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J. M. Martins Ferreira - University of Porto (FEUP / DEEC) Tallinn Technical University :: May 4th 2009 1 / 32 Tallinn Technical University :: May 4th 2009 This presentation is available at http://www.slideshare.net/josemmf Tallinn Technical University :: May 4th 2009 This presentation is available at http://www.slideshare.net/josemmf J. M. Martins Ferreira FEUP / DEEC - Rua Dr. Roberto Frias 4200-537 Porto - PORTUGAL Tel. 351 225 081 889 / Fax: 351 225 081 443 [ [email protected] ] Boundary-scan test for structural fault detection
32

The IEEE 1149.1 Boundary-scan test standard

Jan 14, 2015

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Talk delivered to bachelor students of electrical engineering at the Technical University of Talllinn in May 2009
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Page 1: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 1 / 32

Tallinn Technical University :: May 4th 2009This presentation is available at http://www.slideshare.net/josemmf

Tallinn Technical University :: May 4th 2009This presentation is available at http://www.slideshare.net/josemmf

J. M. Martins Ferreira

FEUP / DEEC - Rua Dr. Roberto Frias

4200-537 Porto - PORTUGAL

Tel. 351 225 081 889 / Fax: 351 225 081 443

[ [email protected] ]

Boundary-scan test for structural fault detection

Page 2: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 2 / 32

Part 1

Outline

1. Introduction to the IEEE 1149.1 boundary-scan test (BST) standard

2. The remote BST controller (MWS-TAP)

Break

3. The demonstration board

4. Open and short fault detection

Page 3: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 3 / 32

• Why do we need it and for what?

• The test principle

• BS cells and test architecture

• The on-chip controller

• The test modes (instructions)

1: The IEEE 1149.1 std (boundary-scan test)

Page 4: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 4 / 32

Why Boundary Scan Test?• The two main reasons that led in the mid-

80s to the development of BST were:– The complexity of ICs made it exceedingly

difficult to develop test programs for the functional test of complex PCBs

– Small outline surface mount devices and advanced mounting technologies almost disabled physical access to internal PCB nodes and made in-circuit test exceedingly difficult

Page 5: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 5 / 32

The application domain of BST• BST addresses the structural test of

digital printed circuit boards

• Keywords: structural, digital, PCBs

• This embedded test infrastructure is now used for other purposes as well (e.g. in-system programming)

Page 6: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 6 / 32

The BS test principle

• BS uses a Test Access Port (TAP) to decouple the internal IC logic from the pins and allows “direct” access to any PCB node without backdriving effects

Page 7: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 7 / 32

The basic BS cell

• Three modes of operation:– Transparency– Controllability– Observability

RegistoBST

Serial input

Parallel input

Parallel output

Serial output

mux

mux

C/S L

Page 8: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 8 / 32

The BS architecture• Main blocks:

– BST register– BP register– Instruction register– TAP controller– Other registers

User data reg.

Identific. reg.

BP reg.

Decoder

Instruction reg.

Data mux

Data / instr. mux

TAP contr.

TDI

/TRST

TMS

TCK

TDO

BST register

Page 9: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 9 / 32

Serial input

Parallel input

Parallel output

Serial output

mux

mux

C/S L

TAP controller state transition diagram1

0

Shift DR

Capture DR

Select DR

Exit-1 DR

Pause DR

Exit-2 DR

Update DR

Test LogicReset

Run Test /Idle

Shift IR

Capture IR

Select IR

Exit-1 IR

Pause IR

Exit-2 IR

Update IR

1

1

1

1

1

1

1

0

0

0

0

0

0

0

1 1

1

1

1

1

1

1

0

0

0

0

0

0

0

0

User data reg.

Identific. reg.

BP reg.

Decoder

Instruction reg.

Data mux

Data / instr. mux

TAP contr.

TDI

/TRST

TMS

TCK

TDO

BST register

Page 10: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 10 / 32

BST instructions

• Mandatory:– EXTEST– SAMPLE / PRELOAD– BYPASS

• Optional:– INTEST, RUNBIST,

CLAMP, IDCODE,USERCODE, HIGHZ

User data reg.

Identific. reg.

BP reg.

Data mux

Data / instr. mux

TDO

BST register

BST register

Page 11: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 11 / 32

2: The remote BST controller (MWS-TAP)

• Why / What is it for?

• The hardware setup

• Configuration

• The MWS-TAP application

• The test program

Page 12: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 12 / 32

Why / what for?

