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www.ondax.com
THz-Raman® Spectroscopy Benchtop Systems
Features• Fast collection of THz-Raman® spectra from
5cm-1 to >3000cm-1 (150GHz to 90THz) • Simultaneous Stokes
and anti-Stokes signals
improve SNR while providing inherent calibration reference
• Available as add-on to an existing Raman systems or
spectrometers, or as a complete custom-configured system
• Convenient vial holder option for fast sample measurements
• Fiber coupling enables easy interface to a wide range of
spectrometers
• Available at 488nm, 514nm, 633nm, 532nm, 785nm, 830nm, and
976nm excitation wavelengths
Applications• Polymorph identification and analysis• Trace
detection and source attribution of
explosives/hazmat/drugs• Crystal and phase monitoring•
Structural studies of nano- and
bio- materials, photovoltaics, and semiconductors
• Forensics, archeology, mineralogy
THz-Raman® – The “Second Fingerprint” of RamanOndax’s patented1
THz-Raman® Spectroscopy Systems extend the range of traditional
Raman spectroscopy into the terahertz/low-frequency regime,
exploring the same range of energy transitions as terahertz
spectroscopy – without limiting the ability to measure the
fingerprint region. The THz-Raman spectral region covers both
Stokes and anti-Stokes signals from ±5 cm-1 to 200 cm-1, (or 150
GHz to 6 THz), which contain important structural information about
the molecule or crystal lattice. This region reveals a new
“Structural Fingerprint” to complement the traditional “Chemical
Fingerprint” of Raman, enabling simultaneous analysis of both
molecular structure and chemical composition in one instrument for
advanced materials characterization.
See What You’ve Been Missing – More Data, Better
Sensitivity and ReliabilityTHz-Raman spectra show clear
differentiation of structural attributes of the material, ideal for
identification and analysis of polymorphs, raw material sources,
defects & contamination, crystal formation and orientation,
phase monitoring and synthesis methods. Applications include
pharmaceuticals, explosives, narcotics, nano- and bio-materials,
semiconductors, photovoltaics, and petrochemicals.
By adding both low-frequency and anti-Stokes signals to the
traditional fingerprint, THz-Raman systems boost overall Raman
intensity and improve SNR. The anti-Stokes signals can also be used
to calculate in-situ temperatures and to confirm the
position/validity of Stokes peaks, providing an inherent
calibration reference (via Stokes/anti-Stokes symmetry) that
improves overall confidence and reliability.
One Sample, One System, One AnswerCombining both composition and
structural analysis eliminates the need for multiple samples and
instruments, lowering capital, training and maintenance costs.
These compact plug-and-play platforms can be integrated with
virtually any lab-grade microscope or Raman system. With excitation
wavelengths ranging from 488nm to 976nm, and a wide range of
options and compatible spectrometers to choose from, an Ondax
THz-Raman® system can be optimized to match any application.
XLF-CLM (with vial holder)
1 Patents #8,184,285 and 7,986,407
Full Raman spectrum of the pharmaceutical Carbamazepine showing
both the THz-Raman “Structural Fingerprint” and traditional
“Chemical Fingerprint” regions. Note higher intensity
and symmetry of THz-Raman signals.
XLF-C(with fiber input
for external laser)
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THz Raman: Covering low frequencies, anti-Stokes, plus the
traditional fi ngerprint region!THz-Raman® extends the reach of
Raman systems into the low-frequency, (low wavenumber) spectral
regime where important structural details can be discerned,
including polymorphs, isomers, cocrystals, and lattice/phonon
modes. The high optical density, ultra-narrowband, high-throughput
design virtually eliminates the Rayleigh signal while enabling
rapid collection of both Stokes and anti-Stokes signals from ±
5cm-1 to >3,000 cm-1.
The examples below show spectra in the ~5-200cm-1, or
150GHz-6THz regimes, using two diff erent excitation wavelengths.
