TEST REPORT Lithium ion cell abuse tests - EV … Jukeng Rd., Juling Village, Jutang District, Guanlan, Longhua New District, Shenzhen, 518110 Report about abuse tests on Lithium ion

Report about abuse tests on Lithium ion cell TÜV SÜD China

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Title: Test report about abusetests on lithium ion cellEffective: 2013-04-20

Report No. 68.280.13.124.01KAuthor: Louise ZhuVersion: 1.0

Phone: +86 755 29807601FAX: +86 755 [email protected]

Jiangsu TUV Product Service Ltd.,Shenzhen Branch

No.11, Jukeng Rd.,Juling Village,Jutang District, Guanlan, LonghuaNew District, Shenzhen 518110P.R.China

TEST REPORTLithium ion cell abuse tests

Lithium ion Cell for electric vehicles

Report Number. .............................. : 68.280.13.124.01K

Date of issue ................................... : 2013-12-12

Total number of pages ................... 59 pages

Applicant’s name ........................... : China Industrial Association of Power Sources

Address : No.6 Haitai Huake 7 Road, Huayuan Science & Technology Park,Xiqing District, Tianjin, P.R.China

Test specification:

Standard.......................................... : Refer to QC/T 743-2006, IEC62660-2:2010, SAE J2464: 2009

Test procedure ............................... : Test report

Non-standard test method ............ : N/A

Test Report Form No. .................... : CIAPS Benchmarking Test 2013

Test Report Form(s) Originator .... : TÜV SÜD China

Master TRF ..................................... : Dated 2013-12-12

Test item description ..................... : Rechargeable lithium-ion cell for electric vehicle

Trade Mark ...................................... : N/A

Manufacturer .................................. : Sinopoly New Energy Investment Co. Ltd.20 Huangshan North Road, Hangu, Binhai New Area

Model/Type reference .................... : SP-LFP66AhA

Ratings ............................................ : 3.2Vd.c., 66Ah

mailto:[email protected]


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Testing procedure and testing location:

Testing Laboratory:

Address .....................................................:

Jiangsu TÜV Product Service Ltd. Shenzhen

Branch 6/F, H Hall, Century Craftwork CultureSquare, No. 4001, Fuqiang Road, Futian District,Shenzhen 518048, P.R. China

Tested by (name + signature) .......... : Andy Ren

Approved by (name + signature) ..... : Louise ZhuList of Attachments (including a total number of pages in each attachment): N/A

Summary of testing:

Tests performed (name of test and testclause):

Tests are made with the number of samples referto IEC62660-2.

6.3.2 Overcharge test

6.3.3 Forced discharge test

6.3.1 External short circuit test

6.2.1 Thermal abuse test

And SAE J2464:2009

4.3.6 Crush test

4.3.3 Nail penetration test

And QC/T 743: 2006

6.2.12.4 Drop test

Testing location:

Jiangsu TÜV Product Service Ltd. ShenzhenBranch

No.11, Jukeng Rd., Juling Village, Jutang District,Guanlan, Longhua New District, Shenzhen, 518110



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Copy of marking plateThe artwork below may be only a draft.



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1. Test item particulars .............................................. :

Classification of installation and use ...................... : Use in electric vehicle

Supply connection ..................................................... : Supply by terminals

Chemistry ................................................................ : lithium systems

Polymer cell electrolyte type ................................. : gel polymer ............ solid polymer

Testing .......................................................................... :

Date of receipt of test item ......................................... : 2013-05-28

Date (s) of performance of tests ............................... : 2013-05-30 to 2013-12-12

General remarks:

The test results presented in this report relate only to the object tested.This report shall not be reproduced, except in full, without the written approval of the Issuing testinglaboratory."(See Enclosure #)" refers to additional information appended to the report."(See appended table)" refers to a table appended to the report.

Throughout this report a comma / point is used as the decimal separator.

Name and address of factory (ies) .......................... : : Huizhou BYD Battery Company Limited

Xiangshui River, Daya Bay, Huizhou

General product information:Lithium ion rechargeable cells, model FP22120167A

Product name Rechargeable Li-ion Cell for electric vehicle

Type/model SP-LFP66AhA

Specification for product 3.2Vd.c. 66Ah

Charge Voltage 3.65V

Charge Current 22A

Charging temperature 25±2°C



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Charging method

Charge at constant current 22A until voltage reaches 3.65V thencharge at constant voltage 3.65V till charge current decline to2.18A.

