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Technical NoteM500 SSD SMART Attributes—Firmware MU02 and MU03 or Later
IntroductionThis technical note describes the self-monitoring, analysis, and reporting technology(SMART) feature set available for the Micron M500 SSD. The SMART attributes are usedto protect user data and minimize the likelihood of unscheduled system downtime thatmay be caused by predictable degradation and/or fault of the device.
This document describes the SMART parameters available with the Micron M500 SSDfirmware versions MU02 and MU03 or later.
Questions relating to this document should be addressed to [email protected].
Mechanism
A SMART attribute is retrieved by the host issuing the SMART READ DATA command. Inthe 512-bytes returned by the SMART READ DATA command, bytes 0–361 (169h) aremarked as vendor-specific in the ATA8-ACS2 specification. These contain the SMARTattribute data.
Table 1: SMART Attribute Table Layout
OffsetLength(Bytes) Description
0 2 SMART structure version (vendor-specific)
2 12 Attribute entry #1
2 + 12 12 Attribute entry #2
… …
2 + (29 * 12) 12 Attribute entry #30
Each attribute entry contains 12 bytes, comprised of the following fields: ID, Flag, Cur-rent Value, Worst Value, Raw Data, and Reserved. There is no requirement on the orderof the attributes in the table.
For each attribute, there is a corresponding threshold that is retrieved by the host issu-ing the SMART READ ATTRIBUTE THRESHOLDS command. In the 512-bytes data re-turned by the command, the host can compare the threshold with the current value ofeach attribute. If the current value is less than or equal to the threshold, the device is ina status that requires further attention from the system. This procedure is also calledSMART Trip.
The SMART RETURN STATUS command will compare the current value attributes withthe threshold and return a status that specifies the self test has either completed with-out error (C24Fh) or detected a threshold has been exceeded (2CF4h). The SMART RE-TURN STATUS command replaces the functionality of the READ THRESHOLD VALUEand WRITE WARRANTY FAILURE THRESHOLD commands, and provides backward-compatibility with existing SMART applications.
TN-FD-21: M500 SSD SMART AttributesIntroduction
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 1 Micron Technology, Inc. reserves the right to change products or specifications without notice.
Products and specifications discussed herein are for evaluation and reference purposes only and are subject to change byMicron without notice. Products are only warranted by Micron to meet Micron's production data sheet specifications. All
information discussed herein is provided on an "as is" basis, without warranties of any kind.
The order of the threshold entries should match those in Table 1 (page 1).
OffsetLength(Bytes) Description
0 2 SMART structure version (vendor-specific)
2 12 Threshold entry #1
2 + 12 12 Threshold entry #2
… …
2 + (29 * 12) 12 Threshold entry #30
Attribute Definition
Table 3: SMART Attribute Entry Format and Definition
OffsetLength(Bytes) Field Name Data Description
0 1 ID00h This attribute entry is invalid.01h–FFh valid entry.
1 2 Flag
Bit 0: Prefailure/advisory bit. Applicable only when the current value is less thanor equal to its threshold.0 = Advisory: the device has exceeded its intended design life; the failure is notcovered under the drive warranty.1 = Prefailure: warrantable, failure is expected in 24 hours and is covered in thedrive warranty.
Bit 1: Online collection bit.0 = Attribute is updated only during off-line activities1 = Attribute is updated during both online and off-line activities.
Bit 2: Performance bit.0 = Not a performance attribute.1 = Performance attribute.
Bit 3: Error Rate bit. Expected, non-fatal errors that are inherent in the device.0 = Not an error rate attribute.1 = Error rate attribute.
Bit 4: Even count bit.0 = Not an even count attribute.1 = Even count attribute.
Bit 5: Self-preserving bit. The attribute is collected and saved by the drive with-out host intervention.0 = Not a self-preserving attribute.1 = Self-preserving attribute.
Bit 6–15: Reserved.
TN-FD-21: M500 SSD SMART AttributesIntroduction
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 2 Micron Technology, Inc. reserves the right to change products or specifications without notice.
Table 3: SMART Attribute Entry Format and Definition (Continued)
OffsetLength(Bytes) Field Name Data Description
3 1Currentvalue
Normalized (normally from the raw data) attribute value.Valid range 1–253 (FDh), initial value 00 (64h).Values of 0, FEh, and FFh are invalid.This value can be compared to the threshold set by the device.The device should collect enough data before updating the normalized value toensure statistical validity.
