Probability and Probability and Statistics for Statistics for Reliability Reliability Benbow and Broome (Ch 4 and Ch 5) Benbow and Broome (Ch 4 and Ch 5) Presented by Dr. Joan Burtner Presented by Dr. Joan Burtner Certified Quality Engineer Certified Quality Engineer Associate Professor of Associate Professor of Industrial Engineering and Industrial Industrial Engineering and Industrial Management Management
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Probability and Statistics for Reliability Benbow and Broome (Ch 4 and Ch 5)
Probability and Statistics for Reliability Benbow and Broome (Ch 4 and Ch 5). Presented by Dr. Joan Burtner Certified Quality Engineer Associate Professor of Industrial Engineering and Industrial Management. Overview. Chapter 4 Basic Concepts Measures of central tendency - PowerPoint PPT Presentation
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Probability and Statistics Probability and Statistics for Reliabilityfor Reliability
Benbow and Broome (Ch 4 and Ch 5)Benbow and Broome (Ch 4 and Ch 5)
Presented by Dr. Joan BurtnerPresented by Dr. Joan Burtner
Industrial Engineering and Industrial Industrial Engineering and Industrial ManagementManagement
Fall 2010 ETM 591 ISE Fall 2010 ETM 591 ISE 427 427
Dr. Joan Burtner, Associate Professor of Industrial EngineeringDr. Joan Burtner, Associate Professor of Industrial Engineering Slide Slide 22
OverviewOverview
Chapter 4 Basic ConceptsChapter 4 Basic Concepts Measures of central tendencyMeasures of central tendency Measures of dispersionMeasures of dispersion Discrete and continuous probability distributionsDiscrete and continuous probability distributions Statistical process controlStatistical process control
Chapter 5 Statistical InferenceChapter 5 Statistical Inference Point estimate for failure ratePoint estimate for failure rate Confidence intervalsConfidence intervals Parametric hypothesis testingParametric hypothesis testing Nonparametric hypothesis testingNonparametric hypothesis testing Type I and Type II errorsType I and Type II errors Bayes’s theorem for reliabilityBayes’s theorem for reliability
Fall 2010 ETM 591 ISE Fall 2010 ETM 591 ISE 427 427
Dr. Joan Burtner, Associate Professor of Industrial EngineeringDr. Joan Burtner, Associate Professor of Industrial Engineering Slide Slide 33
Statistical Analysis Statistical Analysis
Measures of Central TendencyMeasures of Central Tendency MeanMean MedianMedian ModeMode
Measures of Dispersion (aka Measures of Dispersion (aka Variation or Spread) Variation or Spread) RangeRange Standard DeviationStandard Deviation VarianceVariance
Fall 2010 ETM 591 ISE Fall 2010 ETM 591 ISE 427 427
Dr. Joan Burtner, Associate Professor of Industrial EngineeringDr. Joan Burtner, Associate Professor of Industrial Engineering Slide Slide 44
Probability Probability Distributions Distributions Widely-used discrete distributionsWidely-used discrete distributions
Fall 2010 ETM 591 ISE Fall 2010 ETM 591 ISE 427 427
Dr. Joan Burtner, Associate Professor of Industrial EngineeringDr. Joan Burtner, Associate Professor of Industrial Engineering Slide Slide 55
Statistical Process Statistical Process Control (SPC) Control (SPC) Central tool is the control chartCentral tool is the control chart
Provides an early signal when a process changesProvides an early signal when a process changes Basic chart consists of an upper control limit, Basic chart consists of an upper control limit,
lower control limit, and process meanlower control limit, and process mean Trial control charts are based on historic dataTrial control charts are based on historic data The process is monitored and control limits are The process is monitored and control limits are
modified as neededmodified as needed Evaluation of control charts is based on probability Evaluation of control charts is based on probability
distribution of the characteristic being monitoreddistribution of the characteristic being monitored Normal (variables)Normal (variables) Binomial or Poisson (attributes)Binomial or Poisson (attributes)
Fall 2010 ETM 591 ISE Fall 2010 ETM 591 ISE 427 427
Dr. Joan Burtner, Associate Professor of Industrial EngineeringDr. Joan Burtner, Associate Professor of Industrial Engineering Slide Slide 66
SPC - Theory of SPC - Theory of Variation Variation Common CauseCommon Cause
Stable and predictable causes of variationStable and predictable causes of variation Inherent in all processesInherent in all processes Managers, not workers, are responsible Managers, not workers, are responsible
for common cause variationfor common cause variation Special Cause Special Cause
Unexpected or abnormal causes of Unexpected or abnormal causes of variationvariation
May result in sudden or extreme May result in sudden or extreme departures from normaldepartures from normal
May also result in gradual shifts (trends)May also result in gradual shifts (trends)
