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The development of new techniques for SRF cavity surface research at Fermilab Mingqi Ge Technical Division Fermi National Accelerator laboratory Sept 21, 2010 1
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The development of new techniques for surface defect ...

May 25, 2022

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Page 1: The development of new techniques for surface defect ...

Th

e d

eve

lop

me

nt o

f n

ew

te

ch

niq

ue

s

for

SR

F c

avity s

urf

ace

re

se

arc

h a

t

Fe

rmila

b

Mingqi Ge

Technical Division

Fermi National Accelerator laboratory

Sept 21, 2010

1

Page 2: The development of new techniques for surface defect ...

Outlin

e

�C

avity o

ptica

l in

sp

ectio

n

�S

urf

ace

re

plic

a t

ech

niq

ue

�L

ase

r re

-me

ltin

g t

ech

niq

ue

�L

ase

r w

eld

ing

stu

dy

La

se

r w

eld

ing

stu

dy

2

Page 3: The development of new techniques for surface defect ...

Cavity R

F p

erf

orm

ance s

tatistic

Image c

ourt

esy o

f C

am

ille G

insburg

1stpass y

ield

2n

dpass y

ield

�E

ven a

fter

2n

dpass,

less t

han 5

0%

cavitie

s y

ield

at

35M

V/m

.

�S

urf

ace s

tate

affects

SR

F c

avity s

uperc

onductivity d

ram

atically

.

�S

urf

ace r

esearc

h is a

n im

port

ant

assig

nm

ent

for

SR

F m

ate

rial gro

up in F

NA

L.

3

Page 4: The development of new techniques for surface defect ...

Op

tica

l in

sp

ectio

n te

ch

niq

ue

at F

erm

ilab

Kyoto system:

�1

.3G

Hz 9

-ce

ll ca

vity

�1

.3G

Hz s

ing

le-c

ell

ca

vity

Questarsystem:

�1

.3G

Hz 9

-ce

ll d

resse

d c

avity

�1

.3G

Hz s

ing

le-c

ell

ca

vity

�3

.9G

Hz 9

-ce

ll ca

vity

�3

.9G

Hz s

ing

le-c

ell

ca

vity

�1

.3G

Hz T

rave

ling

wa

ve

ca

vity

�S

po

ke

ca

vity

�6

50

MH

z S

RF

ca

vity

Kyo

to o

pti

cal

insp

ect

ion

syst

em

Qu

est

ar

insp

ect

ion

syst

em

Page 5: The development of new techniques for surface defect ...

Ky

oto

sy

ste

m

10

0%

cro

pp

ed

im

ag

e f

rom

ce

nte

r

Re

solu

tio

n c

om

pa

riso

n b

etw

ee

n K

yo

to a

nd

Qu

est

ar

syst

em

Qu

est

ar

syst

em

Resolution

(lp/mm)

Questa

r181

Kyoto

32

5

Page 6: The development of new techniques for surface defect ...

De

fects

ob

se

rve

d in

eq

ua

tor

reg

ion

TE

1C

AT

002

Pit in T

E1C

AT

002

TB

9A

CC

017

TB

9jl0

02

1 m

m

Oxid

e la

ye

r in

TB

9A

CC

01

7

TE

1A

ES

004

TE

1A

CC

004

TE

1A

CC

003 6

Page 7: The development of new techniques for surface defect ...

Gro

wth

of p

it o

bse

rve

d b

y o

ptica

l in

sp

ectio

n

De

fects

ob

se

rve

d in

iri

s r

eg

ion

Image c

ourt

esy o

f D

mitri S

erg

ats

kov

TB

9R

I026

TB

9jl0

02

TB

9jl0

02

1 m

m

Gro

wth

of p

it o

bse

rve

d b

y o

ptica

l in

sp

ectio

n

Bra

nd n

ew

cavity

Aft

er

70µ

m E

PA

fter

anoth

er

70µ

m

EP

(to

tal 140µ

m E

P )

TB

9R

I026

So

me

pits c

an

no

t b

e

rem

ove

d b

y b

ulk

EP

!

10

m

7

Page 8: The development of new techniques for surface defect ...

Surf

ace r

eplic

a techniq

ue a

t F

erm

ilab

Motivation

�T

o r

eveal th

e 3

-D p

rofile

of pits.