4 1 Worst valueWorst ever normalized value.Valid range 1–253 (FDh), initial value 100 (64h).Values of 0, FEh, and FFh are invalid.
5 6 Raw data Vendor and/or attribute-specific.
11 1 Reserved 00h
Threshold Entry Definition
Table 4: SMART Attribute Threshold Entry Format and Definition
OffsetLength(Bytes) Field Name Data Description
0 1 IDCorresponds to the ID field in the SMART Attribute Entry Format and Definitiontable.
1 1 Threshold
00h = Valid threshold value, always passing, as the current value will always belarger.
01h = Valid threshold value.
FDh = Maximum value.
FEh = Invalid threshold value.
FFh = Valid threshold value, always failing.
2 10 Reserved 00h
TN-FD-21: M500 SSD SMART AttributesIntroduction
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 3 Micron Technology, Inc. reserves the right to change products or specifications without notice.
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 4 Micron Technology, Inc. reserves the right to change products or specifications without notice.
TN-FD-21: M500 SSD SMART AttributesSMART Attribute Definitions—MU03 or Later
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 5 Micron Technology, Inc. reserves the right to change products or specifications without notice.
This value is the total number of correctable and uncorrectable ECC error events divi-ded by the total host pages read over the life of the drive, and multiplied by a Constant,C.
VC = CEC + EU
HP
Where:EC = Total number of correctable errorsEU = Total number of uncorrectable errorsHP = Total number of pages read by the host
Constant, C, is defined as:
C =100000(BT)
2
Where:BT = Total number of blocks on the device
Note that ECC errors occurring while reading non-user data will still contribute to thisrate. The Current Value will not be calculated and remains as 0x64 until the host readpage count is greater than C (100,000 × total block count ÷ 2).
Worst Value (8 bits)
The worst value of this field is the lowest value of the Current Value field ever calculatedover the life of the drive, always between 1% and 100% (0x01 to 0x64).
Raw Data (48 bits)
This data field holds the raw sum of correctable and uncorrectable ECC error eventsover the life of the drive. If this ever exceeds 0xFFFFFFFFFFFF, this value will wraparound.
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 32h (50%).
TN-FD-21: M500 SSD SMART AttributesSMART ID 1 (01h): Raw Read Error Rate
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 6 Micron Technology, Inc. reserves the right to change products or specifications without notice.
Note: This attribute definition is applicable to firmware version MU02 only.
Attribute Flags
Self-
preservatio
n
Event c
ount
Error r
ate
Perform
ance
Offline
Warranty
Flag ThresholdMicron 1 1 0 0 1 1 33h
MSB LSB–
Current Value (8 bits)
This value is calculated as:
VC = SM - SM BG
BR
Where:BG = The number of grown bad sectorsBR = The total number of sectors reserved for use by the deviceSM = SMART_MAX_ATTRIBUTE_VALUE
Worst Value (8 bits)
This field contains the value of the Current Value.
Raw Data (48 bits)
The total number of reallocated sectors. This value is calculated as:
VR = BG × BLOCK_SECTOR_COUNT
Note that the retirement of a single defective area on a NAND-based SSD will be done atthe NAND block level. This means that many sectors will be reallocated during a singleblock retirement. For the M500, 16,384 sectors are retired for each single reallocationevent.
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0x0A, meaning the threshold shall represent novalue greater than 90% of the total available reallocated sectors.
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 7 Micron Technology, Inc. reserves the right to change products or specifications without notice.
Note: This attribute definition is applicable to firmware version MU03 or later.
Attribute Flags
Self-
preservatio
n
Event c
ount
Error r
ate
Perform
ance
Offline
Warranty
Flag ThresholdMicron 1 1 0 0 1 1 33h
MSB LSB–
Current Value (8 bits)
This value is calculated as:
VC = SM - SM BG
BR
Where:BG = The number of grown bad blocksBR = The total number of blocks reserved for use by the deviceSM = SMART_MAX_ATTRIBUTE_VALUE
Worst Value (8 bits)
This field contains the value of the Current Value.
Raw Data (48 bits)
The total number of reallocated blocks. This value is calculated as:
VR = BG × BLOCK_SECTOR_COUNT
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0x0A, meaning the threshold shall represent novalue greater than 90% of the total available reallocated blocks.