For strong Raman scatterers such as Sulfur (left), the ratio of
Rayleigh peak to signal peak is exceptionally low. The L-Cystine
spectrum (right) shows how narrow the fi lters are by producing
clearly diff erentiated signals down to
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THz-Raman® System Specifications:Parameter Units
Specification
Wavelength1 nm 532 785/830 976
Power at sample port (min) mW 50 to 2502 100 300
Physical Dimensions (W x L x H) in 9” x 14” x 3” 9” x 14” x 3”
9” x 14” x 3”1 Model XLF-C also available in 488nm, 514nm, and
633nm2 Specify power level at time of order
Spectrometer3:Fixed Grating Spectrometer Tunable Grating
Spectrometer
Spectral Range (typical) -200cm-1 to +2200cm-1 0-1100 nm (w/Si
Detector)
Spectral Resolution 2.5cm-1 to 4cm-1 1.25cm-1 or greater
Computer Interface USB USB
3 Spectrometer specifications depend on manufacturer and options
ordered
System Description and Configurations:All THz-Raman® Series
platforms are ultra-compact and simple to connect via fiber to
almost any spectrometer or Raman system. Our patented SureBlock™
ultra-narrow-band Volume Holographic Grating (VHG) filters
precisely block only the Rayleigh excitation with >OD8
attenuation, enabling simultaneous capture of both Stokes and
anti-Stokes signals. A high-power, wavelength-stabilized, ASE-free
single-frequency laser source is precisely matched to the filters
to assure maximum throughput and exceptional attenuation of the
excitation source.
The TR-MICRO mounts directly to a broad range of popular
microscope platforms and micro-Raman systems, and can be easily
switched in and out of the optical path. The system includes an
Ondax SureLock™ 785nm, 830nm, or 976nm laser source, notch filters,
and optional circular polarization (linear polarization is
standard). A sample imaging camera is also available upon
request.
The XLF-CLM is configured for Benchtop use and offers an
optional vial/cuvette sample holder for fast, easy measurements.
The system also comes with a standard cage mounting plate (centered
on the collimated output beam) to allow for customized collection
optics or easy integration into a customized system. The XLF-CLM
includes a SureLock™ 785nm, 830nm, or 976nm laser source, notch
filters, and optional circular polarization. The XLF-C has a fiber
input port to accept a fiber coupled DPSS or gas laser as an
alternative excitation source to our diode lasers.
Model XLF-CLM with Integrated Laser Module and Sample
Vial/Cuvette Holder Model XLF-C with fiber coupled input
for gas or DPSS laser
Model TR-MICRO Mounted on Leica DM 2700 M
Compatible with either fixed-grating or tunable grating
spectrometers
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850 E. Duarte Rd. Monrovia, CA 91016626-357-9600
(Tel)626-513-7494 (Sales Fax)
For more information about Ondax products and the name of a
local representative or distributor, visit www.ondax.com,email
[email protected], or call (626) 357-9600. Specification Subject to
change without notice. Each purchased laser is provided with test
data. Please refer to this data before using the laser. © 2014
Ondax, Inc. 6/14 - Rev. 1
Phase MonitoringThz-Raman can be used for in-situ phase
monitoring. Shown at right are the phase changes of Sulfur observed
when heated from room temp.(α) to 95.2°C (β) and then to the
melting point of 115.21°C (λ). Note the clearly recognizable
changes in both peak location and magnitude in the THz-Raman
region, with no obvious shifts in peaks in the Raman fi ngerprint
region.
Crystal MonitoringMonitoring the presence or formation of
cocrystals is also improved using THz-Raman spectra. The fi gure at
left shows the clearly recognizable peak shifts that occur when
cocrystals are formed in a mixture of Caff eine and 2-Benzoic
acid.
Gas SensingRotational modes of many gases can be clearly seen in
the THz-Raman region. Signal intensities can be up to 10x those in
the fi ngerprint region, opening up the possibility of using Raman
for extremely sensitive gas sensing applications. The
Stokes/anti-Stokes ratios can also be used for remote sensing of
temperature.
Ordering Information
Additional ApplicationsAs with traditional Raman, THz-Raman
spectra are inelastically scattered from the sample, are excited by
a visible or NIR laser, and enable direct measurement of materials
without special sample preparation or environmental control.
THz-Raman spectra show clear diff erentiation of structural
attributes of the material. A few example applications are shown
below:
λ: Wavelength 1
A: Output Fiber2
B: Sample Port31 Wavelength= 532nm, 785nm, 830nm or 976nm. For
532nm, specify power at time of order2 100µm, 50µm, or 25µm to
match spectrometer f # (NA)3 FS = Free Space, OB = Cage with
Objective, CUV = Cuvette/Vial Holder
Sample Holder (Vial/Cuvette)Circular Polarization
XLF – CLM – λλλ – A – B Options:XLF – C – λλλ – A – B