Discharge Cut-Off Voltage 2.5V

Dimensions 42.5mm*110mm*269mm

Weight About 2100g

Elelctrolyte mass About 420g



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2. SCOPE OF WORK:

China industrial association of power sources contracted TÜV SÜD with the abuse tests of Lithium ion cellrefer to IEC62660-2:2010, QC/T 743-2006 and SAE J2464: 2009 test requirements.The following tests were conducted at the test facility in Guanlan, Shenzhen, P.R. China:

IEC62660-2 Section 6.3.2 Cell overcharge test

IEC62660-2 Section 6.3.3 Cell forced discharge test

IEC62660-2 Section 6.3.1 Cell external short circuit test

IEC62660-2 Section 6.2.1 Cell high temperature endurance

SAE J2464 Section 4.3.6 Cell crush test

SAE J2464 Section 4.3.3 Cell nail penetration test

QC/T 743 Section 6.2.12.4 Drop test (with concrete floor insteadof wood floor)

3. APPROACH

3.1Test bench1) Abuse test chamber2) Data acquisition system(s) for measured parameters3) Test sample holding fixture (if required)4) Penetration fixture: left and right5) Displacement and load battery mounting fixture (if required)6) Temperature sensor (if required)7) Cycler8) Crush tester9) External short circuit test device10) Explosion proof oven11) Drop test equipment12) Video and photograph camera



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Abuse test container: Abuse tests were conducted in an abuse test container( External volume:5.90m*2.34m*2.38m internal volume: 5.69m * 2.13m * 2.18m) with temperaturecontrolling system, exhausting system and pressure release system

Cyclers: Charge and discharge were performed by using Maccor cyclers (0-6V, 120A)inhigh low temperature chamber.

Chamber : Nail penetration tests were conducted in test chamber (volume: 1m3). Thechamber is not completely pressure-tight, plastic glass/tempered glass doorand ventilation system give the possibility of a pressure relief.

External short circuit testresistance:

External short circuit test were conducted with the external resistance <5m .

High frequency datacollection system:

The frequency of data log for external short-circuit current is more than 100 Hz.

Attachment:3.2 Facility of abuse tests

Figure 1 Cycler for charge and discharge



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Figure 2 Nail penetration abuse test chamber

Figure 3 Nail penetration tester



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Figure 4 Abuse test container

3.3 Safety:

1) Protect any open electrical terminals on the sample(s) from shorting to each other or to a ground2) Ensure that all equipment is on the off or standby state until the test is ready to run3) Provide for appropriate fire extinguishing media and personal protective gear for the duration of the

test4) Verify that fume venting means are functioning and available for the duration of the test-coordinate

use of this facility with collection and sampling of gases5) Verify that test personnel have been trained for the test6) Provide for means to prevent unauthorized access to the test7) Prepare to activate the abuse test warning light for the duration of the test

3.4 Sample Preparation:

1) Record time and date of receipt of test samples2) Record condition of test samples noting any visual damage3) Record weight of test samples before and after test4) Prepare test samples with identification label5) Record basic dimensions of test samples6) Determine SOC (state of charge) from customer and document7) If test sample is not at the required SOC, charge or discharge test sample according to instructions

supplied by customer8) Add temperature sensing devices where secure for later connection to the data acquisition

equipment



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3.5 Equipment Setup:

NOTE: Ensure all equipment is calibrated/traceable and its scale/range is appropriate for customerrequirements

1) Set up data acquisition to record voltage and temperature as a function of time at a sampling andrecording frequency as specified by the customer

2) Mount test sample in abuse chamber, in penetration fixture with thermocouple(s) in correctposition(s)

3) If required, add load battery fixture to test sample holding fixture4) Securely mount complete assembly of test sample, test fixture and, if required, load battery on test

table inside the test chamber close to a pass-through port5) Locate data acquisition equipment outside the test chamber convenient to the pass-through port6) Connect the sense leads to the test sample7) Feed the wiring harness from the test sample through the test chamber pass-through port8) Connect wiring harness to the data acquisition.9) Ensure that all integrated controls and interconnect circuitry is in place and operating.10) Setup video camera recording if required11) Close abuse chamber and activate the fume venting unless gases are being collected.

