Top Banner
TID and TS J. William Gu Data Acquisition 1.Trigger distribution scheme 2.TID development 3.TID in test setup 4.TS development
7

TID and TS J. William Gu Data Acquisition 1.Trigger distribution scheme 2.TID development 3.TID in test setup 4.TS development.

Dec 28, 2015

Download

Documents

Bryan Walsh
Welcome message from author
This document is posted to help you gain knowledge. Please leave a comment to let me know what you think about it! Share it to your friends and learn new things together.
Transcript
Page 1: TID and TS J. William Gu Data Acquisition 1.Trigger distribution scheme 2.TID development 3.TID in test setup 4.TS development.

TID and TSJ. William Gu

Data Acquisition

1. Trigger distribution scheme2. TID development3. TID in test setup4. TS development

Page 2: TID and TS J. William Gu Data Acquisition 1.Trigger distribution scheme 2.TID development 3.TID in test setup 4.TS development.

Trigger Distribution/Data Readout

TI: trigger distribution and ROC readout control;A low jitter global clock (250MHz): pipeline etc.;SYNC: all the front end crate can be synchronized.

TS: Trigger control (physical trigger to physical event), SYNC and Clock generation;TD: TRG/CLK/SYNC optic fanout, link checkTI: trigger distribution, ROC controlSD: TRG/CLK/SYNC fan out (VXS P0)

Page 3: TID and TS J. William Gu Data Acquisition 1.Trigger distribution scheme 2.TID development 3.TID in test setup 4.TS development.

TID DevelopmentPrototype:

TS, TI, TD or combinations of these individual board functions. This is especially useful for test setups (detail next page)

Production: (one PCB, two assembly)Dedicated TI (one optic transceiver)Dedicated TD (does not drive P0)

Legacy compatibility:With a Mezz card, the TID/TI can

behave like an TI_rev2 board, which can connect to TS_Rev2

Page 4: TID and TS J. William Gu Data Acquisition 1.Trigger distribution scheme 2.TID development 3.TID in test setup 4.TS development.

TID used in test setup

With TIDs, a system with up to nine crates can be setup. A two-crate system was tested extensively;

Limitation: “TS” trigger inputs: 6 (current firmware); 7 with firmware update;

TI_MASTERTI

TI

Page 5: TID and TS J. William Gu Data Acquisition 1.Trigger distribution scheme 2.TID development 3.TID in test setup 4.TS development.

TS development

External Trigger INTwo 15-bit orFour 7-bit source synced

TS clock output, orQSFP (driving TI)

TS clock input, orQSFP (driving TI)

16 diff. inputs

12 diff. outputs

10 single-endedoutputs

VME64xVMEJTAG (PROM loading)

VXSTRG/CLOCK/SYNC(pulse mode or serialized mode)

6 x 4 LEDs board status

GTP trigger INTwo 15-bit, or four 7-bit source synced

Optional:Trigger to TD,Busy from TD

Page 6: TID and TS J. William Gu Data Acquisition 1.Trigger distribution scheme 2.TID development 3.TID in test setup 4.TS development.

TS developmentTrigger: It can accepts up to 30 GTP inputs (from VME P2 backplane) , 30 external inputs (from front panel), and another 15 front panel inputs. It can also generate readout triggers from VME command. (>=) 10-bit trigger (event) types are supported. Every trigger input can be enabled, pre-scaled, and monitored by scalars.

Sync: With the fiber latency measurement (by TI), all the front end crate can be synced to within 4ns (one 250 MHz clock cycle).

Clock: the onboard 250 MHz oscillator, or external input

Backpressure (or DAQ flow control): with BUSY feedback, and status link (opposite link from the TRIGGER word), the DAQ can work in blocking mode, single event locking mode, or free running mode.

Page 7: TID and TS J. William Gu Data Acquisition 1.Trigger distribution scheme 2.TID development 3.TID in test setup 4.TS development.

TS Development-- Trigger (event) Type lookup table scheme

15x8

15x8

MUX(with

priorities)

VME triggers

15x11

15x11

15x8

16x11

MxN M-bit input, N-bit output memory lookup table.The table is downloaded by software at startup

15

15

8

8

15x8

15x8

16x11

15

15

8

8

15

6

5

5

6

4

4

Trigger(event)Type

GTPTrigger

ExternalTrigger

Front Paneltrigger

>10