Sarah Azimi Boyang Du Luca Sterpone - Indico at ESA ... · SET: mitigation radiation test results ! Heavy ions test performed at the Cyclotron of the Université Catholique de Louvain

Politecnico di Torino CAD Group – Dipartimento di Automatica e Informatica Torino - Italy

Sarah Azimi Boyang Du

Luca Sterpone

Goal ¨  Analysis of Single Event Transients (SETs) occurrency ¨  Effective SET mitigation

2

Outline ¨  SET effects on Flash-based FPGAs ¨  Single Event Transient Analysis (SETA) tool

¨ Analysis ¨ Mitigation ¨ Experimental results

¨  Conclusions and future activities

3

SET effect 4

¨  A Single Event Transient (SET) is generated by the injunction of charge collection ¨  A charged particle crosses a junction area ¨  It generates an amount of current, provoking a “glitch” ¨  SET can be indistinguishable from normal signal and

exist for notable distances

SET width SET amplitude Rise ΔV/ΔT Fall ΔV/ΔT

Circuits on Flash-based FPGAs 5

0 0 0 0 0 0

0 0 0 0 0 0

0 0 0 0 0 0

0 0 0 0 0 0

0 0 0 0 0 0

0 0 0 0 0 0

Flash configura/on memory FPGA array

Circuits on Flash-based FPGAs 6

Flash configura/on memory FPGA array

Configura/on process

0 1 0 0 0 0

1 0 0 0 0 0

1 1 0 0 0 0

0 0 0 0 1 0

0 1 0 1 0 0

0 0 0 0 0 0

SET scenario 7

¨  Considering a place and route design on FPGA ¨  Fixed logic cells

¨  Defined number of routing segments

Source of SET

SET scenario 8



Source of SET Propagation through Gates

Propagation through Routing

SET scenario 9



Source of SET Propagation through Gates

SET Classification

FFs / IOs

Propagation through Routing

SET Propagation through gates 10

For a 1→0→1 transi,on Δtp is defined as: Δtp = tpHL – tpLH For a 0→1→0 transi,on Δtp is defined as: Δtp = tpLH – tpHL

Fist Region: If(τn < k*tp ) then τn+1 = 0 Second Region: If (τn > (k+3)*tp) then τn+1 = τn + Δtp Third Region: If ((k+1)*tp < τn < (k+3)*tp) then τn+1 = (τn2 -‐ tp2 )/ τn + Δtp Fourth Region: If (k*tp < τn < (k+1)*tp) then τn+1 = (k+1)*tp(1 -‐ e(k – ( τn / tp )) ) + Δtp

Source of SET Propagation through gates Propagation through routing SET classification on FFs or IOs

[Wirth et al, NSREC 2008]

SET Propagation through gates 11

For a 1→0→1 transi,on Δtp is defined as: Δtp = tpHL – tpLH For a 0→1→0 transi,on Δtp is defined as: Δtp = tpLH – tpHL

Fist Region: If(τn < k*tp ) then τn+1 = 0 Second Region: If (τn > (k+3)*tp) then τn+1 = τn + Δtp Third Region: If ((k+1)*tp < τn < (k+3)*tp) then τn+1 = (τn2 -‐ tp2 )/ τn + Δtp Fourth Region: If (k*tp < τn < (k+1)*tp) then τn+1 = (k+1)*tp(1 -‐ e(k – ( τn / tp )) ) + Δtp


V

[Wirth et al, NSREC 2008]

SET Propagation through routing 12


V

[Sterpone et al, RADECS 2014]



V


Propagation Induced Pulse Broadening



V



Gate to Gate Characterization



V


V


Gate to Gate Characterization

SET classification on FFs and IOs 16

¨  A tool has been developed: ¨  Single Event Transient Analyzer (SETA)

HDL

Synthesis and Implementation

(Place and Route)


V V

Netlist

Constraints

IO/FF expected Pulses

SETA Tool

SETA tool 17


V V

Netlist

Constraints

Physical Design Description (PDD)