3.6 Method & Procedure:

NOTE: Ensure gauge ranges & capacities meet the specifications & customer requirements1) Ensure that Sample Matrix is updated with receiving information2) Record starting voltage at the test sample3) Record test chamber temperature and test sample temperature4) If test sample is not at the customer specified range, allow for soak time of up to 8 hours to reach

the correct temperature range5) If requested, provide for video recording during the test6) Photograph the test sample before, during (if possible) and after the test

For nail penetration test1) Mount the test sample in the penetration fixture as shown in figure 22) Ensure that the platens are electrically isolated from each other to avoid a current path3) Penetrate the test sample at a rate of 80 mm/sec (or speed requested by customer) using the

following criteria:



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3.7 Measurement methods and devices

3.7.1 Sample rating

Measuring Sampling rate Data acquisition by

Temperature 1Hz Thermal coupe Type K,

Cell voltage 1Hz Sensor and cell terminals

Cell voltage 125Hz For external short circuit test

Current 125 Hz For external hort circuit test

3.7.2 Data acquisition

Type 1 Agilent 34970 Switch-system with multiplexer (34401)

Type 2 High frequency data collection system 1-1kHz, 0-10V

3.7.3 Temperature measurement

Measurement sensor Thermocouple Type K,Class 1, glass wireisolated(1m) with open measurement end ,compens tion wire (5m), connection with TCconnectors

Temperature range (Type K): -40°C to 400°C

Limiting deviation on TC: 1.5K respective 0.0040×[T]

Accuracy data acquisition 1K

3.8 Test setup

3.8.1Overchargetest

1) Adjust the SOC of cell to 100%.2) Charge the cell beyond the 100%SOC with charging current 1It 66 A at room temperature

using a power supply or cycler sufficient to provide the constant charging current.The overcharge test shall be discontinued when the voltage of cell reaches twice the



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maximum voltage 7.30V specified by manufacturer, or the quantity of electricity applied tothe cell reaches 200%SOC equivalent.

3.8.2 Forceddischarge

1) Discharge the fully discharged cell at 1It A for 90 min, by using electronic load.

3.8.3Externalshort circuit

1) Adjust the SOC of cell to 100%.

2) Shortcircuit the cell by connecting the positive and negative terminals with an externalresistance for 10min. A total external resistance shall be equal to or less than 5m .

3) Discontinue the test when the cell temperature reaches to ±10 ºC of the ambienttemperature.

3.8.4

Thermalabuse


2) The oven temperature shall be raised at a rate of 5 K/min from room temperature to atemperature of 130°C±2K.

3) The cell shall remain at this temperature for 30min and then discontinue the test.

Measure the OCV, dimension and weight of the cell when the cell temperature reaches±10K of ambient temperature.

3.8.5

Crush


2) The charged cell after stabilized at room temperature shall be placed on an insulated flatsurface and be crushed with a crushing tool of hemisphere with a 150 mm diameter.

3) The force for the crushing shall be applied in direction nearly perpendicular to a layeredface of positive and negative electrodes inside cell.

4) The force shall be released when one of the following phenomena occurs:

a) an abrupt voltage drop of one-third of the original cell voltage occurs,

b) or a deformation of 15% or more of initial cell dimension occurs,

c) or the force reach 1000 times weight of cell

5) The cells remain on the test for 24h or until the case temperature decline by 20% of

maximum temperature rise, whichever is the sooner.

3.8.6 Nailpenetration


2) Penetrate the test sample at a rate of 8cm/sec using the following criteria

Nail penetration test HY-2C-120, Maximum force 20,000N, in an abuse testchamber (volume: 1m3).

Nail Material Mild steel



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diameter 3 mm±0.1mm

Point taper 30o ± 5o

Surface finish Ra:1.6 m-6.3 m

Straightness within ±0.1 mm over the length which penetrates theDUT

Orientation Perpendicular to test bed within 0.5mm

Penetration Rate 80mm/s, 85 mm/s measured in free space

Depth Through the cell and remain in the cell untiltemperature decline to the ambient temperature±10°C

Penetration site Surface center of cell

3.8.7 Drop 1) Adjust the SOC of cell to 100%.2) Fully charged cell shall be dropped three times from a height of 1.5m onto a concrete

floor. The cell should be dropped in random orientations.