• To enable the students to write real test programs in SVF and to execute online

• To provide a tool for test program validation

• To facilitate hands-on sessions with real 1149.X hardware

Page 13: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 13 / 32

Setup: The MWS board

• The micro web server TAP controller application uses a DSTINIm400 evaluation board (with a networked microcontrollerfrom Maxim-Dallas)

• The current prototype controls one BS chain

Page 14: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 14 / 32

MWS board: the JTAG pinsT

MS

TC

KT

DO

TD

I

Page 15: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 15 / 32

Setup: IP and connections• An RS232C port can be

used to program a valid IP address into the micro web server board

• The server application can then be loaded by FTP and launched via Telnet

Page 16: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 16 / 32

Set up (cont.)

• If the current IP of the MWS is known, a quicker set up procedure is possible:– Connect the card directly to a computer using a

regular LAN cable and telnet to its IP address– Set up the new IP address (cuts the current

connection if in different subnets), e.g. ipconfig -a 158.36.164.12 -m 255.255.254.0 -g 158.36.164.1

– Set the current IP of the computer to the same subnet and reconnect (or use the LAN)

Page 17: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 17 / 32

MWS-TAP – set IP address and connect

Page 18: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 18 / 32

MWS-TAP – Open / write a new SVF test program

Page 19: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 19 / 32

Short break!

Tallinn Technical University :: May 4th 2009

Boundary-scan test for structural fault detection

Tallinn Technical University :: May 4th 2009This presentation is available at http://www.slideshare.net/josemmf

Page 20: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 20 / 32

Part 2

Outline of this talk

1. Introduction to the IEEE 1149.1 boundary-scan test (BST) standard

2. The remote BST controller (MWS-TAP)

Break

3. The demonstration board

4. Open and short fault detection

Page 21: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 21 / 32

3: The demonstration board

• What’s in it?

• Schematic

• Integrity check

• BS in practice (led control)

Page 22: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 22 / 32

Block diagram of the demonstration board

net 232Y3O7

O6

O5

O4

O3

O2

O1

O0

I7

I6

I5

I4

I3

I2

I1

I0

0

1

2

3

4

5

6

7

8

9

17

16

15

14

13

12

11

10

0

1

2

3

4

5

6

7

8

9

17

16

15

14

13

12

11

10

9

8

7

6

5

4

3

2

1

0

10

11

12

13

14

15

16

172Y2

2Y1

2Y0

/1Y3

/1Y2

/1Y1

/1Y0

A1

B1

A2

B2

A3

B3

A4

B4

Y1

Y2

Y3

Y4

net 22

net 21

net 20

net 19

net 18

net 17

net 16

net 7

net 6

net 5

net 4

net 3

net 2

net 1

net 0

net 11

net 10

net 9

net 8

net 14

net 15

Cluster 0BS Component 0 BS Component 1 Cluster 1

BS Component 2

TDI 0

TDO 0

TDO 1

TDI 1

net 13

net 12

A

B

/G1

/G2

S /G

(IC3) (IC1 and IC2) (IC4) (IC6)

(IC5)

Page 23: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 23 / 32

Schematic diagram

Page 24: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 24 / 32

Integrity check of the BS infrastructure• Detection of:

– Faulty TAP pins– Faulty / misplaced components

• Sequence of operations:– Reset (TRST or 5 x TMS1)– IR capture and scan– ID capture and scan (if supported)

XX...X01 XX...X01 XX...X01

TDI

TDO

TDI TDI

TDO TDO

Page 25: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 25 / 32

Led control

• What BS instruction?

• What test vector (into the BS register)?

inst

ruct

ion

sB

S r

egis

ter

Page 26: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 26 / 32

MWS-TAP – Example (led control)

Page 27: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 27 / 32

4: Open and short fault detection

• Detection of an open fault

• Detection of a short-circuit

• Further recommended exercises

Page 28: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 28 / 32

Detection of open circuit X1• What

conditions enable the detection of open circuit X1?

/G A B /Y0 /Y1 /Y2 /Y3

Page 29: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 29 / 32

Detection of short-circuit X2

/G A B /Y0 /Y1 /Y2 /Y3

• What conditions enable the detection of short circuit X2?

Page 30: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 30 / 32

Detection of short circuit X9• What conditions enable the detection of

short-circuit X9?

Page 31: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 31 / 32

• What conditions enable the detection of short- circuit X16?

Detection of short circuit X16

Page 32: The IEEE 1149.1 Boundary-scan test standard

J. M. Martins Ferreira - University of Porto (FEUP / DEEC)Tallinn Technical University :: May 4th 2009 32 / 32

Tallinn Technical University :: May 4th 2009This presentation is available at http://www.slideshare.net/josemmf

Tallinn Technical University :: May 4th 2009This presentation is available at http://www.slideshare.net/josemmf

Boundary-scan test for structural fault detection

Thanks for your attention!

J. M. Martins Ferreira [ [email protected] ]