�T

o p

rovid

e t

opolo

gy info

rmation t

o e

sta

blis

h t

he m

echanis

m

of lo

cal quench a

t th

e fla

ws.

�T

o a

ssess s

urf

ace p

repara

tion e

ffectiveness b

y e

xtr

acting

surf

ace r

oughness

Technic

al challe

ng

es

�R

esolu

tion (

to r

esolv

e f

eatu

res~

>100

µm

in d

iam

ete

r; >

10

µm

in d

epth

) .

�P

ouring s

ilicone in a

nd p

eelin

g it out fr

om

deep 9

-cell

cavity.

�N

o d

egra

dation f

or

RF

perf

orm

ance.

8

Page 9: The development of new techniques for surface defect ...

Technic

al appro

achin

g

Cup

Sil

ico

ne

Ba

llo

on

He

ad

Ra

il

Sta

ge

Cup

Mold

ing e

quato

r re

gio

n

Mold

ing iris r

egio

n

Page 10: The development of new techniques for surface defect ...

Technic

al appro

achin

g

Str

ing

Sili

co

ne

Fe

atu

res o

n s

ilico

ne

Epoxy a

fter

casting o

n s

ilicone

µm

012345678910

11

12

13

14

15

16

17

18

19

20

Featu

re’s

3D

shape a

fter

pro

filo

metr

y s

cannin

g

Page 11: The development of new techniques for surface defect ...

Resolu

tion:

1 m

icro

n !

A m

an-m

ade p

itP

it r

eplic

m 0

20

40

60

80

10

0

12

0

14

0

16

0

18

0

20

0

00

.05

0.1

0.1

50

.20

.25

0.3

0.3

50

.40

.45

0.5

0.5

50

.60

.65

0.7

0.7

5 m

m

Le

ng

th =

0.8

mm

P

t =

12

8 µ

m

Sca

le =

20

0 µ

m 0

20

40

60

80

10

0

12

0

14

0

16

0

18

0

20

0

00

.05

0.1

0.1

50

.20

.25

0.3

0.3

50

.40

.45

0.5

0.5

50

.60

.65

0.7

0.7

5 m

m

Le

ng

th =

0.8

mm

P

t =

12

8 µ

m

Sca

le =

20

0 µ

m

pro

file

of

a p

it o

n t

he N

b c

oupon

pro

file

of

pit’s

replic

a

125µ

m d

eep,

300µ

m in d

iam

ete

r11

Page 12: The development of new techniques for surface defect ...

TE1AES004 - Q vs E

Comparison before and after applying molding material

1.E

+1

0

1.E

+1

1

Q0

Be

fore

mo

ldin

g

Aft

er

mo

ldin

g

No d

egra

dation o

f cavity R

F p

erf

orm

ance

1.E

+0

8

1.E

+0

9

01

02

03

04

0

Eacc [M

V/m

]

Q0

No lig

ht

EP, ju

st

HP

R a

fter

mold

ing

12

Page 13: The development of new techniques for surface defect ...

µm

010

20

30

40

50

60

70

80

90

10

0

11

0

12

0

13

0

14

0

15

0

16

0

1.3

GH

z 9

-cell

cavity T

B9A

CC

017

EB

-We

ldin

g s

ea

m

Y-Y

X-X

Surf

ace d

efe

ct

limits c

avity p

erf

orm

ance a

t lo

w f

ield

µm 0

20

40

60

80

10

0

12

0

14

0

16

0

00

.05

0.1

0.1

50

.20

.25

0.3

0.3

50

.40

.45

0.5

0.5

50

.6 m

m

Le

ng

th =

0.6

23

mm

P

t =

14

8 µ

m

Sca

le =

16

0 µ

m

µm 0

20

40

60

80

10

0

12

0

14

0

16

0

00

.05

0.1

0.1

50

.20

.25

0.3

0.3

50

.40

.45

0.5

0.5

50

.6 m

m

Le

ng

th =

0.6

45

mm

P

t =

14

3 µ

m

Sca

le =

16

0 µ

m

X-X

Y-Y

TB

9A

CC

017

quenched

at12.3

MV

/m,

Pit

was

found

atC

ell

#4

equato

r180

deg

regio

n(q

uench

location),

the

pit

is150

µm

deep

and

200

µm

wid

eon

the

top.