Fall 2010 ETM 591 ISE Fall 2010 ETM 591 ISE 427 427
Dr. Joan Burtner, Associate Professor of Industrial EngineeringDr. Joan Burtner, Associate Professor of Industrial Engineering Slide Slide 77
SPC - Control Chart SPC - Control Chart Types Types Control ChartsControl Charts
Variables – based on continuous dataVariables – based on continuous data• X bar and R (mean and range)X bar and R (mean and range)• X bar and S (mean and standard X bar and S (mean and standard
deviation)deviation) Attributes - based on discrete dataAttributes - based on discrete data
• P (proportion)P (proportion)• C (count)C (count)• U (count per unit)U (count per unit)
Fall 2010 ETM 591 ISE Fall 2010 ETM 591 ISE 427 427
Dr. Joan Burtner, Associate Professor of Industrial EngineeringDr. Joan Burtner, Associate Professor of Industrial Engineering Slide Slide 88
Control Chart Control Chart Calculations for Xbar Calculations for Xbar and R Chartsand R Charts Xbar and R Xbar and R
Control Chart Control Chart ConstantsConstants
RAXLCL
XCL
RAXUCL
RDLCL
RCL
RDUCL
X
X
X
R
R
R
2
2
3
4
Control Chart Control Chart CalculationsCalculations
n d 2 A 2 D 3 D 4
2 1.128 1.88 0 3.267
3 1.693 1.023 0 2.575
4 2.059 0.729 0 2.282
5 2.326 0.577 0 2.115
6 2.534 0.483 0 2.004
7 2.704 0.419 0.076 1.924
Fall 2010 ETM 591 ISE Fall 2010 ETM 591 ISE 427 427
Dr. Joan Burtner, Associate Professor of Industrial EngineeringDr. Joan Burtner, Associate Professor of Industrial Engineering Slide Slide 99
Control Chart Control Chart Interpretation Interpretation We will use Minitab to We will use Minitab to
build / interpret control chartsbuild / interpret control charts
Building Control Charts Building Control Charts Collect at least 25 samplesCollect at least 25 samples Enter data in Minitab using Enter data in Minitab using
appropriate formattingappropriate formatting Use pull-down menu to select the Use pull-down menu to select the
desired type of chartdesired type of chart Interpretation of Control ChartsInterpretation of Control Charts
Use Minitab to identify the testsUse Minitab to identify the testsSample
Sa
mp
le R
an
ge
454137332925211713951
0.4
0.3
0.2
0.1
0.0
_R=0.1972
UCL=0.4170
LCL=0
Line 2 Range Chart
Fall 2010 ETM 591 ISE Fall 2010 ETM 591 ISE 427 427
Dr. Joan Burtner, Associate Professor of Industrial EngineeringDr. Joan Burtner, Associate Professor of Industrial Engineering Slide Slide 1010
Parametric Hypothesis Parametric Hypothesis Testing Testing (used for ‘known’ distributions)(used for ‘known’ distributions)
Basic Hypothesis Testing for MeansBasic Hypothesis Testing for Means One Sample t or Z TestsOne Sample t or Z Tests Two Sample t or Z TestsTwo Sample t or Z Tests
Hypothesis Tests for Population Standard Hypothesis Tests for Population Standard DeviationDeviation
Hypothesis Tests for Population ProportionHypothesis Tests for Population Proportion Advanced Designs for Hypothesis Testing Advanced Designs for Hypothesis Testing
(Covered in Chapter 6 of Benbow and (Covered in Chapter 6 of Benbow and Broome)Broome) One Factor ANOVAOne Factor ANOVA Two Factor ANOVATwo Factor ANOVA Full Factorial Experiments Full Factorial Experiments
Fall 2010 ETM 591 ISE Fall 2010 ETM 591 ISE 427 427
Dr. Joan Burtner, Associate Professor of Industrial EngineeringDr. Joan Burtner, Associate Professor of Industrial Engineering Slide Slide 1111
Nonparametric equivalent to one factor ANOVANonparametric equivalent to one factor ANOVA Does not require the assumption that the population is Does not require the assumption that the population is
normalnormal Hypothesizes about medians unless population known to Hypothesizes about medians unless population known to
be “mound-shaped and symmetric”be “mound-shaped and symmetric” Minitab hypotheses- mediansMinitab hypotheses- medians Benbow and Broome hypotheses - meansBenbow and Broome hypotheses - means
Wilcoxon Signed Rank TestWilcoxon Signed Rank Test Nonparametric equivalent to single sample test for meanNonparametric equivalent to single sample test for mean Used when we can’t assume that the population is Used when we can’t assume that the population is
normalnormal Used when we can’t assume the Central Limit Theorem Used when we can’t assume the Central Limit Theorem
applicableapplicable Examples in MinitabExamples in Minitab
Fall 2010 ETM 591 ISE Fall 2010 ETM 591 ISE 427 427
Dr. Joan Burtner, Associate Professor of Industrial EngineeringDr. Joan Burtner, Associate Professor of Industrial Engineering Slide Slide 1212
ReferencesReferences
Course Text:Course Text: Benbow, D.W. and Broome, H.W., Ed. (2009). Benbow, D.W. and Broome, H.W., Ed. (2009).
Additional Sources Additional Sources Christensen, E.H., Coombes-Betz, K.M., and Christensen, E.H., Coombes-Betz, K.M., and
Stein, M.S. (2006). Stein, M.S. (2006). The Certified Quality Process The Certified Quality Process Analyst HandbookAnalyst Handbook. Milwaukee: ASQ Quality . Milwaukee: ASQ Quality Press.Press.