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Row-Based Area-Array I/O Design Planning in Concurrent Chip- Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011
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Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Dec 17, 2015

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Page 1: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow

R. Lee and H. Chen

Department of EE

NCTU, Taiwan

ASPDAC 2011

Page 2: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Outline

Introduction Novel I/O-bump tile design and I/O-row based

planning Package-aware I/O-bump planning methods Experimental results Conclusion

Page 3: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Introduction

Modern I/O planning is divided into two categories: Peripheral I/O Area-array I/O

Page 4: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Introduction

Area-array I/O has the features of smaller die size, higher I/O density, lower parasitic effects

Page 5: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Introduction

Flip-chip

RDL routing

Page 6: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Introduction

I/O-bump planning Input

I/O-bump tile location Package ball assignment

Output Matching between the I/O-bump tiles and package balls

Objective Minimize net crossing, total wirelength, length deviation

Page 7: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Introduction

Conventional design flow Concurrent chip-package design flow

Page 8: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Novel I/O-bump tile design and I/O-row based planning

In order to achieve concurrent design flow, integrate the I/O (and P/G) and area-array bump into one specific tile called I/O bump

Electrostatic discharge protection

Page 9: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Novel I/O-bump tile design and I/O-row based planning

The I/O-row based I/O planning scheme The width/height of tile and I/O-row are designed to satisfy the

bump size/pitch

Page 10: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Package-aware I/O-bump planning methods

Partition the whole package into four sectors The initial placement of corresponding I/O-bump

tiles is randomly generated in each sector

Page 11: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Package-aware I/O-bump planning methods

Double sorting for planar planning (SORT) Sort package balls (top to bottom, outer to inner) Sort I/O-bump tiles (top to bottom, inner to outer) Balls and bumps which have the same numbers will be

paired for connection

1

2

1

2

Page 12: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Package-aware I/O-bump planning methods

SORT method intuitively succeeds in producing a zero-crossing package routing

However, the net length is another critical factor, nets from bumps to balls should be routed as short as possible

Each net should be kept in the similar wirelength

Apply a greedy way to shorten the total wirelength and the length deviation called GREEDY

Page 13: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Package-aware I/O-bump planning methods

Shortening flylines between I/O-bumps and package balls (GREEDY) Sort package balls (top to bottom, outer to inner) Connect the ball with one I/O-bump tile which can result in

the shortest flyline length

Page 14: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Package-aware I/O-bump planning methods

The GREEDY method will inevitably cause the net crossing in package routing

For optimizing the requirements in chip-package codesign, designer must minimize the net crossing, total wirelength and length deviation at the same time

Model the I/O-bump planning as a weighted bipartite matching problem (WBIPT)

Page 15: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Package-aware I/O-bump planning methods

Matching-based assignment (WBIPT)

xij = 1 if ball i is assigned to bump j m and n are the total number of balls and bumps

Page 16: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Package-aware I/O-bump planning methods

Matching-based assignment (WBIPT)

Diffij is obtained through subtracting the order of bump j from that of ball i

AvgLength is the average length obtained from SORT lij is the flyline length

Page 17: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Experimental results

Page 18: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Experimental results

Page 19: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Experimental results

Page 20: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Experimental results

Page 21: Row-Based Area-Array I/O Design Planning in Concurrent Chip-Package Design Flow R. Lee and H. Chen Department of EE NCTU, Taiwan ASPDAC 2011.

Conclusion

With the setup in the design of I/O-bump tile and I/O-row based scheme, this paper develop a chip-package concurrent design flow