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 8 Micron Technology, Inc. reserves the right to change products or specifications without notice.
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 9 Micron Technology, Inc. reserves the right to change products or specifications without notice.
This value gives the raw number of power-cycle events experienced over the life of thedrive.
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
TN-FD-21: M500 SSD SMART AttributesSMART ID 12 (0Ch): Power-Cycle Count
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 10 Micron Technology, Inc. reserves the right to change products or specifications without notice.
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 11 Micron Technology, Inc. reserves the right to change products or specifications without notice.
Where:FP = Total number of program failsBR = The number of reserved blocks remaining
Worst Value (8 bits)
This value is the lowest Current Value recorded over the life of the drive.
Raw Data (48 bits)
This value contains the raw number of PROGRAM failure events over the life of thedrive.
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
TN-FD-21: M500 SSD SMART AttributesSMART ID 171 (ABh): Program Fail Count
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 12 Micron Technology, Inc. reserves the right to change products or specifications without notice.
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 13 Micron Technology, Inc. reserves the right to change products or specifications without notice.
Where:VC = The current valueSM = SMART_MAX_ATTRIBUTE_VALUEEAVG = The average erase countBL = The rated life of a block (the erase count for which the part is rated)
Worst Value (8 bits)
This value is the lowest recorded Current Value.
Raw Data (48 bits)
This value is the average erase count of all super blocks. One super block is defined toinclude all the physical blocks with the same block number of all planes.
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
TN-FD-21: M500 SSD SMART AttributesSMART ID 173 (ADh): Average Block-Erase Count
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 14 Micron Technology, Inc. reserves the right to change products or specifications without notice.
This value is the total number of times the device has been power-cycled unexpectedly.
Unexpected power loss can be avoided by preceding a power off with an ATA STBI(STANDBY IMMEDIATE) command, and allowing the SSD to properly complete thiscommand before removing power to the SSD.
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
TN-FD-21: M500 SSD SMART AttributesSMART ID 174 (AEh): Unexpected Power Loss Count
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 15 Micron Technology, Inc. reserves the right to change products or specifications without notice.
SMART ID 180 (B4h): Unused Reserve (Spare) NAND Blocks
Note: This attribute definition is applicable to firmware version MU03 or later.
Attribute Flags
Self-
preservatio
n
Event c
ount
Error r
ate
Perform
ance
Offline
Warranty
Flag ThresholdMicron –
MSB LSB
– – – – – – –
Current Value
This value is hard-coded to zero (0x00).
Worst Value
This value is hard-coded to zero (0x00).
Raw Data
This value is calculated as:
URBC = BT - (BU - BF)
Where:URBC = Total unused reserved block countBT = Total number of reserved block listBU = Total number of bad blocks used in the device (both factory and grown)BF = Total factory loaded bad block list (OTP)
Reserved/Threshold
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 16 Micron Technology, Inc. reserves the right to change products or specifications without notice.
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 17 Micron Technology, Inc. reserves the right to change products or specifications without notice.
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
TN-FD-21: M500 SSD SMART AttributesSMART ID 183 (B7h): SATA Interface Downshift
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 18 Micron Technology, Inc. reserves the right to change products or specifications without notice.
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 19 Micron Technology, Inc. reserves the right to change products or specifications without notice.
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 20 Micron Technology, Inc. reserves the right to change products or specifications without notice.
Note: This attribute definition is applicable to firmware version MU02 only.
Attribute Flags
Self-
preservatio
n
Event c
ount
Error r
ate
Perform
ance
Offline
Warranty
Flag ThresholdMicron 1 1 0 0 1 0 32h –
MSB LSB
Current Value (8 bits)
This value is hard-coded to 100% (0x64).
Worst Value (8 bits)
This value is hard-coded to 100% (0x64).
Raw Data (48 bits)
This value is the total number of command timeouts. This attribute tracks the numberof command timeouts as defined by an active command being interrupted by anHRESET, COMRESET, SRST, or another command.
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 21 Micron Technology, Inc. reserves the right to change products or specifications without notice.