13

Page 14: The development of new techniques for surface defect ...

µm

010

20

30

40

50

60

70

80

90

10

0

11

0

12

0

13

0

14

0

15

0

16

0

17

0

18

0

Sp

ot

(a)

Sp

ot

(b)

µm 140

160

Leng

th =

0.7

56 m

m P

t = 1

59 µ

m S

cale

= 1

70 µ

m

Surf

ace d

efe

ct

limits c

avity p

erf

orm

ance a

t lo

w f

ield

020406080100

120

140

00.

050.

10.

150.

20.

250.

30.

350.

40.

450.

50.

550.

60.

650.

70.

75 m

m

µm

020406080100

120

140

160

00.

10.

20.

30.

40.

50.

60.

70.

80.

91

mm

Leng

th =

1 m

m P

t = 1

55 µ

m S

cale

= 1

60 µ

m

AE

S001

quenched

at15.6

~21M

V/m

,

Tw

inpeaks

were

found

atC

ell

#3

equato

r169

deg

regio

n(q

uench

location).

Sp

ot A

h

eig

ht 1

60

µm

, d

iam

ete

r 7

00

µm

on

bo

tto

m

Sp

ot B

h

eig

ht 1

55

µm

, d

iam

ete

r 1

00

m o

n b

ott

om

14

Page 15: The development of new techniques for surface defect ...

Dia

mete

r: 4

00µ

m,D

epth

: 60µ

m

µm 0

10

20

30

40

50

60

70

00

.05

0.1

0.1

50

.20

.25

0.3

0.3

50

.40

.45

0.5

mm

Le

ng

th =

0.5

mm

P

t =

63

.9 µ

m

Sca

le =

70

µm

µm 0102030405060708090100

110

120

130

140

36M

V/m

quenched

at pit r

egio

nT

E1A

CC

00

3

Eq

ua

tor

we

ldin

g s

ea

m

HA

Z

Surf

ace d

efe

ct

limits c

avity p

erf

orm

ance a

t hig

h f

ield

Sin

gle

-cell

cavity T

E1A

CC

003 &

TE

1A

ES

004

µm 0

10

20

30

40

50

60

70

80

90

10

0

00

.10

.20

.30

.40

.50

.60

.70

.80

.91

1.1

1.2

1.3

1.4

mm

Le

ng

th =

1.4

9 m

m

Pt

= 8

1.9

µm

S

ca

le =

10

0 µ

m

Dia

mete

r: 1

300µ

m, D

epth

: 70µ

m

A 1

m h

igh tin

y b

um

p in the c

ente

r.

µm

010

20

30

40

50

60

70

80

90

10

0

11

0

12

0

13

0

14

0

15

0

16

0

17

0

18

0

19

0

20

0

21

0

22

0

23

0

24

0

25

0

26

0

27

0

28

0

29

0

30

0

39M

V/m

quenched

at pit r

egio

nT

E1A

ES

00

4

Eq

ua

tor

we

ldin

g

sea

m

15

Page 16: The development of new techniques for surface defect ...

