The Agilent Atomic Spectroscopy portfolio for ... · The Agilent Atomic Spectroscopy portfolio for Environmental applications AA, ... cost of ownership . and . improved safety. ...

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The Agilent Atomic Spectroscopy portfolio for Environmental applications

AA, MP-AES, ICP-OES, ICP-MS & ICP-QQQ

History of Technology Leadership in Atomic Spectroscopy

‘62• AAS instruments manufactured under license from CSIRO

‘71• Provisional patent awarded for Zeeman background correction for Furnace

AAS

‘84• First computer controlled AAS released (SpectrAA)

‘87• First computer controlled ICP-MS released (PMS 100)

‘91• High resolution sequential ICP-OES released (Liberty)

‘94• HP4500 Worlds first bench top ICP-MS released

‘97• Fast Sequential AAS released doubling productivity for AAS (SpectrAA

220FS)

‘98• Vista ICP-OES released featuring patented CCD for true simultaneous

analysis

‘01• 7500 released with first generation ORS to overcome polyatomic interferences

commonly seen in ICP-MS

‘11• 4100 MP-AES – atomic spectroscopy with energy source that runs on air

‘12• 8800 Worlds First ICP-MS triple quad released

And still leading the way with recent innovative releases!The New 7800 ICP-MS – Quadrupole ICP-MS for routine applicationsEasy setup and operation for routine applications

Simplify analytical workflow with method setup and auto-optimization toolsProven robust performance and unique HMI – minimizes suppression and reduces need for sample dilutionSimple, consistent interference removal using proven He mode collision/reaction cell performanceMinimize over-range results with 10 orders wide dynamic range detector

Agilent 4200 MP-AESSafer, more cost effective elemental analysis that is uniquely suited for a wide range of sample types and applications.

- Reduce your analysis cost- Improve your laboratory safety- Simplify your workflow- Increase analytical performance

Agilent 5100 ICP-OESThe world’s most productive, high performance ICP-OES.

- World’s first and only non-sequential dual view instrument; Synchronous Vertical Dual View (SVDV)- Highest throughput reduces your analysis cost - Vertical plasma runs your toughest sample- Dichroic Spectral Combiner (DSC) simplifies method development

The Agilent Atomic Spectroscopy Portfolio

Agilent’s 55 and 200 Series includes the

world’s fastest flame AA and the

world’s most sensitive furnace.

Agilent’s 4200 MP-AES runs on air for the lowest cost of ownership

and improved safety.

Agilent’s 5100ICP-OES

includes the world’s most

productive, and only

Synchronous Vertical Dual

View ICP-OES.

Agilent’s 7800 & 7900 ICP-MS are robust, sensitive,

accurate, and easy to use

quadrupole ICP-MS

Agilent’s 8800 ICP-QQQ with MS/MS mode

provides unique control of

interference removal in

reaction mode

Leading the way in atomic spectroscopy innovation

Typical Environmental ApplicationsElemental Contamination• Soil, water, air

• Critical for health

• Sample Prep: Leachates and total acid digests

• Large number of elements and samples

• Medium to low ppb detection limits required

• Single nanoparticle analysis for pollution or remediation

• Coupled chromatographic methods for speciation of oxidation states and organometallic compounds (Cr(VI), arsenic, methy-mercury, organo-tin, etc.)

Monitoring of industrial effluent before disposal• Aqueous and organic process streams

• Unregulated screening methods

• Sample Prep: Direct measurement of effluent

• 5-10 elements

• High frequency measurement (process control)

• ppm to high ppb detection limits required

Atomic Absorption SpectroscopyWhy choose FAAS/GFAAS for environmental?

• Simple operation and simple routine maintenance• Reliable• Low system cost

Performance

• Low sample numbers or only a few elements• ppm to high ppb DLs• GFAAS has software wizards to simplify method optimization

with ppb to high ppt DLs

Fit for purpose

• Many established regulated methods for water, soil & sludge• i.e. FAAS - Trade waste, plant/soil macronutrient• i.e. GFAAS – Trace contamination of soil, water and air

Established methods

Microwave Plasma Atomic Emission SpectroscopyWhy choose MP-AES for environmental analysis?

