2
,
io
orhioior
FDGf
coscos4
,,
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Blinn’s microfacet distribution
Parameter e controls “roughness”
ehh
eD n
2
2
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Sampling Blinn’s model (Text ch. 15.5.1)
Sampling from a microfacet BRDF tries to account for all the terms: G, D, F, cos
But D provides most variation, so sample according to D
The sampled direction is completely determined by halfway vector, h, so sample that
Then construct reflection ray based upon it
So how do we sample such a direction …
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Blinn sampling continued
Need to sample spherical coords: , Book has details, and probably an error on page 684Complication: We need to return the probability of choosing i, but we have the probability of choosing h
Simple conversion term
We need to construct the reflection direction about an arbitrary vector …
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Arbitrary reflection
Coordinate system is not nicely aligned, so use construction
hhooi 2
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Anisotropic microfacet distributions
Parameters for x and y direction roughness, where x and y are the local BRDF coordinate system on the surface
Gives the reference frame for
22 sincos2
1
22
11
2
1yx ee
hyx
yxh ee
eeD
n
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Sampling anisotropic distribution
Sampling is discussed in section 15.5.2 of the text Similar to Blinn but with different distributionNote that there are 4 symmetric quadrants in the tangent planeSample in a single quadrant, then map to one of 4 quadrantsTake care to maintain stratification
0 1
1st 2nd 3rd 4th
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Ward’s isotropic model
“the simplest empirical formula that will do the job”Leaves out the geometry and Fresnel terms
Makes integration and sampling easier
3 terms, plus some angular values:d is the diffuse reflectance
s is the specular reflectance is the standard deviation of the micro-surface slope
2
22
2
tanexp
coscos
1,
h
oi
sd
iorf
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Ward’s anisotropic model
For surfaces with oriented grooves2 terms for anisotropy:
x is the standard deviation of the surface slope in the x direction
y is the standard deviation of the surface slope in the y direction
yx
yhxhh
oi
sd
iorf
4
sincostanexp
coscos
1,
22222
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Sampling Ward’s model
Take 1 and 2 and transform to get h and h:
Only samples one quadrant, use same trick as before to get all quadrantsNot sure about correct normalization constant for solid angle measure
22221
21
sincos
log
2tantan
yxh
x
yh
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Schlick’s model (Schlick 94)
Empirical model well suited to samplingTwo parameters:
, a roughness factor (0 = Specular, 1 = Lambertian), an anisotropy term, (0 perfectly anisotropic, 1 = isotropic)
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Schlick’s model
hhh
hhh
hh
h
AZD
A
Z
coscos
coscos
coscos1
2222
222
Facet Distribution:
Geometry Terms: oioi
oooo
iiii
GGG
G
G
,
coscoscos
coscoscos
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Putting it together
Term to account for inter-reflectionNot a Torrance-Sparrow modelAs before, sample a half vector:
Only samples in 1 quadrantUse trick from before
Normalization not given
oi
oihoiorr
GDGFf
coscos4
,1,
22
222
22
2
11
11
12
cos
h
h
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
More to it than that
Both Ward and Schlick’s original papers define complete reflectance, including diffuse and pure specular componentsPBRT calls these materials, because they are simply linear sums of individual componentsSchlick’s paper also includes a way to decide how to combine the diffuse, specular and glossy terms based on the roughnessBoth Ward and Schlick discuss sampling from the complete distribution
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Phong reloaded
The Phong model can be revised to make it physically reasonable – energy conserving and reciprocal
In canonical BRDF coordinate system (z axis is normal)
eooior Rf np ,,,
eozoyoxie
ozoyoxiiorf 1,1,1,,,,p
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Oriented Phong
Define an orientation vector – the direction in which the Phong reflection is strongest
For standard Phong, o=(-1,-1,1)
To get “off specular” reflection, change o
Can get retro-reflection, more reflection at grazing, etc.
eozzoyyoxxiior ooof ,,,, p
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Lafortune’s model (Text ch. 9.5)
A diffuse component plus a sum of Phong lobes
Allow all parameters to vary with wavelength
Lots of parameters, 12 for each lobe, so suited for fitting to data
It’s reasonably easy to fit
Parameters for many surfaces are available
nlobes
j
eizzjiyyjixxjo
dior
jooof1
,,, ,,,, p
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Lafortune’s clay
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Sampling Lafortune
First choose a lobe (or diffuse)Could be proportional to lobe’s contribution to outgoing direction
But that might be expensive
Then sample a direction according to that lobe’s distribution
Just like sampling from Blinn’s microfacet distribution, but sampling the direction directly
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Two-layer models (Text chs. 9.6 and 15.5.3))
Captures the effects of a thin glossy layer over a diffuse substrate
Common in practice – polished painted surfaces, polished wood, …
Glossy dominates at grazing angles, diffuse dominates at near-normal angles
Don’t need to trace rays through specular surface to hit diffuse
University of Texas at Austin CS395T - Advanced Image Synthesis Spring 2006 Don Fussell
Fresnel blend model