Simplified Static Analysis for Shock Behavior Evaluation of Thin Glass Plates Seong-In Moon 1 , Chang-Hoi Kim 1 , J. C. Koo 1,a,∗ , Jae-Boong Choi 1,b , Young-Jin Kim 1,c and Yun-Jae Kim 3,d 1 School of Mechanical Engineering, Sungkyunkwan University 300 Chunchun-dong, Jangan-gu, Suwon, Kyonggi-do 440-746, Korea 2 Mechanical Engineering Department, Korea University 1-5 Ka, Anam-dong, Sungbuk-gu, Seoul 136-701, Korea a [email protected], b [email protected], c [email protected], d [email protected] Keywords: TFT-LCD, Impact Analysis, Static Analysis, Energy Abstract. Recently, mechanical shock failures of a flat display unit such as TFT-LCD device have been an important concern of designers. In order to achieve the mechanical shock requirement, it is necessary to perform the detailed FE analyses which could be very expensive either by the lengthy computation or by the complicated geometry modeling. The objective of this study is to propose a simplified analysis methodology to simulate impact behavior of thin glass plates. The static problem equivalent to the impact one is found from the concept of solid mechanics to estimate the maximum deflection and stress under impact loading. To show the plausibility of the proposed approach, it is applied to the idealized problem which is a two dimensional beam subjected to impact loading. Based on explicit FE analyses using the LS-DYNA FE program, it was shown that the impact problem can be solved by the equivalent static analysis which is much easier to solve in practice. Therefore, the proposed approach provides significant advantages in design optimization of a TFT-LCD device against shock failure, and enables the designer to avoid ad hoc modeling of the transient dynamics so that product design cycle could be shortened. Introduction As the TFT-LCD gets more attention for the next generation display device, the user requirements for the mechanical functionalities as well as the electrical user specifications for the device become much tighter. Due to its brittle characteristics of TFT-LCD(Thin Film Transistor - Liquid Crystal Display) panels, maintaining mechanical integrity under severe impact loading is one of the key design concerns. A major concern during the shock loading is of course the local material failure of the TFT-LCD panel [1]. A typical design-supporting tool against failure under impact loading is detailed impact simulation based on the Lagrangian FE analysis with the explicit integration scheme [1-3]. Despite its popularity, such impact analyses still suffer from several problems. For instance, compared to static analysis, the accuracy of results depends on computational algorithm employed in the analysis [2]. Moreover, impact analysis typically requires tight convergence control, which limits freedom of mesh generation, as the convergence criterion depends on the smallest mesh size [1]. As results, impact analysis typically requires both enormous human interactions in modeling and computational costs. As competitive market needs the shorter cycle for product design, the use of the impact simulation to optimum design against shock failure is getting more difficult for practical design application. In this respect, an innovative computational technique to characterize shock failure of the TFT-LCD panel is needed. With the proper identification and isolation of the worst scenario during the shock loading on the panel, this paper presents a new computational approach to ∗ Corresponding Author Solid State Phenomena Vol. 110 (2006) pp 263-270 Online available since 2006/Mar/15 at www.scientific.net © (2006) Trans Tech Publications, Switzerland doi:10.4028/www.scientific.net/SSP.110.263 All rights reserved. No part of contents of this paper may be reproduced or transmitted in any form or by any means without the written permission of TTP, www.ttp.net. (ID: 130.203.136.75, Pennsylvania State University, University Park, United States of America-03/06/14,12:31:43)
Simplified Static Analysis for Shock Behavior Evaluation of Thin Glass Plates
Jun 27, 2023
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