1 Qualification and Characterization of the FM27C256 Product : 256K bit UV EPROM Organization: 32k x 8 Technology : CMOS Process : TS-55 Die Size : 100 x 92 mils Passivation: Oxy-Nitride planarization Packages: CERDIP PDIP PLCC Fairchild Semiconductor Salt Lake 3333 West 9000 South West Jordan, UT 84088-8838 Fax: 1.801.562.7500
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Qualification and Characterization of the FM27C256 Diodes...Mar 27, 2000 · 3 INTRODUCTION This report is a summary of the qualification and characterization of the FM27C256 manufactured
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Qualification andCharacterization of the
FM27C256
Product : 256K bit UV EPROM
Organization: 32k x 8Technology : CMOS
Process : TS-55
Die Size : 100 x 92 mils
Passivation: Oxy-Nitride planarization
Packages: CERDIP PDIP
PLCC
Fairchild Semiconductor Salt Lake3333 West 9000 SouthWest Jordan, UT 84088-8838Fax: 1.801.562.7500
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TABLE OF CONTENTS
Introduction…………………………………………………..…………3
QualificationSummary……………………………………….………………………4
Die Qualification Summary………..………………………………….6
AC/DC Characteristics…..…………………………………….………7
Datasheet Parameter Table…………………………………..8
SHMOO Plots At 85°C ….……………………………….…..9
At 25°C…………………………….………………..…10
At 0°C..…………………..…………………………... 11
At -40°C.…………………..…………………...………12
Programmability……………………………………………………….13
Erasability………………………………………………………….…..14
Electrostatic Discharge……………………………………………….15
Pin Capacitance………………………………………………..……..16
Latch-up…………………………………………………………..……17
Die Layout…..…………………………………………………..……..18
Packages & Pinouts…..………………………………………………19
Appendix I (Qual/Reliability Test Conditions) ..…………………….22
Appendix II (Compatible Programmers Guide)..…………………..23
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INTRODUCTIONThis report is a summary of the qualification and characterization of theFM27C256 manufactured by Fairchild Semiconductor. The FM27C256is a high-speed 256K UV erasable and electrically reprogrammable.This part is ideal for applications where fast turnarounds,experimentation of patterns, or low power consumption are importantrequirements. The FM27C256 was using the new TS55 fabricationprocess. This process is a .6µm process that allows higher memorydensity and increased part speed. Qualification summaries andcharacterization reports are included in this report. Ten parts from LotNOIO120 were tested at –40°C, 0°C, 25°C and 85°C with acheckerboard pattern for the characterization report.
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PROCESS QUALIFICATION SUMMARY
TS55 Process Qualification Results - May 13, 1998
Test Lot# / wf Samples
168hr 500hrs 1000hrs Package
HTOL N7J3654/21N7J3655/7N7J3655/4N7J3731/9
77 777777
0000
00
00
0000
ceramicceramicplasticplastic
HTOL N7J3655/9N7J3663/4,6N7J3693/4,8
777777
000
000
000
plasticplasticplastic
Test Lot#/wf Samples 168hr 500hrs 1000hrs 2000hrs Package
HTSL N7J3655/9N7J3663/4,6N7J3693/4,8
557777
000
000
000
00
plasticplasticplastic
HTSL N7J3654/21N7J3655/7N7J3655/4N7J3731/9
77777777
0000
0000
0000
ceramicceramicplasticplastic
Test Lot# / wf Samples
100cyc 500cyc 1000cyc Package
TMCL N7J3654/21N7J3655/7N7J3655/4N7J3731/9
78 787878
0000
0000
0000
ceramicceramicplasticplastic
HTOL N7J3655/9N7J3663/4,6N7J3693/4,8
777777
000
000
000
plasticplasticplastic
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See Appendix I for test definitions and conditions.
QUALIFICATION RESULTS CONT.
Test Lot#/wf Samples 96hrs 168hrs 240hrs 336hrs Package
ACLV N7J3655/9N7J3663/4,6
4554
00
00
00
00
plasticplastic
Test Lot#/wf Samples 168hrs 500hrs 1000hrs 2000hrs Package85/85 N7J3655/9
N7J3663/4,6 58 77
0 0
0 0
0 0
0 0
plastic plastic
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DIE QUALIFICATION SUMMARY
FM27C256 Die Qualification Results – Mar 27, 2000
Test Lot# Samples
168hr Package
HTOL NOIO120 100 0 ceramic
Test Lot# Samples 168hr Package
HTSL NOIO120 100 0 ceramic
See Appendix I for test definitions and conditions.
