RIFLE –Engineering Memory Tester Characterization and Engineering tester for Non-Volatile Memory Cells and Arrays • Highest analog performance • Extensive built-in functionality • Easiest test program development • Full integration with data analysis tools
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RIFLE –Engineering Memory Tester
Characterization and Engineering testerfor Non-Volatile Memory Cells and Arrays
• Highest analog performance• Extensive built-in functionality• Easiest test program development• Full integration with data analysis tools
Analog Performance Fast and accurate arbitrary waveform generators
o Applications• Pulse generation for program/erase/set/reset• External reference for Vt readout• Additional supply (also for power on experiments)
o Configurations• Standard (-12..+12V, 100mA, 100MHz)• High Voltage (-9..+36V, 10mA, 100MHz)• Power (0..4V, 600mA)
High-speed PMUo Applications
• Fast measurement of the cell currents• Supply current measurement (idle, standby, operations)• Internal voltage references
o Characteristics• Up to 70 MHz sampling rate, 1ksample dynamic storage, hardware average• 5 nA accuracy in the low range• Synchronized with the digital engine
Extensive Built-In FunctionalityWide range of applications
o Single cell, test array, producto NAND, NOR, NROM, PCM, FeRAM, MRAM, RRAMo SLC and MLCo Serial/parallel/multiplexed/analog interfaceso Wafer and package level
Built-in functionalityo Digital operations: program/erase/verify/reado Vt and Icell:
IV/distribution/bitmapping/galaxy/edge lookupo Support: continuity/iref/icc/disturbs/…o Customizable user functions
Easy Test Program Development Interactive testing
o On-line selection of test functions and parameterso Immediate execution and availability of results (including
bitmaps) on the screen or in datalogs Straightforward development
o Test program implementation, debug and analysis in the same environment
o Device specific functionality implemented in a Windows DLL, using C++ and a powerful library
o Test flow can be implemented in C++ or in VI Installable on desktop
o Low footprinto No need of lab facilities
Integration with Data AnalysisTest result generation
o Bitmaps and detailed test results can be sent on-line via TCP-IP to a data analysis tools
o XML-based datalogBARNIE test data analysis suite
o Bitmap view and processingo Datalog load and analysis
NplusT
would like to thank youfor your time and
consideration
for further information: [email protected]
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