Top Banner
SERIAL ACCEPTANCE TESTING OF 24 DETECTORS FOR „Scientific Detector Workshop“, Florence, 7 th - 11 th Oct. 2013 Andreas Kelz a J.-L. Lizon b , R. Bacon c (P.I.), M. Accardo b , L. Capoani c , S. Deiries b , C. Dupuy b , T. Fechner a , T. Jahn a , A. Jarno c , M. Loupias c , A. Pecontal c , L. Piqueras c , R. Reiss b , J. Richard c , G. Rupprecht b , M. Srivastava (a) , O. Streicher a , P. Weilbacher a a) Leibniz-Institut für Astrophysik Potsdam (AIP) b) European Southern Observatory (ESO) c) Centre de Recherche Astronomique de Lyon (CRAL) Supported by grant no. 05A11BA2
5

Serial Acceptance Testing of 24 Detectors for

Feb 22, 2016

Download

Documents

Chet

Andreas Kelz a J.-L. Lizon b , R. Bacon c (P.I.), M. Accardo b , L. Capoani c , S. Deiries b , C. Dupuy b , T. Fechner a , T. Jahn a , A. Jarno c , M. Loupias c , A. Pecontal c , L. Piqueras c , R. Reiss b , J. Richard c , G. Rupprecht b , M. Srivastava (a) , O. Streicher a , P. Weilbacher a - PowerPoint PPT Presentation
Welcome message from author
This document is posted to help you gain knowledge. Please leave a comment to let me know what you think about it! Share it to your friends and learn new things together.
Transcript
Page 1: Serial  Acceptance Testing of 24 Detectors  for

SERIAL ACCEPTANCE TESTING OF 24 DETECTORS FOR

„Scientific Detector Workshop“, Florence, 7th - 11th Oct. 2013

Andreas Kelza

J.-L. Lizonb, R. Baconc(P.I.), M. Accardob, L. Capoanic, S. Deiriesb, C. Dupuyb, T. Fechnera, T. Jahna, A. Jarnoc, M.

Loupiasc, A. Pecontalc, L. Piquerasc, R. Reissb, J. Richardc, G. Rupprechtb, M. Srivastava(a), O. Streichera, P. Weilbachera

a) Leibniz-Institut für Astrophysik Potsdam (AIP) b) European Southern Observatory (ESO)

c) Centre de Recherche Astronomique de Lyon (CRAL)

Supported by grant no. 05A11BA2

Page 2: Serial  Acceptance Testing of 24 Detectors  for

MUSE overview

MUSE, a second-generation VLT 3D-spectrograph

- Field of View: 60 x 60 acrseconds - Spatial resolution: 0.2 arcseconds - Spatial elements: 60,000 - Spectral range: 465nm – 930nm - 24 spectrographs with detector systems - Adaptive Optics enhanced mode

The MUSE consortium:(P.I.: R. Bacon, CRAL)

Page 3: Serial  Acceptance Testing of 24 Detectors  for

MUSE detector system: AIT process

11. Oct. 2013, A. Kelz Scientific Detector Workshop MUSE detector testing

1) design @ ESO

2) head mechanical assembly @ AIP

3) chip integration & alignment @ ESO 4) CCD character-

isation @ ESO 5) transport to AIP

6) Acceptance test at spectrograph @ AIP

7) Integration & perfomance verification @ CRAL. Vacuum- and cryo- system by ESO

8) Operating-SW by LATT, DR-SW by AIP & CRAL

Production cycle of 24 MUSE detector heads

CCD231 4k x 4k, 15 mm

Page 4: Serial  Acceptance Testing of 24 Detectors  for

Performance of 24 detectors(from VLT-TRE-MUS-1379 technical report to ESO)

11. Oct. 2013, A. Kelz Scientific Detector Workshop MUSE detector testing

Figure 1: Gain values for all quadrants and all channels. The dashed line displays the median value.

Figure 2: Maximum relative non-linearity for the 4 quadrants of each channel.

Figure 3: Measured dark current for the 24 channels. The dash line shows the specification.

Figure 6: Read-out noise measurement performed after shutting down all external electrical sources, except NGCs.

Figure 5: Readout noise for all channels. The mean value and peak-to-peak variation for the 4 quadrants are plotted. The dashed line displays the specification.

Figure 4: Measured remanence level for each channel after medium (blue) and high (red) saturation.

Gain: 1.2 ADU/e- Non-linearity: 0.3 %

Dark current: 1.1 e-/hour

Remanence: <0.05 e-

Readnoise @ quite mean: 2.1 e-

Readnoise @ load

Page 5: Serial  Acceptance Testing of 24 Detectors  for

Acceptance test with spectrograph

11. Oct. 2013, A. Kelz Scientific Detector Workshop MUSE detector testing

Fig 10: example of detector shift and rotation measured across the CCD.

Fig 11: spectrograph focus curves and image quality histograms in three-colours.

Fig 12: relative x and y shifts (top) and tilts (bottom) for all CCDs with allowed margins (green box).