µm 0

10

20

30

40

50

60

70

00

.10

.20

.30

.40

.50

.60

.70

.80

.91

mm

Le

ng

th =

1 m

m

Pt

= 6

6.5

µm

S

cale

= 7

0 µ

m

µm

0510

15

20

25

30

35

40

45

50

55

60

65

70

µm

80

90

10

0

11

0

12

0

13

0

14

0

15

0

16

0

17

0

18

0

19

0

20

0

µm 20

40

60

80

10

0

12

0

14

0

16

0

18

0

20

0

Le

ng

th =

0.8

76

mm

P

t =

19

6 µ

m

Sca

le =

21

0 µ

m

Re

ve

al p

its p

rofile

on

iri

s r

eg

ion

TB

9R

I026

Dia

mete

r: 4

00µ

m,D

epth

: 70µ

m

Sp

ot B

Sp

ot A

Spot A

010

20

30

40

50

60

70 µ

m

010

20

30

40

50

60

70

80

90

10

0

11

0

12

0

0

20

00

.05

0.1

0.1

50

.20

.25

0.3

0.3

50

.40

.45

0.5

0.5

50

.60

.65

0.7

0.7

50

.80

.85

mm

µm 0

20

40

60

80

10

0

12

0

00

.05

0.1

0.1

50

.20

.25

0.3

0.3

50

.40

.45

0.5

0.5

5 m

m

Le

ng

th =

0.5

81

mm

P

t =

11

6 µ

m

Sca

le =

12

0 µ

m

TB

9jl0

02

Spot A

: D

iam

ete

r: 8

00µ

m,D

epth

: 180µ

m

Spot B

: D

iam

ete

r: 5

50µ

m,D

epth

: 110µ

m

A 2

m d

eep c

revic

e in c

ente

r

Spot B

16

Page 17: The development of new techniques for surface defect ...

A-A

’ Join

t of gra

in

boundary

Join

t of gra

in

boundary

Weld

ing s

eam

The m

easure

ment

of

gra

in b

oundary

ste

p

A-A

B-B

Pro

file

on A

-A’

The im

age d

epic

ts t

he join

t of

gra

in b

oundary

.Eacc reached 43MV/m

The h

eig

ht

of

ste

p o

n A

-A’: 6

m

The h

eig

ht

of

ste

p o

n B

-B’: 2

m

Pro

file

on B

-B’

B-B

17

Page 18: The development of new techniques for surface defect ...

Ro

ug

hn

ess c

om

pa

riso

n b

etw

ee

n la

rge

gra

in B

CP

’d c

avity a

nd

fin

e g

rain

EP

’d a

nd

BC

P’d

ca

vity.

µm

012345678910

11

12

13

14

15

16

17

18

µm

0510

15

20

25

30

35

40

45

50

55

60

65

70

75

µm

012345678910

11

12

13

14

15

16

17

La

rge

gra

in B

CP

’d c

avity

Ere

ach

ed

43

MV

/m!

Fin

e g

rain

EP

’d c

avity

Ea

cc

rea

ch

ed

40

MV

/m!

Fin

e g

rain

BC

P’d

ca

vity

Ea

cc

rea

ch

ed

26

MV

/m!

Ea

cc

rea

ch

ed

43

MV

/m!

Ea

cc

rea

ch

ed

40

MV

/m!

Ea

cc

rea

ch

ed

26

MV

/m! 18

Larg

e g

rain

BC

P’d

cavity

Fin

e g

rain

EP

’d c

avity

Fin

e g

rain

BC

P’d

cavity

Ra (

µm

)0.0

516

0.0

53

0.2

57

Rz (

µm

)0.2

83

0.2

75

1.2

1

Rq (

µm

)0.0

648

0.0

665

0.3

33

Page 19: The development of new techniques for surface defect ...

Tra

ckin

g s

urf

ace r

oughness f

rom

each p

repara

tion s

tep

Aft

er

50

µm

tu

mb

ling

su

rfa

ce

Fin

e g

rain

EP

’d c

avity

Aft

er

fin

al tu

mb

ling

su

rfa

ce

µm

012345678910

11

12

13

14

15

16

µm

012345678910

11

12

13

14

15

16

17

µm

012345678910

11

12

13

19

Aft

er

50µ

m

tum

blin

g

Aft

er

final

tum

blin

g

Fin

e g

rain

EP

’d c

avity

Ra (

µm

)0.5

12

0.0

527

0.0

53

Rz (

µm

)2.6

80.2

53

0.2

75

Rq (

µm

)0.6

33

0.0

669

0.0

665

Page 20: The development of new techniques for surface defect ...

Ca

vity s

urf

ace

ro

ug

hn

ess

µm

012345678910

11

12

13

14

15

16

17

18

19

20

21

µm

012345678910

11

12

13

14

15

16

17

18

Brand new

TE1ACC006

Weld

ing

seam

HA

ZO

uts

ide H

AZ

µm

012345678910

11

12

13

14

15

16

17

18

19

Brand new

TE1PAV001

µm

0246810

12

14

16

18

20

22

24

26

28

30

32

34

36

38

µm

012345678910

11

12

13

µm

012345678910

11

12

13

PKU single crystal

µm

17

18

µm

13

14

µm

12

13

BCP'd 70

µm

NR-6

EP'd 40

µm

TE1ACC005

µm

0246810

12

14

16

18

20

22

24

26

28

30

32

34

36

38

40

42

44

µm

012345678910

11

12

13

14

15

16

17

18

19

20

21

22

µm

0510

15

20

25

30

35

40

45

50

55

60

65

70

75

µm

012345678910

11

12

13

14

15

16

17

µm

012345678910

11

12

13

14

15

µm

012345678910

11

12

13

14

15

16

PKU single crystal

BCP‘d cavity

012345678910

11

12

13

14

15

16

17

012345678910

11

12

13

012345678910

11

20

Page 21: The development of new techniques for surface defect ...

