REFERENCES [1] A.C. Boccara, D. Fournier and. J. Badoz, Appl. Phys. Lett., 36 (1980) 130. [2] J.C. Murphy and L.C. Aamodt, J. Appl. Phys., 51 (1980) 4580. [3] W.D. Jackson, N.M. Amer, A.C. Boccara and D, Fournier, Appl. Opt., 20 (1980) 1331. [4] G. Rousset and F. Lepoutre, Rev. Phys. Appl., 17 (1982) 201. [5] R.L. Thomas, L.J. Inglechart, M.J. Lin, L.D. Favro and P.K. Kuo in 'Review df progress in Quantitative NDE', edited by D.O. Thomson and D. Chimenti (Plenum, New York, 1985) Vol. 4, p. 745. [6] L.C. Aamodt, J.W. Maclachlan, Spicer and J.C. Murphy, J. Appl. Phys., 59 (1986) 348. [7] P.E. Nordal and S.O. Kanstad in :Scanned Image Microscopy ed E. Ash (Academic Press, New Yorc, 1.980). [8] G. Bausse, in :Scanned Image Microscopy ed E. Ash (Academic Press, New Yorc, 1.980). [9] M.A. Olmstead, N.M. Amer, S. Kohn, Bull. Am. Phys. Soc., 27 (1982) 227. 208
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REFERENCES - Shodhgangashodhganga.inflibnet.ac.in/bitstream/10603/1094/12/12_referances.p… · REFERENCES [1] A.C. Boccara, D. Fournier and. J. Badoz, Appl. Phys. Lett., 36 (1980)
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REFERENCES
[1] A.C. Boccara, D. Fournier and. J. Badoz, Appl. Phys.
Lett., 36 (1980) 130.
[2] J.C. Murphy and L.C. Aamodt, J. Appl. Phys., 51
(1980) 4580.
[3] W.D. Jackson, N.M. Amer, A.C. Boccara and D,
Fournier, Appl. Opt., 20 (1980) 1331.
[4] G. Rousset and F. Lepoutre, Rev. Phys. Appl., 17