Southwest Test Workshop June 2001 Integrated Technology Integrated Technology Corporation Corporation Productivity Solutions For Probe Productivity Solutions For Probe Probe Card Metrology For Mixed Signal Probe Cards How do I test this probe card with all these #@! relays and components? By By Rod Schwartz, Daniel Kosecki & Russ Allred Rod Schwartz, Daniel Kosecki & Russ Allred Integrated Technology Corporation Integrated Technology Corporation
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Probe Card Metrology For Mixed Signal Probe CardsSouthwest Test Workshop June 2001 Integrated Technology Corporation Productivity Solutions For Probe Introduction Testing Mixed Signal
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Southwest Test Workshop June 2001
Integrated Technology Integrated Technology CorporationCorporation Productivity Solutions For ProbeProductivity Solutions For Probe
Probe Card Metrology ForMixed Signal Probe Cards
How do I test this probe card with all these #@! relays and components?
ByByRod Schwartz, Daniel Kosecki & Russ AllredRod Schwartz, Daniel Kosecki & Russ Allred
Integrated Technology CorporationIntegrated Technology CorporationProductivity Solutions For ProbeProductivity Solutions For Probe
www.IntTechCorp.com
Introduction
Testing Mixed Signal & Other Types of Testing Mixed Signal & Other Types of CardsCardsAny Card with Components or RelaysAny Card with Components or RelaysDefinitions & ExamplesDefinitions & ExamplesTest Methods & Techniques Available NowTest Methods & Techniques Available NowWorkWork--Arounds for Untestable Circuits Arounds for Untestable Circuits FuturesFutures
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Definition of Mixed Signal
Multiple Technologies on One CardMultiple Technologies on One CardMany & Varied Components on CardMany & Varied Components on CardMay Have Linear, RF, Digital, Etc.May Have Linear, RF, Digital, Etc.R, C, L, Networks, Diodes, Active CircuitsR, C, L, Networks, Diodes, Active CircuitsRelaysRelays
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RF Probe Card – Courtesy Artest
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RF Probe Card – Courtesy Artest
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Memory Card – Courtesy Agilent
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Reasons for Testing ComponentsPresence/Absence of Component Presence/Absence of Component Value of ComponentValue of ComponentCircuit may work without itCircuit may work without it
May not work correctlyMay not work correctlyPerformance may degradePerformance may degrade
Oscillator at wrong frequencyOscillator at wrong frequencyBinning to wrong speed categoryBinning to wrong speed categoryFilters at wrong frequencyFilters at wrong frequencyRise time control wrongRise time control wrong
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Resistor Test
Series Series –– In series with probeIn series with probeParallel Parallel –– Between probes (Edges/Pogo’s)Between probes (Edges/Pogo’s)Value Value -- +/+/-- tolerancetolerance
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Capacitance Test
Parallel Parallel –– Between Probes (Edges/Pogo’s)Between Probes (Edges/Pogo’s)Series Series –– In series with probeIn series with probe
Requires AC measurement techniquesRequires AC measurement techniquesPolar Polar –– Applied voltage polarity specifiedApplied voltage polarity specifiedNonNon--Polar Polar –– Polarity not criticalPolarity not criticalValue Value -- +/+/-- ToleranceToleranceLeakage Leakage –– Maximum LimitMaximum LimitImportant to Test Each Component not EquivalentImportant to Test Each Component not Equivalent
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Relay Functional TestBasic operationBasic operationContacts Open/CloseContacts Open/CloseFunction of associated ComponentsFunction of associated Components
TypeTypeForm A N/OForm A N/OForm B N/CForm B N/CForm CForm C
FlybackFlyback DiodesDiodes
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Basic Electronic Measurement System
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RESISTORSWide range of valuesWide range of valuesMilliohms to MegohmsMilliohms to MegohmsKelvin measurements requiredKelvin measurements requiredLow valuesLow valuesIntegrity checkIntegrity checkSeries & Parallel casesSeries & Parallel casesProbe to ProbeProbe to ProbeSeries with probeSeries with probeNetworksNetworks