AttachmentDUT preparation



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3.9 DUT Preparation

Figure 5 Preparation of DUT before test

Figure 6 Preparation of DUT before test



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Figure 7 Front side of sample

Figure 8 Side of sample



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Figure 9 Top side of the sample

Figure 10 Bottom side of the sample



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4. ABUSE TESTS4.1 Remarks concerning measurement data and analysisEvents during the test ar marked with an “×“

HSL Result Description

0 No effect No effect. No change in appearance.

1 Deformation Change or deformation in appearance including swelling.

2 Venting Escape of liquid electrolyte from vent or venting with mist release.

3 Leakage Escape of liquid electrolyte from a part except vent, such as casing,sealing part and/or terminals.

4 Smoking Release of fume from vent.

5 Rupture Mechanical failure of a cell container case induced by an internal orexternal cause, resultingin exposure or spillage but not ejection ofmaterials. Including smoking at the rupture

6 Fire Emission of flames from a cell.

7 Explosion Failure that occurs when a cell container opens violently and majorcomponents are forcibly expelled.



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4.2 Measurement data overview

SeriesNumber

Test items Massbeforetest (g)

Mass aftertest (g)

Massloss (g)

No effect

Deform

ation

Venting

Leakage

Sm

oking

Rupture

Fire

Explosion

CIAPS- -66-1-1

Over-charge2132 1952 180

× ×

CIAPS- -66-1-2


× ×

CIAPS- -66-1-3


× ×

CIAPS- -66-2-1

Over-discharge 2137 2137 0

×

CIAPS- -66-2-2


×

CIAPS- -66-2-3


×

CIAPS- -66-3-1

Externalshortcircuit 2120 1847 273

× × ×

CIAPS- -66-3-2


× × ×

CIAPS- -66-3-3


× × ×

CIAPS- -66-4-1

Thermalabuse 2115 2114 1

×

CIAPS- -66-4-2


×

CIAPS- -66-4-3


× ×



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CIAPS- -66-5-1

Crush2122 2122 0

×

CIAPS- -66-5-2

Crush2136 2136 0

×

CIAPS- -66-5-3

Crush2122 2122 0

×

CIAPS- -66-6-1

Nailpenetration 2145 1770 375

× × × ×

CIAPS- -66-6-2


× × × ×

CIAPS- -66-6-3


× × × ×

CIAPS- -66-7-1

Drop2140 2065 75

×

CIAPS- -66-7-2

Drop2127 2093 34

×

CIAPS- -66-7-3

Drop2132 2039 93

×



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4.3 Result

Overcharge test

Before test

Sample No. OCV , Vd.c.

Mass , g Internalresistance,m

Dimension, mm Result

CIAPS- -66-1-1

3.414 2132 0.477 44.59*110.51*268.19 Venting

CIAPS- -66-1-2

3.411 2114 0.474 44.51*110.81*268.00 Venting

CIAPS- -66-1-3

3.404 2136 0.485 44.51*110.12*268.49 Venting

After test


Mass , g Internalresistance,

m

Dimension mm MaximumCaseTemperatureT, C

CIAPS- -66-1-1

3.589 1952 24.047 47.89*109.59*267.51 59.8

CIAPS- -66-1-2

3.603 1946 26.958 47.10*109.60*267.79 63.3

CIAPS- -66-1-3

3.505 1960 19.438 46.43*111.88*267.60 60.9

Test resultdescription

- No effect- Deformation- Venting- Leakage- Smoking- Rupture- Fire- Explosion

Attached temperature curve, current and voltage-time curves:



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Figure 11 Temperature-time curves of overcharge

Figure 12 Overcharge curves



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Figure 17 Front side of sample after overcharge test

Figure 18 Top side of sample after overcharge test



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Forced discharge testBefore test




CIAPS- -66-2-1

2.985 2137 0.476 44.50*109.80*268.50 Deformation

CIAPS- -66-2-2

2.974 2136 0.475 44.52*110.01*268.00 Deformation

CIAPS- -66-2-3

2.980 2143 0.478 44.50*110.10*268.41 Deformation

After test



m

Dimension mm MaximumCaseTemperature T,

C

CIAPS- -66-2-1

0 2137 0.646 52.61*108.50*267.60 43.1

CIAPS- -66-2-2

0 2133 0.612 50.18*109.60*268.00 46.3

CIAPS- -66-2-3

0 2143 0.660 48.20*110.00*267.20 48.7






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Figure 23 Temperature during forced discharge test

Figure 24 Voltage and current during forced discharge test



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Figure 29 Front side of sample after forced discharge test

Figure 30 Top side of sample after forced discharge test



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External short circuit test

Before test




CIAPS- -66-3-1

3.485 2120 0.480 44.58*110.40*268.41 Leakage

CIAPS- -66-3-2

3.348 2150 0.481 44.60*110.31*268.40 Leakage

CIAPS- -66-3-3

3.350 2140 0.485 44.62*110.20*268.42 Leakage

After test

Sample No.

OCV , Vd.c.