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AC/DC CHARACTERISTICS
The following sections are data gathered from the characterization of 10FM27C256 parts from Lot NOIO120. We programmed these parts witha checkerboard pattern using the Standard NSC Algorithm. Allcharacterization tests were executed on the Epro 142 tester. The partswere tested at four temperatures: -40°C, 0°C, 25°C, and 85°C. All datais summarized by temperature in all parts of this section.
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DATA SHEET PARAMETER TABLE
FM27C256AC & DC CHARACTERIZATION DATA
System : Erpo-142 Pattern: Ckbd Sample size: 10 parts
Symbol Description Limit -40C 0C 25C 85C
VIL INPUT LOW >0.8V Mean 0.90V 0.94V 1.04V 1.04VVOLTAGE @4.5V Std Dev 0.03 0.02 0.00 0.01
VIH INPUT HIGH <2.0V Mean 1.61V 1.57V 1.45V 1.42VVOLTAGE @5.5V Std Dev 0.05 0.03 0.01 0.01
VOL OUTPUT LOW <0.4V Mean 0.13V 0.14V 0.15V0.16V
VOLTAGE @2.1Ma Std 0.00 0.01 0.00 0.01
VOH OUTPUT HIGH >3.5V Mean 4.41V 4.40V 4.42V 4.40VVOLTAGE @-2.5Ma Std 0.00 0.00 0.00 0.00
The programmability of the FM27C256 was measured by giving the device tenprogramming pulses with each pulse being 10us long.During programmingVpp was set to 12.75V and Vcc was set to 6.25V. The margin were measuredaftereach programming pulse to determine how high the worst case cell hadbeen programmed. The maximum value for reading margin is 8V. After the test,device margins were plotted vs. programming pulse time. Five parts from the1st lot (IOI120) were tested.
Voltage Margin ( mV) Number of 10uS Hits
0
1000
2000
3000
4000
5000
6000
7000
8000
9000
1 2 3 4 5 6 7 8 9 10
Read Margin
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ERASABILITY
Erasability of the FM27C256 was tested by programming a pattern into the part usingthe Data-IO Series 1000 parallel programmer and the standard Fairchild Algorithm. Theparts were then erased in a UV oven with a measured intensity of 13.17 mW/cm2. Theparts were erased and the margins of the programmed bits were measured in one minuteintervals. Both a checkerboard and all zeros pattern were tested.
The specification for the FM27C256 requires that the part receive 15W⋅ Sec/cm2 of UVenergy. Using the UV oven’s measured intensity, the parts must be fully erased in 19minutes to meet the spec. A part is fully erased when the margins voltage reaches 4Volts. It can be seen that the FM27C256 meets the specification’s requirements.
FM27C256 Lot NOIO120 Eraseability(5 Parts)
3500
4000
4500
5000
5500
6000
6500
7000
7500
8000
8500
0 1 2 3 4
Number of Minutes in Erase Oven
ReadMarginsVoltage(mV)
Part #1
Part #2
Part#3
Part #4
Part #5
Average
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ElectroStatic Discharge (ESD) Tests
ESD tests were performed on two Fairchild FM27C256 parts, lot NOIO120. The partswere tested on the KeyTek zapper . MIL-STD-883C, Method 3015 (vs. Vss Ground, vs.Vcc Ground, and vs. I/O Ground) was used for all ESD testing. The FM27C256 datasheetspecifies that all pins must withstand a charge of 2000 Volts. All pins were tested withvoltages from 1000 volts to 3000 volts in 500 volt increments, three times at each voltage.At each voltage the polarity was changed from positive to negative so that the totalnumber of discharges to each pin was 36. A summary of test results is shown below.
Part # Voltage Failed Test Condition Failed Pins Failure Condition1 3000 Vss Ground 0 None2 3000 Vss Ground 0 None
* The test were also performed on the three FM27C040 parts which had exactly the sameESD circuit design as the FM27C256 summary of test results is shown below.