• No flammable gases compared to FAAS

Safe

• Uses Nitrogen extracted from the air to sustain the plasma

Low Cost of Ownership

• Simple, intuitive next generation software• Plug and play torch

Easy to Use

4200 MP-AES

• Superior linear dynamic range compared to FAAS• Lower detection limits compared to FAAS

High Performance

Customer testimonials “Results we have seen for our aqua regia soil extract samples…are in very good agreement with round robin…performed Europe Wide”

Why choose ICP-OES for environmental analysis?

• Highest throughput means lowest argon consumption per sample

Lowest Cost of Ownership

• Incredible long term stability

Enhanced Performance

• New sample introduction system• Software with intuitive workflow

Simple Operation 5100 ICP-OES

• ASTM / ISO / US EPA

Many methods available

ICP-MS and ICP-QQQWhy choose ICP-MS for environmental?

• Easy setup and operation with application packs and SOPs• Minimal method development and sample prep required• All regulated elements incl. Hg measured in single acquisition

Simplicity

• >10 orders linear dynamic range – major & traces in one run• Accuracy ensured by proven He mode interference removal• High & variable matrix samples handled easily using (U)HMI• Ultra-low DLs (ppt to ppq range) for critical toxic contaminants

Performance

Today’s Agilent: Atomic SpectroscopyMore choices

Agilent provides the best choice for every lab through:• A full range of atomic spectroscopy instrumentation• Optimal product offering for any budget / application• Continued focus on reliability and performance

Regardless of your application needs and

drivers, Agilent’s unique and comprehensive

Atomic Spectroscopy Portfolio provides the right solution for your

Environmental analysis requirements.

Stay tuned for some application examples for environmental analysis…

Neli Drvodelic

Agilent Technologies Melbourne, Australia

U.S. EPA Method 6010C using the 5100 SVDV ICP-OES

Key Agilent 5100 SVDV ICP-OES benefits

• Fastest sample throughput of difficult samples

• Low gas consumption

Lowest cost of ownership

• Analytical performance • System robustness and

reliability

Enhanced Performance

• Hardware (e.g. Torch)

• Software (e.g. Fitted, FACT, Applets)

Simple Operation

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The unique Dichroic Spectral Combiner that make it possible.

• The Agilent 5100 Synchronous Vertical Dual View ICP-OES measures both axial and radial view of the vertical plasma at the same time.

• Vertical torch is ideal for difficult applications, like environmental samples.

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Mirror

Dichroic Spectral CombinerHole

5100 SVDV Pre-optics

ExperimentalInstrumentation

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Instrument: Ailent 5100 Synchronous Vertical Dual View ICP-OES

Sample introduction system: Sea Spray nebulizer, Double-pass glass cyclonic spray chamber and Standard 1.8 mm dual view quartz injector torch

Accessories:

SPS 4 Autosampler with the SVS 2+ switching valve

to deliver samples to the instrument.

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ExperimentalInstrument Operating Parameters

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Parameter Setting

Torch Standard DV torch (1.8 mm ID injector)

Nebulizer Seaspray

Spray chamber Glass cyclonic (double-pass)

Read Time 20 sec

Replicates 2

Sample uptake delay 0 sec

Stabilization time 10 sec

Rinse time 3 sec

Fast Pump (80 rpm) No

Background correction OPBC for analyte/IEC standard

Nebulizer Pressure 0.70 L/min

RF power 1.4 KW

Plasma flow 12.0 L/min

Aux flow 1.0 L/min

Internal Standard Y 488.368 and Lu 261.541 and Lu 547.668

Experimental

SVS 2+ Operating Parameters

ConditionSetting 1

Loop uptake delay 6.4 sUptake pump speed — refill 350 rpmUptake pump speed — inject 130 rpmSample loop size 1.0 mLTime in sample 4.5 s

Bubble inject time 6.2 s

Results and discussion - SRM RecoveriesElements Certified mg/Kg Found mg/Kg SD %Rec

Ag 328.068 (4.68) 4.70 0.154 101%Al 308.215 28000 27572 0.287 101%As 188.980 38.0 40.0 0.624 107%B 249.678 (29.3 ) 29.6 0.045 102%