Gate PIPB Characterization

SETA tool 18


V V

Netlist

Constraints


Sensitive nodes selection


SETA tool 19


V V

Netlist

Constraints


Sensitive nodes selection SET propagation


SETA tool 20


V V

Netlist

Constraints




SETA tool 21


V V

Netlist

Constraints




SETA tool 22


V V

Netlist

Constraints



Propagation is performed up to “terminal” nodes

(IOs / FFs)


SETA tool 23


V V

Netlist

Constraints



SET classification on FFs or IOs


SETA tool 24


V V

Netlist

Constraints



SET classification on FFs or IOs

V


SET classification on FFs and IOs 25

¨  The classification identifies the number of SET: ¨  Totally filtered

¨  Partially filtered ¨  Equally propagated ¨  Broadened

SETA results – EUCLID project (WP1) 26

0"5000"10000"15000"20000"25000"30000"35000"40000"45000"

0,1"ns" 0,3"ns" 0,45"ns" 0,7"ns" 1"ns" 1,5"ns" 2,0"ns" 2,5"ns" 3,0"ns" 4,0"ns"

Combina2onal"Path"7"Single"Event"Transient"sensi2vity"

Filtered" Par2ally"Filtered" Equal" Broadened"

!

SETA results – EUCLID project (WP1) 27

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!Total number of analyzed SET

Type of SET per injected pulse

SET: mitigation 28

¨  Selective guard gate (GG) mapper ¨  Inserting a GG logic structure in the input of the

selected FF

[Sterpone and Du, IEEE ETS 2014]

SET: mitigation solution 1 29

¨  Selective guard gate (GG) mapper ¨  Inserting a GG logic structure in the input of the

selected FF


Filtering estimated on the basis of the SETA

report


¨  Accurate placement acting on the critical paths ¨  Distance between gates is modified in order to

maximize the electrical filtering effect


SET: mitigation results 33

Different place and route constraints

Average SET sensitivity




Original RISC circuit

Post SETA RISC circuit




Effective mitigation of SET

SET: mitigation radiation test results ¨  Heavy ions test performed at the Cyclotron of the

Université Catholique de Louvain (UCL) ¨ Kripton ion with a fluence of 3.04E8 (particles) ¨ Average flux 1E4 (particles/sec) ¨ RISC working frequency of 20MHz on ProASIC3

A3P250 RISC processor version SEE Cross-section

[MeV cm2/mg]

Unhardened 1.45E-9

Full TMR + GG 6.37E-10

Our Approach 3.12E-12

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SET: in conclusion… 37

¨  SETA tools are available ¨  Effective analysis of SET propagation

¨  Effective overall SET mitigation





V V V

X

Physical Design Description 41

¨  The circuit is modeled as a graph ¨  Cell functionality

¨  Routing model

AND

OR INV

SET generation phenomena 42

¨  Particle hitting a sensitive node ¨  Generate a SET pulse

¨  Propagates through the logic

AND

OR INV

SET generation phenomena 43

[Azimi and Sterpone, IEEE DDECS 2016] [Azimi, Du, Sterpone, Micro Rel, 2015]

¨  SET generation is related to ¨  Linear Energy Transfer (LET) ¨ VersaTile architecture ¨ Technology

Why SET generation ? ¨  The type of source SET is mandatory to understand

the exact type of propagation ¨  Mitigation GG insertion is related to SET length

¨  It is necessary to establish the absolute SET count ¨ Calculation of the realistic IOs/FFs error rate for

the whole space mission duration

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Why SET generation ? 45

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!

Identification of source SET length 46

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!Effective source SET designer must care

Identification of effective SET counts 47

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!Effective source SET designer must care

Effective SET counts

Thank you! ¨  [email protected]

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Sarah Azimi Boyang Du Luca Sterpone - Indico at ESA ... · SET: mitigation radiation test results ! Heavy ions test performed at the Cyclotron of the Université Catholique de Louvain

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