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RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:
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RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

Dec 17, 2015

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Page 1: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

RF Excitation of the STM

Eudean Sun, UC Berkeley, EECSJoonhee Lee, Xiuwen TuDr. Wilson Ho

IM-SURE Fellow:Graduate Students:

Faculty Mentor:

Page 2: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

Scanning Tunneling Microscope Angstrom Resolution Microscope Tunneling Current

Page 3: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

Quantum Tunneling

JT – tunneling current

VT – DC bias

s – tip-sample distance

Order of magnitude change in JT for every angstrom change in s.

sAVJ TT2/1exp

Page 4: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

Scanning Feedback loop

Piezoelectric drives to position sample Ceramic materials that distort with voltage for high-precision

positioning

Maintain constant tunneling current by adjusting tip-sample distance

Page 5: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

RF Excitation via a Coil 800MHz – 2.0GHz, 100MHz steps Resonance

Page 6: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

Experimental Data

Page 7: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

The Model SolidWorks, AutoCAD, Ansoft’s HFSS – High

Frequency Structure Simulator Finite Element Method, like FEMLAB

Page 8: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

The Model cont’d Parts:

Inner radiation shield Sample holder Sample RF coil Crosspiece Tip

Excitation 2mA current

Solution Frequency sweep Fields along polylines

Page 9: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

Preliminary Results Resonance due to radiation shield

Page 10: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

Making a Better Model Added parts:

Outer shield

Coaxial cable

Rails / Grabber

Page 11: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

Making a Better Model cont’d New excitation

Wave port Finer mesh

Page 12: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

Making a Better Model cont’d Rebuilt all parts in HFSS

Transferring between SolidWorks/AutoCAD and HFSS was inconsistent

Refined solution setupAdded parametric analysis to plot E field

across sample for four different tip-sample distances: 1e-6, 1e-5, 1e-4, 1e-3 in.

Increased data points across polylines to 10,000 for plotting fields.

Page 13: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

The New Model…in Color

Page 14: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

Results Frequency Sweep

Page 15: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

Results cont’d Parametric Analysis

Page 16: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

Results cont’d

Page 17: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

Results cont’d

Page 18: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

Results cont’d Field plots

Page 19: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

Results cont’d

Page 20: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

Problems Resonance in simulation at 1.2GHz,

1.4GHz, 2.0GHz primarilyResonance in experiment at 800MHz,

1.2GHz, 1.3GHz, 2.0GHz primarily Parametric analysis shows large E field

differences between 1e-3 in, 1e-4 in, and 1e-5 in, but not a big jump between 1e-5 in and 1e-6 in.

“Out of memory”

Page 21: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

Potential Fixes Better geometry Finer meshes

Page 22: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

Limitations Model complexity

Can’t include everything, but what parts will affect resonance most?

Computer speed 2.66GHz Pentium 4 – 20 hours to complete one

analysis

RAM 1GB physical + 4GB virtual memory “Out of memory”, literally, when finer meshes applied

Page 23: RF Excitation of the STM Eudean Sun, UC Berkeley, EECS Joonhee Lee, Xiuwen Tu Dr. Wilson Ho IM-SURE Fellow: Graduate Students: Faculty Mentor:

Acknowledgements Dr. Wilson Ho Joonhee Lee Xiuwen Tu IMSURE Program