Ca

vity s

urf

ace

ro

ug

hn

ess

Weld

ing

seam

HA

ZO

uts

ide H

AZ

EP'd 120

µm

TE1ACC003

EP'd 150

µm

TB9ACC017

µm

012345678910

µm

012345678910

11

12

13

µm

012345678910

11

12

13

14

µm

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µm

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11

12

13

14

15

16

µm

0.5

11.5

22.5

33.5

44.5

55.5

66.5

77.5

88.5

9

Tumbling

100-120

µm

TE1ACC004

001

00.5

µm

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12

13

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15

16

µm

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12

13

µm

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12

13

PKU Large grain

BCP‘d cavity

µm

0246810

12

14

16

18

20

22

24

26

28

30

32

34

36

38

40

42

µm

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18

µm

0246810

12

14

16

18

20

22

24

26

28

30

32

34

36

21

Page 22: The development of new techniques for surface defect ...

Su

rfa

ce

ro

ug

hn

ess v

s. G

rad

ien

tT

ES

LA

shape ,

quenched b

ut

no

obvio

us d

efe

cts

22

Page 23: The development of new techniques for surface defect ...

Su

mm

ary

of su

rfa

ce

re

plic

a t

ech

niq

ue

�S

urf

ace r

eplic

a t

echniq

ue h

as h

igh r

esolu

tion (

the s

ubstr

uctu

re

insid

e p

its),

and n

o d

egra

dation o

f cavity R

F p

erf

orm

ance.

�R

eveale

d p

it’s

3-D

shape f

rom

9-c

ell

cavity e

quato

r and iri

s

regio

n.

�E

xtr

acte

d s

urf

ace r

oughness f

rom

six

majo

r cate

gories o

f S

RF

cavitie

s, re

pre

senting t

he m

odern

SR

F c

avity technolo

gie

s.

�T

opolo

gy info

rmation e

nable

s u

s t

o e

stim

ate

the f

ield

Topolo

gy info

rmation e

nable

s u

s t

o e

stim

ate

the f

ield

enhancem

ent

facto

r, a

nd t

o a

ssess t

he e

ffectiveness o

f

surf

ace p

repara

tion.

23

Page 24: The development of new techniques for surface defect ...

La

se

r re

-me

ltin

g te

ch

niq

ue

at

FN

AL

Motivation

�R

em

ove s

urf

ace d

efe

cts

lim

itin

g c

avity g

radie

nt

belo

w

20M

V/m

and im

pro

ve g

radie

nt

> 3

5M

V/m

.

Technic

al challe

ng

es

�Laser

spot

should

be v

ery

sm

ooth

and f

lat.

�F

ocus L

aser

beam

on p

it a

ccura

tely

. (P

it ~

100µ

m)

�F

ocus L

aser

beam

on p

it a

ccura

tely

. (P

it ~

100µ

m)

�H

igh r

esolu

tion c

am

era

and s

heet

lighting a

re n

eeded f

or

trackin

g p

it.

�M

olten r

egio

n s

hould

be p

rote

cte

d b

y p

ure

Ar

gas.

24

Page 25: The development of new techniques for surface defect ...

La

se

r re

-me

ltin

g s

yste

m fo

r sin

gle

-ce

ll ca

vity

Mir

ror

Lase

r b

ea

m

Ca

vit

y

Lase

r h

ea

d

No

zzle

25

Page 26: The development of new techniques for surface defect ...

CC

D c

am

era

Laser

beam

deliv

er

line

Monitor

Gas n

ozzle

hold

er

Ro

tatio

n s

tag

e

26

Laser

sourc

eA

r gas c

ylin

der

Laser

focus

pla

tform

X-Y

sta

ge

V-b

lock w

ith

rolle

rs

Ro

tatio

n s

tag

e

26

Page 27: The development of new techniques for surface defect ...