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High ValuesHigh ValuesFV/MIFV/MILow current measurementsLow current measurements
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Series Resistor Test
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Resistor NetworkPrimary Test Path
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Resistor Voltage Divider Network
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CAPACITOR TEST METHODSCharge/Slope MethodCharge/Slope Method
Works well for large capacitorsWorks well for large capacitorsLimitations at low valuesLimitations at low valuesFinds some problems AC will notFinds some problems AC will not
AC Impedance MethodAC Impedance MethodWorks better on small capacitorsWorks better on small capacitorsEasier to compensate for stray capacitanceEasier to compensate for stray capacitanceLimitations at high valuesLimitations at high valuesCorrelates with Capacitance MeterCorrelates with Capacitance Meter
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Capacitance Measurement System
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Capacitor Calculations
C=I/(C=I/(∆∆VV//∆∆TT))
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Capacitor LeakageCritical parameterCritical parameterDC TestDC TestMakes Capacitor Value Look HigherMakes Capacitor Value Look HigherDielectric AbsorptionDielectric Absorption
Makes Leakage Hard to MeasureMakes Leakage Hard to MeasureIncreases Settling Time ConsiderablyIncreases Settling Time ConsiderablyCauses Problems with DischargingCauses Problems with Discharging
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Dielectric Absoption
A measure of the reluctance of a capacitor’s A measure of the reluctance of a capacitor’s dielectric to discharge completely dielectric to discharge completely –– usually usually measured in percent of original charge.measured in percent of original charge.
Def. Def. –– Illinois Capacitor, Inc.Illinois Capacitor, Inc.
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Leakage Test
Source: Vishay Sprague Tantalum Capacitors Data Book Pg 23.
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CAPACITOR TEST LIMITATIONS
Background CapacitanceBackground CapacitanceLimits low end accuracyLimits low end accuracy
LeakageLeakageCauses errors in valueCauses errors in valueTest Times are LongTest Times are Long
Polar CapacitorsPolar CapacitorsMust be properly biasedMust be properly biased
Dielectric AbsorptionDielectric AbsorptionCapacitor Exhibits “Memory”Capacitor Exhibits “Memory”Makes Complete Discharging DifficultMakes Complete Discharging DifficultLooks like leakageLooks like leakage
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Discharging CapacitorsMust discharge for other testsMust discharge for other tests
Prevent “PumpedPrevent “Pumped--Up” VoltagesUp” VoltagesMay Cause Errors in Wire CheckMay Cause Errors in Wire Check
Damage to probes or testerDamage to probes or testerArcing at Probe TipsArcing at Probe Tips
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RELAYSConnect alternate componentsConnect alternate componentsChange test pathChange test pathMay be higher voltage than circuitMay be higher voltage than circuitCoil shorts to test circuit are BAD!Coil shorts to test circuit are BAD!Catch diodes requiredCatch diodes requiredPerformance may be critical to testPerformance may be critical to testFunctional test mandatoryFunctional test mandatoryParametric test desirableParametric test desirableIntermittent function test desirable & UsefulIntermittent function test desirable & UsefulRelays added to prevent probe damageRelays added to prevent probe damage
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RELAY TEST METHODS
Test associated components or pathsTest associated components or pathsTest open/closed casesTest open/closed casesFunctional testFunctional testTest relay function directlyTest relay function directlyContactsContactsParametric TestParametric Test
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Logic & Linear IC’s on Probe CardLogic & Linear IC’s on Probe CardNew Programming TechniquesNew Programming TechniquesMultiple Supply VoltagesMultiple Supply Voltages“Full” Logic Testing“Full” Logic Testing
Ultra Low LeakageUltra Low Leakage
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Acknowledgements
Rex Lewis, TIRex Lewis, TIAli Ali JafariJafari, Agilent, AgilentJerry Jerry PilkayPilkay, , ArtestArtestNick Sporck, Form FactorNick Sporck, Form Factor