Where:TC = Current temperatureSM = SMART_MAX_ATTRIBUTE_VALUE
Worst Value (8 bits)
This value is calculated as:
VW = SM - TM
Where:SM = SMART_MAX_ATTRIBUTE_VALUETM = Maximum temperature recorded for the device
Raw Data (48 bits)
The value is defined as:
Bytes
5 4 3 2 1 0
MAX temperature MIN temperature Current temperature
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
TN-FD-21: M500 SSD SMART AttributesSMART ID 194 (C2h): Enclosure Temperature
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 22 Micron Technology, Inc. reserves the right to change products or specifications without notice.
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 23 Micron Technology, Inc. reserves the right to change products or specifications without notice.
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 24 Micron Technology, Inc. reserves the right to change products or specifications without notice.
This value gives the number of blocks waiting to be remapped.
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
TN-FD-21: M500 SSD SMART AttributesSMART ID 197 (C5h): Current Pending Sector Count
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 25 Micron Technology, Inc. reserves the right to change products or specifications without notice.
SMART ID 198 (C6h): SMART Off-line Scan Uncorrectable Error Count
Attribute Flags
Self-
preservatio
n
Event c
ount
Error r
ate
Perform
ance
Offline
Warranty
Flag ThresholdMicron 1 1 0 0 0 0 30h –
MSB LSB
Current Value (8 bits)
This value is hard-coded to 100% (0x64).
Worst Value (8 bits)
This value is hard-coded to 100% (0x64).
Raw Data (48 bits)
This value is the cumulative number of unrecoverable read errors found in a back-ground media scan. If no background media scan has been run, a value of 0 will be re-turned.
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 26 Micron Technology, Inc. reserves the right to change products or specifications without notice.
This value is the cumulative number of FIS interface general CRC (cycle redundancycheck) error counts over the life of the drive, for both reads and writes, since the mostrecent power cycle.
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 27 Micron Technology, Inc. reserves the right to change products or specifications without notice.
This value gives the threshold inverted value of the data value below. That is, if 30% ofthe lifetime has been used, this value will report 70%. A value of 0% indicates that 100%of the expected lifetime has been used.
This value is defined as:
VC = SM - VR
Where:SM = SMART_MAX_ATTRIBUTE_VALUEVR = Raw data value
Worst Value (8 bits)
This field holds the same value as the Current Value because the Current Value is mo-notonically decreasing.
Raw Data (48 bits)
This value is defined as:
VR = 100 MAX(EAVG)
BL
Where:EAVG = The average erase count for a super block (stripe of blocks)BL = The erase count for which the part is rated (block life)
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 28 Micron Technology, Inc. reserves the right to change products or specifications without notice.
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 29 Micron Technology, Inc. reserves the right to change products or specifications without notice.
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 30 Micron Technology, Inc. reserves the right to change products or specifications without notice.
Note: This attribute definition is applicable to firmware version MU03 or later.
Attribute Flags
Self-
preservatio
n
Event c
ount
Error r
ate
Perform
ance
Offline
Warranty
Flag ThresholdMicron 1 1 1 0 1 0 3Ah –
MSB LSB
Current Value
This value is hard-coded to 100% (0x64).
Worst Value
This value is hard-coded to 100% (0x64).
Raw Data
The total number of sectors written by the host.
Reserved/Threshold
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
TN-FD-21: M500 SSD SMART AttributesSMART ID 246 (F6h): Total Host Sector Writes
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 31 Micron Technology, Inc. reserves the right to change products or specifications without notice.
Note: This attribute definition is applicable to firmware version MU03 or later.
Current Value
Contact factory for details.
Worst Value
Contact factory for details.
Raw Data
Contact factory for details.
Reserved/Threshold
Contact factory for details.
TN-FD-21: M500 SSD SMART AttributesSMART ID 247 (F7h): Contact Factory
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 32 Micron Technology, Inc. reserves the right to change products or specifications without notice.
Note: This attribute definition is applicable to firmware version MU03 or later.
Current Value
Contact factory for details.
Worst Value
Contact factory for details.
Raw Data
Contact factory for details.
Reserved/Threshold
Contact factory for details.
TN-FD-21: M500 SSD SMART AttributesSMART ID 248 (F8h): Contact Factory
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 33 Micron Technology, Inc. reserves the right to change products or specifications without notice.
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Micron and the Micron logo are trademarks of Micron Technology, Inc.All other trademarks are the property of their respective owners.
TN-FD-21: M500 SSD SMART AttributesRevision History
PDF: 09005aef8535b133tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN 34 Micron Technology, Inc. reserves the right to change products or specifications without notice.