µm 05

10

15

20

25

30

35

40

45

50

00

.10

.20

.30

.40

.50

.60

.70

.80

.91

mm

Le

ng

th =

1 m

m

Pt

= 4

5.6

µm

S

ca

le =

50

µm

µm

0510

15

20

25

30

35

40

45

µm

15

0

20

0

25

0

Le

ng

th =

1.8

4 m

m

Pt

= 2

40

µm

S

ca

le =

25

0 µ

m

µm

12

0

14

0

16

0

18

0

20

0

22

0

24

0

Laser

para

mete

rs a

nd g

as

pre

ssure

optim

ize v

ia N

b c

oupon

0

50

10

0

00

.10

.20

.30

.40

.50

.60

.70

.80

.91

1.1

1.2

1.3

1.4

1.5

1.6

1.7

1.8

mm

µm 0

20

40

60

80

10

0

12

0

14

0

16

0

00

.10

.20

.30

.40

.50

.60

.70

.80

.91

1.1

1.2

mm

Le

ng

th =

1.2

1 m

m

Pt

= 1

59

µm

S

ca

le =

16

5 µ

m

020

40

60

80

10

0

12

0

µm

020

40

60

80

10

0

12

0

14

0

27

Page 28: The development of new techniques for surface defect ...

µm 0

20

40

60

80

10

0

12

0

14

0

00

.10

.20

.30

.40

.50

.60

.70

.80

.91

mm

Le

ng

th =

1 m

m

Pt

= 1

25

µm

S

ca

le =

14

0 µ

m

Man-m

ade p

it

µm

010

20

30

40

50

60

70

80

90

10

0

11

0

12

0

13

0

Pro

file

Co

mp

ariso

n b

efo

re a

nd

aft

er

lase

r re

-me

ltin

g

Aft

er

re-m

eltin

g t

he p

it p

rofile

changed f

rom

120µ

mdeep t

o 3

mflat

µm 0

20

40

60

80

10

0

12

0

14

0

00

.05

0.1

0.1

50

.20

.25

0.3

0.3

50

.40

.45

0.5

0.5

50

.60

.65

0.7

0.7

5 m

m

Le

ng

th =

0.8

mm

P

t =

29

.6 µ

m

Sca

le =

14

0 µ

m

µm

0510

15

20

25

30

28

Page 29: The development of new techniques for surface defect ...

La

se

r p

roce

ssin

g o

f 1

.3G

Hz s

ing

le-c

ell

ca

vity

TE

1A

CC

00

3

Scre

en

sh

ot o

f th

e m

on

ito

r b

efo

re a

nd

aft

er

lase

r re

-me

ltin

g

The P

it b

efo

re r

e-m

eltin

gA

fter

re-m

eltin

g

Images w

as t

aken f

rom

Kyoto

Optical In

spection m

achin

e29

Page 30: The development of new techniques for surface defect ...

µm

010

20

30

40

50

60

70

80

90

10

0

11

0

12

0

13

0

14

0

Pro

file

co

mp

ari

so

n b

efo

re a

nd

afte

r

La

se

r p

roce

ssin

g

Befo

re laser

re-m

eltin

g: 400µ

min

dia

mete

r, 6

0 µ

min

depth

The p

it p

rofile

changed f

rom

60µ

m d

eep t

o 3

m f

lat

aft

er

re-m

eltin

g a

nd 5

m lig

ht

EPA

fter

laser

re-m

eltin

g: 700µ

min

dia

mete

r,

30 µ

min

depth

30

Page 31: The development of new techniques for surface defect ...

Cavity vert

ical te

st re

sults

befo

re a

nd a

fter

laser

pro

cessin

g

1.E

+1

0

1.E

+11

Q0

1.3GHz single-cell cavity TE1ACC003

RF perform

ance comparison

Before and after laser re-melting

Aft

er

lase

r re

-m

eltin

g

Aft

er

La

se

r p

roce

ssin

g: E

P 5

m+

HP

R+

12

0C

ba

kin

g;

Ea

cc a

ch

ieve

d 4

0.3

MV

/m,

qu

en

ch

ed

at

mo

lte

n r

eg

ion

.31

1.E

+0

8

1.E

+0

9

01

02

03

04

0Eacc[MV/m]

Page 32: The development of new techniques for surface defect ...