Dimension mm MaximumCaseTemperature T, C

Peakshortcircuitcurrent, A

CIAPS- -66-3-1

3.220 1847 425 45.25*110.50*268.00 65.1 2122.5

CIAPS- -66-3-2

3.197 1850 206 45.22*110.21*268.41 89.6 2156.3

CIAPS- -66-3-3

0 1872 12 45.09*110.11*268.50 88.3 2254.7






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Figure 35 Temperature during external short circuit test

Figure 36 Cell voltage and current during external short circuit test



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Figure 41 Front side of sample after external short circuit test

Figure 42 Top side of sample after external short circuit test



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Thermal abuse test

Before test



m


CIAPS- -66-4-1

3.471 2115 0.482 44.52*110.50*268.60 Deformation

CIAPS- -66-4-2

3.376 2099 0.475 44.65*110.30*268.51 Deformation

CIAPS- -66-4-3

3.371 2131 0.480 44.60*110.21*268.51 Venting

After test

Sample No.

OCV , Vd.c.


m

Dimension, mm MaximumCaseTemperature Rise T,

C

CIAPS- -66-4-1

3.366 2114 0.523 46.74*110.38*268.50 130.2

CIAPS- -66-4-2

3.335 2098 0.524 43.57*110.42*268.80 129.7

CIAPS- -66-4-3

3.340 2119 0.516 51.95*110.51*268.01 130.4





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Figure 47 Front side of sample after thermal abuse test

Figure 48 Top side of sample after thermal abuse test



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Crush test

Before test



m


CIAPS- -66-5-1

3.387 2122 0.477 44.50*110.50*269.51 No effect

CIAPS- -66-5-2

3.378 2136 0.473 44.55*110.21*268.02 No effect

CIAPS- -66-5-3

3.396 2122 0.482 44.62*109.80*268.50 No effect

After test

Sample No.

OCV , Vd.c.


m

Dimension mm Stop condition

CIAPS- -66-5-1

3.387 2122 0.477 44.50*110.50*269.40 1000 weight

CIAPS- -66-5-2

3.378 2136 0.473 44.48*110.21*268.02 1000 weight

CIAPS- -66-5-3

3.396 2122 0.482 44.60*109.80*268.50 1000 weight





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Figure 53 Front side of sample after crush test

Figure 54 Top side of sample after crush test



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Nail penetration test

Before test



Dimension, mm Penetrationspeed, mm/s

Result

CIAPS- -66-6-1

3.453 2145 0.479 44.43*110.21*270.01 84 Leakage

CIAPS- -66-6-2

3.385 2136 0.477 44.51*109.90*267.00 82 Leakage

CIAPS- -66-6-3

3.455 2145 0.484 44.79*110.21*268.00 85 Leakage

After test

Sample No.

OCV , Vd.c.


m

Dimension mm Diameter ofrod,mm

Maximumtemperature

of cellcase, °C

CIAPS- -66-6-1

0 1770 4.244 49.89*114.35*269.50 3 142.8

CIAPS- -66-6-2

0 1765 5.488 51.46*113.18*266.89 3 129.3

CIAPS- -66-6-3

0 1770 3.588 49.06*113.13*269.00 3 137.9






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Figure 59 Temperature during nail penetration test

Figure 60 Voltage during nail penetration test



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Figure 65 Front side of sample after nail penetration test

Figure 66 Top side of sample after nail penetration test



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Drop test

Before test




CIAPS- -66-7-1

3.340 2140 0.478 44.40*109.81*270.05 Leakage

CIAPS- -66-7-2

3.339 2127 0.484 44.25*109.98*269.80 Leakage

CIAPS- -66-7-3

3.348 2132 0.476 44.18*110.02*268.80 Leakage

After test

Sample No.

OCV , Vd.c.


m

Dimension mm Drop height,m

CIAPS- -66-7-1

3.337 2065 0.488 44.41*109.78*270.03 1.5

CIAPS- -66-7-2

3.338 2093 0.474 44.20*109.96*269.82 1.5

CIAPS- -66-7-3

3.343 2039 0.478 44.16*110.00*268.78 1.5






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Figure 71 Front side of sample after drop test

Figure 72 Leakage point of sample after drop test



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Figure 74 Leakage point of sample after drop test



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Figure 76 Leakage point of sample after drop testEnd of test report


TEST REPORT Lithium ion cell abuse tests - EV … Jukeng Rd., Juling Village, Jutang District, Guanlan, Longhua New District, Shenzhen, 518110 Report about abuse tests on Lithium ion

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