LA SIGMA Mi c ros c opy Work s hop S c anning El ec tron Mi c ros c opy Alfr e d Guna s e karan
Scanning Electron Microscopy
Jun 07, 2023
A standard SEM is typically used for
low
-to
-medium magnification (10
-
150,000X) imaging of conductive
samples, usually metals
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For non-conductive samples, a conductive coating of carbon, gold, chromium, etc. should be applied to avoid charging effects.
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