Th

e n

ext ste

pTo

de

ve

lop

9-c

ell

syste

m.

Pit in 1

.3G

Hz 9

-cell

cavity T

B9A

CC

017

Quenched a

t 12.3

MV

/m.

32

Page 33: The development of new techniques for surface defect ...

Sum

mary

Laser

re-m

eltin

g techniq

ue

�C

hanged p

it’s

pro

file

to fla

t surf

ace b

y h

igh p

ow

er

lase

r

puls

e.

�S

uccessfu

lly r

e-m

elted a

pit insid

e 1

.3G

Hz s

ingle

-cell

cavity.

�Im

pro

ved c

avity g

radie

nt

to 4

0.3

MV

/m a

fter

50µ

m E

P.

�N

ext

ste

p is t

o d

evelo

p a

syste

m for

9-c

ell

cavity.

�N

ext

ste

p is t

o d

evelo

p a

syste

m for

9-c

ell

cavity.

33

Page 34: The development of new techniques for surface defect ...

La

se

r w

eld

ing

stu

dy

Motivation a

nd B

enefits

�D

ram

atically

decre

ase H

AZ

are

a.

1.T

he

la

se

r p

uls

e h

as v

ery

sh

ort

du

ratio

n ~

10

ms;

2.T

he

po

ten

tia

l b

en

efit is

to

de

cre

ase

th

e p

rob

ab

ility

of w

eld

ing

pit

ge

ne

ratio

n.

�T

he w

eld

could

be v

ery

sm

ooth

and n

arr

ow

.

1.P

rove

d b

y la

se

r re

-me

ltin

g te

ch

niq

ue

(4

0M

V/m

);1

.Pro

ve

d b

y la

se

r re

-me

ltin

g te

ch

niq

ue

(4

0M

V/m

);

2.B

y c

ha

ng

ing

diffe

ren

t p

uls

e fo

rm, w

e c

an

ch

an

ge

th

e r

atio

of w

eld

wid

th

an

d d

ep

th.

�W

eld

ing c

avity in A

ir just w

ith A

r gas p

rote

ction

Pro

ve

d b

y la

se

r re

-me

ltin

g te

ch

niq

ue

�W

eld

ing v

ery

com

plic

ate

d s

tructu

re.

La

se

r b

ea

m c

an

be

re

fle

cte

d a

nd

fo

cu

se

d b

y o

ptics a

s w

ell

as c

on

du

cte

d

by la

se

r fib

ers

with

ou

t so

mu

ch

po

we

r lo

ss.

34

Page 35: The development of new techniques for surface defect ...

Fro

nt sid

e

10cm

Back s

ide

35

Page 36: The development of new techniques for surface defect ...

RR

R te

st

resu

lts

13

45

Sa

mp

le N

o.

RR

R

13

26

33

48

42

86

52

34

, 2

52

Weld

ing s

eam

52

34

, 2

52

RR

R v

alu

e d

oes n

ot decre

ase s

o m

uch! 3

6

Page 37: The development of new techniques for surface defect ...

Co

nclu

sio

n

�S

evera

l new

techniq

ues h

ave b

een d

evelo

ped a

t F

erm

ilab

surr

oundin

g a

topic

: S

urf

ace.

�O

ptical In

spection locate

s t

he d

efe

cts

and lin

ks t

hem

to

quench location v

ia T

-mappin

g.

�S

urf

ace r

eplic

a t

echniq

ue e

xhib

its 3

-D s

hape o

f pit, and

extr

acts

surf

ace r

oughness f

rom

SR

F c

avity.

�H

igh p

ow

er

laser

puls

e is a

ble

to r

e-m

elt p

it a

nd r

esto

re

cavity g

radie

nt

up t

o 4

0M

V/m

.

�Laser

weld

ing h

as p

ote

ntial to

avoid

weld

ing p

its g

enera

tion.

37

Page 38: The development of new techniques for surface defect ...

Thanks for

your

att

ention

Thanks for

your

att

ention

38