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Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)
29

Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Jan 13, 2016

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Page 1: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Prospect for Si sensors in Korea

Y. Kwon(Yonsei Univ.)

Page 2: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

What is Si sensor?(Sensor on Si wafer)

Page 3: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

What is Si sensor?(Diced sensor)

Page 4: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Introduction for student

Page 5: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

How do we make it? (CMOS process)

High purity Si waferOxidationIon implantOxide layer depositionEtch for contactMetal layer depositionPassivation

Page 6: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

biVVW 2

How does it operate?

-

Page 7: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

7/32KPS, Fall 2010

Cosmic muon test

Page 8: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Possibility in Korea

Page 9: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Si sensor in general

• Mature technology• Reliable performance• Fine granule • Higher energy and time resolution

(than gaseous ionization detectors) • Key burden is cost.

Page 10: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Korean Strength

• Productivity!– Large amount of Si sensors produced

with the standard CMOS process

Page 11: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

6 inch fabrication line

11/32

8 inch fabrication line

R&D environment

300 cm2 ~ $ 500

Page 12: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Application

Page 13: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

“A” Si/W calorimeter prototype

Large amount of Si sensors needed!

Page 14: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Schematics

Segment - 0 Segment - 1 Segment - 2

Lateral

Longitudinal

8 pad sensors in one carrier board

15 mm

W, 4mm

Page 15: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

15

SEG0 SEG1 SEG2

y

z

PAD STRIP W

-RM<

y<

RM

FOCAL - schematic view (y-z view)

(EM Shower by single e)

~1X0 x 20

Page 16: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Current snapshot

Page 17: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

MPC-EX for PHENIX

• Application as a pre-shower for EM-Cal (Electromagnetic calorimeter)

Page 18: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Sensor Design

Page 19: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Segmentation as a pre-shower

# of PADs =32

# of PADs =4

Total # of PADs = 128

6.2 cm

6.2

cm

0.18cm

1.5

cm

Page 20: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Fine structure

PADs of Sensor

Bond-ing PADs

Bias Guardring

Floating Guardring(3 layer structure)

Edge Rounding

Page 21: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Process monitoring

Page 22: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

C–V simulation

• Substrate specification – (resistivity) = 6,9,12,18 kΩ∙cm – thickness = 405μm – orientation = <100>

• Full depletion– 90V(6kΩ∙cm)– 60V(9kΩ∙cm)– 45V(12kΩ∙cm) – 30V(18kΩ∙cm)

Page 23: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Test system

Page 24: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Test electronics

Page 25: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Actual test

Page 26: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Measurement : Capacitance

Page 27: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Measurement : Leakage current

< 1 A for whole sensor!

Page 28: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Electric circuit test• We measured resistance between neighboring channels.

Small fraction of them had short. Current yield ~ 30%. Statis-tics suggest the short is between metal traces. Stringent metal etching process is expected to cure the problem.

30 30

1.5 cm1.5 cm

3 cm

123 4

6 cm

Page 29: Prospect for Si sensors in Korea Y. Kwon (Yonsei Univ.)

Ending comment

• Challenges are there…, but bright fu-ture is ahead!