Part # Voltage Passed Test Condition Failed Pins Failure Condition1 3000 Vss Ground 0 None2 3000 Vss Ground 0 None3 3000 Vss Ground 0 None
Note: The 1st five (5) units were tested at 500v, the 2nd five (5) units were tested at1000v and up to 3000v …Total of 30 units were tested with 0 failure.
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Pin Capacitance Measurements
Pin capacitance for the FM27C256 was measured with an HP 4275A Multi-Frequency LCR meter. The pin capacitance was measured for each pin withrespect to ground. Ground and VCC pins were not measured. The datasheetspecifies that input and output pin capacitance should not exceed 12pF. Asample of five parts was used from Lot NOIO120 to gather data, and theaverage pin capacitances (pF) are plotted below.
LATCH-UPA sample of five FM27C256 parts from lot NOIO120 were tested for latch-up at 150°C. Latch-up is caused by a paracitic bi-polar transistor withina CMOS transistor that becomes forward biased. This forms a shortcircuit from Vcc to Vss. Three test methods were used to test for latch-up.
Method 1:All outputs left floating. Vcc, OE,CE and all addresses were set to 5.5Volts except the pin to be tested. A current was forced in this pinranging from 0 to 450 mA.
Method 2:All outputs left floating. Vcc, CE, OE and all addressses were atGROUND except the pin to be tested. A current was forced in this pinranging from 0 to 450 mA.
Method 3:All outputs left floating. Vcc, CE, OE and all addressses were atGROUND except the pin to be tested. A current was forced in this pinranging from 0 to -450 mA.
There were no failures due to latch-up after these tests wereperformed.
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DIE LAYOUT
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PACKAGES & PINOUTS
The packages used for the FM27C256 have been extensively used forthe previous revision of this product. All packages have been previouslytested and qualified for this part. Package dimensions, specificationsand pin outs are shown on the following pages.
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Appendix I
Qual/Reliability Test Conditions
The parameters for the Qualification and Reliability tests performed for the CE 60process and FM27C256 Lot NOIO120 are listed below.
TEST CONDITIONS
Hot Temperature Operating Life T= 150°C; Bias = VCC max;(HTOL) Duration = 1000 hrs.
Hot Temperature Static Life Ceramic: Unbiased bake at 250°C;(HTSL) Duration: 1000 hrs. Plastic: 150°C; Duration=1000hrs.
Temperature Cycle Air to air per MIL STD 883,(TMCL) Method 1010, Cond. 1000 cycles
Temperature Humidity Bias T = 85°C R.H.= 85% Bias = VCC
(THB or 85/85) Duration: 1000 hrs.
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Appendix IICompatible Programmers Guide
On the following pages is a list of programmer manufacturers that produce deviceprogrammers for the FM27C256. They use the Fairchild Turbo programmingalgorithm, which ensures high programmability ratio and excellent data retention.Contact a specific manufacturer to find the best programmer for your application.
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Advantest CorporationShinjuku-NS Bldg.,2-4-1,Nishi-Shinjuku,Shinjuku-ku, Tokyo 163-0880Phone [email protected][email protected] http://207.240.44.26/index-e.html
Advin Systems Inc.1050-L East Duane AvenueSunnyvale, CA 94086 USAPhone: (408) 243-7000Fax: (408) [email protected] http://www.advin.com/
American Reliance (AMREL)11801 Goldring Road Arcadia CA 91006Phone (626) [email protected] http://www.amrel.com
Data IOPhone: 800-332-8246Fax: [email protected] http://www.data-io.com/
Dataman Programmers, Inc.215 East Michigan AvenueOrange City, FL 32763 USATel: (904) 774-7785Fax: (904) [email protected] http://www.dataman.com/
Elan Digital Systems Ltd.Elan House, Little Park Farm Road,Segensworth West, Fareham,Hampshire, PO15 5SJ. UKTel: +44 (0)1489 579 799Fax: +44 (0)1489 577 [email protected] http://www.elan-digital-systems.co.uk/
Hi-Lo Ssystems Research Co.4F. NO. 2, SEC. 5, MING SHEN E. RD.TAIPEI, TAIWANTEL:886-2-27640215.FAX:886-2-27566403, [email protected] http://www.hilosystems.com.tw/