Presenter Information: Wallace Scott Military & Space Products, Texas Instruments 6412 Highway 75 South, MS 860 Sherman, Texas 75090, USA Phone (903)-868-6448 Fax (903)-868- 6245 [email protected]Heavy Ion Induced Single Event Effects on a 32-Bit, Floating-Point Digital Signal Processor W.Scott , R.Joshi, R.Daniels, T.Linnebur, I.Khan, K.Settle (Texas Instruments), Dr. M.Shoga (Science Applications International Corporation - SAIC), Dr. M.Gauthier (ICS Radiation Technologies, Inc.)
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Presenter Information: Wallace Scott Military & Space Products, Texas Instruments
Heavy Ion Induced Single Event Effects on a 32-Bit, Floating-Point Digital Signal Processor. W.Scott , R.Joshi, R.Daniels, T.Linnebur, I.Khan, K.Settle (Texas Instruments), Dr. M.Shoga (Science Applications International Corporation - SAIC), Dr. M.Gauthier (ICS Radiation Technologies, Inc.). - PowerPoint PPT Presentation
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Presenter Information:Wallace ScottMilitary & Space Products, Texas Instruments6412 Highway 75 South, MS 860Sherman, Texas 75090, USAPhone (903)-868-6448 Fax (903)[email protected]
Heavy Ion Induced Single Event Effectson a 32-Bit, Floating-Point
Digital Signal Processor
W.Scott, R.Joshi, R.Daniels, T.Linnebur, I.Khan, K.Settle (Texas Instruments), Dr. M.Shoga (Science Applications International Corporation - SAIC),
Dr. M.Gauthier (ICS Radiation Technologies, Inc.)
The Single Event Effects (SEE) response of SMV320C6701, a 32-bit, floating-point digital signal processor (DSP) from Texas Instruments was tested with heavy ions.
The processor was tested for Single Event Latch-up (SEL) and Single Event Upsets (SEU) at room and high temperature. An innovative test methodology and test flow developed for evaluating the SEU response of different functional blocks of the DSP are discussed. The SEU response of various functional blocks of the DSP at different (Linear Energy Transfer) LETs is also presented.
Finally, based on the SEE response of the DSP, its potential use in different spacecraft orbits is described.
Abstract
Test Device - SMV320C6701GLPW14
Advanced VelociTITM
very-long-instruction-word (VLIW) architecture
Up to 1120 MIPS and 840 MFLOPS at 140 MHz 1 Mbit On-Chip SRAM for
fast program/data access 2 Multi-Channel Buffered
Serial Ports (McBSPs) provide glueless connect to codecs & framers, full duplex operation, and support SPI and ST-Bus
-55°C to 125°C Tcase 429-pin CBGA package
C6701 CPUDMAController
Data Memory64 KByte
Program Memory64 KByte
EMIF
McBSP 1
Timer 1
Timer 0
McBSP 0
Host Port Interface
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Test Device – Key Parameters
Design Features
Process FeaturesLibrary
featuresCore Vdd 1.8V Starting Substrate
(Baseline for Class-V)
EPI (3.5µm)
Metal Levels
5
IO Vdd 3.3V STI Depth 5000A Flip Chip Yes
Core Lpoly 0.18µm PLL Yes
Core tox 40A
IO Lpoly 0.45µm
IO tox 80A
Test Details
Test Location: Texas A&M University Cyclotron Facility (TAMU-CF), College Station, Texas, USA
Website: http://cycltron.tamu.edu
Test Date: May 18, 2004
Ions Incident Angle
LET eff MeV/mg/cm²
#Units Test Temperature
Ar 0° 6.24 1 25°C
Ar 45° 9.16 2 25°C
Kr 0° 23.6 2 25°C
Kr 45° 35.4 2 25°C
Xe 0° 47.1 1 25°C
Xe 45° 71.1 1 25°C
Xe 45° 71.1 3 125°C
Xe45° + #2
Degrader89 3 125°C
Heavy Ion Beam Parameters
SEE Test System• Monitoring and Recording equipment
Texas Instruments 256-pin Automatic Test Equipment (ATE)
Monitor Supply currents (I/Os, Core, and PLL)
Automatic power-down when supply currents exceed user programmed limits
Event-Driven, exhaustive Functional and SCAN testing Translates to ~5-10 MHz test frequency
High-Speed (167 MHz) memory testing via internal-BIST (Built-In Self-Test)
Log parameters and fail counts
ContinuityContinuity Open PinsOpen Pins Open SupplyOpen Supply Short PinsShort Pins Short SupplyShort Supply
FunctionalFunctional Data and Program MemoryData and Program Memory
FunctionalFunctional Data word sizes, DMA, EMIFData word sizes, DMA, EMIF Multi-Channel Serial PortsMulti-Channel Serial Ports Power-down ModePower-down Mode PLLPLL