T-Micro From chip level to 12” wafer level 3D processing
T-Micro
From chip level to 12” wafer level 3D processing
Tohoku-MicroTec Co., Ltd.Tohoku-MicroTec Co., Ltd.
Advantages of 3D IC
Conventional SoC 3D-SoCLength of TSV:
20-150mm
-Short global interconnect small RC delay, small CP
-High band width-Small form factor
1. Maximization of electrical performances
2. Increase of circuit density
3. New Architecture (Hyper-parallel processing, Multifunction, etc)
4. Heterogeneous integration
5. Cost reduction
6. Realization of high performance detector with ~100% area factor in chip
segment 2D-SoC into functional block
Long Global interconnect
large RC delay, large CP
Sync.
clock
Compound semiconductor
SoC: System on Chip (System LSI)
We provide cutting-edge 3D-IC R&D Prototyping and Pilot / Low-Volume Production Service
State-of-the-art technologies◦ 200mm and 300mm 3D process engineering lines and advanced technology platforms
- design / layout / mask making
- wafer / chip thinning
- forming TSV on chip / wafer (front side / backside TSV)
- redistribution routing
- both side u-bumps formation on chip / wafer
- chip / wafer stacking
3D stacking LSIs prototype manufacturing service◦ Prototyping of proof of concepts using commercial/customized 2D chips
◦ die-level 3D hetero-integration with backside TSV technology
Support your small-volume, special customized 3D productions◦ base-line process set-up for the pilot production
◦ facilitate your product development
2.5D interposer R&D foundry and pilot production service ◦ Large area interposer
◦ Interposer with passive devices
Development innovative 3D stacking technologies for creative 3D products and
applications
Supply IP and special customized TEG wafers for process-induced reliability
characterization
Lineup of Neural Microprobes
Double–sided
Si Probes
Array typeMicroelectrode
Microprobe w/ μ-fluidic channel
4-shunk
Double–sided
Si Probes
w/ optical waveguide
μ-bump
μ-TSV (10k~1M TSVs/chip)
Technology / Samples
MicroProbes for Neural recording
・Diagnosis and treatment for brain disorder
・Research for BMI/BCI
[Double-sided Si Probe]
[ Tungsten core Omnidirectional probe]
Others
Obsessive-Compulsive Disorder (OCD)
Parkinson’s Disease
Essential Tremor
Epilepsy245,000
216,000
80,000
775,000
3,500,000
Depression
Research/InvestigationPractical use
DystoniaNeurodegenerative Disease
Diagnosis of Epilepsy patient
Au micro-bump connection
Overall view
1.3
mm
38 chips stack
Low cost 3D-Soc Manufacturing Technology
We focus on a versatile bonding technology for silicon LSI,compound semiconductor, and microelectromechanical systemdevices at temperatures of less than 200 C for heterogeneousintegration. Our new gold (Au) micro-bump technology is one of thepromising candidates for this purpose.
12-inch Wafer50mm
2.5D Interposer
3μmΦ 5-10μmΦ0.7μmΦ
18
μm
W-TSV Cu-TSV (Via middle)
3μm
Cu-TSV (Via last)
30
μm
TSV Process
3D Stacked Imager Sensor
LSI Chip
LSI Chip
Capacitor Chip
Inductor Chip
MEMS Chip
Cavity ChipBeam Lead
Cu TSV
Interposer
Cu Sidewall
Chip
Hetero-Integrated LSI-MEMS Multi-Chip Module
Vertically Stacked MEMS on LSI Chip
MEMS Chip
LSI ChipSubstrate
Cu Sidewall
UT
LT
Back gate Metal
5μm
UT: upper tier
LT: lower tier
3D Stacked SOI pixel detector
3D-MEMS/Hetero-Integration
5μm 5μm
Cylinder bump for fragile material5μm pitch Au Cone bump
CdTe
Si
3D-Sensor/Detector
TSV
Micro-bump
Heterogeneous Integration
Low cost fabrication
5μm
Headquarter (Japan)
6-6-40 Aza-Aoba Suite 203, Aramaki, Aoba-ku,
Sendai, 980-8579 Japan
Phone:+81-22-398-6264, Fax:+81-22-398-6265
US Office
750 North King Road #206 San Jose CA 95133
USA
Phone: 408-464-7972
Information in this document is subject to change without notice.
Copyright (C) 2016 Tohoku-MicroTec Co., Ltd. All Right Reserved.
200mm/300mm 3D Integration Process Facilities
Tohoku-MicroTec Co., Ltd. (http://www.t-microtec.com)
DeveloperDouble sided
i-Line Stepper
Low Temp.
Asher
High-Aspect-Ratio Sputter Electroplating SystemMetal Etcher
CtW / WtW Aligner and BonderSelf-Assembly System CtC / CtW Flip-Chip Bonder
TSV Liner-CVDEdge Trimming Dicing SawWafer Grinder CMPWafer Debonder Evaporator for Metal Bump
Temporary Bonder Deep Si RIE Self-Assembly Multichip
Bonder
NpD for cone
bump
T-Micro
Ver.9.0