Ba 233.527 (466) 473 0.027 102%Be 313.042 (1.59) 1.58 0.025 99%Ca 318.127 31000 31442 1.87 102%Cd 214.439 6.29 5.91 0.031 96%Ce 446.021 (38.9) 37.4 0.350 97%Co 228.615 13.4 13.6 0.099 100%Cr 205.560 124 129 0.078 104%Cu 324.754 127 129 0.079 101%Fe 273.358 37300 38068 7.51 102%Hg 184.887 1.86 1.81 0.250 97%K 766.491 4560 4502 5.669 99%Li 610.365 (32.2 ) 34.5 1.437 107%Mg 279.078 6980 7129 0.574 102%Mn 257.610 847 830.6 0.020 98%Mo 202.032 (1.91) 1.85 0.154 97%Na 588.995 432 436 37.608 101%Ni 231.476 59.3 60.5 1.893 102%P 213.618 3810 3727 102.685 98%

Pb 220.353 192 176 3.680 92%Sb 206.834 (2.18 ) 2.05 0.033 94%Se 196.026 (1.59) 1.59 0.130 100%Sn 189.925 (21.2) 19.6 0.366 92%Sr 421.552 (131) 134 2.670 103%Ti 334.188 (339) 358 20.540 106%Tl 190.794 (1.19) 1.21 0.061 101%V 292.401 (50.8) 50.9 0.816 100%

Zn 313.857 816 800 10.673 98%

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Results and discussion -Method Detection Limits (MDL) and Linear Dynamic Range (LDR)

ElementsLDR, mg/L MDL, µg/L

ElementsLDR, mg/L MDL, µg/L

Ag 328.068 50 0.48 Mg 279.078 1000 3.5Al 308.215 2000 3.6 Mn 257.610 50 0.08As 188.980 50 4.6 Mo 202.032 50 0.48B 249.678 200 0.81 Na 588.995 1000 50

Ba 233.527 50 0.18 Ni 231.476 100 3.7Be 313.042 5.0 0.04 P 213.618 500 6.3Ca 318.127 1000 5.9 Pb 220.353 200 3.1Cd 214.439 25 0.35 Sb 206.834 200 4.0Ce 446.021 100 2.3 Se 196.026 25 5.1Co 228.615 250 0.54 Sn 189.925 100 3.8Cr 205.560 100 0.47 Sr 421.552 2.5 0.05Cu 324.754 100 0.42 Ti 334.188 25 0.14Fe 273.358 10000 53 Tl 190.794 100 4.4Hg 184.887 250 1.4 V 292.401 100 0.73

K 766.491 1000 21 Zn 313.857 20 0.22

Li 610.365 50 0.31

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Wide Linear Range for K766.491 in SVDV Mode

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Standards Concentration (ppm) % Error

Blank 0 N/AStandard 1 5 1.17Standard 2 50 0.99Standard 3 500 0.16Standard 4 1000 1.36

Instrument Stability

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0.5

0.6

0.7

0.8

0.9

1

1.1

1.2

0:00 0:48 1:36 2:24 3:12 4:00 4:48 5:36 6:24 7:12 8:00

Nor

mal

ize

Conc

entr

atio

n

Time (Hrs)

Long Term Stability with SVS2+

Ag 328.068 Al 308.215 As 188.980 B 249.678 Ba 233.527 Be 313.042 Ca 318.127

Cd 214.439 Ce 446.021 Co 228.615 Cr 205.560 Cu 324.754 Fe 273.358 Hg 194.164

K 766.491 Li 610.365 Mg 279.078 Mn 257.610 Mo 202.032 Na 588.995 Ni 231.604

P 213.618 Pb 220.353 Sb 206.834 Se 196.026 Sn 189.925 Sr 421.552 Ti 334.941

Tl 190.794 V 292.401 Zn 213.857

Sample Throughput and Ar Consumption

• Rapid throughput enabled by SVS 2 + (including 3 sec rinse time)

• Sample measurement = 60 seconds per samples and

• 60 samples per hour over 480 samples for an 8 hr day

• Total Ar Consumed = 20 L Ar/sample

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Conclusion

• The Agilent 5100 ICP-OES with synchronous vertical dual view meet the requirements outlined in the US EPA method 6010C.

• SVDV means only one reading of the samples which gives high sample throughput and quicker sample measurement leading to considerable gas savings of only 20 L of Ar per sample.

• SRM samples were analyzed on SVDV and good recoveries (92-107%) were achieved for all elements.

• Ionization interferences was eliminated using SVDV with radial view plasma leading to wide dynamic range for EIE elements.

• Excellent Long term stability is achieved as no moving optical part in SVDV instrument

• Exceptional MDL’s, linearity for all elements

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